AgCl-doped CdSe quantum dots with near-IR photoluminescence

• Pavel A. Kotin,
• Sergey S. Bubenov,
• Natalia E. Mordvinova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2017, 8, 1156–1166, doi:10.3762/bjnano.8.117

• investigate the location of Ag and Cl in NPs, element distribution maps with the use of energy dispersion X-ray (EDX) spectroscopy were obtained (Figure 5). Figure 5a shows a high angle annular dark field (HAADF) image of sample AgCl_32, which was obtained with the use of scanning transmission electron

• microscopy (STEM). Figure 5–e display the position of Cd, Se, Ag and Cl atoms. The investigation was made on the day of the synthesis of NPs. The colour brightness of one selected pixel is determined by the intensity of L (Cd, Se and Ag) or K (Cl) line in EDX spectrum. The element distribution maps show that

Structural properties and thermal stability of cobalt- and chromium-doped α-MnO₂ nanorods

• Romana Cerc Korošec,
• Polona Umek,
• Alexandre Gloter,
• Jana Padežnik Gomilšek and
• Peter Bukovec

Beilstein J. Nanotechnol. 2017, 8, 1032–1042, doi:10.3762/bjnano.8.104

• the material under X-ray irradiation. The IFEFFIT program package [33] was used for the XANES (X-ray absorption near edge structure) and EXAFS (extended X-ray absorption fine structure) analysis. High-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) images were acquired

• transmission electron microscopy (HAADF-STEM), both shown in Figure 7. The chemical profiles of manganese and oxygen show a correlation with the nanorod shape while the cobalt profile shows more fluctuations due to the rather lower cobalt content (1.3 atom %). Nevertheless, it is clear that cobalt is present

• ). The sulfur detected in the samples is originating from the sulfuric acid that was a part of the reaction mixture [26]. The chemical composition of an individual nanorod (Co-90) was determined using electron energy loss spectroscopy (EELS) in combination with high-angle annular dark field scanning

Ion beam profiling from the interaction with a freestanding 2D layer

• Ivan Shorubalko,
• Kyoungjun Choi,
• Michael Stiefel and
• Hyung Gyu Park

Beilstein J. Nanotechnol. 2017, 8, 682–687, doi:10.3762/bjnano.8.73

• beam source. For imaging the milled pores we use scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM) and helium ion microscopy (HIM). All methods give similar results regarding the measured focused ion beam profiles. Finally, we discuss technical limitations and

Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

• Marta Agati,
• Guillaume Amiard,
• Vincent Le Borgne,
• Paola Castrucci,
• Richard Dolbec,
• Maurizio De Crescenzi,
• My Alì El Khakani and
• Simona Boninelli

Beilstein J. Nanotechnol. 2017, 8, 440–445, doi:10.3762/bjnano.8.47

• Dipartimento di Fisica, Università di Roma “Tor Vergata”, Via della Ricerca Scientifica 1, Roma 00133, Italy, Tekna Plasma Systems Inc., 2935 Industrial Blvd., Sherbrooke QC-J1L 2T9, Canada 10.3762/bjnano.8.47 Abstract Scanning transmission electron microscopy (STEM) was successfully applied to the analysis

Role of oxygen in wetting of copper nanoparticles on silicon surfaces at elevated temperature

• Tapas Ghosh and
• Biswarup Satpati

Beilstein J. Nanotechnol. 2017, 8, 425–433, doi:10.3762/bjnano.8.45

• the high-angle annular dark-field scanning transmission electron microscopy (STEM-HAADF). After the TEM analysis, the same samples were transferred to a rapid thermal annealing unit (model: JETFIRST100 jipelec) and annealing was performed in air, oxygen and nitrogen atmospheres, one by one. The rapid

Influence of hydrofluoric acid treatment on electroless deposition of Au clusters

• Rachela G. Milazzo,
• Antonio M. Mio,
• Giuseppe D’Arrigo,
• Emanuele Smecca,
• Alessandra Alberti,
• Gabriele Fisichella,
• Filippo Giannazzo,
• Corrado Spinella and
• Emanuele Rimini

Beilstein J. Nanotechnol. 2017, 8, 183–189, doi:10.3762/bjnano.8.19

• plating solution. The morphology of gold was examined with plan view TEM and scanning transmission electron microscopy (STEM) in high-angle annular dark-field imaging (HAADF) Z-contrast (atomic number) imaging mode, while the crystalline structure was analyzed in detail with X-ray diffraction. Figure 4a

Thickness-modulated tungsten–carbon superconducting nanostructures grown by focused ion beam induced deposition for vortex pinning up to high magnetic fields

• Ismael García Serrano,
• Javier Sesé,
• Isabel Guillamón,
• Hermann Suderow,
• Sebastián Vieira,
• Manuel Ricardo Ibarra and
• José María De Teresa

Beilstein J. Nanotechnol. 2016, 7, 1698–1708, doi:10.3762/bjnano.7.162

• , whereas for the samples with higher pitches (120 and 140 nm), the corrugation is greater than 50%. The W–C samples were further characterized by means of scanning transmission electron microscopy (STEM) in a 300 kV F30-Tecnai apparatus by FEI. In the STEM experiments performed, the electron beam was

• along the x direction. Cross-sectional SEM micrographs of a sample with 60 nm pitch (a), a sample with 100 nm pitch (b) and the flat sample (c). The y and z axes correspond to the short sides of the film and the thickness direction, respectively. Scanning transmission electron microscopy (STEM) study of

Photocurrent generation in carbon nanotube/cubic-phase HfO₂ nanoparticle hybrid nanocomposites

• Protima Rauwel,
• Augustinas Galeckas,
• Martin Salumaa,
• Frédérique Ducroquet and
• Erwan Rauwel

Beilstein J. Nanotechnol. 2016, 7, 1075–1085, doi:10.3762/bjnano.7.101

• pure ethanol along with the MWCNTs and sonicated for a total of 2 h [67]. Characterization: High angle annular dark field scanning transmission electron microscopy (HAADF-STEM) was carried out on a probe-corrected Titan G2 80–200 kV operating at 80 kV to reduce beam damage. The probe size and therefore

Ultrastructural changes in methicillin-resistant Staphylococcus aureus induced by positively charged silver nanoparticles

• Dulce G. Romero-Urbina,
• Humberto H. Lara,
• J. Jesús Velázquez-Salazar,
• M. Josefina Arellano-Jiménez,
• Eduardo Larios,
• Anand Srinivasan,
• Jose L. Lopez-Ribot and
• Miguel José Yacamán

Beilstein J. Nanotechnol. 2015, 6, 2396–2405, doi:10.3762/bjnano.6.246

• induced by AgNPs, which were investigated using various electron microscopy techniques, such as high resolution transmission electron microscopy (HRTEM), high angle annular dark field scanning transmission electron microscopy (HAADF-STEM), scanning electron microscopy (SEM), and energy dispersive X-ray

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

• Xiaoxing Ke,
• Carla Bittencourt and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

• Figure 5e–h, where a grain boundary is imaged on a single graphene layer using annular dark field scanning transmission electron microscopy (ADF-STEM) acquired at 60 kV. An extensive arrangement of the 5–7 pairs together with distorted hexagons is revealed (Figure 5g,h) [62]. It can be deduced that

Influence of the shape and surface oxidation in the magnetization reversal of thin iron nanowires grown by focused electron beam induced deposition

• Luis A. Rodríguez,
• Lorenz Deen,
• Rosa Córdoba,
• César Magén,
• Etienne Snoeck,
• Bert Koopmans and
• José M. De Teresa

Beilstein J. Nanotechnol. 2015, 6, 1319–1331, doi:10.3762/bjnano.6.136

• microstructure were determined by bright field (BF) TEM and high resolution TEM (HRTEM) imaging, and chemical composition of the sections was determined by combining high angle annular dark field (HAADF) imaging and electron energy loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) mode

Heterometal nanoparticles from Ru-based molecular clusters covalently anchored onto functionalized carbon nanotubes and nanofibers

• Deborah Vidick,
• Xiaoxing Ke,
• Michel Devillers,
• Claude Poleunis,
• Arnaud Delcorte,
• Pietro Moggi,
• Gustaaf Van Tendeloo and
• Sophie Hermans

Beilstein J. Nanotechnol. 2015, 6, 1287–1297, doi:10.3762/bjnano.6.133

• microscopy (HRTEM) and high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) confirms their bimetal nature on the nanoscale. The obtained bimetal nanoparticles supported on nanocarbon were tested as catalysts in ammonia synthesis and are shown to be active at low temperature

• transmission electron microscopy (HRTEM) and high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) using aberration-corrected transmission electron microscopy (AC-TEM). HRTEM images of nanoparticles derived from cluster 4 reveal that they are not well crystallized (Figure 4a

Magnetic properties of iron cluster/chromium matrix nanocomposites

• Arne Fischer,
• Robert Kruk,
• Di Wang and
• Horst Hahn

Beilstein J. Nanotechnol. 2015, 6, 1158–1163, doi:10.3762/bjnano.6.117

• energy-filtered transmission electron microscopy (EFTEM) and scanning transmission electron microscopy (STEM) micrographs of the Fe distribution for a 10 vol % Fe1000/Cr sample, specifically prepared for TEM. To avoid subsequent focused ion beam cutting and possible oxidation, the sample was deposited on

Tunable magnetism on the lateral mesoscale by post-processing of Co/Pt heterostructures

• Oleksandr V. Dobrovolskiy,
• Maksym Kompaniiets,
• Roland Sachser,
• Fabrizio Porrati,
• Christian Gspan,
• Harald Plank and
• Michael Huth

Beilstein J. Nanotechnol. 2015, 6, 1082–1090, doi:10.3762/bjnano.6.109

• magnetic field directed normally to the stripe plane and immediately after transferring the samples from the SEM after the Co purification step. Transmission electron microscopy For an inspection of the selected sample C by scanning transmission electron microscopy (STEM) a Titan G2 microscope from FEI

Nanostructuring of GeTiO amorphous films by pulsed laser irradiation

• Valentin S. Teodorescu,
• Cornel Ghica,
• Adrian V. Maraloiu,
• Mihai Vlaicu,
• Andrei Kuncser,
• Magdalena L. Ciurea,
• Ionel Stavarache,
• Ana M. Lepadatu,
• Nicu D. Scarisoreanu,
• Andreea Andrei,
• Valentin Ion and
• Maria Dinescu

Beilstein J. Nanotechnol. 2015, 6, 893–900, doi:10.3762/bjnano.6.92

• film sample were glued face to face, followed by mechanical polishing and ion milling in a Gatan PIPS model 691 aparatus. Transmission electron microscopy was performed by using a Jeol ARM 200F electron microscope, performing normal TEM imaging, scanning transmission electron microscopy-high angle

Overview about the localization of nanoparticles in tissue and cellular context by different imaging techniques

• Anja Ostrowski,
• Daniel Nordmeyer,
• Alexander Boreham,
• Cornelia Holzhausen,
• Lars Mundhenk,
• Christina Graf,
• Martina C. Meinke,
• Annika Vogt,
• Sabrina Hadam,
• Jürgen Lademann,
• Eckart Rühl,
• Ulrike Alexiev and
• Achim D. Gruber

Beilstein J. Nanotechnol. 2015, 6, 263–280, doi:10.3762/bjnano.6.25

• 1 to 10 µm3 that is usually analyzed [20][29][35][153][154]. Scanning transmission electron microscopy (STEM) has been presented recently as an elegant approach to overcome this limitation [154]. The authors simultaneously recorded bright and dark field STEM images of gold NP in murine liver tissue

The impact of the confinement of reactants on the metal distribution in bimetallic nanoparticles synthesized in reverse micelles

• Concha Tojo,
• Elena González and
• Nuria Vila-Romeu

Beilstein J. Nanotechnol. 2014, 5, 1966–1979, doi:10.3762/bjnano.5.206

• experimental STEM (scanning transmission electron microscopy) profiles confirms the validity of the simulation model [37]. The Au/Pt bimetallic system was successfully simulated by employing a reduction rate ratio of vAu/vPt ≈ 10. This value can be associated with bimetallic couples with a difference in

The influence of molecular mobility on the properties of networks of gold nanoparticles and organic ligands

• Edwin J. Devid,
• Paulo N. Martinho,
• M. Venkata Kamalakar,
• Úna Prendergast,
• Christian Kübel,
• Tibebe Lemma,
• Jean-François Dayen,
• Tia. E. Keyes,
• Bernard Doudin,
• Mario Ruben and
• Sense Jan van der Molen

Beilstein J. Nanotechnol. 2014, 5, 1664–1674, doi:10.3762/bjnano.5.177

• transmission electron microscopy (SEM) is used to image the arrays on flat (oxidized) silicon substrates and the Au-NP–S-BPP networks on nanotrench electrodes devices (see Supporting Information File 1, Figure S8). Scanning transmission electron microscopy (STEM) and transmission electron microscopy (HAADF

• polyimide (Kapton) films) and electron beam lithography-written high-aspect-ratio (HAR) nanotrench electrodes devices [25]. The Au-NP–S-BPP arrays are stored in a dark and cold environment and can be kept for several months. Results and Discussion Imaging of Au-NP–S-BPP arrays and networks Scanning

Synthesis, characterization, and growth simulations of Cu–Pt bimetallic nanoclusters

• Subarna Khanal,
• Ana Spitale,
• Nabraj Bhattarai,
• Daniel Bahena,
• J. Jesus Velazquez-Salazar,
• Sergio Mejía-Rosales,
• Marcelo M. Mariscal and
• Miguel José-Yacaman

Beilstein J. Nanotechnol. 2014, 5, 1371–1379, doi:10.3762/bjnano.5.150

• 66450, México 10.3762/bjnano.5.150 Abstract Highly monodispersed Cu–Pt bimetallic nanoclusters were synthesized by a facile synthesis approach. Analysis of transmission electron microscopy (TEM) and spherical aberration (Cs)-corrected scanning transmission electron microscopy (STEM) images shows that

• –Pt clusters; energy dispersive X-ray spectroscopy (EDX); grand-canonical Langevin dynamics; nanoalloys; scanning transmission electron microscopy (STEM); Introduction The study of bimetallic (BM) nanoclusters has received particular interest because of their myriad properties and applications in

• , formic acid electro-oxidation, and ORR, in comparison with other Pt-based nanoparticles [40][41][42]. In this paper, we describe the synthesis of monodispersed sub-3 nm Cu–Pt BM nanoclusters, and their characterization by spherical aberration (Cs)-corrected scanning transmission electron microscopy (STEM

Self-organization of mesoscopic silver wires by electrochemical deposition

• Sheng Zhong,
• Thomas Koch,
• Stefan Walheim,
• Harald Rösner,
• Eberhard Nold,
• Aaron Kobler,
• Torsten Scherer,
• Di Wang,
• Christian Kübel,
• Mu Wang,
• Horst Hahn and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2014, 5, 1285–1290, doi:10.3762/bjnano.5.142

• profile equipment. Transmission electron microscopy (TEM) investigations were performed with a Philips Tecnai F20 ST system operated at 200 kV. EDX analyses were carried out in STEM (scanning transmission electron microscopy) mode in order to measure nanometer-scale samples (1 nm spot size for the EDX

Purification of ethanol for highly sensitive self-assembly experiments

• Kathrin Barbe,
• Martin Kind,
• Christian Pfeiffer and
• Andreas Terfort

Beilstein J. Nanotechnol. 2014, 5, 1254–1260, doi:10.3762/bjnano.5.139

• , zeolite, to facilitate the handling and to suppress coagulation. These hybrid systems were characterized using (scanning) transmission electron microscopy (TEM/STEM) and energy-dispersive X-ray (EDX) spectroscopy. The cleaning capacity of the immobilized NPs and their recyclability depending on the

• . Afterwards they were sprayed onto carbon-coated copper grids using a modified UIS250v Hielscher sonifier [44]. Measurements were carried out with a FEI TECNAI F30 S-TWIN microscope working at 300 kV. Scanning transmission electron microscopy (STEM) images were acquired with a scanning unit by a FISCHIONE

Surface processes during purification of InP quantum dots

• Natalia Mordvinova,
• Pavel Emelin,
• Alexander Vinokurov,
• Sergey Dorofeev,
• Artem Abakumov and
• Tatiana Kuznetsova

Beilstein J. Nanotechnol. 2014, 5, 1220–1225, doi:10.3762/bjnano.5.135

• D/MAX 2500 diffractometer using Cu Kα radiation (λ = 1.540598 Å). Transmission electron microscopy (TEM) was performed on a LEO912 AB OMEGA microscope. High-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) imaging and energy-dispersive X-ray (EDX) analysis have been

Design criteria for stable Pt/C fuel cell catalysts

• Josef C. Meier,
• Carolina Galeano,
• Ioannis Katsounaros,
• Jonathon Witte,
• Hans J. Bongard,
• Angel A. Topalov,
• Claudio Baldizzone,
• Stefano Mezzavilla,
• Ferdi Schüth and
• Karl J. J. Mayrhofer

Beilstein J. Nanotechnol. 2014, 5, 44–67, doi:10.3762/bjnano.5.5

• investigation discloses also the platinum nanoparticles inside and on the back side of the porous network. Figure 5 shows dark field scanning transmission electron microscopy (DF-STEM) images for all three materials at the same locations as in Figure 4, before (top) and after (middle) the above described

The role of electron-stimulated desorption in focused electron beam induced deposition

• Willem F. van Dorp,
• Thomas W. Hansen,
• Jakob B. Wagner and
• Jeff T. M. De Hosson

Beilstein J. Nanotechnol. 2013, 4, 474–480, doi:10.3762/bjnano.4.56

• desorption. Keywords: desorption energy; focused electron beam induced processing; scanning transmission electron microscopy; temperature dependence; tungsten hexacarbonyl; Introduction When the electron beam in an electron microscope is focused on a sample in the presence of a precursor gas, it can be

Characterization of electroforming-free titanium dioxide memristors

• John Paul Strachan,
• J. Joshua Yang,
• L. A. Montoro,
• C. A. Ospina,
• A. J. Ramirez,
• A. L. D. Kilcoyne,
• Gilberto Medeiros-Ribeiro and
• R. Stanley Williams

Beilstein J. Nanotechnol. 2013, 4, 467–473, doi:10.3762/bjnano.4.55

• . Scanning transmission electron microscopy (STEM) was also used to explore the forming-free device from a structural and morphological standpoint. Figure 5 depicts STEM images obtained from bright-field (BF) detection. BF imaging was utilized rather than HAADF detection due to the latter having an image