Templating effect of single-layer graphene supported by an insulating substrate on the molecular orientation of lead phthalocyanine

• K. Priya Madhuri,
• Abhay A. Sagade,
• Pralay K. Santra and
• Neena S. John

Beilstein J. Nanotechnol. 2020, 11, 814–820, doi:10.3762/bjnano.11.66

• molecules with monoclinic and triclinic fractions on the surface of SLG/SiO2/Si is inferred in Figure 4. The topography of the PbPc layer was studied using atomic force microscopy (AFM, Figure 5). Figure 5a and the inset show that the film consists of granular PbPc crystallites deposited uniformly on the

• electrical studies using conducting-AFM (C-AFM). Figure 6a,b shows the topography and the corresponding current map of the film. The current response map shows an average current value of about 1 nA across the surface with highly conducting grains, which exhibit current values as high as 8–9 nA (Figure 6c

• height variation. (a) AFM topography,1 µm × 1 µm scan area. (b) Corresponding current map of 10 nm PbPc thin film on SLG/SiO2/Si substrate obtained at 2 V sample bias. (c) Profile section of (b) along the marked line showing the current variation across the film. (d) I–V curve acquired from a conducting

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• topography, among other parameters. In order to determine the interaction force behavior as a function of the separation distance, we measured the frequency shift of the oscillating cantilever as a function of the separation distance (Δf–d curves) between a silicon AFM probe and a diamond sample. An

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• of the graphite film is 7 nm. A conventional AFM topography image is shown in Figure 6a. Film and substrate are labeled. Then, a comparison is shown between the results obtained by RT-AFAM and S-AFAM. Figure 6b shows an RT-AFAM image where the difference between materials is hardly noticeable. S-AFAM

• ) Conventional AFM topography; b) RT-AFAM for 188–191 kHz window; and S-AFAM frequency maps for c) 49–53 kHz window, d) 82–97 kHz window, e) 168–176 kHz window and f) 186–194 kHz window. Results for a graphite film on a glass substrate: a) indentation modulus mapping and b) histogram for the mapping. Modeled and

Exfoliation in a low boiling point solvent and electrochemical applications of MoO₃

• Matangi Sricharan,
• Bikesh Gupta,
• Sreejesh Moolayadukkam and
• H. S. S. Ramakrishna Matte

Beilstein J. Nanotechnol. 2020, 11, 662–670, doi:10.3762/bjnano.11.52

• in Figure 2c shows the topography of MoO3 nanosheets the thickness values of which suggest the presence of 5–7 layers [6]. The FESEM micrographs shown in Supporting Information File 1 corroborate the exfoliation of MoO3. Figure S3a,b (Supporting Information File 1) shows bulk MoO3 and exfoliated

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• (FIB) SEM and X-ray absorption near edge structure (XANES) [6][7][8][9][10][11][12][13]. Another technique for post-mortem analysis is atomic force microscopy (AFM). In its basic form, it provides information on the topography of the sample. More advanced AFM modes extract in addition to the topography

• additional mechanical (stiffness, elasticity), electrical (conductivity, surface potential), electrochemical (reactivity, mobility and activity), mechanoelectrical (piezoelectricity) and chemical (chemical bonding) material properties. In situ AFM imaging of the sample topography is often used to study the

• analysis was conducted with a Bruker Icon instrument inside a glovebox (MBraun, O2 and H2O < 2 ppm), equipped with a Zurich Instruments lock-in amplifier (HF2LI), a signal access module (SAM V) and PeakForce quantitative nanomechanical properties (QNM) module. In addition to the ESM signal, the topography

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different

A review of demodulation techniques for multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

• provide further nanomechanical sample information. These include properties such as sample elasticity, stiffness and adhesiveness [17], which are mapped simultaneously with the topography. Acquiring these observables requires the accurate demodulation of amplitude and phase of multiple frequency

• illustrates a cantilever driven at multiple frequencies being amplitude-modulated by a sample topography. In MF-AFM, the cantilever deflection signal contains frequency components originating from the fundamental resonance mode, as well as from higher eigenmodes and/or harmonics. If for simplicity we assume

• are preferred over the Kalman filter, as they are significantly easier to implement. (a) Schematic diagram of sample topography amplitude-modulating a cantilever the oscillation of which consists of multiple frequencies. (b) Double-sided amplitude frequency spectrum of a cantilever oscillating at

The effect of heat treatment on the morphology and mobility of Au nanoparticles

• Sven Oras,
• Sergei Vlassov,
• Simon Vigonski,
• Boris Polyakov,
• Mikk Antsov,
• Vahur Zadin,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2020, 11, 61–67, doi:10.3762/bjnano.11.6

• and 2 nm NPs into rounded shapes bounded by energetically favorable surfaces. Atoms are colored according to their crystallographic surface type. (a) Profile of a Au NP and (b) topography image of NPs on the Si substrate prior to manipulation. (c and d) Phase images recorded during the manipulation

Label-free highly sensitive probe detection with novel hierarchical SERS substrates fabricated by nanoindentation and chemical reaction methods

• Jingran Zhang,
• Tianqi Jia,
• Yongda Yan,
• Li Wang,
• Peng Miao,
• Yimin Han,
• Xinming Zhang,
• Guangfeng Shi,
• Yanquan Geng,
• Zhankun Weng,
• Daniel Laipple and
• Zuobin Wang

Beilstein J. Nanotechnol. 2019, 10, 2483–2496, doi:10.3762/bjnano.10.239

• . Compared with the pyramidal cavities etched for 5 minutes, the topography of the pyramidal cavities etched by 10 minutes are obviously changed as shown in Figure 2c. Figure 1e and Figure 2d show SEM images of arrayed triangular cavities with fx = 5 μm and fy = 1 μm. Compared with cavities etched for 5

• of the Cu substrate. The simulation model corresponds to the SEM topography of the indentation structures fabricated by different feeds in the AgNO3 solution after 5 minutes as shown in Figure 1d,e. The Ag nanoparticles are formed on the pile-ups of the indentation structures and the adjacent

Mobility of charge carriers in self-assembled monolayers

• Zhihua Fu,
• Tatjana Ladnorg,
• Hartmut Gliemann,
• Alexander Welle,
• Asif Bashir,
• Michael Rohwerder,
• Qiang Zhang,
• Björn Schüpbach,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2019, 10, 2449–2458, doi:10.3762/bjnano.10.235

• determination of apparent heights of islands from STM data is somewhat indirect, the conductivities of the patterned areas were determined directly by means of highly sensitive current measurements, where the conductive tip of the AFM is used as a top electrode. This setup allows determining the topography and

• rather indirect. In contrast, with the conductive AFM the conductivity can be determined for a fixed height of the AFM tip above the SAM surface directly from simultaneous measurements of the topography and conductive response of the SAMs. The topography and the associated conductivity measurements of

• the sample surface with PAT islands prepared by grafting insulating HDT in the PAT SAM are shown in Figure 2. Figure 2a and Figure 2c show the topography image of a representative surface area with grafted PAT islands with different magnifications. Figure 2b represents the 3D image of the current

Self-assembly of a terbium(III) 1D coordination polymer on mica

• Quentin Evrard,
• Giuseppe Cucinotta,
• Felix Houard,
• Guillaume Calvez,
• Yan Suffren,
• Carole Daiguebonne,
• Olivier Guillou,
• Andrea Caneschi,
• Matteo Mannini and
• Kevin Bernot

Beilstein J. Nanotechnol. 2019, 10, 2440–2448, doi:10.3762/bjnano.10.234

• solution and a pulsed Horiba Scientific DeltaDiode DD-340 nm for the CHCl3 solution. Deposition of [Tb(hfac)3·2H2O]n on the mica substrate. AFM topography images of [Tb(hfac)3·2H2O]n@mica (a) 30 minutes and (b) 1 day after deposition showing the presence on the surface of needle-like objects together with

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• (SPM) [1]. Quality and accuracy of an AFM image strongly depend on the tip geometry since the image topography is the convolution of the surface topography and the cantilever tip geometry [2]. More precisely, the resulting images suffer from the effect of dilation [3]. AFM images with tip artefacts are

• topography significantly better. Discussion The critical feature of any AFM cantilever is the tip. For general imaging, the quality of the tip is primarily determined by the tip radius and the wear rate of the tip. We need to comment that our tips have a decent sharpness compared to other silicon nitride

• µm pitch reference sample taken by the RTESPA silicon cantilever and the LSNT-tip SU8 cantilever at scan rates of 1, 10, 20 and 30 Hz. The SU8 cantilever shows a better topography tracking ability compared to the RTESPA cantilever due to its higher tapping bandwidth. The scale bar is 500 nm

A novel method to remove impulse noise from atomic force microscopy images based on Bayesian compressed sensing

• Yingxu Zhang,
• Yingzi Li,
• Zihang Song,
• Zhenyu Wang,
• Jianqiang Qian and
• Junen Yao

Beilstein J. Nanotechnol. 2019, 10, 2346–2356, doi:10.3762/bjnano.10.225

• result, Φ ∈ RM×N is the measurement matrix, xT ∈ RN×1 represents the true sample topography, and e is the measurement noise. If M is smaller than N, then the AFM imaging is CS imaging. Because the AFM only samples one pixel of an image at a time and moves around to obtain an image, the compressed

• sampling of the AFM can be seen as randomly collecting partial elements of x. The undersampling process can be modeled by an identity matrix with some rows removed, shown in Figure 2. In order to recover the true AFM image from the undersampled data, the sample topography x must be sparse, i.e. some

• CS imaging because all the rows of the image are stacked together to generate a vector [19][28]. In CS AFM imaging, recovering the true sample topography from the undersampled information has high computational cost. For a n × n AFM image, the compressed sampling matrix is M × N (n ≪ M < N), which

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• Manufacturing of China, Changchun University of Science and Technology, Changchun 130022, China Computer Department, Changchun Medical College, Changchun 130031, China JR3CN & IRAC, University of Bedfordshire, Luton LU1 3JU, UK 10.3762/bjnano.10.223 Abstract The stiffness and the topography of the substrate at

• the cell–substrate interface are two key properties influencing cell behavior. In this paper, atomic force acoustic microscopy (AFAM) is used to investigate the influence of substrate stiffness and substrate topography on the responses of L929 fibroblasts. This combined nondestructive technique is

• able to characterize materials at high lateral resolution. To produce substrates of tunable stiffness and topography, we imprint nanostripe patterns on undeveloped and developed SU-8 photoresist films using electron-beam lithography (EBL). Elastic deformations of the substrate surfaces and the cells

Microbubbles decorated with dendronized magnetic nanoparticles for biomedical imaging: effective stabilization via fluorous interactions

• Da Shi,
• Justine Wallyn,
• Dinh-Vu Nguyen,
• Francis Perton,
• Delphine Felder-Flesch,
• Sylvie Bégin-Colin,
• Mounir Maaloum and
• Marie Pierre Krafft

Beilstein J. Nanotechnol. 2019, 10, 2103–2115, doi:10.3762/bjnano.10.205

• 5.0 ± 1.0 nm, respectively. These measurements are in agreement with earlier reports [43]. Figure 11A shows an AFM topography image of a mixed film composed of DPPC and IONP@C2F5OEG8Den. The IONPs are embedded within the DPPC monolayer domains in which they are well-dispersed, showing no tendency to

• the bubble characteristics and stability. For further experimental details see [48]. Each measurement was repeated three times for different bubble preparations. The volume of the microbubble dispersion injected in the acoustic cell was 2 mL. AFM topography analysis of mixed films of DPPC and

• @C4F9OEG8 (blue). Schematic representation of dendronized IONPs a) incorporated within the MB DPPC shell and b) located at the surface of this shell. AFM topography images (1 × 1 µm) and height profiles of a) IONP@C2F5OEG8Den and b) IONP@C2H5OEG8Den. Dispersions of IONPs in ethanol (0.002 mg mL−1) were spin

Ion mobility and material transport on KBr in air as a function of the relative humidity

• Dominik J. Kirpal,
• Korbinian Pürckhauer,
• Alfred J. Weymouth and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

• from 25.0% to 35.1% within a time period of 46 h. Figure 2b and Figure 2c show the surface topography directly before and after this period. It can be observed that the accumulated material around the top right and the middle left structure has completely eroded. Also, for the other structures only a

• on the surface. This state is observed by the AFM technique as the surface topography. (2) In the second state the ions are dissolved in the hydration layer or in a physiosorbed or precursor state [30], which shows a high mobility and cannot be imaged. The material from the accumulation over time

Nanostructured and oriented metal–organic framework films enabling extreme surface wetting properties

• Andre Mähringer,
• Julian M. Rotter and
• Dana D. Medina

Beilstein J. Nanotechnol. 2019, 10, 1994–2003, doi:10.3762/bjnano.10.196

• (OCA) of diiodomethane on these pellets reveals an inverse wetting phenomenon. Under these conditions, the M-CAT-1 materials reject oil and turn oleophobic with an OCA of 90° (Figure 1H). Constructing nanostructured M-CAT-1 surfaces According to Wenzel’s model, film topography has a strong impact on

Nanoarchitectonics meets cell surface engineering: shape recognition of human cells by halloysite-doped silica cell imprints

• Elvira Rozhina,
• Ilnur Ishmukhametov,
• Svetlana Batasheva,
• Farida Akhatova and
• Rawil Fakhrullin

Beilstein J. Nanotechnol. 2019, 10, 1818–1825, doi:10.3762/bjnano.10.176

• , fixed with formaldehyde, sputter-coated with a thin gold layer and then imaged using a Hitachi SU8000 microscope. As shown in Figure 2D–F, the typical smooth surface topography of HeLa cells was changed drastically by the deposition of either pure or halloysite-doped silica. Analysing the cell diameter

• cells and (G) HeLa cells coated with halloysite-doped silica shells. Atomic force microscopy (PeakForce Tapping mode) images of inorganic silica/halloysite imprints templated on HeLa cells: (A) topography image, (B) non-specific adhesion map; (C) scanning electron microscopy image of inorganic silica

Growth dynamics and light scattering of gold nanoparticles in situ synthesized at high concentration in thin polymer films

• Corentin Guyot,
• Philippe Vandestrick,
• Ingrid Marenne,
• Olivier Deparis and
• Michel Voué

Beilstein J. Nanotechnol. 2019, 10, 1768–1777, doi:10.3762/bjnano.10.172

• were imaged by AFM. A typical image of 5 μm × 5 μm size is presented in Figure 5a. It unambiguously shows the presence of the AuNPs. The topography of the samples was characterized by the average surface roughness parameter (Sa) and by the root-mean-square surface roughness parameter (Sq). For the

• angle of incidence (AOI) of θi = −20° (note that incidence angles are conventionally negative in BRDF measurements). A 12 mW HeNe Laser was also used in preliminary experiments in order to qualitatively evidence scattering after the annealing of the samples. Atomic force microscopy The topography of the

• °). Azimuth angles are varied along these circles (0–360°). Scattered intensity in the plane orthogonal to the incidence plane (azimuth 90° or 270°) as a function of the scattering angle. (A) Non-annealed sample; (B) sample annealed for 120 min at 135 °C. AFM topography images (Color scale bars in nanometers

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He⁺: Projected images and intensity patterns

• Michael Mousley,
• Santhana Eswara,
• Olivier De Castro,
• Olivier Bouton,
• Nico Klingner,
• Christoph T. Koch,
• Gregor Hlawacek and
• Tom Wirtz

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

• suggests that the orientation of the particle surface is responsible for the direction of deflection. The local surface topography then defines the caustic pattern and the exact position of the bright points around the edge. Figure 4C shows that there is still a large amount of intensity at the center of

• increased rate of charging. However, the motion of the spots could also be due to the most intense section of the beam (i.e., the focal plane of Lens 2) intersecting with different positions along the surfaces of the charged sample, having varying topography, which then deflect the beam to different

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• ranging from 1000 to 6000 rpm. The resulting cover thicknesses were 52, 117, 185, 380, and 653 nm as measured by AFM. Furthermore, the top surface was smoothed to eliminate the cross-talk of surface topography in subsurface CR-AFM imaging. Our experiments were performed on an MFP-3D Origin AFM (Asylum

• . The obtained topography and resonance frequency images are shown in Figure 2a and Figure 2b, respectively. We can clearly discern the circuit pattern from the resonance frequency image, which cannot be found in the topography. This verifies the CR-AFM’s capability in detecting subsurface circuit

• sample was scanned with the PPP-FM cantilever by using its first mode under an applied normal force of 1162 nN. The obtained topography and the resonance frequency image are shown in Figure 9b and Figure 9c, respectively. Even the smallest defects can be clearly observed from the CR-AFM frequency image

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• , providing the possibility of obtaining current maps as well as I–V characteristics at a given spot. Figure 2a and Figure 2b show the topography and current maps of the TiO nanowire network on SrTiO3(100). TiO has a higher conductivity than the surrounding SrTiO3 (STO) surface (the no current areas at

• topography and work function of the same area. Differences in the WF are as high as 900 meV between TiO and SrTiO3, in favor of TiO. However, there is also a certain variation within the TiO and SrTiO3 structures, which will be discussed later. The bias sweep measurements presented in Figure 2f show

• 3D topography overprinted image with color scale representing the WF is shown in Figure 3a. The WF of titanium monoxide varies to as high as 300 meV, even within one nanowire. This is not an imaging artifact but rather a morphological-related feature, which is proved by the two profiles obtained for

Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology

• Loïc Crouzier,
• Alexandra Delvallée,
• Sébastien Ducourtieux,
• Laurent Devoille,
• Guillaume Noircler,
• Christian Ulysse,
• Olivier Taché,
• Elodie Barruet,
• Christophe Tromas and
• Nicolas Feltin

Beilstein J. Nanotechnol. 2019, 10, 1523–1536, doi:10.3762/bjnano.10.150

• Figure 8. The profiles correspond to the intensity in grey level and the topography of the sample along the NP diameter for SEM and AFM measurements, respectively. For simplicity, the SEM diameter used here corresponds to DSEM, i.e., the projected area-equivalent diameter. Figure 7a and Figure 7b

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

• Petr Knotek,
• Tomáš Plecháček,
• Jan Smolík,
• Petr Kutálek,
• Filip Dvořák,
• Milan Vlček,
• Jiří Navrátil and
• Čestmír Drašar

Beilstein J. Nanotechnol. 2019, 10, 1401–1411, doi:10.3762/bjnano.10.138

• tunneling microscopy (STM) [27][28] or by using AFM in the semicontact mode. The latter enables a describtion not only of the topography (size and shape) but also a detection of the changes in density, stiffness and adhesion of NPs [20][21][24][29][30]. In the present study we demonstrate that the Schottky

• had to be used to decrease the plasma intensity. The topography, phase shift image, Kelvin probe force microscopy and I–V characteristics were measured by the AFM SolverPro M, Nt-MDT (Russia) with a resolution of 512 × 512 pixels. The HA_NC tips (resonant frequency 140 kHz, force constant 3.5 N/m

• potential difference) measurement was achieved by the modulation of the VAC at a frequency higher than the bandwidth of the topography feedback system. The topography was measured by the oscillation at the first resonance frequency of the AFM tip, and VCPD was measured by the amplitude of the oscillation at

Highly ordered mesoporous silica film nanocomposites containing gold nanoparticles for the catalytic reduction of 4-nitrophenol

• Mohamad Azani Jalani,
• Leny Yuliati,
• Siew Ling Lee and
• Hendrik O. Lintang

Beilstein J. Nanotechnol. 2019, 10, 1368–1379, doi:10.3762/bjnano.10.135

• TEM 3D tomography at low accelerating voltage with topography-based reconstruction to show the pore orientation at the various angles with the presence of AuNPs (see Supporting Information File 1 for the movie). Optical properties of AuNPs Surface plasmon resonance (SPR) peaks in the UV–vis spectrum