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Search for "field emission" in Full Text gives 296 result(s) in Beilstein Journal of Nanotechnology. Showing first 200.

Sheet-on-belt branched TiO2(B)/rGO powders with enhanced photocatalytic activity

  • Huan Xing,
  • Wei Wen and
  • Jin-Ming Wu

Beilstein J. Nanotechnol. 2018, 9, 1550–1557, doi:10.3762/bjnano.9.146

Graphical Abstract
  • corresponding to graphene can be detected, which can be ascribed to its small quantity in the composite powders. Figure 2 shows the field emission scanning electron microscopy (FESEM) images of the pristine TiO2 nanobelt structures, TGN and TGN-branch 4 h. Comparing Figure 2a and Figure 2b, no obvious
  • TGN-branch x h, where x refers to the precipitation time in the precursor solution. Characterization The morphology was examined by field emission scanning electron microscopy (FESEM, Hitachi S-4800) and transmission electron microscopy (TEM, JEM-2100). The X-ray diffraction (XRD) patterns were
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Published 24 May 2018

Ag2WO4 nanorods decorated with AgI nanoparticles: Novel and efficient visible-light-driven photocatalysts for the degradation of water pollutants

  • Shijie Li,
  • Shiwei Hu,
  • Wei Jiang,
  • Yanping Liu,
  • Yu Liu,
  • Yingtang Zhou,
  • Liuye Mo and
  • Jianshe Liu

Beilstein J. Nanotechnol. 2018, 9, 1308–1316, doi:10.3762/bjnano.9.123

Graphical Abstract
  • ) were denoted as 0.1AgI/Ag2WO4, 0.2AgI/Ag2WO4, 0.3AgI/Ag2WO4, and 0.4AgI/Ag2WO4, respectively. Characterization The crystalline structure of the samples was studied by using a Bruker D8 Advance X-ray diffractometer (XRD). The images of the morphological structure were observed by a field emission
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Published 27 Apr 2018

Surface characterization of nanoparticles using near-field light scattering

  • Eunsoo Yoo,
  • Yizhong Liu,
  • Chukwuazam A. Nwasike,
  • Sebastian R. Freeman,
  • Brian C. DiPaolo,
  • Bernardo Cordovez and
  • Amber L. Doiron

Beilstein J. Nanotechnol. 2018, 9, 1228–1238, doi:10.3762/bjnano.9.114

Graphical Abstract
  • analysis of uncoated SPIOs (Fe3O4). ImageJ software (NIH, Bethesda, MD) was used to measure the mean diameter of the particles from TEM images. Scanning electron microscopy Uncoated SPIOs, PEG-SPIOs, and IPC-SPIOs were characterized by field-emission scanning electron microscopy (FE-SEM, Supra 55 VP, Carl
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Published 18 Apr 2018

Electrodeposition of reduced graphene oxide with chitosan based on the coordination deposition method

  • Mingyang Liu,
  • Yanjun Chen,
  • Chaoran Qin,
  • Zheng Zhang,
  • Shuai Ma,
  • Xiuru Cai,
  • Xueqian Li and
  • Yifeng Wang

Beilstein J. Nanotechnol. 2018, 9, 1200–1210, doi:10.3762/bjnano.9.111

Graphical Abstract
  • -GO was reduced by hydrazine hydrate to obtain the HACC-rGO. In our previous work, the structure and morphology of the resulting HACC-rGO have been characterized by infrared spectroscopy, X-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM) [29]. As shown in Figure 1b, the
  • the HACC-rGO material was observed using a field emission scanning electron microscope (JSM-5610LV, JEOL Ltd., Japan). The Raman spectrum of the HACC-rGO sample was measured using a Raman spectrometer (INVIA, Renishaw, UK) with an excitation wavelength of 633 nm. The surface and the cross-section
  • morphology of the deposited HACC-rGO/CS film were observed by a field emission scanning electron microscope (JSM-5610LV, JEOL Ltd., JP). The tensile strength and elongation at break of the deposited HACC-rGO/CS film were tested by a universal testing machine (CMT6503, Shenzhen SANS Test Machine Co., China
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Published 17 Apr 2018

Enzymatically promoted release of organic molecules linked to magnetic nanoparticles

  • Chiara Lambruschini,
  • Silvia Villa,
  • Luca Banfi,
  • Fabio Canepa,
  • Fabio Morana,
  • Annalisa Relini,
  • Paola Riani,
  • Renata Riva and
  • Fulvio Silvetti

Beilstein J. Nanotechnol. 2018, 9, 986–999, doi:10.3762/bjnano.9.92

Graphical Abstract
  • . They are here identified as NP@silica@APTES. The morphology and chemical composition of these nanoparticles was studied using field emission scanning electron microscopy (FE-SEM) in combination with energy dispersive X-ray spectroscopy (EDXS) in addition to dynamic light scattering (DLS). In Figure 1A
  • reflectance (ATR) sampling accessory. The morphology of the particles was analysed using a field emission scanning electron microscope (FE-SEM, ZEISS SUPRA 40VP), collecting the signal (secondary electrons) by means of an in-lens detector; the particle microanalyses were performed with an energy dispersive X
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Published 27 Mar 2018

Valley-selective directional emission from a transition-metal dichalcogenide monolayer mediated by a plasmonic nanoantenna

  • Haitao Chen,
  • Mingkai Liu,
  • Lei Xu and
  • Dragomir N. Neshev

Beilstein J. Nanotechnol. 2018, 9, 780–788, doi:10.3762/bjnano.9.71

Graphical Abstract
  • π/2 phase difference for the electric quadrupole. Thus, there is naturally a π/2 relative phase difference between the electric dipole and quadrupole contribution to the far-field emission, when their corresponding charges oscillate in phase. In this case, the parallel electric field components of
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Published 02 Mar 2018

Perovskite-structured CaTiO3 coupled with g-C3N4 as a heterojunction photocatalyst for organic pollutant degradation

  • Ashish Kumar,
  • Christian Schuerings,
  • Suneel Kumar,
  • Ajay Kumar and
  • Venkata Krishnan

Beilstein J. Nanotechnol. 2018, 9, 671–685, doi:10.3762/bjnano.9.62

Graphical Abstract
  • ascertain the stability of the as-prepared samples under nitrogen atmosphere by using a Netzsch STA 449 F1 Zupiter instrument. The samples were heated from room temperature to 800 °C at a heating rate of 10 °C min−1 with a flow rate of 40 mL min−1 in all experiments. Field-emission scanning electron
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Published 21 Feb 2018

Optimisation of purification techniques for the preparation of large-volume aqueous solar nanoparticle inks for organic photovoltaics

  • Furqan Almyahi,
  • Thomas R. Andersen,
  • Nathan A. Cooling,
  • Natalie P. Holmes,
  • Matthew J. Griffith,
  • Krishna Feron,
  • Xiaojing Zhou,
  • Warwick J. Belcher and
  • Paul C. Dastoor

Beilstein J. Nanotechnol. 2018, 9, 649–659, doi:10.3762/bjnano.9.60

Graphical Abstract
  • force microscope (AFM) operated in AC mode was used to probe the nanoparticle films. Film samples for AFM were spin-coated on quartz glass substrates at 2000 rpm for 1 min. A Zeiss Sigma ZP field-emission scanning electron microscope (FESEM) was used to image the nanoparticle films (operating at
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Published 20 Feb 2018

Sensing behavior of flower-shaped MoS2 nanoflakes: case study with methanol and xylene

  • Maryam Barzegar,
  • Masoud Berahman and
  • Azam Iraji zad

Beilstein J. Nanotechnol. 2018, 9, 608–615, doi:10.3762/bjnano.9.57

Graphical Abstract
  • using X-ray diffraction, Brunauer–Emmett–Teller surface area measurements, elemental analysis using energy dispersive X-ray spectroscopy, and field-emission scanning electron microscopy. The gas sensing characteristics were evaluated under exposure to various concentrations of xylene and methanol vapors
  • for several times and then dried under vacuum at 45 °C overnight. Characterization X-ray diffraction (XRD) patterns were obtained with an X-ray diffractometer (Shimadzu XRD-6000, Cu Kα radiation) and energy dispersive X-ray (EDX) spectra and sample morphology were characterized by field-emission
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Published 16 Feb 2018

Single-step process to improve the mechanical properties of carbon nanotube yarn

  • Maria Cecilia Evora,
  • Xinyi Lu,
  • Nitilaksha Hiremath,
  • Nam-Goo Kang,
  • Kunlun Hong,
  • Roberto Uribe,
  • Gajanan Bhat and
  • Jimmy Mays

Beilstein J. Nanotechnol. 2018, 9, 545–554, doi:10.3762/bjnano.9.52

Graphical Abstract
  • which electron and ion beam can be used simultaneously. The FIB is generated from a gallium liquid metal ion source with resolution of 7 nm at 30 keV acceleration voltages. The e-beam is generated from field emission gun electron source with high resolution SEM 1 nm at 15 keV and 1.9 nm at 1 keV
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Published 13 Feb 2018

Facile synthesis of ZnFe2O4 photocatalysts for decolourization of organic dyes under solar irradiation

  • Arjun Behera,
  • Debasmita Kandi,
  • Sanjit Manohar Majhi,
  • Satyabadi Martha and
  • Kulamani Parida

Beilstein J. Nanotechnol. 2018, 9, 436–446, doi:10.3762/bjnano.9.42

Graphical Abstract
  • -maximum of the diffraction peak) [27]. The XRD pattern of the ZFO mixed oxide shows peaks at 2θ values of 29.7, 35.1, 42.7, 53.7, 56.4, 62.0, and 73.4ο which correspond to (220), (311), (400), (422), (333), (440) and (533) crystal planes of ZFO crystal structure. FESEM Field-emission scanning electron
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Published 05 Feb 2018

Engineering of oriented carbon nanotubes in composite materials

  • Razieh Beigmoradi,
  • Abdolreza Samimi and
  • Davod Mohebbi-Kalhori

Beilstein J. Nanotechnol. 2018, 9, 415–435, doi:10.3762/bjnano.9.41

Graphical Abstract
  • materials should be higher than that of less-aligned CNTs. Figure 22 shows field emission (FE)-SEM micrographs of two CNT samples with random and aligned orientation and their polarized Raman spectra at 0° and 90° (0° related to the polarization direction of the laser light where it is parallel to the CNT
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Published 05 Feb 2018

Electron interaction with copper(II) carboxylate compounds

  • Michal Lacko,
  • Peter Papp,
  • Iwona B. Szymańska,
  • Edward Szłyk and
  • Štefan Matejčík

Beilstein J. Nanotechnol. 2018, 9, 384–398, doi:10.3762/bjnano.9.38

Graphical Abstract
  • -induced deformation, and electromigration resistance which is higher than for aluminum [24][25][26][27]. Copper nanostructures, especially nanowires, are applied in opto-electronic devices, solar cells, field-emission displays, catalysis, electronic skins, and sensor devices. Moreover, they can find
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Published 01 Feb 2018

Sugarcane juice derived carbon dot–graphitic carbon nitride composites for bisphenol A degradation under sunlight irradiation

  • Lan Ching Sim,
  • Jing Lin Wong,
  • Chen Hong Hak,
  • Jun Yan Tai,
  • Kah Hon Leong and
  • Pichiah Saravanan

Beilstein J. Nanotechnol. 2018, 9, 353–363, doi:10.3762/bjnano.9.35

Graphical Abstract
  • the removal of BPA, mainly because the CDs act as a photosensitizer to extend the light harvesting region. Results and Discussion Field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) Figure 1a shows a field emission scanning electron microscopy (FESEM) image
  • composites [77]. The scavenging test was carried out for 2 h under the solar radiation and the sample was collected for HPLC analysis. Field emission scanning electron microscopy (FESEM) images of (a) g-C3N4, (b) CD/g-C3N4(0.1), (c) CD/g-C3N4(0.2), and (d) CD/g-C3N4(0.5) composites. (e) TEM image and (f
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Published 30 Jan 2018

Review: Electrostatically actuated nanobeam-based nanoelectromechanical switches – materials solutions and operational conditions

  • Liga Jasulaneca,
  • Jelena Kosmaca,
  • Raimonds Meija,
  • Jana Andzane and
  • Donats Erts

Beilstein J. Nanotechnol. 2018, 9, 271–300, doi:10.3762/bjnano.9.29

Graphical Abstract
  • used to anneal nanowires for enhancing electrical and field emission properties [100]. Current densities higher than 10 nA/nm2 were reported to be applicable for Joule heating induced local welding of Ag (12 nA/nm2) [101] and Pt (up to 14.5 nA/nm2) [102][103] nanowires, as well as for welding of
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Published 25 Jan 2018

Bombyx mori silk/titania/gold hybrid materials for photocatalytic water splitting: combining renewable raw materials with clean fuels

  • Stefanie Krüger,
  • Michael Schwarze,
  • Otto Baumann,
  • Christina Günter,
  • Michael Bruns,
  • Christian Kübel,
  • Dorothée Vinga Szabó,
  • Rafael Meinusch,
  • Verónica de Zea Bermudez and
  • Andreas Taubert

Beilstein J. Nanotechnol. 2018, 9, 187–204, doi:10.3762/bjnano.9.21

Graphical Abstract
  • TEM with a LaB6 cathode operated at 120 kV. High resolution transmission electron microscopy (HRTEM) was done using an aberration corrected Titan 80-300 (FEI, Eindhoven, The Netherlands) with field emission gun, operated at 300 kV. Scanning transmission electron microscopy (STEM) and chemical analysis
  • were done on a Tecnai F20 ST (FEI, Eindhoven, The Netherlands) field emission TEM equipped with an Orius SC600 CCD-camera and a S-UTW EDX detector (EDAX, Mahwah, NJ, USA) operated at 200 kV. For EDXS the instrument was in scanning transmission mode and the α-tilt of the samples was set to 20°. Scanning
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Published 17 Jan 2018

Gas-sensing behaviour of ZnO/diamond nanostructures

  • Marina Davydova,
  • Alexandr Laposa,
  • Jiri Smarhak,
  • Alexander Kromka,
  • Neda Neykova,
  • Josef Nahlik,
  • Jiri Kroutil,
  • Jan Drahokoupil and
  • Jan Voves

Beilstein J. Nanotechnol. 2018, 9, 22–29, doi:10.3762/bjnano.9.4

Graphical Abstract
  • [30]. The resulting morphologies of structured NCD films and ZnO NRs were characterized by field-emission scanning electron microscopy (FE-SEM, Merlin, ZEISS). Raman spectroscopy measurements were carried out at room temperature using a Renishaw InVia Raman Microscope with the following conditions
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Published 03 Jan 2018

Facile synthesis of silver/silver thiocyanate (Ag@AgSCN) plasmonic nanostructures with enhanced photocatalytic performance

  • Xinfu Zhao,
  • Dairong Chen,
  • Abdul Qayum,
  • Bo Chen and
  • Xiuling Jiao

Beilstein J. Nanotechnol. 2017, 8, 2781–2789, doi:10.3762/bjnano.8.277

Graphical Abstract
  • comparison, the pure AgSCN nanomaterial (labeled as M0) was also prepared using the same procedure as preparing AgSCN with a small amount of Ag except the addition of N2H4·H2O. Characterization The morphology and microstructure of the samples were characterized using a field-emission scanning electron
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Published 22 Dec 2017

The rational design of a Au(I) precursor for focused electron beam induced deposition

  • Ali Marashdeh,
  • Thiadrik Tiesma,
  • Niels J. C. van Velzen,
  • Sjoerd Harder,
  • Remco W. A. Havenith,
  • Jeff T. M. De Hosson and
  • Willem F. van Dorp

Beilstein J. Nanotechnol. 2017, 8, 2753–2765, doi:10.3762/bjnano.8.274

Graphical Abstract
  • reservoir or the Al crucible of an FEI gas injection system (GIS) in Ar or N2 atmosphere. Electron microscopy Crystals of ClAuCO, ClAuPMe3, ClAuPEt3 and MeAuPMe3 were inserted in the sample chamber of a Philips XL30 environmental scanning electron microscope (SEM), equipped with a field-emission gun and an
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Published 20 Dec 2017

Patterning of supported gold monolayers via chemical lift-off lithography

  • Liane S. Slaughter,
  • Kevin M. Cheung,
  • Sami Kaappa,
  • Huan H. Cao,
  • Qing Yang,
  • Thomas D. Young,
  • Andrew C. Serino,
  • Sami Malola,
  • Jana M. Olson,
  • Stephan Link,
  • Hannu Häkkinen,
  • Anne M. Andrews and
  • Paul S. Weiss

Beilstein J. Nanotechnol. 2017, 8, 2648–2661, doi:10.3762/bjnano.8.265

Graphical Abstract
  • microscopy was performed using a JEOL JSM-6700F scanning electron microscope (JEOL, Inc., Tokyo, Japan) with a 750 V DC detector bias and 5 kV accelerating voltage. Field-emission gun variable pressure electron microscopy of Au on PDMS The scanning electron micrographs of Au–alkanethiolate monolayers on flat
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Published 08 Dec 2017

Enhanced photoelectrochemical water splitting performance using morphology-controlled BiVO4 with W doping

  • Xin Zhao and
  • Zhong Chen

Beilstein J. Nanotechnol. 2017, 8, 2640–2647, doi:10.3762/bjnano.8.264

Graphical Abstract
  • : The morphologies were observed using a field-emission scanning electron microscope (FESEM, JEOL JSM-7600F). Crystallinity was identified by X-ray diffraction (XRD) patterns (Shimadzu 6000 X-ray diffractometer) with Cu Kα radiation (λ = 0.154 nm), using a 2θ scan mode with a fixed incidence angle at 5
  • °. Elemental analysis was conducted by energy-dispersive X-ray spectroscopy (EDX) equipped on a field-emission scanning electron microscopy (FESEM, JEOL JSM-7600F). Light absorption was measured using a UV–visible spectrophotometer by measuring the reflectance and transmittance with an integrating sphere
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Published 07 Dec 2017

Localized growth of carbon nanotubes via lithographic fabrication of metallic deposits

  • Fan Tu,
  • Martin Drost,
  • Imre Szenti,
  • Janos Kiss,
  • Zoltan Kónya and
  • Hubertus Marbach

Beilstein J. Nanotechnol. 2017, 8, 2592–2605, doi:10.3762/bjnano.8.260

Graphical Abstract
  • S-4700 Type II cold field emission SEM instrument operated at 10–15 kV accelerating voltage with an integrated Röntec QX2 EDX detector. (a) Scheme of the electron beam induced deposition (EBID) process with Fe(CO)5 as precursor molecule, producing a point matrix of Fe deposits. (b) SEM micrograph of
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Published 05 Dec 2017

Direct writing of gold nanostructures with an electron beam: On the way to pure nanostructures by combining optimized deposition with oxygen-plasma treatment

  • Domagoj Belić,
  • Mostafa M. Shawrav,
  • Emmerich Bertagnolli and
  • Heinz D. Wanzenboeck

Beilstein J. Nanotechnol. 2017, 8, 2530–2543, doi:10.3762/bjnano.8.253

Graphical Abstract
  • well as in nanomedicine [30]. Many applications require precise positioning of Au structures on the nanoscale, e.g., for fabrication of interconnects [31][32] and field emission tips [33] or in direct writing of plasmonic and photonic nanostructures and devices [4][34][35][36][37][38][39][40]. We
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Published 29 Nov 2017

Comparing postdeposition reactions of electrons and radicals with Pt nanostructures created by focused electron beam induced deposition

  • Julie A. Spencer,
  • Michael Barclay,
  • Miranda J. Gallagher,
  • Robert Winkler,
  • Ilyas Unlu,
  • Yung-Chien Wu,
  • Harald Plank,
  • Lisa McElwee-White and
  • D. Howard Fairbrother

Beilstein J. Nanotechnol. 2017, 8, 2410–2424, doi:10.3762/bjnano.8.240

Graphical Abstract
  • identified and imaged by SEM. All of the effects of electrons and atomic hydrogen reported in this study were independent of the substrate on which the deposits were created. Deposits generated in the Auger system were imaged and analyzed ex situ using a cold-cathode field-emission SEM (JEOL 6700F, LEI
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Published 15 Nov 2017

Surfactant-induced enhancement of droplet adhesion in superhydrophobic soybean (Glycine max L.) leaves

  • Oliver Hagedorn,
  • Ingo Fleute-Schlachter,
  • Hans Georg Mainx,
  • Viktoria Zeisler-Diehl and
  • Kerstin Koch

Beilstein J. Nanotechnol. 2017, 8, 2345–2356, doi:10.3762/bjnano.8.234

Graphical Abstract
  • Stereoscan 200 (Cambridge Instruments GmbH, Dortmund) instrument or with a high-resolution field emission scanning electron microscope (FE-SEM, Gemini Supra 40VP, Carl Zeiss GmbH, Oberkochen, Germany), equipped with a cryo-preparation unit (Emitech K1250X, Gabler Instrumente GmbH, Germany), consisting of a
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Published 08 Nov 2017
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