Search results

Search for "image" in Full Text gives 1342 result(s) in Beilstein Journal of Nanotechnology. Showing first 200.

Comparative electron microscopy particle sizing of TiO2 pigments: sample preparation and measurement

  • Ralf Theissmann,
  • Christopher Drury,
  • Markus Rohe,
  • Thomas Koch,
  • Jochen Winkler and
  • Petr Pikal

Beilstein J. Nanotechnol. 2024, 15, 317–332, doi:10.3762/bjnano.15.29

Graphical Abstract
  • particles on each image, and to correctly identify the particle edges. Effective image acquisition and analysis requires training and routine performance checks for both the personnel capturing the images and those interpreting them. Results Electron microscopy measurements of E171 samples and related
  • samples in 2023. Three of the reported measurements were made by SEM and three by TEM. The following three images (Figures 3–5) illustrate typical images used for the different methods. A top-view SEM image is shown in Figure 3 (Precheza M2, Venator M3), Figure 4 is an example of a TEM image (RCPTM, P1
  • , P6), and Figure 5 is a cross-section SEM image (KRONOS M1). The particle size distributions measured with each manufacturer’s method are remarkably similar, as shown in Figure 1. The D50n values are close, but the tails of the distributions vary slightly, especially in the cases where a small number
PDF
Album
Supp Info
Full Research Paper
Published 25 Mar 2024

Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications

  • August K. Roos,
  • Ermes Scarano,
  • Elisabet K. Arvidsson,
  • Erik Holmgren and
  • David B. Haviland

Beilstein J. Nanotechnol. 2024, 15, 242–255, doi:10.3762/bjnano.15.23

Graphical Abstract
  • microscopy (SPM), the tip plays a fundamental role in the achievable lateral resolution of the image. The focused electron-beam induced deposition (FEBID) [34] technique has been adapted to fabricate tips for SPM, for example, to enhance commercial platinum–iridium alloy (Pt-Ir)-coated conductive tips [35
  • by setting the deposition height to 10 μm. Defocusing of the electron spot during vertical growth naturally forms a narrowing conical structure. At the apex of this cone, we routinely achieve a curvature radius of less than 10 nm, as verified by the SEM image in Figure 6c. Finally, we deposit a thin
  • direction. (a) Scanning electron microscope (SEM) image of a fabricated sensor seen from an angled topside view. The cantilever is formed from a Si-N plate protruding from and supported by a Si substrate. A thin film of Nb-Ti-N is deposited on top of the Si-N and patterned to form the microwave resonator. A
PDF
Album
Full Research Paper
Published 15 Feb 2024

Quantitative wear evaluation of tips based on sharp structures

  • Ke Xu and
  • Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

Graphical Abstract
  • surface topography [7]. A sharper needle tip leads to more accurate measurements [8]. During the scanning process, tip and sample come into mutual contact, causing wear on the tip [9]. Tip wear or damage in practical applications can have severe consequences, including reduced image quality and erroneous
  • . Orji et al. [14] utilized a transmission electron microscope (TEM) to image a tip and derived its tapered shape from the TEM image. Electron microscopic observation offers the advantages of high precision and resolution, enabling accurate acquisition of morphological information about the tip. However
  • indicator of tip wear, but also used the surface roughness (Ra) to represent the degree of image deterioration to evaluate the degree of probe wear. It was concluded that a high free amplitude and a set point of 0.5 increase probe wear, while a set point of 0.6 reduces tip wear; the scanning speed does not
PDF
Album
Full Research Paper
Published 14 Feb 2024

Ion beam processing of DNA origami nanostructures

  • Leo Sala,
  • Agnes Zerolová,
  • Violaine Vizcaino,
  • Alain Mery,
  • Alicja Domaracka,
  • Hermann Rothard,
  • Philippe Boduch,
  • Dominik Pinkas and
  • Jaroslav Kocišek

Beilstein J. Nanotechnol. 2024, 15, 207–214, doi:10.3762/bjnano.15.20

Graphical Abstract
  • , we only evaluated samples on Si. AFM imaging was used to check and subsequently analyze the irradiated samples. The imaging was performed in air using a Dimension Icon AFM (Bruker) in ScanAsyst mode which employs PeakForce Tapping Technology and ScanAsyst probes (40 kHz, 0.4 N/m). Image processing
  • irradiated samples with the height profiles of one side of representative nanotriangles at each fluence level plotted at the bottom of each image. The relative mean height of the nanotriangles in comparison to the unirradiated control sample is plotted in Figure 2A as a function of the fluence. We associate
  • increasing fluences of 56Fe25+ ions with height profiles of representative triangles shown at the bottom of each image. A height map at higher magnification is also presented in Figure 1D, and the relative height increase is plotted as a function of the fluence in Figure 2B. In this irradiation experiment
PDF
Album
Supp Info
Full Research Paper
Published 12 Feb 2024

Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO2 substrates

  • Aleksandra Szkudlarek,
  • Jan M. Michalik,
  • Inés Serrano-Esparza,
  • Zdeněk Nováček,
  • Veronika Novotná,
  • Piotr Ozga,
  • Czesław Kapusta and
  • José María De Teresa

Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18

Graphical Abstract
  • be optimized to prevent unnecessary defects and reduce the detrimental impact on the underlying substrate. The optical microscope image of the graphene flake before the patterning process is shown in Figure 2A. The size of the etched lines, estimated based on SEM measurements, is usually smaller than
  • 50 nm (20 nm in the best case). However, due to the long residual time of the water molecules inside the SEM chamber, the collection of an image can further destroy the investigated material. Therefore, we performed a second series of experiments for a detailed analysis with Raman spectroscopy and
  • that with certain precautions water-assisted FEBIE can be applied for such a nanopatterning process. The experimental data obtained with scanning Raman spectroscopy, correlative probe and electron microscopy, and in situ AFM measurements provide a comprehensive image of FEBIE etch profiles. In addition
PDF
Album
Full Research Paper
Published 07 Feb 2024

Nanocarrier systems loaded with IR780, iron oxide nanoparticles and chlorambucil for cancer theragnostics

  • Phuong-Thao Dang-Luong,
  • Hong-Phuc Nguyen,
  • Loc Le-Tuan,
  • Xuan-Thang Cao,
  • Vy Tran-Anh and
  • Hieu Vu Quang

Beilstein J. Nanotechnol. 2024, 15, 180–189, doi:10.3762/bjnano.15.17

Graphical Abstract
  • . Then, the signals were normalized to the signal of PVA@NP/Cou-6 for comparison. The fluorescence image of the NPs in the cells were displayed in Supporting Information File 1, Supplementary data 2 and Figure S2. Cytotoxicity effects of nanoparticles The cells were seeded onto 96-well plates at 5,000
PDF
Album
Supp Info
Full Research Paper
Published 06 Feb 2024

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

  • Mustafa Kangül,
  • Navid Asmari,
  • Santiago H. Andany,
  • Marcos Penedo and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

Graphical Abstract
  • therefore the imaging speed. To overcome these limitations, we introduce an alternative control technique that takes advantage of the non-zero contact duration, enabling an enhanced force control. This method provides rapid control of the maximum force, resulting in better image quality at faster scan rates
  • examine the system response. A peak-to-peak ORT actuation of 50 nm at 2 kHz rate was applied to the Z piezo. We have mounted a Fastscan-A (Bruker) cantilever, setting the scan rate to 4 Hz. The acquired image has 250 × 250 pixels so both trace and retrace images have 1 ORT cycle per pixel. Integral gains
  • high-frequency disturbances, but also in improving tracking of lower-frequency components of the sample topography. Extracting mechanical properties from the interaction curves is one of the most powerful capabilities of ORT techniques. Together with the topographical image, they provide material
PDF
Album
Supp Info
Full Research Paper
Published 01 Feb 2024

New application of bimetallic Ag/Pt nanoplates in a colorimetric biosensor for specific detection of E. coli in water

  • Azam Bagheri Pebdeni,
  • Mohammad N. AL-Baiati and
  • Morteza Hosseini

Beilstein J. Nanotechnol. 2024, 15, 95–103, doi:10.3762/bjnano.15.9

Graphical Abstract
  • that, one drop of the E. coli-contaminated sample was put onto a paper chip. The final stage in the paper evaluation was to add 6 µL of H2O2 and 6 µL of TMB to paper chips. The ImageJ software was utilized to evaluate the intensity of the resulting blue color. a) The SEM image AND b) EDS analysis of Ag
  • /Pt NPL. a) Absorbance spectra of Ag/Pt NPL after the addition of TMB, TMB and H2O2, NPL, and aptamer-NPL in the presence of TMB-H2O2. b) Image related to the color change of the proposed NPL, c) the zeta potential of NPL, aptamer-NPL, E. coli bacteria, and NPL-E. coli. a) The calibration curve of
PDF
Album
Supp Info
Full Research Paper
Published 17 Jan 2024

Study of the reusability and stability of nylon nanofibres as an antibody immobilisation surface

  • Inés Peraile,
  • Matilde Gil-García,
  • Laura González-López,
  • Nushin A. Dabbagh-Escalante,
  • Juan C. Cabria-Ramos and
  • Paloma Lorenzo-Lozano

Beilstein J. Nanotechnol. 2024, 15, 83–94, doi:10.3762/bjnano.15.8

Graphical Abstract
  • immunocapture system in NF and 96-well microplate, for each time: ***p < 0.001. Field-emission scanning electron microscopy image of NFs. Acknowledgements We would like to thank the whole team at Nieves Murillo of TECNALIA – Industry and Transport Division for providing the nylon NFs. Funding These results
PDF
Album
Full Research Paper
Published 15 Jan 2024

Berberine-loaded polylactic acid nanofiber scaffold as a drug delivery system: The relationship between chemical characteristics, drug-release behavior, and antibacterial efficiency

  • Le Thi Le,
  • Hue Thi Nguyen,
  • Liem Thanh Nguyen,
  • Huy Quang Tran and
  • Thuy Thi Thu Nguyen

Beilstein J. Nanotechnol. 2024, 15, 71–82, doi:10.3762/bjnano.15.7

Graphical Abstract
  • ImageJ software as an image analysis tool. Fourier-transform infrared spectroscopy was performed in a Nicolet NEXUS 670 spectrometer. The resulting spectra were recorded in transmission mode in the wavelength range of 500–4000 cm−1. A Raman spectrometer (MacroRAM, Horiba) was used to investigate the
  • contact angles of the electrospun scaffolds were measured using a Samsung FACED camera (Korea). A drop of bidistilled water was placed on the flat surface of the electrospun scaffold and then a digital image of the drop was taken for measuring the value of the contact angle using an image processing
  • inverted microscope every 24 h. Statistical analysis The data were reported as mean values ± standard deviations. Statistical analysis of antibacterial data was performed using one-way analysis of variance (ANOVA). A p-value of less than 0.05 was considered statistically significant. (a) SEM image of BBR
PDF
Album
Supp Info
Full Research Paper
Published 12 Jan 2024

Measurements of dichroic bow-tie antenna arrays with integrated cold-electron bolometers using YBCO oscillators

  • Leonid S. Revin,
  • Dmitry A. Pimanov,
  • Alexander V. Chiginev,
  • Anton V. Blagodatkin,
  • Viktor O. Zbrozhek,
  • Andrey V. Samartsev,
  • Anastasia N. Orlova,
  • Dmitry V. Masterov,
  • Alexey E. Parafin,
  • Victoria Yu. Safonova,
  • Anna V. Gordeeva,
  • Andrey L. Pankratov,
  • Leonid S. Kuzmin,
  • Anatolie S. Sidorenko,
  • Silvia Masi and
  • Paolo de Bernardis

Beilstein J. Nanotechnol. 2024, 15, 26–36, doi:10.3762/bjnano.15.3

Graphical Abstract
  • a substrate thickness of 0.29 mm seem to be closer to the experimental results, see Measurement results section below. (a) Design of the sample of LSPE VB 210/240 from the SINS1 series. (b) Optical photo of the sample of LSPE VB 210/240 from the SINS1 series. (a) SEM image of the LSPE sample; bow
  • -tie antennas are visible. (b) SEM image where the required elements are painted with pseudocolors; red: normal metal absorber, green: SN contact, and blue: SIN tunnel junctions. I–V characteristics of two receiving structures of a sample receiving system from the LSPE VB 210/240 SINS1 series. Measured
PDF
Album
Full Research Paper
Published 04 Jan 2024

TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

  • Joshua Williams,
  • Michael I. Faley,
  • Joseph Vimal Vas,
  • Peng-Han Lu and
  • Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

Graphical Abstract
  • deflected by the circularly oriented magnetic fields. The magnetic contrast can hardly be observed when the image is in-focus but becomes more visible when the image is defocused. On one side of the focus, the magnetization of the vortex deflects the electron beams inwards, which then overlaps and results
  • sample and a coherently tilted reference plane wave. The intensity of the hologram can be represented in the form of where Ψi(r) stands for the electron wavefunction in the image plane i with amplitude Ai and phase φi, r is a two-dimensional vector in the sample plane, and q is the two-dimensional
  • -off or IBE methods on the bulk substrate. Then we protected the nanostructure with a resist and patterned AZ®5214E resist on the back side of the substrate using the image reversal technique. A window in the SiN buffer layer was prepared by ion beam etching through the aperture in the mask of AZ®5214E
PDF
Album
Supp Info
Full Research Paper
Published 02 Jan 2024

unDrift: A versatile software for fast offline SPM image drift correction

  • Tobias Dickbreder,
  • Franziska Sabath,
  • Lukas Höltkemeier,
  • Ralf Bechstein and
  • Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

Graphical Abstract
  • for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image
  • determine the drift velocity from the apparent movement of stationary features either by automatic evaluation of the cross-correlation image or based on positions identified manually by the user. We demonstrate the performance and reliability of unDrift using three challenging examples, namely images
  • force microscopy; calibration; drift correction; image correlation functions; periodic structures; scanning probe microscopy; Introduction In science and technology, scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces from the
PDF
Album
Supp Info
Full Research Paper
Published 28 Dec 2023

Fluorescent bioinspired albumin/polydopamine nanoparticles and their interactions with Escherichia coli cells

  • Eloïse Equy,
  • Jordana Hirtzel,
  • Sophie Hellé,
  • Béatrice Heurtault,
  • Eric Mathieu,
  • Morgane Rabineau,
  • Vincent Ball and
  • Lydie Ploux

Beilstein J. Nanotechnol. 2023, 14, 1208–1224, doi:10.3762/bjnano.14.100

Graphical Abstract
  • (inspired from [14]). (e) Possible locations of organic nanoparticles in bacterial cells. Figure 1c was adapted with permission from [13]. Copyright 2018 American Chemical Society. This content is not subject to CC BY 4.0. (a) Photographic image of a dopamine solution. Main reactions leading to an auto
PDF
Album
Supp Info
Full Research Paper
Published 22 Dec 2023

Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function

  • Perawat Boonpuek and
  • Jonathan R. Felts

Beilstein J. Nanotechnol. 2023, 14, 1200–1207, doi:10.3762/bjnano.14.99

Graphical Abstract
  • force curves with contact mechanics models and extracting the adhesion and friction forces [5][6]. If we do not know the exact value of the tip radius, the sample image with the observation of scanning frequency and the calculation results are not accurate. This indicates that the measurement results
PDF
Album
Supp Info
Full Research Paper
Published 15 Dec 2023

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH3)2Cl]2

  • Elif Bilgilisoy,
  • Ali Kamali,
  • Thomas Xaver Gentner,
  • Gerd Ballmann,
  • Sjoerd Harder,
  • Hans-Peter Steinrück,
  • Hubertus Marbach and
  • Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

Graphical Abstract
  • ). Figure 1a depicts an SEM image of the FEBID deposit created with an electron exposure of 7.80 C/cm2. The position of the corresponding AES analysis is marked in Figure 1a by a green-colored star. The AES spectra acquired on the bare substrate and the deposit are shown in Figure 1b. On the pristine SiO2
  • selected area of the SEM image shown in Figure 1a is depicted in Figure 1c, where nanoparticles in the deposition are noticeable, although the picture is somewhat blurry. To better visualize the observed nanoparticles, a background subtraction was performed with the image enhancement program ImageJ [35
  • ]. The image after the background subtraction is shown in Figure 1d, where the particles can be more clearly distinguished. After background subtraction, some of the deposited nanoparticles appear facetted; however, the majority are spherical. HAADF-STEM on FEBID (SiO2 (500 nm)/Si(111)) As a next step
PDF
Album
Supp Info
Full Research Paper
Published 06 Dec 2023

Spatial variations of conductivity of self-assembled monolayers of dodecanethiol on Au/mica and Au/Si substrates

  • Julian Skolaut,
  • Jędrzej Tepper,
  • Federica Galli,
  • Wulf Wulfhekel and
  • Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2023, 14, 1169–1177, doi:10.3762/bjnano.14.97

Graphical Abstract
  • . In this mode of CAFM operation, a force–distance curve is measured at every pixel of the image. The tip is approached until a certain bend of the cantilever is reached, corresponding to the force setpoint Fsetpoint. Plotting the z position at which the force setpoint is reached provides the
  • Figure 2b show the topography and the current map, respectively, for a Au/mica substrate. The 300 × 300 nm2 topography map shows that the Au/mica substrate has large flat areas on which the height does not change significantly. The overall change in height throughout the image is approximately 4 nm, and
  • the most significant changes in height occur at the boundaries between different flat areas. The corresponding current map (Figure 2b) shows a nearly homogeneous distribution of the current throughout the whole image, where the current takes on well-measurable values distributed around 200 pA. Only
PDF
Album
Supp Info
Full Research Paper
Published 05 Dec 2023

Elasticity, an often-overseen parameter in the development of nanoscale drug delivery systems

  • Agnes-Valencia Weiss and
  • Marc Schneider

Beilstein J. Nanotechnol. 2023, 14, 1149–1156, doi:10.3762/bjnano.14.95

Graphical Abstract
  • convinced that elasticity as a formulation parameter can help to promote more nanoparticulate drug delivery systems to be translated to the clinics. (A) Height image of gelatin nanoparticles on a silica surface imaged in Milli-Q® water at 37 °C in the quantitative imaging mode. (B) A force–distance curve
PDF
Album
Perspective
Published 23 Nov 2023

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

  • François Piquemal,
  • Khaled Kaja,
  • Pascal Chrétien,
  • José Morán-Meza,
  • Frédéric Houzé,
  • Christian Ulysse and
  • Abdelmounaim Harouri

Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94

Graphical Abstract
  • deviation. In addition, we noticed that all I–V straights did not pass through zero, which introduced a shift in the measured currents leading to an increase in the resistance values by a constant amount of (+8 ± 1)%, which agrees very well with the deviations observed from the image values (taken at a bias
PDF
Album
Supp Info
Full Research Paper
Published 22 Nov 2023

Density functional theory study of Au-fcc/Ge and Au-hcp/Ge interfaces

  • Olga Sikora,
  • Małgorzata Sternik,
  • Benedykt R. Jany,
  • Franciszek Krok,
  • Przemysław Piekarz and
  • Andrzej M. Oleś

Beilstein J. Nanotechnol. 2023, 14, 1093–1105, doi:10.3762/bjnano.14.90

Graphical Abstract
  • microscopy image [23] one can identify the Au-hcp plane parallel to Ge substrate as (010). We discuss the optimized structures and defects that could stabilize the interface. Finally, we demonstrate the electronic properties of Au/Ge junctions and the formation of Ge–Au bonds at the interface. The Appendices
  • perpendicular direction (with no experimental image to guide us), we chose to join seven germanium blocks and five gold slabs as shown in Figure 1c, obtaining a mismatch of about 3%. Variant C is constructed in such a way that rows of gold atoms are located between the germanium rows (see Figure 6c), and we
  • , respectively. The Ge atoms replacing some Au pairs gradually improve the interface energy, and the result obtained for the last modification is very close to the interface energy of variant C. Figure 8 shows the experimental image of the investigated interface together with one of our optimized structures
PDF
Album
Full Research Paper
Published 15 Nov 2023

Dual-heterodyne Kelvin probe force microscopy

  • Benjamin Grévin,
  • Fatima Husainy,
  • Dmitry Aldakov and
  • Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

Graphical Abstract
  • ) illumination. An SPV image can eventually be recalculated as the difference between both sets of data [1]. The inherent drawback of this dual-pass method is that the source images used for the SPV calculation may feature misalignments, which is especially unavoidable at room temperature (RT) due to thermal
  • with the application of a light pulse (i.e., a curve is recorded at each point of the surface along a 2D grid). Again, a differential SPV image can be reconstructed from the matrix of spectroscopic curves [5]. However, this approach is not free from artefacts, in particular the cantilever photothermal
  • amplitude image (appearing as dark spots in Figure 3b and Supporting Information File 1, Figure S6b) correspond to areas of the sample where the SPV is "less positive". Thus, from an electrostatic point of view, the most reasonable hypothesis is that these contrasts (and the correlated topographic
PDF
Album
Supp Info
Full Research Paper
Published 07 Nov 2023

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

  • Zeinab Eftekhari,
  • Nasim Rezaei,
  • Hidde Stokkel,
  • Jian-Yao Zheng,
  • Andrea Cerreta,
  • Ilka Hermes,
  • Minh Nguyen,
  • Guus Rijnders and
  • Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

Graphical Abstract
  • of a specific point at the center of the membrane was recorded over time for the utilized voltage and frequency. We selected 10 line profiles from the modulated topography image, took the average over the selected lines similarly to the previous case, and fitted these with a sinusoidal function. The
PDF
Album
Supp Info
Full Research Paper
Published 06 Nov 2023

Recognition mechanisms of hemoglobin particles by monocytes – CD163 may just be one

  • Jonathan-Gabriel Nimz,
  • Pichayut Rerkshanandana,
  • Chiraphat Kloypan,
  • Ulrich Kalus,
  • Saranya Chaiwaree,
  • Axel Pruß,
  • Radostina Georgieva,
  • Yu Xiong and
  • Hans Bäumler

Beilstein J. Nanotechnol. 2023, 14, 1028–1040, doi:10.3762/bjnano.14.85

Graphical Abstract
  • ; N = 3. Different uptake of untagged E. coli (39.8 ± 11.4%) vs HbMP (30′: 51.9 ± 6.0%; 120′: 47.1 ± 5.1%) by monocytes; N = 3. Phagocytosis of PMMA-FluoroGreen-COOH-MP diameter between 0.4 and 2.1 µm by monocytes and granulocytes. N = 3. The confocal laser scanning microscopy image showing the uptake
PDF
Album
Supp Info
Full Research Paper
Published 19 Oct 2023

A visible-light photodetector based on heterojunctions between CuO nanoparticles and ZnO nanorods

  • Doan Nhat Giang,
  • Nhat Minh Nguyen,
  • Duc Anh Ngo,
  • Thanh Trang Tran,
  • Le Thai Duy,
  • Cong Khanh Tran,
  • Thi Thanh Van Tran,
  • Phan Phuong Ha La and
  • Vinh Quang Dang

Beilstein J. Nanotechnol. 2023, 14, 1018–1027, doi:10.3762/bjnano.14.84

Graphical Abstract
  • photodetectors (PDs) to “Industry 4.0”, which may include image sensors, biomedical imaging, manufacturing process control, environmental sensing, and optical sensors [8]. Various materials for photodetectors have been developed. Photodetectors can be classified into two main categories, namely PDs that work at
  • -emission scanning electron microscopy (FESEM) image of ZnO NRs exhibits nanorods with hexagonal cross section, well aligned with the glass substrate (Figure 1a). Figure 1b indicates that many spherical nanoparticles are formed on the ZnO NRs after spraying the CuO NP solution with a concentration of 0.05 M
PDF
Album
Supp Info
Full Research Paper
Published 13 Oct 2023

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

  • Michael R. Roenbeck and
  • Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

Graphical Abstract
  • at 1.1 GPa. In contrast to the modulus maps in Technora®, the distinctions between the local ET measurements within fibrils and their interfaces are very clear in Kevlar®. Image thresholding of K29 modulus maps indicates that the most compliant regions are near interfaces, which can also be readily
PDF
Album
Full Research Paper
Published 05 Oct 2023
Other Beilstein-Institut Open Science Activities