Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM

• Xiaoxing Ke,
• Carla Bittencourt,
• Sara Bals and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2013, 4, 77–86, doi:10.3762/bjnano.4.9

• desired. In this paper, we explore the use of focused-electron-beam-induced deposition (FEBID) to pattern CNTs with well-dispersed ultrasmall nanoclusters. FEBID is a direct-write process where a focused electron beam is used to locally decompose a precursor gas that contains a component such as a metal

• Xiaoxing Ke Carla Bittencourt Sara Bals Gustaaf Van Tendeloo EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium Chemistry of Interaction Plasma Surface (ChiPS), University of Mons, Place du Parc 20, 7000 Mons, Belgium 10.3762/bjnano.4.9 Abstract Focused-electron-beam

• -induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, demonstrating that the Pt

Focused electron beam induced deposition: A perspective

• Michael Huth,
• Fabrizio Porrati,
• Christian Schwalb,
• Marcel Winhold,
• Roland Sachser,
• Maja Dukic,
• Jonathan Adams and
• Georg Fantner

Beilstein J. Nanotechnol. 2012, 3, 597–619, doi:10.3762/bjnano.3.70

• ), Station 17, CH-1015 Lausanne, Switzerland 10.3762/bjnano.3.70 Abstract Background: Focused electron beam induced deposition (FEBID) is a direct-writing technique with nanometer resolution, which has received strongly increasing attention within the last decade. In FEBID a precursor previously adsorbed on

• the field of focused electron beam induced deposition. Keywords: atomic force microscopy; binary systems; electron beam induced deposition; granular metals; micro Hall magnetometry; radiation-induced nanostructures; strain sensing; Review Introduction Focused electron beam induced deposition (FEBID

Spontaneous dissociation of Co₂(CO)₈ and autocatalytic growth of Co on SiO₂: A combined experimental and theoretical investigation

• Kaliappan Muthukumar,
• Harald O. Jeschke,
• Roser Valentí,
• Evgeniya Begun,
• Johannes Schwenk,
• Fabrizio Porrati and
• Michael Huth

Beilstein J. Nanotechnol. 2012, 3, 546–555, doi:10.3762/bjnano.3.63

• dissociation of the precursor molecule. In view of these calculations, we discuss the origin of this dissociation and the subsequent autocatalysis. Keywords: Co2(CO)8; deposition; dissociation; EBID; FEBID; precursor; radiation-induced nanostructures; Introduction In recent years, focused electron beam

• induced deposition (FEBID) has emerged as a versatile, high-resolution technique for nanostructure fabrication in contrast to the more conventional nanolithographic techniques. In FEBID, a previously adsorbed precursor gas is dissociated in the focus of an electron beam. The nonvolatile part of the

Radiation-induced nanostructures: Formation processes and applications

• Michael Huth

Beilstein J. Nanotechnol. 2012, 3, 533–534, doi:10.3762/bjnano.3.61

• –liquid–solid approach and the preparation of monolayers of metal–organic frameworks attached to the functional groups of a self-assembled monolayer (see, e.g., [1][2][3][4]). Not as wide-spread, but rapidly developing, is the technique of focused electron beam induced deposition (FEBID) [5]. In this

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

• Miriam Jaafar,
• Oscar Iglesias-Freire,
• Luis Serrano-Ramón,
• Manuel Ricardo Ibarra,
• Jose Maria de Teresa and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2011, 2, 552–560, doi:10.3762/bjnano.2.59

• array of Co nanostructures that exhibit high electrostatic interaction with the MFM tip. Thanks to the use of the KPFM/MFM system we were able to separate the electric and magnetic interactions between the tip and the sample. Keywords: electrostatic interaction; focused electron beam induced deposition

• Discussion In the present work we have studied cobalt nanowires grown by focused-electron-beam-induced deposition (FEBID). The sample growth was performed in a commercial dual beam® equipment using a field emission scanning electron microscope with Co2(CO)8 as gas precursor. The substrate material used in