Nanoanalytics for materials science

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Editor: Dr. Thilo Glatzel
University of Basel
 
With the progress in fabricating more energy efficient and sustainable devices, an increased need for advanced materials and processing techniques arises that becomes increasingly challenging and demands for new analysis techniques. In particular excellent spatial resolution together with high-sensitivity chemical information at the nanoscale are of utmost importance for future developments. These nanoanalytical techniques need detailed understanding of the physical processes included in both the device structures and detection techniques. A typical setup includes a probe (such as tip, ion beam or electron beam), the condition of the sample and the interaction between them, which all need to be extensively investigated by simulations and modeling in order to obtain an in-depth and reliable understanding and accurate physical models. Furthermore, a reliable and easy way to extract a maximum of information out of the multimodal datasets, efficient data visualization strategies, and methods for analysis, mining and modeling are of utmost importance. This Thematic Series groups six exciting articles around the aforementioned aspects of nanoanalytics, describing the development of both new instrumentation as well as new methodologies.
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Nanoanalytics for materials science

  • Thilo Glatzel and
  • Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1674–1675, doi:10.3762/bjnano.7.159

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Editorial
Published 10 Nov 2016

Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

  • Sebastian Gutsch,
  • Daniel Hiller,
  • Jan Laube,
  • Margit Zacharias and
  • Christian Kübel

Beilstein J. Nanotechnol. 2015, 6, 964–970, doi:10.3762/bjnano.6.99

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Published 15 Apr 2015

High sensitivity and high resolution element 3D analysis by a combined SIMS–SPM instrument

  • Yves Fleming and
  • Tom Wirtz

Beilstein J. Nanotechnol. 2015, 6, 1091–1099, doi:10.3762/bjnano.6.110

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Published 30 Apr 2015

Thermal treatment of magnetite nanoparticles

  • Beata Kalska-Szostko,
  • Urszula Wykowska,
  • Dariusz Satula and
  • Per Nordblad

Beilstein J. Nanotechnol. 2015, 6, 1385–1396, doi:10.3762/bjnano.6.143

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Published 23 Jun 2015

Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

  • Eyup Cinar,
  • Ferat Sahin and
  • Dalia Yablon

Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205

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Published 12 Oct 2015

Free vibration of functionally graded carbon-nanotube-reinforced composite plates with cutout

  • Mostafa Mirzaei and
  • Yaser Kiani

Beilstein J. Nanotechnol. 2016, 7, 511–523, doi:10.3762/bjnano.7.45

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Published 07 Apr 2016

Customized MFM probes with high lateral resolution

  • Óscar Iglesias-Freire,
  • Miriam Jaafar,
  • Eider Berganza and
  • Agustina Asenjo

Beilstein J. Nanotechnol. 2016, 7, 1068–1074, doi:10.3762/bjnano.7.100

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Published 25 Jul 2016
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