A scanning probe microscopy study of nanostructured TiO₂/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

• Laurie Letertre,
• Roland Roche,
• Olivier Douhéret,
• Hailu G. Kassa,
• Denis Mariolle,
• Nicolas Chevalier,
• Łukasz Borowik,
• Philippe Dumas,
• Benjamin Grévin,
• Roberto Lazzaroni and
• Philippe Leclère

Beilstein J. Nanotechnol. 2018, 9, 2087–2096, doi:10.3762/bjnano.9.197

• theoretical and material design perspective. Keywords: hybrid heterojunctions; hybrid photovoltaic; Kelvin probe force microscopy; photoconductive-AFM; photo-KPFM; poly(3-hexylthiophene); TiO2; Introduction Over the past decades, a large range of photovoltaic (PV) technologies have been developed for the

• photoconductive-AFM (PC-AFM) and photo-assisted Kelvin probe force microscopy (photo-KPFM) to follow the photovoltaic response, i.e., photocurrent and photovoltage, respectively, at the nanoscale under illumination, in order to understand the local physical processes taking place during the photoconversion of

• interspacing being sufficient for the polymer infiltration. The photo-KPFM measurements were carried out in a UHV (<10−10 Torr) instrument composed of an Omicron Nanotechnology VT-AFM system with a Nanonis controller. The KPFM electrical excitation used a frequency ωKPFM/2π of 958 Hz, with a VAC amplitude of