Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• ion mass spectrometry (TOF-SIMS), Carr et al. [18] concluded that the wing layers consist of mostly chitin with an alternating content of melanin. Chitin forms the structure and melanin modulates the relative permittivity along the cross section. From the results shown in Figure 7, we can see that, in

• addition, the number of layers and their thickness varies from one color region to the other. Comparing the composition of the layers measured in the TOF-SIMS study [18] with the relative permittivity maps of this work, we can say that melanin-rich layers have a relative permittivity of 8 ± 1, while low

Bio-imaging with the helium-ion microscope: A review

• Matthias Schmidt,
• James M. Byrne and
• Ilari J. Maasilta

Beilstein J. Nanotechnol. 2021, 12, 1–23, doi:10.3762/bjnano.12.1

• al. [26][27][28][29], and commercialised by Carl Zeiss Microscopy [30]. The second approach, developed by Klingner, Hlawacek et al., integrated a spectrometer for Rutherford backscattering analysis with time-of-flight (ToF) SIMS for the HIM [31][32][33][34][35]. The first biological application of

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

• Eduardo Serralta,
• Nico Klingner,
• Olivier De Castro,
• Michael Mousley,
• Santhana Eswara,
• Serge Duarte Pinto,
• Tom Wirtz and
• Gregor Hlawacek

Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167

• acquisition of the STIM data and the external scan generator are controlled by a LabView interface based on an earlier implementation used for ToF-SIMS in the HIM [14]. The program allows for the generation of sample images in which the gray value, or color, of each pixel is assigned based upon the strength

Mobility of charge carriers in self-assembled monolayers

• Zhihua Fu,
• Tatjana Ladnorg,
• Hartmut Gliemann,
• Alexander Welle,
• Asif Bashir,
• Michael Rohwerder,
• Qiang Zhang,
• Björn Schüpbach,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2019, 10, 2449–2458, doi:10.3762/bjnano.10.235

• . Time-of-flight secondary ion mass spectrometry (TOF-SIMS) measurements were carried out in a TOF-SIMS 5 device (ION-TOF GmbH, Münster, Germany). The spectrometry was performed in static SIMS mode (primary ion beam dose < 2 × 1011 ions/cm2) with Bi3+ primary ions at 25 keV. Spectra were calibrated on

• removed [34], and after immersion times of about 12 hours a well-defined SAM had formed on the surface. The as-prepared SAMs were analyzed by ToF-SIMS. As expected, the main contribution in these spectra was a molecular ion peak at m/z 323.1, assigned to a C23H15S species (Supporting Information File 1

• depends on the island size. The PAT is shown schematically in blue with the S anchor group on a gold surface, while the respective resistances are shown laterally and within the thiol. Supporting Information The supporting information contains (1) Figure S1 with the ToF-SIMS spectra of PAT and HDT SAM on

Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS

• Jonathan Op de Beeck,
• Nouha Labyedh,
• Alfonso Sepúlveda,
• Valentina Spampinato,
• Alexis Franquet,
• Thierry Conard,
• Philippe M. Vereecken,
• Wilfried Vandervorst and
• Umberto Celano

Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154

• , which can be attributed to the dielectric breakdown of the film. High vacuum condition can be achieved (see below in Figure 3a) by working with a dedicated tool combining AFM and time-of-flight SIMS (TOF-SIMS) in the same apparatus (10−6 mbar or lower, TOF-SIMS V, ION-TOF GmbH, Münster, Germany). The

• advantage of this concept is that it allows one to perform electrical analysis (using C-AFM) and chemical analysis (using TOF-SIMS) on exactly the same area with C-AFM offering a much higher spatial resolution (ca. 3–5 nm) than TOF-SIMS (50–100 nm). The schematic of the experiment to perform TOF-SIMS

Effect of annealing treatments on CeO₂ grown on TiN and Si substrates by atomic layer deposition

• Silvia Vangelista,
• Rossella Piagge,
• Satu Ek and
• Alessio Lamperti

Beilstein J. Nanotechnol. 2018, 9, 890–899, doi:10.3762/bjnano.9.83

• distribution as in [26]. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) investigation of the compositional depth profile of the CeO2/TiN/Si and CeO2/Si structures has been performed by means of a Cs+ ion beam (energy of 0.5 keV, ion current 38.0 nA) sputtering a 200 μm × 200 μm area, and a Ga+ ion

• nm thick interlayer included in the model accounts for the suspected further oxidation of the silicon substrate during annealing. ToF-SIMS depth profiles collected from the samples annealed at high temperature confirm the XRR findings. To further clarify the sample response to the annealing

• Figure 2b we compare ToF-SIMS profiles of CeO2 on Si as-deposited (star symbols), and annealed at 700 (circles), 800 (squares) and 900 °C (triangles). These progressive annealing treatments allow us to observe the evolution of the SiO2 interfacial layer thickness in between CeO2 and silicon substrate. It

Application of visible-light photosensitization to form alkyl-radical-derived thin films on gold

• Rashanique D. Quarels,
• Xianglin Zhai,
• Neepa Kuruppu,
• Jenny K. Hedlund,
• Ashley A. Ellsworth,
• Amy V. Walker,
• Jayne C. Garno and
• Justin R. Ragains

Beilstein J. Nanotechnol. 2017, 8, 1863–1877, doi:10.3762/bjnano.8.187

• . Analysis with AFM demonstrated that the films are robust and resistant to mechanical force while contact angle goniometry suggests a multilayered and disordered film structure. Analysis with IRRAS, XPS, and TOF SIMS provides further insights. Keywords: atomic force microscopy; organic thin film; particle

• lithography; photosensitization; TOF SIMS; Introduction The deposition of radical-derived organic thin films has emerged as an attractive alternative to the grafting of molecules such as thiols, chlorosilanes and alkoxysilanes [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23

• irradiation all proved necessary for the deposition of robust films that could survive nanoshaving. In addition to characterizations with AFM, grazing angle infrared reflectance–absorbance spectroscopy (IRRAS), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (TOF SIMS

Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment

• Ann-Kathrin Kleinschmidt,
• Lars Barzen,
• Johannes Strassner,
• Christoph Doering,
• Henning Fouckhardt,
• Wolfgang Bock,
• Michael Wahl and
• Michael Kopnarski

Beilstein J. Nanotechnol. 2016, 7, 1783–1793, doi:10.3762/bjnano.7.171

• investigated by secondary ion mass spectrometry (SIMS), using a TOF–SIMS IV instrument from ION-TOF GmbH, Muenster, Germany. Applying the so-called dual beam depth profiling technique with 2 keV Cs+ as sputter ions and 20 keV Bi3+ as analysis ions, the thickness of the sputtered Al0.5Ga0.5As (i.e., Al

Orthogonal chemical functionalization of patterned gold on silica surfaces

• Francisco Palazon,
• Didier Léonard,
• Thierry Le Mogne,
• Francesca Zuttion,
• Céline Chevalier,
• Magali Phaner-Goutorbe,
• Éliane Souteyrand,
• Yann Chevolot and
• Jean-Pierre Cloarec

Beilstein J. Nanotechnol. 2015, 6, 2272–2277, doi:10.3762/bjnano.6.233

• orthogonality of the functionalization (i.e., selective grafting of the thiol on the gold areas and the silane on the silica) was demonstrated by X-ray photoelectron spectroscopy (XPS) as well as time-of-flight secondary ion mass spectrometry (ToF–SIMS) mapping. The orthogonal functionalization was used to

• biosensors) is a major challenge. Keywords: characterization; self-assembled monolayer; surface functionalization; ToF–SIMS; XPS; Introduction The orthogonal self-assembly of different molecules onto a patterned substrate was first demonstrated in 1989 by Whitesides and co-workers [1]. Recently, especially

• functionalization protocol to selectively bind different thiols and silanes (mixed in organic solvent at room temperature) onto the gold and silica areas of a patterned surface. The chemical functionalization was verified by direct characterization using XPS and ToF–SIMS mapping. To this end, microscale gold

Peptide-equipped tobacco mosaic virus templates for selective and controllable biomineral deposition

• Klara Altintoprak,
• Axel Seidenstücker,
• Alexander Welle,
• Sabine Eiben,
• Petia Atanasova,
• Nina Stitz,
• Alfred Plettl,
• Joachim Bill,
• Hartmut Gliemann,
• Holger Jeske,
• Dirk Rothenstein,
• Fania Geiger and
• Christina Wege

Beilstein J. Nanotechnol. 2015, 6, 1399–1412, doi:10.3762/bjnano.6.145

• viruses from suspensions to the wafer substrates did not reduce the objects' height. This indicated the formation of a rigid composite not radially compressed upon its surface adsorption. ToF-SIMS analysis of the deposited material An analysis of the deposited materials with time-of-flight secondary ion

• mass spectrometry (ToF-SIMS) [90] was performed on air-dried, drop cast suspensions of TMVwt or TMV–KD10 particles (both with and without 10 days of exposure to TEOS). Positive and negative secondary ion spectra were recorded from random positions of the TMV deposits. The peak assignment is based on

• sufficient to resolve the deposition of silica on the wild type viral template. The ToF-SIMS analysis therefore revealed either a spontaneous hydrolysis of TEOS (also occurring in the absence of effector peptides) or a low but specific mineralization-promoting activity of the bare viral CP surface (not

Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting

• Tatjana Ladnorg,
• Alexander Welle,
• Stefan Heißler,
• Christof Wöll and
• Hartmut Gliemann

Beilstein J. Nanotechnol. 2013, 4, 638–648, doi:10.3762/bjnano.4.71

• SAMs by using the AFM as nanografting tool. ToF-SIMS analyses were carried out to demonstrate the successful SAM patterning by nanografting, while FT-IR microscopy and AFM were used to verify the SURMOF growth on the patterned substrate. Results and Discussion The in-situ nanografting process includes

• . In addition to the AFM investigations, which provided information about topography and material contrast of the grafted sample, a chemical characterization was carried out by time-of-flight secondary ion mass spectrometry (ToF-SIMS). For that purpose a sample with grafted rectangular structures of 10

• agreement with the theoretical length difference of approx. 0.2 nm between the MHDA and the ODT molecule. To characterize the chemical composition of the structured areas, ToF-SIMS measurements were carried out. Characteristic ions of ODT and MHDA are detected at m/z 483, [AuSC18H38]−, m/z 679, [Au2SC18H37