Search for "selected area electron diffraction" in Full Text gives 93 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2017, 8, 2438–2445, doi:10.3762/bjnano.8.242
Beilstein J. Nanotechnol. 2017, 8, 2425–2437, doi:10.3762/bjnano.8.241
Beilstein J. Nanotechnol. 2017, 8, 2116–2125, doi:10.3762/bjnano.8.211
Beilstein J. Nanotechnol. 2017, 8, 2017–2025, doi:10.3762/bjnano.8.202
Beilstein J. Nanotechnol. 2017, 8, 1680–1687, doi:10.3762/bjnano.8.168
Beilstein J. Nanotechnol. 2017, 8, 1174–1182, doi:10.3762/bjnano.8.119
Beilstein J. Nanotechnol. 2017, 8, 649–656, doi:10.3762/bjnano.8.69
Beilstein J. Nanotechnol. 2017, 8, 494–505, doi:10.3762/bjnano.8.53
Beilstein J. Nanotechnol. 2017, 8, 425–433, doi:10.3762/bjnano.8.45
Beilstein J. Nanotechnol. 2017, 8, 183–189, doi:10.3762/bjnano.8.19
Beilstein J. Nanotechnol. 2017, 8, 108–122, doi:10.3762/bjnano.8.12
Beilstein J. Nanotechnol. 2016, 7, 1960–1970, doi:10.3762/bjnano.7.187
Beilstein J. Nanotechnol. 2016, 7, 1586–1601, doi:10.3762/bjnano.7.153
Beilstein J. Nanotechnol. 2016, 7, 1492–1500, doi:10.3762/bjnano.7.142
Beilstein J. Nanotechnol. 2016, 7, 1350–1360, doi:10.3762/bjnano.7.126
Beilstein J. Nanotechnol. 2016, 7, 1338–1349, doi:10.3762/bjnano.7.125
Beilstein J. Nanotechnol. 2016, 7, 1129–1140, doi:10.3762/bjnano.7.105
Beilstein J. Nanotechnol. 2016, 7, 990–994, doi:10.3762/bjnano.7.91
Beilstein J. Nanotechnol. 2016, 7, 926–936, doi:10.3762/bjnano.7.84
Beilstein J. Nanotechnol. 2016, 7, 278–283, doi:10.3762/bjnano.7.25
Beilstein J. Nanotechnol. 2015, 6, 2300–2309, doi:10.3762/bjnano.6.236
Beilstein J. Nanotechnol. 2015, 6, 1298–1305, doi:10.3762/bjnano.6.134
Beilstein J. Nanotechnol. 2015, 6, 907–918, doi:10.3762/bjnano.6.94
Beilstein J. Nanotechnol. 2015, 6, 799–808, doi:10.3762/bjnano.6.83
Beilstein J. Nanotechnol. 2015, 6, 546–558, doi:10.3762/bjnano.6.57