Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

• Marta Agati,
• Guillaume Amiard,
• Vincent Le Borgne,
• Paola Castrucci,
• Richard Dolbec,
• Maurizio De Crescenzi,
• My Alì El Khakani and
• Simona Boninelli

Beilstein J. Nanotechnol. 2017, 8, 440–445, doi:10.3762/bjnano.8.47

• Dipartimento di Fisica, Università di Roma “Tor Vergata”, Via della Ricerca Scientifica 1, Roma 00133, Italy, Tekna Plasma Systems Inc., 2935 Industrial Blvd., Sherbrooke QC-J1L 2T9, Canada 10.3762/bjnano.8.47 Abstract Scanning transmission electron microscopy (STEM) was successfully applied to the analysis

Role of oxygen in wetting of copper nanoparticles on silicon surfaces at elevated temperature

• Tapas Ghosh and
• Biswarup Satpati

Beilstein J. Nanotechnol. 2017, 8, 425–433, doi:10.3762/bjnano.8.45

• the high-angle annular dark-field scanning transmission electron microscopy (STEM-HAADF). After the TEM analysis, the same samples were transferred to a rapid thermal annealing unit (model: JETFIRST100 jipelec) and annealing was performed in air, oxygen and nitrogen atmospheres, one by one. The rapid

Influence of hydrofluoric acid treatment on electroless deposition of Au clusters

• Rachela G. Milazzo,
• Antonio M. Mio,
• Giuseppe D’Arrigo,
• Emanuele Smecca,
• Alessandra Alberti,
• Gabriele Fisichella,
• Filippo Giannazzo,
• Corrado Spinella and
• Emanuele Rimini

Beilstein J. Nanotechnol. 2017, 8, 183–189, doi:10.3762/bjnano.8.19

• plating solution. The morphology of gold was examined with plan view TEM and scanning transmission electron microscopy (STEM) in high-angle annular dark-field imaging (HAADF) Z-contrast (atomic number) imaging mode, while the crystalline structure was analyzed in detail with X-ray diffraction. Figure 4a

Thickness-modulated tungsten–carbon superconducting nanostructures grown by focused ion beam induced deposition for vortex pinning up to high magnetic fields

• Ismael García Serrano,
• Javier Sesé,
• Isabel Guillamón,
• Hermann Suderow,
• Sebastián Vieira,
• Manuel Ricardo Ibarra and
• José María De Teresa

Beilstein J. Nanotechnol. 2016, 7, 1698–1708, doi:10.3762/bjnano.7.162

• , whereas for the samples with higher pitches (120 and 140 nm), the corrugation is greater than 50%. The W–C samples were further characterized by means of scanning transmission electron microscopy (STEM) in a 300 kV F30-Tecnai apparatus by FEI. In the STEM experiments performed, the electron beam was

• along the x direction. Cross-sectional SEM micrographs of a sample with 60 nm pitch (a), a sample with 100 nm pitch (b) and the flat sample (c). The y and z axes correspond to the short sides of the film and the thickness direction, respectively. Scanning transmission electron microscopy (STEM) study of

Influence of the shape and surface oxidation in the magnetization reversal of thin iron nanowires grown by focused electron beam induced deposition

• Luis A. Rodríguez,
• Lorenz Deen,
• Rosa Córdoba,
• César Magén,
• Etienne Snoeck,
• Bert Koopmans and
• José M. De Teresa

Beilstein J. Nanotechnol. 2015, 6, 1319–1331, doi:10.3762/bjnano.6.136

• microstructure were determined by bright field (BF) TEM and high resolution TEM (HRTEM) imaging, and chemical composition of the sections was determined by combining high angle annular dark field (HAADF) imaging and electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) mode

Magnetic properties of iron cluster/chromium matrix nanocomposites

• Arne Fischer,
• Robert Kruk,
• Di Wang and
• Horst Hahn

Beilstein J. Nanotechnol. 2015, 6, 1158–1163, doi:10.3762/bjnano.6.117

• energy-filtered transmission electron microscopy (EFTEM) and scanning transmission electron microscopy (STEM) micrographs of the Fe distribution for a 10 vol % Fe1000/Cr sample, specifically prepared for TEM. To avoid subsequent focused ion beam cutting and possible oxidation, the sample was deposited on

Tunable magnetism on the lateral mesoscale by post-processing of Co/Pt heterostructures

• Oleksandr V. Dobrovolskiy,
• Maksym Kompaniiets,
• Roland Sachser,
• Fabrizio Porrati,
• Christian Gspan,
• Harald Plank and
• Michael Huth

Beilstein J. Nanotechnol. 2015, 6, 1082–1090, doi:10.3762/bjnano.6.109

• magnetic field directed normally to the stripe plane and immediately after transferring the samples from the SEM after the Co purification step. Transmission electron microscopy For an inspection of the selected sample C by scanning transmission electron microscopy (STEM) a Titan G2 microscope from FEI

Overview about the localization of nanoparticles in tissue and cellular context by different imaging techniques

• Anja Ostrowski,
• Daniel Nordmeyer,
• Alexander Boreham,
• Cornelia Holzhausen,
• Lars Mundhenk,
• Christina Graf,
• Martina C. Meinke,
• Annika Vogt,
• Sabrina Hadam,
• Jürgen Lademann,
• Eckart Rühl,
• Ulrike Alexiev and
• Achim D. Gruber

Beilstein J. Nanotechnol. 2015, 6, 263–280, doi:10.3762/bjnano.6.25

• 1 to 10 µm3 that is usually analyzed [20][29][35][153][154]. Scanning transmission electron microscopy (STEM) has been presented recently as an elegant approach to overcome this limitation [154]. The authors simultaneously recorded bright and dark field STEM images of gold NP in murine liver tissue

The influence of molecular mobility on the properties of networks of gold nanoparticles and organic ligands

• Edwin J. Devid,
• Paulo N. Martinho,
• M. Venkata Kamalakar,
• Úna Prendergast,
• Christian Kübel,
• Tibebe Lemma,
• Jean-François Dayen,
• Tia. E. Keyes,
• Bernard Doudin,
• Mario Ruben and
• Sense Jan van der Molen

Beilstein J. Nanotechnol. 2014, 5, 1664–1674, doi:10.3762/bjnano.5.177

• transmission electron microscopy (SEM) is used to image the arrays on flat (oxidized) silicon substrates and the Au-NP–S-BPP networks on nanotrench electrodes devices (see Supporting Information File 1, Figure S8). Scanning transmission electron microscopy (STEM) and transmission electron microscopy (HAADF

Synthesis, characterization, and growth simulations of Cu–Pt bimetallic nanoclusters

• Subarna Khanal,
• Ana Spitale,
• Nabraj Bhattarai,
• Daniel Bahena,
• J. Jesus Velazquez-Salazar,
• Sergio Mejía-Rosales,
• Marcelo M. Mariscal and
• Miguel José-Yacaman

Beilstein J. Nanotechnol. 2014, 5, 1371–1379, doi:10.3762/bjnano.5.150

• 66450, México 10.3762/bjnano.5.150 Abstract Highly monodispersed Cu–Pt bimetallic nanoclusters were synthesized by a facile synthesis approach. Analysis of transmission electron microscopy (TEM) and spherical aberration (Cs)-corrected scanning transmission electron microscopy (STEM) images shows that

• –Pt clusters; energy dispersive X-ray spectroscopy (EDX); grand-canonical Langevin dynamics; nanoalloys; scanning transmission electron microscopy (STEM); Introduction The study of bimetallic (BM) nanoclusters has received particular interest because of their myriad properties and applications in

• , formic acid electro-oxidation, and ORR, in comparison with other Pt-based nanoparticles [40][41][42]. In this paper, we describe the synthesis of monodispersed sub-3 nm Cu–Pt BM nanoclusters, and their characterization by spherical aberration (Cs)-corrected scanning transmission electron microscopy (STEM

Purification of ethanol for highly sensitive self-assembly experiments

• Kathrin Barbe,
• Martin Kind,
• Christian Pfeiffer and
• Andreas Terfort

Beilstein J. Nanotechnol. 2014, 5, 1254–1260, doi:10.3762/bjnano.5.139

• . Afterwards they were sprayed onto carbon-coated copper grids using a modified UIS250v Hielscher sonifier [44]. Measurements were carried out with a FEI TECNAI F30 S-TWIN microscope working at 300 kV. Scanning transmission electron microscopy (STEM) images were acquired with a scanning unit by a FISCHIONE

Characterization of electroforming-free titanium dioxide memristors

• John Paul Strachan,
• J. Joshua Yang,
• L. A. Montoro,
• C. A. Ospina,
• A. J. Ramirez,
• A. L. D. Kilcoyne,
• Gilberto Medeiros-Ribeiro and
• R. Stanley Williams

Beilstein J. Nanotechnol. 2013, 4, 467–473, doi:10.3762/bjnano.4.55

• . Scanning transmission electron microscopy (STEM) was also used to explore the forming-free device from a structural and morphological standpoint. Figure 5 depicts STEM images obtained from bright-field (BF) detection. BF imaging was utilized rather than HAADF detection due to the latter having an image

Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM

• Xiaoxing Ke,
• Carla Bittencourt,
• Sara Bals and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2013, 4, 77–86, doi:10.3762/bjnano.4.9

• [24][25][26][27]. The ability of FEBID to write ultrasmall nanostructures has been demonstrated by using scanning transmission electron microscopy (STEM) with an electron probe of 0.2 nm operated at 200 kV [28][29]. By using scanning electron microscopy (SEM)-assisted FEBID, Co nanowires of lateral

Tuning the properties of magnetic thin films by interaction with periodic nanostructures

• Ulf Wiedwald,
• Felix Haering,
• Stefan Nau,
• Carsten Schulze,
• Herbert Schletter,
• Denys Makarov,
• Alfred Plettl,
• Karsten Kuepper,
• Manfred Albrecht,
• Johannes Boneberg and
• Paul Ziemann

Beilstein J. Nanotechnol. 2012, 3, 831–842, doi:10.3762/bjnano.3.93

• commercially available Au nanoparticles as described above. The structure of the magnetic multilayer on the nanoparticles strongly influences its magnetic properties. By means of SEM and cross-sectional scanning transmission electron microscopy (STEM) investigations, it was found that, independent of the