Novel reversibly switchable wettability of superhydrophobic–superhydrophilic surfaces induced by charge injection and heating

• Xiangdong Ye,
• Junwen Hou and
• Dongbao Cai

Beilstein J. Nanotechnol. 2019, 10, 840–847, doi:10.3762/bjnano.10.84

• surface-potential characterization. Atomic force microscopy (AFM) was used to characterize the physical morphology (Bruker Dimension Icon, Brook). The water contact angle (CA) of all surfaces was measured using a JC2000C1 contact angle measurements system (Shanghai Zhongchen Digital equipment). At room

Self-assembly and wetting properties of gold nanorod–CTAB molecules on HOPG

• Imtiaz Ahmad,
• Floor Derkink,
• Tim Boulogne,
• Pantelis Bampoulis,
• Harold J. W. Zandvliet,
• Hidayat Ullah Khan,
• Rahim Jan and
• E. Stefan Kooij

Beilstein J. Nanotechnol. 2019, 10, 696–705, doi:10.3762/bjnano.10.69

• drying on a nonwetting highly ordered pyrolytic graphite (HOPG) surface have been investigated using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Although SEM did not reveal coverage of CTAB layers, AFM showed not only CTAB assembly, but also the dynamics of the process on the

• superstructures on HOPG substrates using atomic force microscopy (AFM). The assembly of CTAB molecules was investigated at various positions on the substrate. Also, the role of CTAB molecules that changes the wettability of the HOPG terraces is discussed in relation to the previous work [51]. The application of

Ultrathin hydrophobic films based on the metal organic framework UiO-66-COOH(Zr)

• Miguel A. Andrés,
• Clemence Sicard,
• Christian Serre,
• Olivier Roubeau and
• Ignacio Gascón

Beilstein J. Nanotechnol. 2019, 10, 654–665, doi:10.3762/bjnano.10.65

• OPD/MOF ultrathin films have been fabricated onto glass, calcium fluoride, quartz crystal microbalance (QCM), Si(100) substrates and mica and characterized using scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD), atomic force microscopy (AFM

• substrates using an optical tensiometer (Theta Lite) purchased from Attension. Average values and error are calculated from four measurements performed at different positions of each sample. Atomic force microscopy (AFM) imaging was conducted on a NTEGRA Aura microscope from NT-MDT under ambient conditions

Direct observation of the CVD growth of monolayer MoS₂ using in situ optical spectroscopy

• Claudia Beatriz López-Posadas,
• Yaxu Wei,
• Wanfu Shen,
• Daniel Kahr,
• Michael Hohage and
• Lidong Sun

Beilstein J. Nanotechnol. 2019, 10, 557–564, doi:10.3762/bjnano.10.57

• of the sapphire substrate. This conclusion is based on a thorough ex situ characterization after CVD growth using differential reflectance spectroscopy (DRS), Raman spectroscopy, photoluminescent spectroscopy (PL), optical microscopy (OM), and atomic force microscopy (AFM). Actually, from the first

Mechanical and thermodynamic properties of Aβ₄₂, Aβ₄₀, and α-synuclein fibrils: a coarse-grained method to complement experimental studies

• Adolfo B. Poma,
• Horacio V. Guzman,
• Mai Suan Li and
• Panagiotis E. Theodorakis

Beilstein J. Nanotechnol. 2019, 10, 500–513, doi:10.3762/bjnano.10.51

• mechanism of deformation that gives rise to the linear response can be characterized in the CG simulations. From the experimental point of view, there is a long-standing discussion in the atomic force microscopy (AFM) community whether Hertzian mechanics is applicable to all soft-matter samples explored

Temperature-dependent Raman spectroscopy and sensor applications of PtSe₂ nanosheets synthesized by wet chemistry

• Mahendra S. Pawar and
• Dattatray J. Late

Beilstein J. Nanotechnol. 2019, 10, 467–474, doi:10.3762/bjnano.10.46

• low intensity at 52.9 eV which corresponds to Pt 5d3/2 [24]. The thickness of the as-prepared PtSe2 nanosheets was calculated using atomic force microscopy (AFM). Figure 5a shows the AFM image which clearly shows that the lateral dimensions of the nanosheets are ≈700 nm. Figure 5b represents the

Biocompatible organic–inorganic hybrid materials based on nucleobases and titanium developed by molecular layer deposition

• Leva Momtazi,
• Henrik H. Sønsteby and
• Ola Nilsen

Beilstein J. Nanotechnol. 2019, 10, 399–411, doi:10.3762/bjnano.10.39

• for 15 minutes was measured by atomic force microscopy (AFM) (Figure 8). All as-deposited films exhibit high surface roughness; however, the roughness of the Ti-adenine film is caused by small islands appearing on an otherwise almost flat surface. After water treatment, the surface roughness decreases

• purging system. An uncoated Si(100) substrate was used to collect the background. Atomic force microscopy (AFM) measurements were performed in contact mode using a Park XE70 device. The data were analyzed using the Gwyddion 2.44 SPM visualization tool. The contact angle measurements were performed using a

Nitrous oxide as an effective AFM tip functionalization: a comparative study

• Taras Chutora,
• Bruno de la Torre,
• Pingo Mutombo,
• Jack Hellerstedt,
• Jaromír Kopeček,
• Pavel Jelínek and
• Martin Švec

Beilstein J. Nanotechnol. 2019, 10, 315–321, doi:10.3762/bjnano.10.30

• apexes. Keywords: atomic force microscopy; Au(111); carbon monoxide; functionalization; high resolution; nitrous oxide; submolecular resolution; Introduction Frequency-modulated atomic force microscopy (AFM) has become the tool of choice for the characterization of molecules on the atomic scale

Pull-off and friction forces of micropatterned elastomers on soft substrates: the effects of pattern length scale and stiffness

• Peter van Assenbergh,
• Marike Fokker,
• Julian Langowski,
• Jan van Esch,
• Marleen Kamperman and
• Dimitra Dodou

Beilstein J. Nanotechnol. 2019, 10, 79–94, doi:10.3762/bjnano.10.8

• samples from sub-microscale particles were characterized with atomic force microscopy (AFM), optical microscopy, and scanning electron microscopy (SEM). Monolayers and samples from microscale particles were characterized with optical microscopy and SEM. The elastic modulus of the fabricated micropatterns

Threshold voltage decrease in a thermotropic nematic liquid crystal doped with graphene oxide flakes

• Mateusz Mrukiewicz,
• Krystian Kowiorski,
• Paweł Perkowski,
• Rafał Mazur and
• Małgorzata Djas

Beilstein J. Nanotechnol. 2019, 10, 71–78, doi:10.3762/bjnano.10.7

• , electric anisotropy, splay elastic constant, switch-on time, and switch-off time. The shape and dimensions of the GO flakes were studied using atomic force microscopy (AFM) and scanning electron microscopy (SEM). The influence of the GO concentration on the physical properties and switching process in the

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• conditions are fulfilled by electrostatic force microscopy (EFM) [18][19]. EFM is an atomic force microscopy (AFM)-based electrostatic method in which a conductive tip and a metallic sample holder are used. The probe-to-stage system is electrically polarized for the detection of electrostatic forces or force

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

• Majid Fazeli Jadidi,
• Umut Kamber,
• Oğuzhan Gürlü and
• H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

• Majid Fazeli Jadidi Umut Kamber Oguzhan Gurlu H. Ozgur Ozer Department of Physics Engineering, İstanbul Technical University, 34469, İstanbul, Turkey 10.3762/bjnano.9.274 Abstract Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) images of graphene reveal either a triangular

• scanning tunneling microscopy (STM) and atomic force microscopy (AFM) by various groups [3]. The interaction of graphene with its substrate affects the STM measurements and that casts doubts on its electronic structure. Having the possibility to make simultaneous STM and AFM measurements, on the same area

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

• Jesús S. Lacasa,
• Lisa Almonte and
• Jaime Colchero

Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271

• of clean and well-prepared surfaces. Accordingly, a wealth of experimental techniques have been developed to control and characterize their contamination state [8]. In the present work we propose atomic force microscopy (AFM) [9][10] as a valuable tool to visualize nanoscale surface contamination and

Layered calcium phenylphosphonate: a hybrid material for a new generation of nanofillers

• Kateřina Kopecká,
• Ludvík Beneš,
• Klára Melánová,
• Vítězslav Zima,
• Petr Knotek and
• Kateřina Zetková

Beilstein J. Nanotechnol. 2018, 9, 2906–2915, doi:10.3762/bjnano.9.269

• as nucleation centers; however, these methods were not successful. Although the shape of the particles differs minimally as they are rod-shaped in each case, the thickness of the individual lamellas differs significantly with the selected procedure, as was confirmed by the atomic force microscopy

• (AFM) analysis. The samples prepared by the “drop by drop” and “several portions” methods contained thinner particles in comparison those where the portion was all added at once. Nevertheless, as it can be seen in scanning electron microscopy (SEM) images (Figure 2) and as was also verified by AFM

Charged particle single nanometre manufacturing

• Philip D. Prewett,
• Cornelis W. Hagen,
• Claudia Lenk,
• Steve Lenk,
• Marcus Kaestner,
• Tzvetan Ivanov,
• Ahmad Ahmad,
• Ivo W. Rangelow,
• Xiaoqing Shi,
• Stuart A. Boden,
• Alex P. G. Robinson,
• Dongxu Yang,
• Sangeetha Hari,
• Marijke Scotuzzi and
• Ejaz Huq

Beilstein J. Nanotechnol. 2018, 9, 2855–2882, doi:10.3762/bjnano.9.266

• techniques of atomic force microscopy (AFM) and scanning tunneling microscopy (STM). In both cases, a probe is scanned over a sample and the interaction is used to study the sample properties. For AFM, the atomic force between a sharp tip at the end of a cantilever beam and the sample surface is measured by

Controlling surface morphology and sensitivity of granular and porous silver films for surface-enhanced Raman scattering, SERS

• Sherif Okeil and
• Jörg J. Schneider

Beilstein J. Nanotechnol. 2018, 9, 2813–2831, doi:10.3762/bjnano.9.263

• silver films were characterized using atomic force microscopy (AFM) in contact mode on a CP-II AFM (Bruker-Veeco) with SiC cantilevers to determine the topography and surface roughness (root mean square roughness, Rq). Scanning electron microscopy (SEM) of the silver films was performed on a Philips XL

• surfaces act as efficient SERS substrates showing greater enhancement factors compared to as prepared, sputtered, but untreated silver films when using rhodamine B as Raman probe molecule. The obtained roughened silver films were fully characterized by scanning electron microscopy (SEM), atomic force

• microscopy (AFM), X-ray diffraction (XRD), transmission electron microscopy (TEM), X-ray photoelectron (XPS and Auger) and ultraviolet–visible spectroscopy (UV–vis) as well as contact angle measurements. It was found that different morphologies of the roughened Ag films could be obtained under controlled

Low cost tips for tip-enhanced Raman spectroscopy fabricated by two-step electrochemical etching of 125 µm diameter gold wires

• Antonino Foti,
• Francesco Barreca,
• Enza Fazio,
• Cristiano D’Andrea,
• Paolo Matteini,
• Onofrio Maria Maragò and
• Pietro Giuseppe Gucciardi

Beilstein J. Nanotechnol. 2018, 9, 2718–2729, doi:10.3762/bjnano.9.254

• ]. The tips efficiently enhance and confine the electromagnetic field at the nanoscale [8][9] or even at sub-nanometer levels [10]. TERS has a sensitivity that can reach the single molecule level [11][12]. TERS setups based on atomic force microscopy (AFM) [1][13], scanning tunneling microscopy (STM) [14

Disorder in H⁺-irradiated HOPG: effect of impinging energy and dose on Raman D-band splitting and surface topography

• Lisandro Venosta,
• Noelia Bajales,
• Sergio Suárez and
• Paula G. Bercoff

Beilstein J. Nanotechnol. 2018, 9, 2708–2717, doi:10.3762/bjnano.9.253

• techniques is advantageous in order to gain a better insight into the origin of defects. Atomic force microscopy (AFM) can help to reveal an increase in the graphene/graphite surface roughness, which has been correlated with the disorder generated by increasing hydrogen irradiation doses [21][22][23

• from the irradiation chamber to the SQUID holder by using a portable vacuum chamber in order to avoid contamination during manipulation. After Raman and SQUID characterizations, atomic force microscopy (AFM) measurements were performed at room temperature using a Di-Innova Microscope (Bruker, USA) in

Optimization of Mo/Cr bilayer back contacts for thin-film solar cells

• Nima Khoshsirat,
• Fawad Ali,
• Vincent Tiing Tiong,
• Mojtaba Amjadipour,
• Hongxia Wang,
• Mahnaz Shafiei and
• Nunzio Motta

Beilstein J. Nanotechnol. 2018, 9, 2700–2707, doi:10.3762/bjnano.9.252

• scanning electron microscopy (SEM), atomic force microscopy (AFM), UV–vis–NIR spectroscopy and X-ray photoelectron spectroscopy. A careful analysis of the resulting Mo/Cr thin film across all the sputtering parameters led us to the best combination, optimizing both the electro-optical response of the Mo/Cr

Characterization of the microscopic tribological properties of sandfish (Scincus scincus) scales by atomic force microscopy

• Weibin Wu,
• Christian Lutz,
• Simon Mersch,
• Richard Thelen,
• Christian Greiner,
• Guillaume Gomard and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2018, 9, 2618–2627, doi:10.3762/bjnano.9.243

• , it is highly unlikely that the surface structure of the scales is responsible for the observed low abrasion. Baumgartner and co-workers [10][11][16] measured adhesion by atomic force microscopy (AFM) on scales of S. scincus and observed extremely low values. They analysed the chemical composition of

Non-agglomerated silicon–organic nanoparticles and their nanocomplexes with oligonucleotides: synthesis and properties

• Asya S. Levina,
• Marina N. Repkova,
• Nadezhda V. Shikina,
• Zinfer R. Ismagilov,
• Svetlana A. Yashnik,
• Dmitrii V. Semenov,
• Yulia I. Savinovskaya,
• Natalia A. Mazurkova,
• Inna A. Pyshnaya and
• Valentina F. Zarytova

Beilstein J. Nanotechnol. 2018, 9, 2516–2525, doi:10.3762/bjnano.9.234

• coupled plasma mass spectrometry (ICP-MS). The experimental Si/P value (10.9) showed a reasonable correlation with the calculated data (10.0). The atomic force microscopy (AFM) image of the Si–NH2 nanoparticles was not obtained in a satisfactory quality because of the very small size of the particles

• microscope. The results are presented in Figure 3. Atomic force microscopy (AFM) was performed on a Solver P47 Bio atomic force microscope (NT-МDT, Russia) in a tapping mode. The aqueous solution of the Si–NH2·ODN(1) sample (10 µL, 0.16 µM, NH2/p = 10) was applied to a freshly cleaved mica area of 25–30 mm2

High-temperature magnetism and microstructure of a semiconducting ferromagnetic (GaSb)_1−x(MnSb)_x alloy

• Leonid N. Oveshnikov,
• Elena I. Nekhaeva,
• Alexey V. Kochura,
• Alexander B. Davydov,
• Mikhail A. Shakhov,
• Sergey F. Marenkin,
• Oleg A. Novodvorskii,
• Alexander P. Kuzmenko,
• Alexander L. Vasiliev,
• Boris A. Aronzon and
• Erkki Lahderanta

Beilstein J. Nanotechnol. 2018, 9, 2457–2465, doi:10.3762/bjnano.9.230

• (FEI, US) was used for image analysis. P. Stadelmann’s JEMS software [16] was used for the simulation of diffraction patterns and images. Scanning atomic force microscopy (AFM) and magnetic force microscopy (MFM) images were obtained on an SmartSPM microscope (AIST-NT, US) at temperatures of T = 295

High-throughput micro-nanostructuring by microdroplet inkjet printing

• Hendrikje R. Neumann and
• Christine Selhuber-Unkel

Beilstein J. Nanotechnol. 2018, 9, 2372–2380, doi:10.3762/bjnano.9.222

• maximum and minimum. Apparently, the micelle-containing o-xylene solution spreads out most reproducibly on silicon and less on NiTi. To explain the differences in the droplet diameters of our different materials, the surface topography of the samples was measured using atomic force microscopy (AFM). As

• all nanoparticles, the particle analyzer was used (included in ImageJ) and the image was converted to a binary image. Finally, a freely accessible nearest-neighbor detection algorithm was employed for the determination of the nanoparticle distances [36]. Atomic force microscopy (AFM) imaging and image

• processing Atomic force microscopy (AFM) topographic imaging was employed to measure the roughness of the samples. Imaging was performed on a JPK NanoWizard 3 (JPK Instruments AG) operated in ac mode using ACTA cantilevers (spring constant ≈40 N/m, resonance frequency ≈300 kHz; Applied NanoStructuresInc

Block copolymers for designing nanostructured porous coatings

• Roberto Nisticò

Beilstein J. Nanotechnol. 2018, 9, 2332–2344, doi:10.3762/bjnano.9.218

• mol−1) at low magnification. c) PS-b-PEO (10.6-b-5.0 kg mol−1) at high magnification. d) Freeze fracture cross section PS-b-PEO (10.6-b-5.0 kg mol−1). Reprinted with permission from [62], copyright 2011 The Royal Society of Chemistry. a) Atomic force microscopy (AFM) images of a composite nanoporous

Nanotribology

• Enrico Gnecco,
• Susan Perkin,
• Andrea Vanossi and
• Ernst Meyer

Beilstein J. Nanotechnol. 2018, 9, 2330–2331, doi:10.3762/bjnano.9.217

• techniques for materials characterization are those typical of surface science (e.g., X-ray diffraction, SEM, TEM, XPS and Raman spectroscopy), more specific to nanotribology are nanoindenters, nanotribometers, quartz force microbalance and especially atomic force microscopy (AFM), which, without a doubt