Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

• Lukasz Rzeznik,
• Yves Fleming,
• Tom Wirtz and
• Patrick Philipp

Beilstein J. Nanotechnol. 2016, 7, 1113–1128, doi:10.3762/bjnano.7.104

• can be reached for multi-frame secondary ion images. Thereafter, AFM measurements in tapping mode (AFM probe type: ACST soft tapping mode tips without coating from Appnano) on an Agilent 5100 Surface Probe Microscope [51] were carried out inside the different post-bombardment craters in order to

Generalized Hertz model for bimodal nanomechanical mapping

• Aleksander Labuda,
• Marta Kocuń,
• Waiman Meinhold,
• Deron Walters and
• Roger Proksch

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

• ” or “spectroscopic” techniques. In parametric nanomechanical techniques, the sample properties are deduced from changes in the parameters of a driven cantilever that is oscillating in a (quasi) steady state while interacting with the sample surface. For example, tapping-mode AFM [16][17] (also known

Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

• Santiago D. Solares

Beilstein J. Nanotechnol. 2016, 7, 554–571, doi:10.3762/bjnano.7.49

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

• Michael G. Ruppert and
• S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

• mount components. In this approach, due to small circuit mismatches, the feedthrough has to be canceled for each mode separately to achieve the best dynamic range which is necessary for tapping-mode AFM. The inherent self-sensing capability of a single piezoelectric layer enables the omission of the

Synthesis and applications of carbon nanomaterials for energy generation and storage

• Marco Notarianni,
• Jinzhang Liu,
• Kristy Vernon and
• Nunzio Motta

Beilstein J. Nanotechnol. 2016, 7, 149–196, doi:10.3762/bjnano.7.17

A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

• Santiago D. Solares

Beilstein J. Nanotechnol. 2015, 6, 2233–2241, doi:10.3762/bjnano.6.229

• modified to implement other controls schemes in order to aid in the interpretation of AFM experiments. Keywords: atomic force microscopy (AFM); modeling; multifrequency; multimodal; polymers; simulation; spectroscopy; standard linear solid; tapping-mode AFM; viscoelasticity; Introduction The

Optimization of phase contrast in bimodal amplitude modulation AFM

• Mehrnoosh Damircheli,
• Amir F. Payam and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2015, 6, 1072–1081, doi:10.3762/bjnano.6.108

• map compositional variations under the influence of conservative forces is a main advantage with respect to AFM phase imaging (tapping mode AFM), where the phase contrast is related to variations in energy dissipation [33]. In AM-AFM there are two interacting regimes, attractive and repulsive [2]. The

• ., tapping mode AFM. For this simulation the best contrast is yielded for an amplitude ratio of 250. This value is significantly larger than the values previously recommended (10–50) which were based on experiments [43][44][45]. Phase contrast in the attractive regime (dissipation): A01 > A02 To study the

Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments

• Horacio V. Guzman,
• Pablo D. Garcia and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2015, 6, 369–379, doi:10.3762/bjnano.6.36

• experiments. The simulator presents the cantilever–tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental situations in air or liquid. The code provides all the variables and parameters relevant in those modes, for example, the

• simulations. Finally, the accuracy of dForce has been tested against numerical simulations performed during the last 18 years. Keywords: bimodal AFM; dynamic AFM; nanomechanics; numerical simulations; tapping mode AFM; Introduction Numerical simulations have played a pivotal role to advance the

• understanding and, in the process, to improve the performance of amplitude modulation atomic force microscopy (AM-AFM), usually known as tapping mode AFM. The following discussion provides some examples. Simulations provided the first estimation of the forces and deformations involved in tapping mode AFM [1][2

Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 2149–2163, doi:10.3762/bjnano.5.224

• ; Introduction Atomic force microscopy (AFM) has evolved rapidly since its invention in the mid-1980s [1] and has been used since then for measuring topography and probe–sample forces on micro- and nanoscale surfaces in different environments. Tapping mode AFM (amplitude modulation, AM-AFM) is the most common

• dynamic method and has been the subject of thorough studies [2][3][4][5][6]. In tapping mode AFM damage or wear of the tip and surface are reduced with respect to contact-mode AFM due to lower friction and lateral forces, which makes it more applicable for imaging soft samples, such as polymers and

• biological surfaces. Tapping mode AFM has the additional advantage that it records a phase contrast simultaneously with the acquisition of topography, which can be very useful in the study of heterogeneous samples [7][8][9][10]. Moreover, the observables in tapping mode AFM (phase and amplitude) can provide

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air

• Santiago D. Solares,
• Sangmin An and
• Christian J. Long

Beilstein J. Nanotechnol. 2014, 5, 1637–1648, doi:10.3762/bjnano.5.175

• , as in previously validated bimodal and trimodal methods [2][3][4][5][6][7][8][9]. Although the dynamics of multimodal tapping-mode AFM can be quite complex, we find that imaging can be remarkably stable and that the cantilever eigenmodes, in general, exhibit the predicted behavior [20]. We focus our

• rates for tapping mode AFM with an amplitude setpoint ratio of 50 to 60%. Similar to the spectroscopy results of Figure 4, it was possible to image the surface with the fundamental eigenmode operating in the repulsive imaging regime (Figure 6 and Figure 7) as well as in the attractive imaging regime

• nominal fundamental resonance frequency and force constant of 70 kHz and 2 N/m, respectively. As the mode order increases the shape of the peak increasingly deviates from the ideal response of a damped harmonic oscillator. Simulated tip and eigenmode responses for pentamodal tapping-mode AFM: (a) tip

Exploring the retention properties of CaF₂ nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid

• Matthias Wasem,
• Joachim Köser,
• Sylvia Hess,
• Enrico Gnecco and
• Ernst Meyer

Beilstein J. Nanotechnol. 2014, 5, 36–43, doi:10.3762/bjnano.5.4

• substrate roughness, morphology and size of the particles. Keywords: AM-AFM in liquid; nanodentistry; nanoparticles; Introduction Amplitude-modulation atomic force microscopy (AM-AFM), also known as tapping mode AFM, is a variant of scanning probe microscopy. In this dynamic technique imaging is achieved

• mica and on tooth enamel in liquid. Manipulation experiments of nanoparticles are routinely done by using the AFM in the contact mode [10][11][12]. However some studies have been reported, in which a controlled manipulation of nanoparticles in tapping mode AFM was performed. Sitti et al. used a

• nanoparticles on silicon substrates with dynamic AFM [16]. Darwich et al. investigated the retention of colloidal gold nanoparticles depending on particle–substrate affinity and humidity with tapping mode AFM [17]. In all these studies the major difficulty arises to quantify the dynamic processes during

Routes to rupture and folding of graphene on rough 6H-SiC(0001) and their identification

• M. Temmen,
• O. Ochedowski,
• B. Kleine Bussmann,
• M. Schleberger,
• M. Reichling and
• T. R. J. Bollmann

Beilstein J. Nanotechnol. 2013, 4, 625–631, doi:10.3762/bjnano.4.69

• exposed to SHI irradiation (i) followed by a combination of line scanning the sample with an AFM tip (ii) and severe heating (iii). The tapping mode AFM survey image shown in Figure 3a exhibits a representative part of the flake comprising all phenomena discussed in this paper, rupture and folding of

• various origin, labeled by (i), (ii) and (iii), respectively. The tapping mode AFM survey image shown in Figure 3b, has been taken right after SHI irradiation where the SLG shows foldings at an angle of 58.0 ± 1.2° with respect to the flakes edge. The properties of such foldings related to the ion track

• a line profile taken on the SLG flake perpendicular to substrate step edges measured by Kelvin-compensated NC-AFM. Tapping mode AFM image (a) of an exfoliated SLG flake on 6H-SiC(0001) showing examples of rupture and folding by the use of SHI, type (i), modification by AFM tip contacting and

AFM as an analysis tool for high-capacity sulfur cathodes for Li–S batteries

• Renate Hiesgen,
• Seniz Sörgel,
• Rémi Costa,
• Linus Carlé,
• Ines Galm,
• Natalia Cañas,
• Brigitta Pascucci and
• K. Andreas Friedrich

Beilstein J. Nanotechnol. 2013, 4, 611–624, doi:10.3762/bjnano.4.68

• cathodes. X-ray diffraction (XRD) measurements of Li2S exposed to ambient air showed that insulating Li2S hydrolyses to insulating LiOH. This validates the significance of electrical ex-situ AFM analysis after cycling. Conductive tapping mode AFM indicated the existence of large carbon-coated sulfur

• tapping mode AFM. We aim to demonstrate that a direct correlation exists between the cycling stability and the properties on the nanometre scale, and that AFM analysis can disclose the morphology of the carbon–sulfur interface. Based on the analytical results of the nanoscale analysis an optimized

Kelvin probe force microscopy of nanocrystalline TiO₂ photoelectrodes

• Alex Henning,
• Gino Günzburger,
• Res Jöhr,
• Yossi Rosenwaks,
• Biljana Bozic-Weber,
• Catherine E. Housecroft,
• Edwin C. Constable,
• Ernst Meyer and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2013, 4, 418–428, doi:10.3762/bjnano.4.49

• H2O and <10 ppm O2) on a commercial microscope (Solver PH-47, NT-MDT). Amplitude modulation (AM) KPFM was conducted with a two-scan method (lift mode) meaning that the topography and CPD were measured separately (Figure 10). During the first line scan the topography was determined in tapping mode AFM

Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes

• Daniel Kiracofe,
• Arvind Raman and
• Dalia Yablon

Beilstein J. Nanotechnol. 2013, 4, 385–393, doi:10.3762/bjnano.4.45

• property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide contrast between regions with different material properties under gentle imaging conditions

High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

• Mark Cronin-Golomb and
• Ozgur Sahin

Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

• -average detector signals in vertical and horizontal channels during a tapping-mode AFM experiment. To minimize contributions of drift in quasi-static deflection signals, we previously developed a procedure that takes advantage of the transitions between attractive and repulsive modes [36]. The calibrated

Micro- and nanoscale electrical characterization of large-area graphene transferred to functional substrates

• Gabriele Fisichella,
• Salvatore Di Franco,
• Patrick Fiorenza,
• Raffaella Lo Nigro,
• Fabrizio Roccaforte,
• Cristina Tudisco,
• Guido G. Condorelli,
• Nicolò Piluso,
• Noemi Spartà,
• Stella Lo Verso,
• Corrado Accardi,
• Cristina Tringali,
• Sebastiano Ravesi and
• Filippo Giannazzo

Beilstein J. Nanotechnol. 2013, 4, 234–242, doi:10.3762/bjnano.4.24

• . Due to the good optical contrast between the graphene-coated and bare SiO2 areas, a homogenous graphene membrane, free from macroscopic cracks, can be observed. Higher resolution morphological analyses of the graphene layer onto SiO2 were carried out by tapping mode AFM. Two representative AFM images

• electronic properties. Experimental Tapping mode AFM and TRCAFM: Both tapping-mode AFM and torsion resonant conductive atomic force microscopy (TRCAFM) measurements were performed by using a DI3100 microscope with Nanoscope V electronics. For TRCAFM, we used Pt/Ir-coated Si tips with an apex radius of

• ) magnifications. Line scans on a peculiar corrugation of the graphene membrane (d) and across a microscopic crack (e). Tapping-mode AFM images of the bare PEN surface (a) and of graphene transferred onto PEN (b). (a) Optical Image of a TLM structure, (b) I–V characteristics measured between pairs of contacts at

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

• Jianming Zhang,
• Zehra Parlak,
• Carleen M. Bowers,
• Terrence Oas and
• Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

• behavior in tapping-mode AFM, in which the amplitude in regime A is typically much larger than that in regime D [51]. In tapping-mode AFM, the cantilever is intentionally actuated at its resonance frequency to achieve a large cantilever amplitude. In FMM, however, the actuation frequency is typically well

Self-assembly of octadecyltrichlorosilane: Surface structures formed using different protocols of particle lithography

• ChaMarra K. Saner,
• Kathie L. Lusker,
• Zorabel M. LeJeune,
• Wilson K. Serem and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2012, 3, 114–122, doi:10.3762/bjnano.3.12

• models 5420 and 5500 scanning probe microscopes operated in contact or tapping-mode AFM. (Agilent Technologies, Chandler, AZ). Lateral force images were acquired for either the trace or retrace views corresponding to the scan direction of the selected topography frames. The color scales of lateral-force

• images indicate differences in tip–surface interactions, but were not normalized for the comparison of friction changes between different tips or experiments. The tips were silicon nitride probes. Tips used with tapping-mode AFM were rectangular shaped ultrasharp silicon tips that have an aluminium

Direct monitoring of opto-mechanical switching of self-assembled monolayer films containing the azobenzene group

• Einat Tirosh,
• Enrico Benassi,
• Silvio Pipolo,
• Marcel Mayor,
• Michal Valášek,
• Veronica Frydman,
• Stefano Corni and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2011, 2, 834–844, doi:10.3762/bjnano.2.93

• . Tapping mode AFM measurements were carried out in air with a Multimode Nanoscope V AFM (Veeco, Woodbury, NY). Integrated Si tips (Olympus AC240, resonance frequency ca. 70 kHz) were used for these measurements. Images of the morphology of bare Au and the azobenzene on Au on Si samples are shown in Figure

Tip-enhanced Raman spectroscopic imaging of patterned thiol monolayers

• Johannes Stadler,
• Thomas Schmid,
• Lothar Opilik,
• Phillip Kuhn,
• Petra S. Dittrich and
• Renato Zenobi

Beilstein J. Nanotechnol. 2011, 2, 509–515, doi:10.3762/bjnano.2.55

• of the spectroscopic image in (a). (c) 120 s reference SERS spectrum of 2-PySH (blue) and 2 s TERS spectra from (a) on the thiol (red) and on the bare gold surface (black). Spectra have been offset (red) and rescaled (blue) for better visibility. 20 μm tapping mode AFM image of microcontact printed 2

Recrystallization of tubules from natural lotus (Nelumbo nucifera) wax on a Au(111) surface

• Sujit Kumar Dora and
• Klaus Wandelt

Beilstein J. Nanotechnol. 2011, 2, 261–267, doi:10.3762/bjnano.2.30

• (XRD) and electron diffraction (ED) techniques [10][11]. Koch and co-workers applied tapping mode AFM to study the continuous growth of nonacosan-10-ol tubules on HOPG [8]. By applying a 10 µL droplet of natural wax molecules derived from nasturtium (Tropaeolum majus) and lotus (Nelumbo nucifera

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• Microscopy, FMM: Force Modulation Microscopy, ic-AFM: intermittent contact AFM, TMAFM: tapping mode AFM, nc-AFM: non-contact AFM, KPFM: Kelvin probe force microscopy, EFM: Electrostatic force microscopy, MFM: Magnetic force microscopy, MRFM: Magnetic resonance force microscopy, NSOM: Near-field scanning