Advanced atomic force microscopy techniques III

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Editor: Dr. Thilo Glatzel
University of Basel
 
Atomic force microscopy is the standard tool for nanometer-scale imaging of all types of surfaces in all environments. The third volume of the Thematic Series “Advanced atomic force microscopy techniques”, which is presented here, compiles again exciting developments in nanoscale research. The second volume was edited by Thilo Glatzel and Thomas Schimmel, the first volume by Thilo Glatzel and Udo D. Schwarz.

See also the Thematic Series:
Advanced atomic force microscopy techniques IV

Noncontact atomic force microscopy III

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Advanced atomic force microscopy techniques III

  • Thilo Glatzel and
  • Thomas Schimmel

Beilstein J. Nanotechnol. 2016, 7, 1052–1054, doi:10.3762/bjnano.7.98

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Published 21 Jul 2016

Modification of a single-molecule AFM probe with highly defined surface functionality

  • Fei Long,
  • Bin Cao,
  • Ashok Khanal,
  • Shiyue Fang and
  • Reza Shahbazian-Yassar

Beilstein J. Nanotechnol. 2014, 5, 2122–2128, doi:10.3762/bjnano.5.221

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Published 14 Nov 2014

Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy

  • Enrique A. López-Guerra and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 2149–2163, doi:10.3762/bjnano.5.224

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Published 18 Nov 2014

High-frequency multimodal atomic force microscopy

  • Adrian P. Nievergelt,
  • Jonathan D. Adams,
  • Pascal D. Odermatt and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

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Published 22 Dec 2014

Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM

  • Kfir Kuchuk and
  • Uri Sivan

Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14

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Published 13 Jan 2015

Increasing throughput of AFM-based single cell adhesion measurements through multisubstrate surfaces

  • Miao Yu,
  • Nico Strohmeyer,
  • Jinghe Wang,
  • Daniel J. Müller and
  • Jonne Helenius

Beilstein J. Nanotechnol. 2015, 6, 157–166, doi:10.3762/bjnano.6.15

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Published 14 Jan 2015

Kelvin probe force microscopy in liquid using electrochemical force microscopy

  • Liam Collins,
  • Stephen Jesse,
  • Jason I. Kilpatrick,
  • Alexander Tselev,
  • M. Baris Okatan,
  • Sergei V. Kalinin and
  • Brian J. Rodriguez

Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19

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Published 19 Jan 2015

Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments

  • Horacio V. Guzman,
  • Pablo D. Garcia and
  • Ricardo Garcia

Beilstein J. Nanotechnol. 2015, 6, 369–379, doi:10.3762/bjnano.6.36

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Published 04 Feb 2015

Influence of spurious resonances on the interaction force in dynamic AFM

  • Luca Costa and
  • Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

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Published 10 Feb 2015

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

  • M. Kalyan Phani,
  • Anish Kumar,
  • T. Jayakumar,
  • Walter Arnold and
  • Konrad Samwer

Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79

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Published 18 Mar 2015

Capillary and van der Waals interactions on CaF2 crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions

  • Annalisa Calò,
  • Oriol Vidal Robles,
  • Sergio Santos and
  • Albert Verdaguer

Beilstein J. Nanotechnol. 2015, 6, 809–819, doi:10.3762/bjnano.6.84

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Published 25 Mar 2015

Stick–slip behaviour on Au(111) with adsorption of copper and sulfate

  • Nikolay Podgaynyy,
  • Sabine Wezisla,
  • Christoph Molls,
  • Shahid Iqbal and
  • Helmut Baltruschat

Beilstein J. Nanotechnol. 2015, 6, 820–830, doi:10.3762/bjnano.6.85

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Published 26 Mar 2015

Stiffness of sphere–plate contacts at MHz frequencies: dependence on normal load, oscillation amplitude, and ambient medium

  • Jana Vlachová,
  • Rebekka König and
  • Diethelm Johannsmann

Beilstein J. Nanotechnol. 2015, 6, 845–856, doi:10.3762/bjnano.6.87

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Published 30 Mar 2015

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

  • Mykola Telychko,
  • Jan Berger,
  • Zsolt Majzik,
  • Pavel Jelínek and
  • Martin Švec

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

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Published 07 Apr 2015

Automatic morphological characterization of nanobubbles with a novel image segmentation method and its application in the study of nanobubble coalescence

  • Yuliang Wang,
  • Huimin Wang,
  • Shusheng Bi and
  • Bin Guo

Beilstein J. Nanotechnol. 2015, 6, 952–963, doi:10.3762/bjnano.6.98

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Published 14 Apr 2015

Optimization of phase contrast in bimodal amplitude modulation AFM

  • Mehrnoosh Damircheli,
  • Amir F. Payam and
  • Ricardo Garcia

Beilstein J. Nanotechnol. 2015, 6, 1072–1081, doi:10.3762/bjnano.6.108

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Published 28 Apr 2015

Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy

  • Andrzej J. Kulik,
  • Małgorzata Lekka,
  • Kyumin Lee,
  • Grazyna Pyka-Fościak and
  • Wieslaw Nowak

Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118

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Published 15 May 2015

Tattoo ink nanoparticles in skin tissue and fibroblasts

  • Colin A. Grant,
  • Peter C. Twigg,
  • Richard Baker and
  • Desmond J. Tobin

Beilstein J. Nanotechnol. 2015, 6, 1183–1191, doi:10.3762/bjnano.6.120

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Published 20 May 2015

Nano-contact microscopy of supracrystals

  • Adam Sweetman,
  • Nicolas Goubet,
  • Ioannis Lekkas,
  • Marie Paule Pileni and
  • Philip Moriarty

Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126

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Published 29 May 2015

Atomic force microscopy as analytical tool to study physico-mechanical properties of intestinal cells

  • Christa Schimpel,
  • Oliver Werzer,
  • Eleonore Fröhlich,
  • Gerd Leitinger,
  • Markus Absenger-Novak,
  • Birgit Teubl,
  • Andreas Zimmer and
  • Eva Roblegg

Beilstein J. Nanotechnol. 2015, 6, 1457–1466, doi:10.3762/bjnano.6.151

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Published 06 Jul 2015

Lower nanometer-scale size limit for the deformation of a metallic glass by shear transformations revealed by quantitative AFM indentation

  • Arnaud Caron and
  • Roland Bennewitz

Beilstein J. Nanotechnol. 2015, 6, 1721–1732, doi:10.3762/bjnano.6.176

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Published 13 Aug 2015

A simple method for the determination of qPlus sensor spring constants

  • John Melcher,
  • Julian Stirling and
  • Gordon A. Shaw

Beilstein J. Nanotechnol. 2015, 6, 1733–1742, doi:10.3762/bjnano.6.177

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Published 14 Aug 2015

Electrospray deposition of organic molecules on bulk insulator surfaces

  • Antoine Hinaut,
  • Rémy Pawlak,
  • Ernst Meyer and
  • Thilo Glatzel

Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195

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Published 18 Sep 2015
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