Comparative study of antibacterial properties of polystyrene films with TiO_x and Cu nanoparticles fabricated using cluster beam technique

• Vladimir N. Popok,
• Cesarino M. Jeppesen,
• Peter Fojan,
• Anna Kuzminova,
• Jan Hanuš and
• Ondřej Kylián

Beilstein J. Nanotechnol. 2018, 9, 861–869, doi:10.3762/bjnano.9.80

• toluene. Thin films are coated on silicon and quartz substrates of 10 × 10 mm2 and annealed at 110 °C (above the glass transition temperature). The thickness of PS films was measured by ellipsometry and found to be 50 ± 5 nm. Ti clusters are produced by magnetron sputtering in a cluster source similar to

The nanofluidic confinement apparatus: studying confinement-dependent nanoparticle behavior and diffusion

• Stefan Fringes,
• Felix Holzner and
• Armin W. Knoll

Beilstein J. Nanotechnol. 2018, 9, 301–310, doi:10.3762/bjnano.9.30

• increase adhesion for the subsequently spin coated 175 ± 2 nm thick poly-phthalaldehyde (PPA) film. The thicknesses were measured with AFM. The refractive indices nHM = 1.67 and nPPA = 1.59 were measured by ellipsometry. The surface potential of PPA in 1 mM KCl solution (pH 7–7.5) was measured in a Malvern

Growth model and structure evolution of Ag layers deposited on Ge films

• Arkadiusz Ciesielski,
• Lukasz Skowronski,
• Ewa Górecka,
• Jakub Kierdaszuk and
• Tomasz Szoplik

Beilstein J. Nanotechnol. 2018, 9, 66–76, doi:10.3762/bjnano.9.9

• and density profile of 35 nm thick Ag layers seeded with 2 nm thick Ge films with and without temperature treatment. To investigate the kinetics of the segregation process, we perform time-dependent transmission and ellipsometry measurements for Ag samples deposited on Ge films with thicknesses

• thick Ag films deposited on 2 nm thick Ge wetting layer and capped with 3 nm thick LiF overlayer, measured using spectroscopic ellipsometry 10 days after the deposition process. The black and red curves have been reproduced from [4]. Transmission spectra of non-annealed (left column) and annealed (right

• ) Transmission spectra of Ge/Ag multilayer structure with total thickness of 20 nm. (b) Imaginary part of permittivity for 20 nm thick silver film deposited on 2 nm thick Ge wetting layer, measured using spectroscopic ellipsometry at 1, 10 and 60 days after deposition (solid lines), as well as Maxwell–Garnett

Increasing the stability of DNA nanostructure templates by atomic layer deposition of Al₂O₃ and its application in imprinting lithography

• Hyojeong Kim,
• Kristin Arbutina,
• Anqin Xu and
• Haitao Liu

Beilstein J. Nanotechnol. 2017, 8, 2363–2375, doi:10.3762/bjnano.8.236

• Cleaner (Novascan Technologies, Inc., Ames, IA, USA). Before UV irradiation, the chamber was flushed with O2 for 3 min, and the sample was subjected to UV/O3 treatment for 60 min at room temperature. Characterization methods Ellipsometry: The experimental thickness of an Al2O3 film was measured by an Alpha

Expanding the molecular-ruler process through vapor deposition of hexadecanethiol

• Alexandra M. Patron,
• Timothy S. Hooker,
• Daniel F. Santavicca,
• Corey P. Causey and
• Thomas J. Mullen

Beilstein J. Nanotechnol. 2017, 8, 2339–2344, doi:10.3762/bjnano.8.233

• lowest-intensity region between the two Au regions corresponds to the nanogap where the Si substrate is exposed. This nanogap measures 26.0 ± 4.3 nm and is consistent with the thickness of the Cu-ligated MHDA decalayer measured via spectroscopic ellipsometry (24.8 ± 0.1 nm) and the thickness of Cu

• capping (31.0 ± 1.0 nm) measured via spectroscopic ellipsometry. The standard deviations of the nanogap widths, thus the quality of the nanogaps, result from the morphologies of the Cu-ligated multilayers of MHDA only and MHDA with vapor-phase deposition of C16 (Figure S2, Supporting Information File 1

Tailoring the nanoscale morphology of HKUST-1 thin films via codeposition and seeded growth

• Landon J. Brower,
• Lauren K. Gentry,
• Amanda L. Napier and
• Mary E. Anderson

Beilstein J. Nanotechnol. 2017, 8, 2307–2314, doi:10.3762/bjnano.8.230

• control the film morphology for surMOFs of HKUST-1 fabricated by codeposition and seeded deposition. Time and temperature were investigated to observe film formation, to control film thickness, and to tune morphology. Film thickness was investigated by ellipsometry, while film structure and film roughness

• controllable nanoscale dimensions can be designed and fabricated for integration of MOF systems directly into device architectures and sensor platforms. Keywords: atomic force microscopy; copper(II) 1,3,5-benzenetricarboxylate; ellipsometry; surface-anchored metal-organic frameworks; Introduction Metal

• varying temperature, time, and deposition method, the goal was to develop and expand design rules to tailor surMOFs with desired thickness, roughness, and grain size. In order to understand the growth mechanism and identify key variables, atomic force microscopy (AFM) and ellipsometry were used to

(Metallo)porphyrins for potential materials science applications

• Lars Smykalla,
• Carola Mende,
• Michael Fronk,
• Pablo F. Siles,
• Michael Hietschold,
• Georgeta Salvan,
• Dietrich R. T. Zahn,
• Oliver G. Schmidt,
• Tobias Rüffer and
• Heinrich Lang

Beilstein J. Nanotechnol. 2017, 8, 1786–1800, doi:10.3762/bjnano.8.180

• covered with 100 nm thick Au layers were applied. Variable angle spectroscopic ellipsometry (VASE) was used to determine the absorption spectra of the as-obtained thin films. The extinction coefficients of the thin films display the typical features expected for (metallo)porphyrins, including expected

• leading to an increase of the nominal film thickness (both determined from the ellipsometry data). This could be explained considering that oxygen or moisture from the atmosphere diffuses into the H2TPP(OMe)4 film progressively, with a slight saturation tendency after 20 days. Increasing roughness might

• corresponding to the observed features in the absorption spectra. This indicates that the LUMO of these molecules generating the Q band is a formerly degenerated state undergoing Zeeman splitting in the magnetic field. With respect to the spectroscopic ellipsometry and magneto-optical Kerr effect spectroscopy

Charge transfer from and to manganese phthalocyanine: bulk materials and interfaces

• Florian Rückerl,
• Daniel Waas,
• Bernd Büchner,
• Martin Knupfer,
• Dietrich R. T. Zahn,
• Francisc Haidu,
• Torsten Hahn and
• Jens Kortus

Beilstein J. Nanotechnol. 2017, 8, 1601–1615, doi:10.3762/bjnano.8.160

• photoemission spectroscopy (IPES), electron energy-loss spectroscopy (EELS), spectroscopic ellipsometry and X-ray absorption spectroscopy (XAS). Here, we only briefly mention the kind of information that is provided by these methods, and we refer the reader to comprehensive literature for detailed information

• moment of open shells is accessible. Spectroscopic ellipsometry [47][48][49] measures the change in the light polarization after reflection on a sample surface. This information allows for the determination of the real and the imaginary part of the dielectric function. XAS [42][50] is equivalent to EELS

• were determined using EELS and spectroscopic ellipsometry. In Figure 2 we show the corresponding results. The EELS measurements were carried out at a momentum transfer of 0.1 Å−1 which represents the so-called optical limit, i.e., the data are equivalent to those from corresponding optical studies [43

Deposition of exchange-coupled dinickel complexes on gold substrates utilizing ambidentate mercapto-carboxylato ligands

• Martin Börner,
• Laura Blömer,
• Marcus Kischel,
• Peter Richter,
• Georgeta Salvan,
• Dietrich R. T. Zahn,
• Pablo F. Siles,
• Maria E. N. Fuentes,
• Carlos C. B. Bufon,
• Daniel Grimm,
• Oliver G. Schmidt,
• Daniel Breite,
• Bernd Abel and
• Berthold Kersting

Beilstein J. Nanotechnol. 2017, 8, 1375–1387, doi:10.3762/bjnano.8.139

• ) and 8 (J = +20.8 cm−1; H = −2JS1S2). The reactivity of complexes 6–8 is reminiscent of that of pure thiolato ligands, which readily chemisorb on Au surfaces as verified by contact angle, atomic force microscopy (AFM) and spectroscopic ellipsometry measurements. The large [Ni2L] tail groups, however

• “auration” of 2 and 3 with AuI sources leads to the trinuclear NiII2AuI species 4 and 5. Moreover, complexes 2 and 3 interact also with Au surfaces via Au–S and Au–P bonds without complex disintegration as established by contact angle, spectroscopic ellipsometry, atomic force microscopy (AFM), X-ray

• ). The crystal structure, reactivity features, and magnetic properties of compounds 6–8 are presented along with the results stemming from characterization of the surface assemblies by contact angle measurements, spectroscopic ellipsometry, AFM and transport measurements. To our knowledge, polynuclear

Optical response of heterogeneous polymer layers containing silver nanostructures

• Miriam Carlberg,
• Florent Pourcin,
• Olivier Margeat,
• Judikaël Le Rouzo,
• Gérard Berginc,
• Rose-Marie Sauvage,
• Jörg Ackermann and
• Ludovic Escoubas

Beilstein J. Nanotechnol. 2017, 8, 1065–1072, doi:10.3762/bjnano.8.108

• colloidal solutions range from 390 to 1300 nm. The non-absorbing, transparent polymer matrix poly(vinylpyrrolidone) (PVP) was chosen because of its suitable optical and chemical properties. The optical studies of the layers include spectrophotometry and spectroscopic ellipsometry measurements, which provide

• the nanoparticles to complete the optical characterization. A simple analysis method is proposed to obtain the complex refractive index of nanospheres and nanoprisms in a polymer matrix. Keywords: nanoprisms; nanospheres; plasmonic nanoparticles; spectroscopic ellipsometry; thin film layers

• with computer simulations and transmission electron microscopy (TEM) imaging. Spectrophotometer and spectroscopic ellipsometry measurements of the PVP host matrix validated its non-absorbing and transparent properties. Spectroscopic ellipsometry measurements of the heterogeneous layers of nanospheres

Vapor-phase-synthesized fluoroacrylate polymer thin films: thermal stability and structural properties

• Paul Christian and
• Anna Maria Coclite

Beilstein J. Nanotechnol. 2017, 8, 933–942, doi:10.3762/bjnano.8.95

• . Keywords: EGDMA; iCVD; in situ; PFDA; spectroscopic ellipsometry; temperature dependent; X-ray diffraction; Introduction Fluoropolymers, such as polytetrafluoroethylene, are interesting for a variety of different applications due to their low surface energy. The resultant hydrophobic and oleophobic

• hysteresis between advancing and receding contact angle [14]. The advantage of cross-linking with EGDMA is the elimination of the annealing step, resulting in a cross-linked film already in the as-deposited form. The thermal stability of the thin films was evaluated by ellipsometry, Fourier transform

• situ temperature-dependent spectroscopic ellipsometry measurements were performed on a Woollam M-2000 ellipsometer (J.A. Woollam Co., USA), equipped with a THMS600 temperature stage (Linkam, UK) under nitrogen atmosphere. The samples were investigated in the temperature range between 10 and 150 °C at a

Triptycene-terminated thiolate and selenolate monolayers on Au(111)

• Jinxuan Liu,
• Martin Kind,
• Björn Schüpbach,
• Daniel Käfer,
• Stefanie Winkler,
• Wenhua Zhang,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2017, 8, 892–905, doi:10.3762/bjnano.8.91

• ]. Other methods with sufficient height resolutions (0.1 nm) are ellipsometry and scanning probe microscopy (SPM). To our knowledge, SPM methods have so far not been successfully used to determine the absolute thickness of organic self-assmbled monolayers, most likely due to difficulties with preparing a

• defined border between zones with and without the molecules on the substrate. Occasionally, using sophisticated patterning methods, height differences between two different SAMs have been determined [33]. Ellipsometry is suitable to measure thicknesses of monomolecular films, in principle, but the

Thin SnO_x films for surface plasmon resonance enhanced ellipsometric gas sensing (SPREE)

• Daniel Fischer,
• Andreas Hertwig,
• Uwe Beck,
• Volkmar Lohse,
• Detlef Negendank,
• Martin Kormunda and
• Norbert Esser

Beilstein J. Nanotechnol. 2017, 8, 522–529, doi:10.3762/bjnano.8.56

• sensing devices with different coated SPREE sensors. Keywords: doped tin oxide; ellipsometry; gas sensing; surface plasmon resonance; thin films; transparent conductive oxides; Introduction Gas sensors are an important tool for example in the fields of process monitoring, workplace safety or

• was used. The Fe-doped SnOx was deposited with a 20%/80% oxygen/argon mixture with a pressure of 0.2 Pa. The thickness of the SnOx and Fe:SnOx overcoatings was 7 nm and 5 nm, respectively. The thickness was determined by using spectroscopic ellipsometry. The layer morphology was also determined by

• enhanced ellipsometry (SPREE) has been described previously [20][21][22]. The scheme of the device is shown in Figure 1. It consists of the sensing unit with the prepared layer system which is placed onto a gas tube which was prepared with a hole. The gas tube is filled with a gas mixture consisting of

Advances in the fabrication of graphene transistors on flexible substrates

• Gabriele Fisichella,
• Stella Lo Verso,
• Silvestra Di Marco,
• Vincenzo Vinciguerra,
• Emanuela Schilirò,
• Salvatore Di Franco,
• Raffaella Lo Nigro,
• Fabrizio Roccaforte,
• Amaia Zurutuza,
• Alba Centeno,
• Sebastiano Ravesi and
• Filippo Giannazzo

Beilstein J. Nanotechnol. 2017, 8, 467–474, doi:10.3762/bjnano.8.50

• collected by tapping mode atomic force microscopy (tAFM) for the LT growth (Figure 1a left) is comparable to the morphology obtained by the ST growth (Figure 1a right). The dielectric thickness and the consequent growth per cycle was determined by spectroscopic ellipsometry measurements performed on an

Colorimetric gas detection by the varying thickness of a thin film of ultrasmall PTSA-coated TiO₂ nanoparticles on a Si substrate

• Urmas Joost,
• Andris Šutka,
• Meeri Visnapuu,
• Aile Tamm,
• Meeri Lembinen,
• Mikk Antsov,
• Kathriin Utt,
• Krisjanis Smits,
• Ergo Nõmmiste and
• Vambola Kisand

Beilstein J. Nanotechnol. 2017, 8, 229–236, doi:10.3762/bjnano.8.25

• films were examined in air under ambient conditions. The optical constants given here are those measured at 633 nm wavelength. Using ellipsometry, the refractive index of the film was modelled between 1.2–4.5 eV at a wavelength of 633 nm. The three-layer stack (silicon substrate/silicon oxide/TiO2 film

• , ellipsometry measurements showed a clear change of thickness and also a change of the refractive index during exposure to ethanol. The ellipsometry results showed a swelling of the film of roughly 6% and, at the same time, a decrease of the refractive index from 2.06 to 1.99, i.e., 3% measured at 365 nm, and

Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment

• Ann-Kathrin Kleinschmidt,
• Lars Barzen,
• Johannes Strassner,
• Christoph Doering,
• Henning Fouckhardt,
• Wolfgang Bock,
• Michael Wahl and
• Michael Kopnarski

Beilstein J. Nanotechnol. 2016, 7, 1783–1793, doi:10.3762/bjnano.7.171

• . Those are mostly optical, for instance (laser) interferometry and reflectometry [16][17] or (spectroscopic) ellipsometry [18]. Also, combinations of several techniques are applied [19][20][21]. RAS incorporates some advantages. Usually for RAS reflectometric information is recorded for a broad spectral

Morphology of SiO₂ films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

• Volodymyr Tkachenko,
• Antigone Marino,
• Eva Otón,
• Noureddine Bennis and
• Josè Manuel Otón

Beilstein J. Nanotechnol. 2016, 7, 1743–1748, doi:10.3762/bjnano.7.167

• , we studied the optical anisotropy of thin SiO2 films by generalized ellipsometry as a function of deposition angle. The columnar SiO2 structure orientation measured by a noninvasive ellipsometry technique is reported for the first time, and its morphology influence on the LC alignment is demonstrated

• for large deposition angles. Keywords: anisotropy; ellipsometry; liquid crystal alignment; morphology; thin film; Introduction Thin films of SiO2 and SiOx obtained by oblique deposition are commonly used as alignment layers for liquid crystal (LC) displays [1][2][3][4][5][6][7]. Several alignments

• interest in photonics because of porosity dependence on the deposition angle, and consequently low and controllable refractive index. Many research groups have studied such films with ellipsometry techniques [16][17][18]. Some of them [16][17] investigated porosity and refractive index without taking into

Localized surface plasmons in structures with linear Au nanoantennas on a SiO₂/Si surface

• Ilya A. Milekhin,
• Sergei A. Kuznetsov,
• Ekaterina E. Rodyakina,
• Alexander G. Milekhin,
• Alexander V. Latyshev and
• Dietrich R. T. Zahn

Beilstein J. Nanotechnol. 2016, 7, 1519–1526, doi:10.3762/bjnano.7.145

• structures using ANSYS HFSS™). The authors are thankful to K. P. Mogil’nikov for determining the SiO2 layer thickness using spectral ellipsometry and L. L.Sveshnikova for technical assistance.

Surface roughness rather than surface chemistry essentially affects insect adhesion

• Matt W. England,
• Tomoya Sato,
• Makoto Yagihashi,
• Atsushi Hozumi,
• Stanislav N. Gorb and
• Elena V. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1471–1479, doi:10.3762/bjnano.7.139

• pressure, hereafter referred to as Soot-TMOS-FAS17Cl. Characterization of sample surfaces The thicknesses of the ODS and FAS17 monolayers were measured using ellipsometry (Philips, PZ2000). The thicknesses of the superhydrophobic (Never Wet), superhydrophilic (VUV-Never Wet), and superomniphobic films

An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers

• Falko O. Rottke,
• Burkhard Schulz,
• Klaus Richau,
• Karl Kratz and
• Andreas Lendlein

Beilstein J. Nanotechnol. 2016, 7, 1156–1165, doi:10.3762/bjnano.7.107

• -Liebknecht-Straße 24–25, 14476 Golm, Germany 10.3762/bjnano.7.107 Abstract The applicability of nulling-based ellipsometric mapping as a complementary method next to Brewster angle microscopy (BAM) and imaging ellipsometry (IE) is presented for the characterization of ultrathin films at the air–water

• enabled and morphological inhomogeneity could be quantified. Keywords: ellipsometric mapping; Langmuir monolayer; polyester; root mean square roughness; spectroscopic ellipsometry; Introduction Ellipsometry is an established in situ technique to investigate surfaces, capable to derive information about

• dielectric properties of a film and its thickness [1]. Like applications of thin films, the uses of ellipsometry are widespread, ranging from the characterization of metal-oxide layers in semiconductors, over the characterization of functional organic films, to investigations of biologically relevant

Manufacturing and investigation of physical properties of polyacrylonitrile nanofibre composites with SiO₂, TiO₂ and Bi₂O₃ nanoparticles

• Tomasz Tański,
• Wiktor Matysiak and
• Barbara Hajduk

Beilstein J. Nanotechnol. 2016, 7, 1141–1155, doi:10.3762/bjnano.7.106

• concentration by weight of the used reinforcing phase, which was as follows: 0%, 4%, 8% and 12% for each type of nanoparticles. The width of the band gap was determined on the basis of the absorption spectra of radiation (UV–vis) and ellipsometry methods. Spectroscopic ellipsometry has been used in order to

• determine the dielectric constant, refractive index and the thickness of the obtained fibrous mats. Keywords: ceramic nanoparticles; electrospinning methods; polyacrylonitrile; polymer composite nanofibres; spectroscopic ellipsometry; Introduction Over the last decade, there has been a noticeable

• properties of the obtained composite nanofibres with the participation of fibrous layers are scrutinized by means of ellipsometry and UV–vis spectroscopy. Experimental In order to prepare the spinning solution, the following were used: polyacrylonitrile (PAN purity 99%, Mw = 150 000 g/mol). The reinforcing

Investigating organic multilayers by spectroscopic ellipsometry: specific and non-specific interactions of polyhistidine with NTA self-assembled monolayers

• Ilaria Solano,
• Pietro Parisse,
• Ornella Cavalleri,
• Federico Gramazio,
• Loredana Casalis and
• Maurizio Canepa

Beilstein J. Nanotechnol. 2016, 7, 544–553, doi:10.3762/bjnano.7.48

• .7.48 Abstract Background: A versatile strategy for protein–surface coupling in biochips exploits the affinity for polyhistidine of the nitrilotriacetic acid (NTA) group loaded with Ni(II). Methods based on optical reflectivity measurements such as spectroscopic ellipsometry (SE) allow for label-free

• spectra method, which emphasizes the small changes of the ellipsometry spectral response upon the nanoscale thickening/thinning of the molecular film, we characterized different steps of the process such as the NTA-functionalization of Au, the adsorption of the His6 layer and its eventual displacement

• ellipsometry; Introduction The design of biosensing devices requires precise immobilization, with controlled orientation, of functional proteins on a surface, generally consisting of a substrate functionalized with a molecular receptor layer [1][2]. After seminal works [3], the interaction of chelated Ni ions

Rigid multipodal platforms for metal surfaces

• Michal Valášek,
• Marcin Lindner and
• Marcel Mayor

Beilstein J. Nanotechnol. 2016, 7, 374–405, doi:10.3762/bjnano.7.34

• packed self-assembled monolayers (SAMs) on gold [101]. The SAMs were characterized using ellipsometry, contact angle goniometry, polarization modulation-infrared reflection adsorption spectroscopy (PM-IRRAS) and XPS. The data in these fundamental studies were compared with those obtained from SAMs that

• thermal stability of these SAMs than those derived from monodentate and bidentate adsorbates as revealed by preliminary studies at elevated temperatures using ellipsometry [102]. Later systematic studies of both thiol-functionalized flat gold surfaces and colloidal gold nanoparticles approved that the

• monolayers with a well-defined bonding configuration on gold substrates. Film formation from solution was investigated in situ by second harmonic generation (SHG) and ellipsometry, which revealed a two-step process (fast adsorption ≈ physisorption, followed by slow film ordering ≈ chemisorption). The SAMs

Characterisation of thin films of graphene–surfactant composites produced through a novel semi-automated method

• Nik J. Walch,
• Alexei Nabok,
• Frank Davis and
• Séamus P. J. Higson

Beilstein J. Nanotechnol. 2016, 7, 209–219, doi:10.3762/bjnano.7.19

• LbL deposition of graphene(−)SDS alternated with polyethyleneimine (PEI). The optical study of graphene thin films deposited on different substrates was carried out using UV–vis absorption spectroscopy and spectroscopic ellipsometry. A particular focus was on studying graphene layers deposited on gold

• -coated glass using a method of total internal reflection ellipsometry (TIRE) which revealed the enhancement of the surface plasmon resonance in thin gold films by depositing graphene layers. Keywords: characterization; ellipsometry; graphene; 1H NMR; surfactant; Introduction Since its initial discovery

• -by-layer (LbL) deposition. Films composed of these new graphene composite materials were then characterised using SEM, AFM, and spectroscopic ellipsometry. The study of SPR in gold films coated with graphene using total internal reflection ellipsometry was carried out for the first time. Experimental

3D solid supported inter-polyelectrolyte complexes obtained by the alternate deposition of poly(diallyldimethylammonium chloride) and poly(sodium 4-styrenesulfonate)

• Eduardo Guzmán,
• Armando Maestro,
• Sara Llamas,
• Jesús Álvarez-Rodríguez,
• Francisco Ortega,
• Ángel Maroto-Valiente and
• Ramón G. Rubio

Beilstein J. Nanotechnol. 2016, 7, 197–208, doi:10.3762/bjnano.7.18

• initially formed on the surface of the gold electrode of the quartz crystal, in order to obtain a charged substrate [19]. QCM-D provided the impedance spectra of the crystal for the fundamental resonance frequency and for its odd overtones, ν, up to 11 [26]. Ellipsometry An imaging null-ellipsometer from

• has been used, as in a previous work [20]. From the results obtained from ellipsometry it was possible to calculate the mass adsorbed on the substrate, Г, using De Feijter’s equation [27], where nf and nl, are the refractive index of the film and solvent, respectively. The (dn/dc)T values measured for

• using QCM-D and ellipsometry data following the method proposed by Vöros [19][38][39][40][41]. Figure 3 shows the water weight fraction, Xw, for (PDADMAC + PSS)N films. The water content decreases as N increases, which agrees with the behavior reported for other films [42][43]. This behavior is due to