Polynomial force approximations and multifrequency atomic force microscopy

• Daniel Platz,
• Daniel Forchheimer,
• Erik A. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

• to spectral data, and we demonstrate how it can be adapted to a force quadrature picture. Keywords: AFM; atomic force microscopy; force spectroscopy; multifrequency; intermodulation; polynomial; Introduction The combination of high-resolution imaging [1][2][3][4] and high-accuracy force

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• ) [Fukuma et al., Appl. Phys. Lett. 2005, 87, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging

• manipulate the effective quality factor of the oscillating probe, has been proposed [15][16]. However, the merits of this approach for improving imaging resolution are still under question [17]. In this article we present a combined theoretical and experimental study of high-resolution imaging in liquid

• , while the phase lag of the oscillation is free to vary. Imaging modes with more complex feedback architectures, such as FM and DAM, will be described later in this section. In order to establish the performance metrics for high-resolution imaging, we start with the equation of motion describing the time

Dimer/tetramer motifs determine amphiphilic hydrazine fibril structures on graphite

• Loji K. Thomas,
• Nadine Diek,
• Uwe Beginn and
• Michael Reichling

Beilstein J. Nanotechnol. 2012, 3, 658–666, doi:10.3762/bjnano.3.75

• structures, it has not shown the same level of efficacy [20]. Particularly for high-resolution imaging in an ambient/solution environment, data acquisition becomes an exhausting and time-consuming process. Difficulties arise from the requirement of having single-digit nanometre-wide isolated strands and

Nano-structuring, surface and bulk modification with a focused helium ion beam

• Daniel Fox,
• Yanhui Chen,
• Colm C. Faulkner and
• Hongzhou Zhang

Beilstein J. Nanotechnol. 2012, 3, 579–585, doi:10.3762/bjnano.3.67

• energy spread and subsequent chromatic aberration which limits the resolution of the FIB [10]. Our HIM is capable of sub-nm resolution imaging with its <0.75 nm probe size. This makes it ideally suited to both high resolution imaging and also modification of materials with a higher level of control and

Modeling noncontact atomic force microscopy resolution on corrugated surfaces

• Kristen M. Burson,
• Mahito Yamamoto and
• William G. Cullen

Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26

• resolution. Here we have shown that, even more so than for flat surfaces, these factors are especially important for high-resolution imaging of rough surfaces, based only on the differences between vdW interactions. While the model results support the experimental difficulty of obtaining accurate images of

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• selective swelling of components. Keywords: atomic force microscopy; fluoroalkanes; Kelvin force microscopy; surface potential; Introduction Atomic force microscopy (AFM) applications include high-resolution imaging, probing of local materials properties and compositional mapping of heterogeneous

• materials in different environments. In recent years the improvements in these fields have been associated with the development of oscillatory modes and multi-frequency approaches. Despite the continuing interest and progress in high-resolution imaging, the practical value of AFM is strongly related to