Lithium niobate on insulator: an emerging nanophotonic crystal for optimized light control

• Midhun Murali,
• Amit Banerjee and
• Tanmoy Basu

Beilstein J. Nanotechnol. 2024, 15, 1415–1426, doi:10.3762/bjnano.15.114

• , which are surrounded by air boundaries. Specifically, Figure 4a illustrates the electric field distribution over the 2D cross-section of LN/TiO2 PhC structures, while Figure 4c shows the distribution for LN/SiO2 PhC structures. On the light incident side, the partial standing wave pattern is formed due

Hymenoptera and biomimetic surfaces: insights and innovations

• Vinicius Marques Lopez,
• Carlo Polidori and
• Rhainer Guillermo Ferreira

Beilstein J. Nanotechnol. 2024, 15, 1333–1352, doi:10.3762/bjnano.15.107

• morphology (triangular cross section with two corrugated surfaces) associated with a strong optical reflection in the visible and near-infrared (NIR) range, while maximizing heat emissivity in the mid-infrared (MIR). This allows the insects to maintain a lower thermal steady state and to cope with high

Functional morphology of cleaning devices in the damselfly Ischnura elegans (Odonata, Coenagrionidae)

• Silvana Piersanti,
• Gianandrea Salerno,
• Wencke Krings,
• Stanislav Gorb and
• Manuela Rebora

Beilstein J. Nanotechnol. 2024, 15, 1260–1272, doi:10.3762/bjnano.15.102

• along its medially oriented side (Figure 1c–e). In the cross section, the asymmetrical and concave shape of the grooming structures was clearly visible, with a thin lamina originating from a robust seta (Figure 1f). Dirt particles tended to accumulate inside the flag-shaped structures in correspondence

• indicate the dirt particles accumulated inside the flag-shaped structures in correspondence of the concave cuticular lamina. S, socket. (e) Detail of the border of the cuticular lamina with indentations (arrows). (f) Cross section of a grooming device in its central portion. Note the hair (H) and the

A low-kiloelectronvolt focused ion beam strategy for processing low-thermal-conductance materials with nanoampere currents

• Annalena Wolff,
• Nico Klingner,
• William Thompson,
• Yinghong Zhou,
• Jinying Lin and
• Yin Xiao

Beilstein J. Nanotechnol. 2024, 15, 1197–1207, doi:10.3762/bjnano.15.97

• and a cross section through the middle of the ion beam spot for a simulated sample volume of 600 nm × 600 nm × 400 nm after an irradiation time of 990.0 ns is shown in Figure 3. The simulations for 5 keV in the nanoampere beam current range (Figure 3A) and picoampere beam current range (Figure 3B

• simulations and experimental data Cross sections were cut into collagen using 5 keV energy Ga ions to evaluate the results from the simulations and the proposed model. One cross section was cut with an acceleration voltage of 30 kV, beam current of 1 nA, 200 nm blur, and 20% overlap to assess the heat damage

• × 10 µm × 200 nm) were cut into the non-resin embedded collagen sample using the FEI Quanta 200 3D at the Queensland University of Technology, Brisbane, Australia. All cross-sections were processed using 5 keV ions. One cross-section was cut with 1.4 nA, 50% overlap to assess if reducing the ion energy

Local work function on graphene nanoribbons

• Daniel Rothhardt,
• Amina Kimouche,
• Tillmann Klamroth and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2024, 15, 1125–1131, doi:10.3762/bjnano.15.91

• irregularities such as kinks or defects at the edge are observed in the topography measurement. For example for the GNR where the cross section has been taken, marked by a black line, there is a kink associated with a darker region in the local work function, and in the topography image there are some small

Direct electron beam writing of silver using a β-diketonate precursor: first insights

• Katja Höflich,
• Krzysztof Maćkosz,
• Chinmai S. Jureddy,
• Aleksei Tsarapkin and
• Ivo Utke

Beilstein J. Nanotechnol. 2024, 15, 1117–1124, doi:10.3762/bjnano.15.90

• significantly larger after 6 months, when the cross section was prepared. This, again, hints toward incompletely dissociated precursor, which may have been further dissociated after the actual deposition process (cf. the section on deposit evolution in Supporting Information File 1 for more details). The cross

• parasitic co-deposition occurred below the actual helix wires caused by the residual primary electrons that penetrate the helix arms [39]. This can potentially be reduced by lowering the primary beam energy and, correspondingly, the interaction volume, while at the same time a more circular cross section of

• cut for the TEM sample preparation. (c) Transmission electron micrograph of the deposit cross-section with close-ups (d–f). Scanning electron micrographs of a spot deposit with 60 min continuous spot irradiation (a) with the corresponding close-ups of the halo regions. (b) High-resolution SEM image 6

Recent progress on field-effect transistor-based biosensors: device perspective

• Billel Smaani,
• Fares Nafa,
• Mohamed Salah Benlatrech,
• Ismahan Mahdi,
• Hamza Akroum,
• Mohamed walid Azizi,
• Khaled Harrar and
• Sayan Kanungo

Beilstein J. Nanotechnol. 2024, 15, 977–994, doi:10.3762/bjnano.15.80

Water-assisted purification during electron beam-induced deposition of platinum and gold

• Cristiano Glessi,
• Fabian A. Polman and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 884–896, doi:10.3762/bjnano.15.73

• purification of the deposits to compensate for the low electron-stimulated dissociation cross section of water on the substrate [37]. Deposits were made at increasing water flux, indicated by an increase of the total chamber pressure. The carbon and platinum contents were determined afterwards, and the C/Pt

• , isolated grains are visible. Also, several gaps are present in the lines, where the grains apparently did not connect to each other. A FIB cross section of the line revealed that the gaps extend down to the substrate surface. The gaps and the granularity may arise from the high mobility of Pt, and

• patterned area ranges between −0.125 and 0.125 µm. The (a) carbon and (b) platinum contents are presented in atom %. The background Si signal was not excluded from the analysis. (a) High-resolution TEM image and (b) overlay of the HAADF image and the STEM-EDX map of the cross section of deposit 1g. Layers

Electron-induced ligand loss from iron tetracarbonyl methyl acrylate

• Hlib Lyshchuk,
• Atul Chaudhary,
• Thomas F. M. Luxford,
• Miloš Ranković,
• Jaroslav Kočišek,
• Juraj Fedor,
• Lisa McElwee-White and
• Pamir Nag

Beilstein J. Nanotechnol. 2024, 15, 797–807, doi:10.3762/bjnano.15.66

• dipole moment of 1.72 Debye. We thus presume that, also in the present case, the high DEA cross section close to 0 eV is mediated by long-range electron–precursor interactions to a large extent. For higher electron energies, the resonance structures in Fe(CO)5 and Fe(CO)4MA are very similar. There is the

Level set simulation of focused ion beam sputtering of a multilayer substrate

• Alexander V. Rumyantsev,
• Nikolai I. Borgardt,
• Roman L. Volkov and
• Yuri A. Chaplygin

Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61

• cross section, the simulation can accurately predict the depth and shape of the structures, but there is some inaccuracy in reproducing the form of the left sidewall of the structure with a large amount of the redeposited material. To further validate the developed simulation approach and gain a better

• microscopy (SEM) image of the trenches with a superimposed line depicting the position of the prepared cross section. Figure 3b–d presents the corresponding cross-sectional STEM images of trenches, where the silicon dioxide is visualized as the dark layer. The shape of trenches was mainly determined by the

• structures to protect the surface. Cross section specimens for transmission electron microscopy investigation were prepared using in situ lift-out [39]. Final polishing was performed at the glancing incidence angles of the ion beam through the gradual decrease of the accelerating voltage from 30 to 2 kV. The

Elastic modulus of β-Ga₂O₃ nanowires measured by resonance and three-point bending techniques

• Annamarija Trausa,
• Sven Oras,
• Sergei Vlassov,
• Mikk Antsov,
• Tauno Tiirats,
• Andreas Kyritsakis,
• Boris Polyakov and
• Edgars Butanovs

Beilstein J. Nanotechnol. 2024, 15, 704–712, doi:10.3762/bjnano.15.58

• deviations from rectangular cross-sections, e.g., trapezoid). Minimal and maximal values of possible geometry deviations are used for modelling elastic modulus variations. These cross-section errors are detailed in Table S4 and Table S5, along with Figure S4, available in Supporting Information File 1. These

• ]. This drastic difference from the bulk value is typically ascribed to a growth-direction-dependent concentration of stacking faults and point defects in NWs and NBs, which is correlated to the nanostructure cross-section aspect ratio (e.g., in ZnO nanostructures). Lower width-to-height ratio in NWs

• resulted in higher elastic modulus values, while NBs with higher width-to-height ratios showed a significant decrease in elastic modulus [22]. Although the variation of the cross-section geometry and the presence of different growth directions, related to the low symmetry of the monoclinic Ga2O3 phase and

Comparative analysis of the ultrastructure and adhesive secretion pathways of different smooth attachment pads of the stick insect Medauroidea extradentata (Phasmatodea)

• Julian Thomas,
• Stanislav N. Gorb and
• Thies H. Büscher

Beilstein J. Nanotechnol. 2024, 15, 612–630, doi:10.3762/bjnano.15.52

Stiffness calibration of qPlus sensors at low temperature through thermal noise measurements

• Laurent Nony,
• Sylvain Clair,
• Daniel Uehli,
• Aitziber Herrero,
• Jean-Marc Themlin,
• Andrea Campos,
• Franck Para,
• Alessandro Pioda and
• Christian Loppacher

Beilstein J. Nanotechnol. 2024, 15, 580–602, doi:10.3762/bjnano.15.50

• qPlus sensor. The discussion is restricted to probes with a rectangular cross section (length l, thickness t, width w are such that l ≫ t and l ≫ w) treated in the Euler–Bernoulli model of the embedded beam, extensively detailed, for example, in [35] (cf. also Supporting Information File 1). The

Sidewall angle tuning in focused electron beam-induced processing

• Sangeetha Hari,
• Willem F. van Dorp,
• Johannes J. L. Mulders,
• Piet H. F. Trompenaars,
• Pieter Kruit and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 447–456, doi:10.3762/bjnano.15.40

• ) or the removal of substrate material by reactive precursor fragments, that is, etching (focused electron beam-induced etching, FEBIE). For the interested reader, the literature contains a number of good reviews of the technique [1][2][3][4][5]. The cross section of a line patterned using FEBID

• ) and from the BSE (SE2) [6][7][8]. An example of a line deposited from a carbon precursor on a silicon substrate, coated with a 20 nm Au–Pd layer and a 5 nm Ti adhesion layer, is shown in Figure 1a, clearly showing the broad (black) tails on both sides of the line. The cross section of the line, made

• using focused ion beam (FIB) milling and shown as an electron tilt image in Figure 1b, clearly demonstrates the Gaussian shape. For lithography applications, however, both the long tails and the Gaussian cross section are highly undesirable. The tails may form interconnects to neighboring lines, and the

Heat-induced morphological changes in silver nanowires deposited on a patterned silicon substrate

• Elyad Damerchi,
• Sven Oras,
• Edgars Butanovs,
• Allar Liivlaid,
• Mikk Antsov,
• Boris Polyakov,
• Annamarija Trausa,
• Veronika Zadin,
• Andreas Kyritsakis,
• Loïc Vidal,
• Karine Mougin,
• Siim Pikker and
• Sergei Vlassov

Beilstein J. Nanotechnol. 2024, 15, 435–446, doi:10.3762/bjnano.15.39

• Au NWs have a pentagonal cross-section, meaning that for NWs deposited on a flat substrate, 1/5 of the NW surface is in contact with the substrate [35]. This aspect should unavoidably have an influence on the total surface energy of NW. Therefore, in addition to parameters such as temperature, time

• a nominal diameter of 120 nm and length of tens of micrometers were purchased from Blue Nano, Inc. These NWs have a pentagonal cross-section and a five-fold twinned inner structure. More details on the structure and properties of these NWs can be found in our previous works [35][39]. The patterned

• NWs used in the present study have a five-fold twinned crystal structure resulting in a pentagonal cross-section. Since pentagonal symmetry is a “forbidden” symmetry in crystallography, five-fold twinned crystals unavoidably have inner strains [44]. This could potentially be one of the driving forces

Modulated critical currents of spin-transfer torque-induced resistance changes in NiCu/Cu multilayered nanowires

• Mengqi Fu,
• Roman Hartmann,
• Julian Braun,
• Sergej Andreev,
• Torsten Pietsch and
• Elke Scheer

Beilstein J. Nanotechnol. 2024, 15, 360–366, doi:10.3762/bjnano.15.32

• which are near the surface of the AAO template. (b) SEM image of nanowire-based devices. The measured nanowire array was contacted by the patterned Au bottom electrode and the Al top electrode. (c) Sketch of the cross section of the device. (a) SEM image of nanowires after the AAO template was removed

Controllable physicochemical properties of WO_x thin films grown under glancing angle

• Rupam Mandal,
• Aparajita Mandal,
• Alapan Dutta,
• Rengasamy Sivakumar,
• Sanjeev Kumar Srivastava and
• Tapobrata Som

Beilstein J. Nanotechnol. 2024, 15, 350–359, doi:10.3762/bjnano.15.31

• films was studied in cross-section view mode using a field-emission scanning electron microscope (FESEM) (Carl Zeiss). The samples were cleaved using a diamond cutter and placed on the SEM sample holder with the cross-sectional area facing the electron beam. All SEM images were captured using 5 keV

Comparative electron microscopy particle sizing of TiO₂ pigments: sample preparation and measurement

• Ralf Theissmann,
• Christopher Drury,
• Markus Rohe,
• Thomas Koch,
• Jochen Winkler and
• Petr Pikal

Beilstein J. Nanotechnol. 2024, 15, 317–332, doi:10.3762/bjnano.15.29

• , P6), and Figure 5 is a cross-section SEM image (KRONOS M1). The particle size distributions measured with each manufacturer’s method are remarkably similar, as shown in Figure 1. The D50n values are close, but the tails of the distributions vary slightly, especially in the cases where a small number

• sample preparation, measurement and data evaluation, including all relevant steps, are briefly described here, a more elaborate description of the cross section method (M1) can be found in literature [21]. Methods M2 and M3 used for sample preparation, image acquisition, and image processing are the same

• , calculations, and graphics were performed using the R software [24], the fitdistrplus package, [25] and the graphical package ggplot2 [26]. Comparison of cumulative distribution curves measured by three different manufacturers using three different methods (M1: cross section, M2: dry, and M3: sonicated

Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• tip has a circular cross section, the rearward extension forms a trapezoidal structure, and the two waists are tangent to the top circle. When simulating the scanning of the sample in tapping mode using the blunt tip, the height data graph of the sample forms a continuous arc (Figure 4e). The vertex

In situ optical sub-wavelength thickness control of porous anodic aluminum oxide

• Aleksandrs Dutovs,
• Raimonds Popļausks,
• Oskars Putāns,
• Vladislavs Perkanuks,
• Aušrinė Jurkevičiūtė,
• Tomas Tamulevičius,
• Uldis Malinovskis,
• Iryna Olyshevets,
• Donats Erts and
• Juris Prikulis

Beilstein J. Nanotechnol. 2024, 15, 126–133, doi:10.3762/bjnano.15.12

• view and cross section (inset, same scale) of a representative porous anodic aluminum oxide (PAAO) layer, produced through anodization at 40 V using 0.3 M oxalic acid electrolyte. (b) Diagram illustrating the PAAO structure. (c) Schematics of the optical model used in spectroscopic ellipsometry data

TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

• Joshua Williams,
• Michael I. Faley,
• Joseph Vimal Vas,
• Peng-Han Lu and
• Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

• lower dose than the main exposure so that it does not induce chain scission in the top resist layer, but only in the bottom resist layer, which is more sensitive. The result of the multi-dose exposure was controlled by observing a cross section of the developed bilayer resist using a SEM in snapshot

• of the 3 mm TEM window grid that provides nine windows of free-standing 50 nm thick SiN membrane. (a) Front side and (b) back side. (c) Spin coating adapter for the 3 mm TEM grid. (a) Electron beam exposure scheme. (b) Cross section of developed resist with multi-dose exposure on a bulk substrate

Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function

• Perawat Boonpuek and
• Jonathan R. Felts

Beilstein J. Nanotechnol. 2023, 14, 1200–1207, doi:10.3762/bjnano.14.99

• the determined tip radius Scanned height images of the standard grating (uncoated Si tip, Pt-coated tip, and Cr/Au-coated tip) were taken to extract the cross section for fifteen profiles of the tip radius, which are the curved arc profiles over the corner edge of the grate (see Supporting Information

• the curvature radius of the AFM tip. The fifteen determined radius values of each tip (uncoated Si tip, Pt-coated tip, and Cr/Au-coated tip) obtained from independent cross-section profiles were plotted in distribution graphs (see Figure S4-5, Figure S4-6, and Figure S4-7 in Supporting Information

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

• the formation of AuCl2−, m/z 267, whose low energy contribution peaks at about 0.4 eV. In addition, a broader and lower intensity contribution to the AuCl2− signal is observed at approx. 4 eV. In DEA the cross section for the attachment process is inversely proportional to the square root of the

• of electrons that this volume has been exposed to is approx. 8 × 1012. Respectively, a monolayer consists of 1.5 × 107 molecules that has been exposed to 4 × 1011 electrons. This corresponds to approx. 35,000 electrons per molecule. Assuming a generic cross section of 10−16 cm2, which is on the order

• of magnitude for DI and DEA of the FEBID precursor Co(CO)3(NO) [49][50] and Pt(PF3)4 [51], the reactive area of this monolayer is 0.15 μm2. Statistically, this implies approx. 300 reactive incidents per molecule if the cross section is assumed to stay unchanged. This is clearly not a quantitative

Density functional theory study of Au-fcc/Ge and Au-hcp/Ge interfaces

• Olga Sikora,
• Małgorzata Sternik,
• Benedykt R. Jany,
• Franciszek Krok,
• Przemysław Piekarz and
• Andrzej M. Oleś

Beilstein J. Nanotechnol. 2023, 14, 1093–1105, doi:10.3762/bjnano.14.90

• ) grid for crystallographic cells of bulk crystal to a (4,4,4) grid for larger superlattices that model the Au-fcc(011)/Ge(001) and Au-hcp(010)/Ge(111) heterostructures. The slabs with vacuum were calculated using (8,8,2) or (4,4,2) k-points grids depending on the size of the cross section. A vacuum

• a plane defined by three atoms inside the red frame in panel Figure 12a, that is, a cross section through both Au–Ge and Ge–Ge bonds, revealing their detailed structure. Perhaps unexpectedly, the charge density between the interface Au and Ge atoms reaches almost the same level as for Ge–Ge covalent

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88