Level set simulation of focused ion beam sputtering of a multilayer substrate

• Alexander V. Rumyantsev,
• Nikolai I. Borgardt,
• Roman L. Volkov and
• Yuri A. Chaplygin

Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61

• semiconductor heterostructures [13]. Metal and dielectric layers can be used as hard masks for achieving high resolution and throughput of the FIB nanofabrication process [14]. Modification of integrated circuits [15] is an industrially relevant application of multilayer structure processing. Effective

Simultaneous electrochemical determination of uric acid and hypoxanthine at a TiO₂/graphene quantum dot-modified electrode

• Vu Ngoc Hoang,
• Dang Thi Ngoc Hoa,
• Nguyen Quang Man,
• Le Vu Truong Son,
• Le Van Thanh Son,
• Vo Thang Nguyen,
• Le Thi Hong Phong,
• Ly Hoang Diem,
• Kieu Chan Ly,
• Ho Sy Thang and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 719–732, doi:10.3762/bjnano.15.60

• diffraction, Raman spectroscopy, high-resolution transmission electron microscopy, and energy-dispersive X-ray mapping. The TiO2/GQDs-GCE exhibits better electrochemical activity for uric acid and hypoxanthine than GQDs/GCE or TiO2/GCE in differential pulse voltammetry (DPV) measurements. Under optimized

• GQDs were observed by using a JEM 2100 high-resolution transmission electron microscopy (HRTEM), Joel, Japan. Raman spectroscopy measurements were performed on a WiTec, Alpha 300R with a 532 nm laser. Surface analyses of the obtained materials were carried out using a S-4800 scanning electron

Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system

• Wendong Sun,
• Jianqiang Qian,
• Yingzi Li,
• Yanan Chen,
• Zhipeng Dou,
• Rui Lin,
• Peng Cheng,
• Xiaodong Gao,
• Quan Yuan and
• Yifan Hu

Beilstein J. Nanotechnol. 2024, 15, 694–703, doi:10.3762/bjnano.15.57

• , Chinese Academy of Sciences, Dalian 116023, P. R. China 10.3762/bjnano.15.57 Abstract Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of cantilevers to achieve rapid high-resolution imaging and extract multiple properties. However, the higher-order modal response of

Laser synthesis of nanoparticles in organic solvents – products, reactions, and perspectives

• Theo Fromme,
• Sven Reichenberger,
• Katharine M. Tibbetts and
• Stephan Barcikowski

Beilstein J. Nanotechnol. 2024, 15, 638–663, doi:10.3762/bjnano.15.54

Exfoliation of titanium nitride using a non-thermal plasma process

• Priscila Jussiane Zambiazi,
• Dolores Ribeiro Ricci Lazar,
• Larissa Otubo,
• Rodrigo Fernando Brambilla de Souza,
• Almir Oliveira Neto and
• Cecilia Chaves Guedes-Silva

Beilstein J. Nanotechnol. 2024, 15, 631–637, doi:10.3762/bjnano.15.53

• the same exfoliation method. These combined findings highlight the structural changes during the non-thermal plasma exfoliation process, further supporting the successful transformation of bulk TiN into nanosheets. Figure 3 shows high-resolution transmission electron microscopy (HRTEM) images of TiN

• higher transparency to the microscope beam is observed, indicating fewer scattering centers. When comparing Figure 3a and Figure 3d, it is clear that the initial compact 3D TiN blocks underwent a transformation and evolved into plate-like thin layers. The high-resolution image in Figure 3f shows a

AFM-IR investigation of thin PECVD SiO_x films on a polypropylene substrate in the surface-sensitive mode

• Hendrik Müller,
• Hartmut Stadler,
• Teresa de los Arcos,
• Adrian Keller and
• Guido Grundmeier

Beilstein J. Nanotechnol. 2024, 15, 603–611, doi:10.3762/bjnano.15.51

• detection. The chosen detection frequency should equal a mechanical contact resonance of the tip–sample contact for a sufficiently large signal level. NAP-XPS survey (a) and high-resolution core level spectra of oxygen O 1s (b), carbon C 1s, (c) and silicon Si 2p (d) of the polypropylene foil covered with

• 50 nm SiOx measured in a 1.5 mbar N2 atmosphere for environmental charge compensation. Black dots represent measured data, while the blue lines are fits to the data that incorporate different components as indicated by the red lines. NAP-XPS survey (a) and high-resolution core level spectra of oxygen

Radiofrequency enhances drug release from responsive nanoflowers for hepatocellular carcinoma therapy

• Yanyan Wen,
• Ningning Song,
• Yueyou Peng,
• Weiwei Wu,
• Qixiong Lin,
• Minjie Cui,
• Rongrong Li,
• Qiufeng Yu,
• Sixue Wu,
• Yongkang Liang,
• Wei Tian and
• Yanfeng Meng

Beilstein J. Nanotechnol. 2024, 15, 569–579, doi:10.3762/bjnano.15.49

• sample was added to ethanol and ultrasonically dispersed. Then the dispersed liquid was added dropwise to the copper net. After drying, the US FEI Tecnai F20 TEM was used at an accelerated voltage of 200 kV to capture the morphology in high resolution. Zeta potentials and hydrodynamic diameters were

Photocatalytic degradation of methylene blue under visible light by cobalt ferrite nanoparticles/graphene quantum dots

• Vo Chau Ngoc Anh,
• Le Thi Thanh Nhi,
• Le Thi Kim Dung,
• Dang Thi Ngoc Hoa,
• Nguyen Truong Son,
• Nguyen Thi Thao Uyen,
• Nguyen Ngoc Uyen Thu,
• Le Van Thanh Son,
• Le Trung Hieu,
• Tran Ngoc Tuyen and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 475–489, doi:10.3762/bjnano.15.43

• (Japan). High-resolution transmission electron microscopy (HR-TEM) observation was performed with a JEM 1010. The intermediates in the MB degradation were determined by using an Agilent 1100 LC/MS-MS system with an electron spray ionization source combined with an ion trap. Synthesis of CoFe2O4, CoFe2O4

Sidewall angle tuning in focused electron beam-induced processing

• Sangeetha Hari,
• Willem F. van Dorp,
• Johannes J. L. Mulders,
• Piet H. F. Trompenaars,
• Pieter Kruit and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 447–456, doi:10.3762/bjnano.15.40

• simply varying the etch position on the sidewall using the top view SE image for reference, the slope of the deposit can be tuned from negative (outward) to positive (inward). The evolution has been studied in detail by high-resolution imaging in a TEM. A surprising trend not indicated by the simple

• : Additional experimental data. Acknowledgements Considerable parts of this paper originate from Hari, S., ‘High resolution resist-free lithography in the SEM’, doctoral thesis (chapter 6), Delft University of Technology, Netherlands, 2017. Funding This work is supported by NanoNextNL, a micro- and

Investigating ripple pattern formation and damage profiles in Si and Ge induced by 100 keV Ar⁺ ion beam: a comparative study

• Indra Sulania,
• Harpreet Sondhi,
• Tanuj Kumar,
• Sunil Ojha,
• G R Umapathy,
• Ambuj Mishra,
• Ambuj Tripathi,
• Richa Krishna,
• Devesh Kumar Avasthi and
• Yogendra Kumar Mishra

Beilstein J. Nanotechnol. 2024, 15, 367–375, doi:10.3762/bjnano.15.33

• electron microscopy; Introduction Scientific research varying from electronics to photonics, homeland security, high-resolution parallel patterning of magnetic media, biotechnology, and medicine are based upon nanotechnology. These applications require nanopatterning techniques to fabricate devices or

• in a controlled manner on a wide variety of substrates with required dimensions. There are reports from 1960’s, by Cunningham et al. [1] and Navez et al. [2], on the production of submicron and nanoscale patterns by IBS. However, with the availability of high-resolution tools such as atomic force

Vinorelbine-loaded multifunctional magnetic nanoparticles as anticancer drug delivery systems: synthesis, characterization, and in vitro release study

• Zeynep Özcan and
• Afife Binnaz Hazar Yoruç

Beilstein J. Nanotechnol. 2024, 15, 256–269, doi:10.3762/bjnano.15.24

• , 2:1, and 4:1) and the cumulative drug release were determined by calculating according to Equations 2–4 utilizing the absorbance values obtained from UV–vis spectrophotometer and calibration curves. Characterization The morphology of the synthesized nanoparticles was determined with a high

• -resolution analytical electron microscope (FE-SEM, Thermo Scientific, Apreo 2S LoVac) and a scanning transmission electron microscope (STEM, Phillips XL, 30 ESEM-FEG/EDAX) operating at 120 kV acceleration voltage. The structure of the nanoparticles was analyzed by X-ray diffraction (XRD, PANalytical, Xpert

Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO₂ substrates

• Aleksandra Szkudlarek,
• Jan M. Michalik,
• Inés Serrano-Esparza,
• Zdeněk Nováček,
• Veronika Novotná,
• Piotr Ozga,
• Czesław Kapusta and
• José María De Teresa

Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18

• shape control are very limited in those cases. Conventional electron beam lithography (EBL) reaches the resolution of a few nanometers. However, it leaves residual resists on the surface [9], which strongly affects electrical transport properties [10]. A similar high resolution can be achieved with e

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological samples, soft polymers, and hard materials. These modes offer precise and stable control of vertical

TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

• Joshua Williams,
• Michael I. Faley,
• Joseph Vimal Vas,
• Peng-Han Lu and
• Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

• membrane also allows for high-resolution patterning since there is less electron scattering during exposure [26]. The purpose of applying two layers of resist is to create a large undercut by using a bottom layer that is more sensitive than the top layer. This prevents the unwanted deposition of metal that

• and to create a meniscus shape, thus, decreasing the redeposition at the edge of the resist during etching. The advantage of IBE are the well-defined structures with good edge sharpness (Figure 8). This technique offers high resolution for structures down to 200 nm, and dense structures with spacings

• etching opens further applications for TEM sample preparation for more complicated high-resolution nanostructures. We have developed a straightforward method to prepare a SiN membrane with nanostructures on one side. This method allows for the use of an ultrasonic bath, higher deposition temperatures, and

unDrift: A versatile software for fast offline SPM image drift correction

• Tobias Dickbreder,
• Franziska Sabath,
• Lukas Höltkemeier,
• Ralf Bechstein and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

• series After discussing the performance of unDrift under different experimental conditions, we now demonstrate the applicability to long image series spanning several hundred SPM images with an example shown in Figure 5. The presented series comprises 530 high-resolution AFM images recorded at the

• directions. Extraction of lattice vectors from images exhibiting periodic structures. (a, d) High-resolution AFM images showing atomic resolution at the calcite (10.4)–water interface. (b, e) Fourier transform images of the real-space images shown in (a) and (d). The maxima in the Fourier transforms are

• optimized lattices as found by unDrift are shown as red lines. Only the centers of the autocorrelations are shown. (a, b) Two consecutive up images recorded with high-resolution AFM on calcite(10.4) in ultrahigh vacuum. The images show several defects, whose positions are marked with colored crosses in both

Fluorescent bioinspired albumin/polydopamine nanoparticles and their interactions with Escherichia coli cells

• Eloïse Equy,
• Jordana Hirtzel,
• Sophie Hellé,
• Béatrice Heurtault,
• Eric Mathieu,
• Morgane Rabineau,
• Vincent Ball and
• Lydie Ploux

Beilstein J. Nanotechnol. 2023, 14, 1208–1224, doi:10.3762/bjnano.14.100

• high-resolution fluorescence imaging (high-resolution confocal microscopy). Also, the capacity of the pristine and fluorescent NPs to inhibit the growth of bacterial cells was evaluated through minimal inhibitory concentration (MIC) tests. The MIC value was also determined for Staphylococcus aureus (S

• inversely related to NP size [36]. The accumulation of pristine and fluorescent BSA/PDA NPs was evaluated by standard and high-resolution fluorescence confocal microscopy after 24 h of contact of NPs with E. coli cells. Obviously, bacteria without NPs and bacteria with pristine BSA/PDA NPs were not detected

• ), a low fluorescence signal was detected in the 460–541 nm and 415–482 nm ranges with the standard and the high-resolution microscope, respectively (Supporting Information File 1, Figure S7a). In part, it may result from the fluorescence of Ox-BSA/PDA NPs at λexc = 405 nm; however, it is more probably

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

• François Piquemal,
• Khaled Kaja,
• Pascal Chrétien,
• José Morán-Meza,
• Frédéric Houzé,
• Christian Ulysse and
• Abdelmounaim Harouri

Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94

• versatility and high resolution in probing the local conductivity of materials, C-AFM has been extensively used in studying semiconductors [6][7], two-dimensional materials [8][9][10], memristive devices [11][12][13][14][15], photoelectric systems [16][17][18], dielectric films [19][20][21][22][23], molecular

Density functional theory study of Au-fcc/Ge and Au-hcp/Ge interfaces

• Olga Sikora,
• Małgorzata Sternik,
• Benedykt R. Jany,
• Franciszek Krok,
• Przemysław Piekarz and
• Andrzej M. Oleś

Beilstein J. Nanotechnol. 2023, 14, 1093–1105, doi:10.3762/bjnano.14.90

• crystalline phases on a specific substrate [2][3]. The structure of a heterophase can be studied using advanced atomic-resolution experiments, such as high-resolution electron microscopy [4], high-resolution secondary-electron microscopy [5], scanning transmission electron microscopy [6][7] or scanning

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

• Zeinab Eftekhari,
• Nasim Rezaei,
• Hidde Stokkel,
• Jian-Yao Zheng,
• Andrea Cerreta,
• Ilka Hermes,
• Minh Nguyen,
• Guus Rijnders and
• Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

• precise motion with high resolution. This offers promising possibilities for biomedical, environmental, and micro/nanoengineering applications [5][6]. Various types of design and actuation mechanisms have been developed in recent years [7][8]. A primary requirement to unlock the better performance of

• these micro/nano devices is to scrutinize their structure and the interaction between their different components. This can be done by high-resolution characterization techniques that simultaneously probe dynamic properties of different parts of the device. This enables the decoupling of the roles of

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• through real-space mapping. Complementing these full-fiber scans, high-resolution topography and stiffness maps on smaller fiber subdomains were also obtained to study the nanostructure of Technora®. From detailed topography maps, we found that the well-aligned surface features observed on the full

Isolation of cubic Si₃P₄ in the form of nanocrystals

• Polina K. Nikiforova,
• Sergei S. Bubenov,
• Vadim B. Platonov,
• Andrey S. Kumskov,
• Nikolay N. Kononov,
• Tatyana A. Kuznetsova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2023, 14, 971–979, doi:10.3762/bjnano.14.80

• determination; thus, the linear dimensions of the particles could only be estimated to be in the range of 10–50 nm. The particles are polycrystalline and highly defective as evident from the high-resolution image (Figure 7a). The size of the crystalline domains does not exceed 10 nm in its longest dimension

• . (a) Bright-field TEM image and (b) electron diffraction of the sample SP550. TEM studies of the sample SP550. (a) High-resolution TEM image; (b) HAADF-STEM image; EDX elemental maps for (c) Si Kα, (d) P Kα, and (e) O Kα. The scale bar in images (b–e) is 30 nm. Synthesis conditions and results of X

Upscaling the urea method synthesis of CoAl layered double hydroxides

• Camilo Jaramillo-Hernández,
• Víctor Oestreicher,
• Martín Mizrahi and
• Gonzalo Abellán

Beilstein J. Nanotechnol. 2023, 14, 927–938, doi:10.3762/bjnano.14.76

• aperture selecting the unscattered electrons. To record the images, an AMT RX80 8MP CCD camera (JEOL JEM-1010) and a Gatan CCD 1k × 1k device were used. (A) PXRD patterns exhibit the layered nature of the obtained samples. Indexation according to [13]. (B) ATR-FTIR spectra. (C) High-resolution XPS spectra

Two-dimensional molecular networks at the solid/liquid interface and the role of alkyl chains in their building blocks

• Suyi Liu,
• Yasuo Norikane and
• Yoshihiro Kikkawa

Beilstein J. Nanotechnol. 2023, 14, 872–892, doi:10.3762/bjnano.14.72

• flat conducting substrates, such as metal surfaces and highly oriented pyrolytic graphite (HOPG), under ultrahigh vacuum (UHV) conditions, at solid/air or solid/liquid interfaces [23][24][25][26][27][28]. Although UHV-STM offers high-resolution imaging, it requires large, complex, and expensive

• monolayers can be prepared by simply placing the sample solution on a freshly cleaved HOPG surface. The self-assembly at the solid/liquid interface is characterized by the following properties: (i) The correlation between the molecular structure and resultant 2D arrangements can be revealed by STM with high

• resolution. (ii) Post-reaction is available by external stimuli such as the addition of metal ions for metal coordination, light irradiation for photoreaction, and post-blending of other molecules. (iii) The dynamic process of the 2D structural change (caused by the external stimuli) can be followed in situ

In situ magnesiothermic reduction synthesis of a Ge@C composite for high-performance lithium-ion batterie anodes

• Ha Tran Huu,
• Ngoc Phi Nguyen,
• Vuong Hoang Ngo,
• Huy Hoang Luc,
• Minh Kha Le,
• Minh Thu Nguyen,
• My Loan Phung Le,
• Hye Rim Kim,
• In Young Kim,
• Sung Jin Kim,
• Van Man Tran and
• Vien Vo

Beilstein J. Nanotechnol. 2023, 14, 751–761, doi:10.3762/bjnano.14.62

• carried out for structural and phase information. Infrared (IR, Shimadzu IRAffinity-1S) and Raman (LabRAM HR evolution confocal Raman microscope) spectra were measured for bond analysis. Field-emission scanning electron microscopy (FE-SEM, Hitachi S-4800) and high-resolution transmission electron

Titania nanoparticles for photocatalytic degradation of ethanol under simulated solar light

• Evghenii Goncearenco,
• Iuliana P. Morjan,
• Claudiu Teodor Fleaca,
• Florian Dumitrache,
• Elena Dutu,
• Monica Scarisoreanu,
• Valentin Serban Teodorescu,
• Alexandra Sandulescu,
• Crina Anastasescu and
• Ioan Balint

Beilstein J. Nanotechnol. 2023, 14, 616–630, doi:10.3762/bjnano.14.51

• spectral alignment of the binding energy (BE) scale was referenced to adventitious carbon at 284.8 eV [40][41]. Figure 4a shows the full survey scans of TO-250-a, TO-850-b, and commercial TiO2 (Degussa P25) samples, indicating the presence of the expected elements Ti, O, and C. The high-resolution XPS

• diffraction (XRD) patterns, measured by an X-ray diffractometer Panalytical X’Pert MPD theta–theta, and the morphological properties were determined by transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), and selected-area electron diffraction (SAED) measurements

• , and P25 samples: (a) survey spectra; (b–d) high-resolution XPS spectra of (b) C 1s, (c) Ti 2p, and (d) O 1s core lines. Absorbance of the TiO2 samples at room temperature. Example of the calculated (a) indirect and (b) direct transitions from sample series “b”. Photoluminescence of the TiO2 powders