High sensitivity and high resolution element 3D analysis by a combined SIMS–SPM instrument

• Yves Fleming and
• Tom Wirtz

Beilstein J. Nanotechnol. 2015, 6, 1091–1099, doi:10.3762/bjnano.6.110

• is widely used in the SIMS field. The 3D SIMS-AFM surface reconstructions are visualised using the SPIP™ software by Image Metrology [15], the ParaView software tool [16] as well as the MayaVI 2 software tool [17]. Results and Discussion PS/PVP polymer blend An annealed polystyrene (PS

Stiffness of sphere–plate contacts at MHz frequencies: dependence on normal load, oscillation amplitude, and ambient medium

• Jana Vlachová,
• Rebekka König and
• Diethelm Johannsmann

Beilstein J. Nanotechnol. 2015, 6, 845–856, doi:10.3762/bjnano.6.87

• method is closely analogous to related procedures in AFM-based metrology. The real part of the contact stiffness as a function of normal load can be fitted with the Johnson–Kendall–Roberts (JKR) model. The contact stiffness was found to increase in the presence of liquid water. This finding is

• . have provided such a model [24], making extensive use of the Greenwood–Williamson formalism [25]. The experiments below rely on the contact resonance method. The contact resonance method is also applied on the macroscopic scale [26] and in AFM-based metrology [27]. In particular, the mathematics is

Conformal SiO₂ coating of sub-100 nm diameter channels of polycarbonate etched ion-track channels by atomic layer deposition

• Nicolas Sobel,
• Christian Hess,
• Manuela Lukas,
• Anne Spende,
• Bernd Stühn,
• M. E. Toimil-Molares and
• Christina Trautmann

Beilstein J. Nanotechnol. 2015, 6, 472–479, doi:10.3762/bjnano.6.48

• detector (Molecular Metrology) at 150 cm distance from the sample providing an accessible range of q-vectors between 0.008 Å−1 up to 0.25 Å−1. Precise orientation of the sample with respect to the scattering plane is important in order to be able to interpret the data quantitatively. During SAXS analysis

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

• Tobias Meier,
• Alexander Förste,
• Ali Tavassolizadeh,
• Karsten Rott,
• Dirk Meyners,
• Roland Gröger,
• Günter Reiss,
• Eckhard Quandt,
• Thomas Schimmel and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

• effects; magnetostriction; scanning probe microscopes and components; Introduction Since its invention in the 1980s [1] the atomic force microscope (AFM) became a versatile tool frequently used in nanoscale metrology, biosensing, maskless lithography and high density data storage with nearly as many

X-ray photoelectron spectroscopy of graphitic carbon nanomaterials doped with heteroatoms

• Toma Susi,
• Thomas Pichler and
• Paola Ayala

Beilstein J. Nanotechnol. 2015, 6, 177–192, doi:10.3762/bjnano.6.17

• to firmly establish the metrology of dopants in carbon nanomaterials. Structural models of graphitic carbon nanomaterials. Clockwise from top left: graphene, graphite, C60 fullerene, and a single-walled carbon nanotube. The photoemission response of metallicity-separated and purified single-walled

Functionalization of α-synuclein fibrils

• Simona Povilonienė,
• Vida Časaitė,
• Virginijus Bukauskas,
• Arūnas Šetkus,
• Juozas Staniulis and
• Rolandas Meškys

Beilstein J. Nanotechnol. 2015, 6, 124–133, doi:10.3762/bjnano.6.12

• the standard contact and tapping AFM modes by scanning probe microscope SPM D3100/Nanoscope IVa (Veeco, now Bruker). Two types of silicon tips, OTESPA and SNL (Bruker), were used. The images were processed by the Scanning Probe Image Processor, Version 5.1.0 software (Image Metrology, Denmark). The

Size-dependent density of zirconia nanoparticles

• Agnieszka Opalinska,
• Iwona Malka,
• Wojciech Dzwolak,
• Tadeusz Chudoba,
• Adam Presz and
• Witold Lojkowski

Beilstein J. Nanotechnol. 2015, 6, 27–35, doi:10.3762/bjnano.6.4

• , where new phenomena appear at particle sizes less than 100 nm. The results presented here are important for nanoparticle metrology and determination of their quality. The smaller the grain size, the larger the contribution of the low density surface layer to the average density. The technological aim is

Properties of plasmonic arrays produced by pulsed-laser nanostructuring of thin Au films

• Katarzyna Grochowska,
• Katarzyna Siuzdak,
• Peter A. Atanasov,
• Carla Bittencourt,
• Anna Dikovska,
• Nikolay N. Nedyalkov and
• Gerard Śliwiński

Beilstein J. Nanotechnol. 2014, 5, 2102–2112, doi:10.3762/bjnano.5.219

• research and in the fields of medicine, metrology and optoelectronic devices. Among studies on short-pulse laser interactions with materials, the topic of nanostructuring by photothermally induced instabilities at the liquid–solid interface due to fast heating and solidifying of thin metal films evoked

Surface topography and contact mechanics of dry and wet human skin

• Alexander E. Kovalev,
• Kirstin Dening,
• Bo N. J. Persson and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2014, 5, 1341–1348, doi:10.3762/bjnano.5.147

• Instruments AG, Berlin, Germany) equipped with a high density carbon tip (0.2 N/m, NanoWorld AG, Neuchâtel, Switzerland) in contact mode at 1024 × 1024 pixels resolution and 0.5 Hz scanning rate. Figure 3 was produced by using the software SPIP 5.1.2 (Image Metrology, Denmark). Contact angles of water on skin

Insect attachment on crystalline bioinspired wax surfaces formed by alkanes of varying chain lengths

• Elena Gorb,
• Sandro Böhm,
• Nadine Jacky,
• Louis-Philippe Maier,
• Kirstin Dening,
• Sasha Pechook,
• Boaz Pokroy and
• Stanislav Gorb

Beilstein J. Nanotechnol. 2014, 5, 1031–1041, doi:10.3762/bjnano.5.116

• software (SPIP, Version 5.1.2, Image Metrology A/S, Hørsholm, Danemark) for evaluation of roughness parameters, such as Ra (mean roughness) and r.m.s. (root mean square of roughness). Prior to roughness analyses, the images were plane corrected. The scanning tip geometry was characterized by scanning on a

Exploring the complex mechanical properties of xanthan scaffolds by AFM-based force spectroscopy

• Hao Liang,
• Guanghong Zeng,
• Yinli Li,
• Shuai Zhang,
• Huiling Zhao,
• Lijun Guo,
• Bo Liu and
• Mingdong Dong

Beilstein J. Nanotechnol. 2014, 5, 365–373, doi:10.3762/bjnano.5.42

• × 512 pixels were obtained at separate locations to ensure a high degree of reproducibility of experiment data. The images and force data were analyzed by the commercial software Scanning Probe Image Processor (SPIPTM, by Image Metrology ApS, version 5.1.3, Lyngby, Denmark). Force spectroscopy

Routes to rupture and folding of graphene on rough 6H-SiC(0001) and their identification

• M. Temmen,
• O. Ochedowski,
• B. Kleine Bussmann,
• M. Schleberger,
• M. Reichling and
• T. R. J. Bollmann

Beilstein J. Nanotechnol. 2013, 4, 625–631, doi:10.3762/bjnano.4.69

• , France) for SHI irradiation with 81 MeV Ta24+ ions under 1.5° grazing incidence. The ion fluence is adjusted to 5–10 ions/μm2. Irradiated samples are initially inspected by tapping mode atomic force microscopy performed under ambient conditions using a Dimension 3100 AFM (Veeco Metrology, Santa Barbara

Apertureless scanning near-field optical microscopy of sparsely labeled tobacco mosaic viruses and the intermediate filament desmin

• Alexander Harder,
• Mareike Dieding,
• Volker Walhorn,
• Sven Degenhard,
• Andreas Brodehl,
• Christina Wege,
• Hendrik Milting and
• Dario Anselmetti

Beilstein J. Nanotechnol. 2013, 4, 510–516, doi:10.3762/bjnano.4.60

• SPIP image processing software (Image Metrology A/S, Hørsholm, Denmark). All SNOM experiments were done with monolithic silicon cantilevers (ATEC-NC, Nanosensors, Neuchatel, Switzerland). The tetrahedral tip protruding from the end of the lever ensures visibility of the tip apex and consequently

High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices

• Pierre Eyben

Beilstein J. Nanotechnol. 2013, 4, 318–319, doi:10.3762/bjnano.4.35

• transistors is also being intensively studied. In all these cases, metrology is a challenge, and no universal solution is identifiable. Moreover in many cases it becomes also very difficult to establish a complete assessment of accuracy, precision and spatial resolution due to a lack of appropriate 3-D

• standards and comparative metrology. The development of high-performance devices (high speed and density, low consumption) is not the only objective of the electronic industry. The need for low-cost devices processed industrially on flexible and light substrates over very large surfaces has led to the

• compositional analysis. At the same time we need to recognize that, notwithstanding the past efforts and achievements, there remains a considerable knowledge and performance gap between the state-of-the-art metrology and the future metrology requirements. Hence also some simulation work is presented in this

Effect of spherical Au nanoparticles on nanofriction and wear reduction in dry and liquid environments

• Dave Maharaj and
• Bharat Bhushan

Beilstein J. Nanotechnol. 2012, 3, 759–772, doi:10.3762/bjnano.3.85

•  4, for a 10 µm × 10 µm scan size. The average nanoparticle diameter for Au 30 is 25.4 ± 7.1 nm and for Au 90 is 98.4 ± 27 nm. The nanoparticle coverage analysis was performed by using SPIP 5.1.11 (Image Metrology A/S, Horshølm, Denmark). Imaging was performed at a normal load of 10 nN. For

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• experiments. Thus, a stable repulsive regime could be achieved while excessive tip–sample forces were avoided. Bimodal imaging The imaging of a thin film of a polystyrene-block-polybutadiene (SB) diblock copolymer was conducted on a Dimension 3100 AFM with a Nanoscope IV controller (Veeco Metrology Inc

Self-assembly of octadecyltrichlorosilane: Surface structures formed using different protocols of particle lithography

• ChaMarra K. Saner,
• Kathie L. Lusker,
• Zorabel M. LeJeune,
• Wilson K. Serem and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2012, 3, 114–122, doi:10.3762/bjnano.3.12

• available on the internet and supported by the Czech Metrology Institute [59]. Estimates of surface coverage were obtained for individual topography frames by manually converting images to black and white using thresholding and pixel counting with UTHSCA Image Tool [60]. Preparation of latex-particle masks

STM visualisation of counterions and the effect of charges on self-assembled monolayers of macrocycles

• Tibor Kudernac,
• Natalia Shabelina,
• Wael Mamdouh,
• Sigurd Höger and
• Steven De Feyter

Beilstein J. Nanotechnol. 2011, 2, 674–680, doi:10.3762/bjnano.2.72

• Processor (SPIP) 4.1.7 software (Image Metrology ApS)). Structure of the shape-persistent macrocycles 1 and 2. STM images and tentative molecular packing model of 1 self-assembled at the TCB/graphite interface. The unit cell parameters are a = 5.5 ± 0.1 nm, b = 4.4 ± 0.2 nm, γ = 68 ± 2°. a) 47.7 nm × 47.7