Focused ion and electron beams for synthesis and characterization of nanomaterials

editorImage
Editors:
Dr. Aleksandra Szkudlarek, AGH University of Science and Technology, Poland
Dr. Ivo Utke, Swiss Laboratories for Materials Science and Technology (EMPA), Switzerland
Dr. Katja Höflich, Ferdinand-Braun-Institut gGmbH, Germany
Dr. Gregor Hlawacek, Helmholtz-Zentrum Dresden-Rossendorf, Germany
Dr. Nico Klingner, Helmholtz-Zentrum Dresden-Rossendorf, Germany
 

This thematic issue is dedicated to the synthesis and characterization of nanomaterials using focused ion and electron beams. The aim is to provide an overview of the recent advancements made over the last years by the communities.

In particular, the issue is focused on the following aspects:

  • 1D, 2D and 3D additive manufacturing (nanoprinting) of functional nanostructures for superconducting, magnetic and plasmonic applications.
  • Spatially resolved removal or modification of materials using gas-assisted electron/ion beam lithography.
  • Focused ion beam (FIB) milling and development of new ion beam sources and gas precursors.
  • Characterization methods using focused charged particle beams with techniques such as cryo-electron microscopy, helium ion microscopy, and secondary ion mass spectroscopy.
  • Development of novel instrumentation for current and future research on applications of multiple ion species plasma FIB, effective structural modification of nanomaterials using laser FIB, and FIB–SEM tomography for advanced microstructural analysis.
  • Theoretical aspects of electron and ion interactions and surface kinetics processes.

Submission deadline: April 30, 2024

*Please contact the guest editors directly if you still want to submit your article*

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A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH3)2Cl]2

  • Elif Bilgilisoy,
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Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

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Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO2 substrates

  • Aleksandra Szkudlarek,
  • Jan M. Michalik,
  • Inés Serrano-Esparza,
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  • Czesław Kapusta and
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Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18

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Published 07 Feb 2024

Ion beam processing of DNA origami nanostructures

  • Leo Sala,
  • Agnes Zerolová,
  • Violaine Vizcaino,
  • Alain Mery,
  • Alicja Domaracka,
  • Hermann Rothard,
  • Philippe Boduch,
  • Dominik Pinkas and
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Beilstein J. Nanotechnol. 2024, 15, 207–214, doi:10.3762/bjnano.15.20

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Published 12 Feb 2024

Sidewall angle tuning in focused electron beam-induced processing

  • Sangeetha Hari,
  • Willem F. van Dorp,
  • Johannes J. L. Mulders,
  • Piet H. F. Trompenaars,
  • Pieter Kruit and
  • Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 447–456, doi:10.3762/bjnano.15.40

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Published 23 Apr 2024

Electron-induced deposition using Fe(CO)4MA and Fe(CO)5 – effect of MA ligand and process conditions

  • Hannah Boeckers,
  • Atul Chaudhary,
  • Petra Martinović,
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Beilstein J. Nanotechnol. 2024, 15, 500–516, doi:10.3762/bjnano.15.45

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Published 08 May 2024

Level set simulation of focused ion beam sputtering of a multilayer substrate

  • Alexander V. Rumyantsev,
  • Nikolai I. Borgardt,
  • Roman L. Volkov and
  • Yuri A. Chaplygin

Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61

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Published 24 Jun 2024

Electron-induced ligand loss from iron tetracarbonyl methyl acrylate

  • Hlib Lyshchuk,
  • Atul Chaudhary,
  • Thomas F. M. Luxford,
  • Miloš Ranković,
  • Jaroslav Kočišek,
  • Juraj Fedor,
  • Lisa McElwee-White and
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Beilstein J. Nanotechnol. 2024, 15, 797–807, doi:10.3762/bjnano.15.66

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Published 03 Jul 2024

Water-assisted purification during electron beam-induced deposition of platinum and gold

  • Cristiano Glessi,
  • Fabian A. Polman and
  • Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 884–896, doi:10.3762/bjnano.15.73

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Published 18 Jul 2024

Direct electron beam writing of silver using a β-diketonate precursor: first insights

  • Katja Höflich,
  • Krzysztof Maćkosz,
  • Chinmai S. Jureddy,
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Beilstein J. Nanotechnol. 2024, 15, 1117–1124, doi:10.3762/bjnano.15.90

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Published 26 Aug 2024

A low-kiloelectronvolt focused ion beam strategy for processing low-thermal-conductance materials with nanoampere currents

  • Annalena Wolff,
  • Nico Klingner,
  • William Thompson,
  • Yinghong Zhou,
  • Jinying Lin and
  • Yin Xiao

Beilstein J. Nanotechnol. 2024, 15, 1197–1207, doi:10.3762/bjnano.15.97

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Published 27 Sep 2024
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