Ultrathin water layers on mannosylated gold nanoparticles

• Maiara A. Iriarte Alonso,
• Jorge H. Melillo,
• Silvina Cerveny,
• Yujin Tong and
• Alexander M. Bittner

Beilstein J. Nanotechnol. 2025, 16, 2183–2198, doi:10.3762/bjnano.16.151

• hydrophobic tips. While VSFG indicated preferential hydration of the dimannoside and proved conformational changes in the organic ligands, AFM provided sub-nanometer changes in particle topography due to water adsorption. In general, the dimannoside nanoparticles condense ultrathin water layers upon humidity

• , Section S1). We used heavy metal staining in STEM on the nanometer scale, to distinguish the organic ligand shell from the gold core. The main method, however, was “noncontact” (AC mode) AFM. Its advantage lies in obtaining a very detailed surface topography through height images. This also includes

• to the nanoscale, we found a homogenous dispersion of the particles (Figure 6B). This is supported by AFM topography images at the nanoscale (Figure 6C). In contrast, PEG AuNPs are not well dispersed, with more agglomerates (see the analogous Figure 6G–I), and particle clusters form microscale

Microplastic pollution in Himalayan lakes: assessment, risks, and sustainable remediation strategies

• Sameeksha Rawat,
• S. M. Tauseef and
• Madhuben Sharma

Beilstein J. Nanotechnol. 2025, 16, 2144–2167, doi:10.3762/bjnano.16.148

• widely used to simulate groundwater flow and contaminant transport processes [20]. Such models have been adapted to cold mountain environments by adding glacier-fed recharge zones, freeze–thaw processes in soils, and topography-induced flow [21]. Semi-distributed models such as SWAT and MIKE SHE have

Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization

• Yanping Wei,
• Jiafeng Shen,
• Yirong Yao,
• Xuke Li,
• Ming Li and
• Peiling Ke

Beilstein J. Nanotechnol. 2025, 16, 2077–2085, doi:10.3762/bjnano.16.142

• withdraw with the sample surface periodically, forming a force curve. The peak force, identified within this curve, is utilized as a feedback parameter. By sustaining a constant peak force between the probe and the sample, the topography of the sample can be obtained. Quantitative mechanical properties of

• -frequency noise and baseline drift, ensuring stable force feedback for accurate topography and quantitative mechanical mapping. These processing routines are factory-implemented and operate transparently to the user [23]. The unfiltered signal branch of the high-eigenmode detection path is routed directly

• stiffness, insufficient sample deformation led to significant variability in modulus measurements (Figure 3b), indicating the ScanAsyst-Air probe was unsuitable for reliable Young’s modulus quantification. Comparative analysis revealed a high degree of similarity in the topography, modulus, and adhesion

Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

• Thomas Mathias,
• Roland Bennewitz and
• Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

• ); mechanical property measurements; surface science; Introduction Atomic force microscopy (AFM) has become an indispensable tool for imaging the surface topography on a variety of surfaces [1]. Since the invention of the AFM [2], several other modes of AFM have been developed, including friction force

• their polymerization/deposition. The topography of the surface was measured before acquiring a force-versus-distance measurement to ensure that these measurements were acquired on clean and flat regions of the substrate. To observe how the resonant frequency of the AFM cantilever changes as the attached

Low-temperature AFM with a microwave cavity optomechanical transducer

• Ermes Scarano,
• Elisabet K. Arvidsson,
• August K. Roos,
• Erik Holmgren,
• Riccardo Borgani,
• Mats O. Tholén and
• David B. Haviland

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

• –surface distance, oscillation amplitude of the driven cantilever, sharpness of the tip, and pickup of environmental vibrations and noise, such as noise from the actuator driving the cantilever oscillation as well as feedback noise and sample topography. We perform initial positioning of the microscope by

• resolution of 100 pixels/line. In order to track the surface topography while scanning, we developed a proportional-integral-derivative (PID) control firmware running on the embedded real-time processing unit of the microwave multifrequency lock-in amplifier (Presto by Intermodulation Products AB). The

• feedback system must be able to follow rapid changes in topography while avoiding feedback oscillation. Depending on the mode of operation, AM-AFM or FM-AFM, the PID setpoint and error signal are determined, respectively, from the amplitude or phase of the motional sideband, which is the up-converted

Electrical, photocatalytic, and sensory properties of graphene oxide and polyimide implanted with low- and medium-energy silver ions

• Josef Novák,
• Eva Štěpanovská,
• Petr Malinský,
• Vlastimil Mazánek,
• Jan Luxa,
• Ulrich Kentsch and
• Zdeněk Sofer

Beilstein J. Nanotechnol. 2025, 16, 1794–1811, doi:10.3762/bjnano.16.123

• lowest fluence (GO and PI, 3.75 × 1012 cm−2), suggesting that, at greater implantation depths, subsurface effects and Ag-induced electronic modifications play a more important role than surface topography alone. These results indicate that the key to maximizing photocatalytic efficiency is not to

Mechanical stability of individual bacterial cells under different osmotic pressure conditions: a nanoindentation study of Pseudomonas aeruginosa

• Lizeth García-Torres,
• Idania De Alba Montero,
• Eleazar Samuel Kolosovas-Machuca,
• Facundo Ruiz,
• Sumati Bhatia,
• Jose Luis Cuellar Camacho and
• Jaime Ruiz-García

Beilstein J. Nanotechnol. 2025, 16, 1171–1183, doi:10.3762/bjnano.16.86

• specific molecular agents is critical in generating strategies to control their undesired propagation. Atomic force microscopy (AFM) is a powerful, sensitive technique that scans the surface topography of a sample with an ultra-sharp tip while monitoring the interaction forces between this tip and the

• force–separation curve analyzed in real time by the software. A color-coded map is obtained according to the physical parameters extracted from the curve, as shown in Figure 1B,C. Figure 2 shows an FV image of the topography or height channel for several individual PA bacteria on the substrate. An

• hypertonic conditions. Force–volume AFM demonstrated its capacity for testing the mechanical properties of multiple bacteria at once. This mechanical nanoscale mapping allowed us to successfully discriminate the minute variations in the surface topography of bacteria (h), their mechanical resistance to

Influence of ion beam current on the structural, optical, and mechanical properties of TiO₂ coatings: ion beam-assisted vs conventional electron beam evaporation

• Agata Obstarczyk and
• Urszula Wawrzaszek

Beilstein J. Nanotechnol. 2025, 16, 1097–1112, doi:10.3762/bjnano.16.81

• properties tests. The results of surface topography measurements before and after abrasion tests for the annealed TiO2 thin films are included in Figure 9. Before the abrasion test, all coatings were homogeneous and had low roughness values from 2.0 to 2.5 nm. However, after the steel wool tests, the film

• surface topography measurements before and after abrasion tests of TiO2 thin films deposited by EBE (a) without and with IBAD with ion beam gun currents of (b) Iibg = 3 A and (c) Iibg = 4 A. Results of surface topography measurements before and after abrasion tests of TiO2 thin films deposited by EBE (a

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• topography is acquired. SICM is particularly well suited for biological applications, as it is a non-contact method with minimal interaction forces, preserving the native state of the sample [27]. To date, SICM investigations of mitochondria have been limited to subsarcolemmal mitochondria, specifically in

• this work, we employ SICM to investigate the shape, dynamics, and nanomorphology of metabolically active, isolated mitochondria, with a specific focus on the outer mitochondrial membrane. Furthermore, we identify and characterise two distinct dynamic effects observed in time-dependent topography data

• . Apparent heights varied between 0.2 and 2.8 μm, with an average of 1.2 μm. The topography shows shallow irregular undulations with an amplitude and spatial dimension of approximately 100 nm. Statistical analyses comparing the spherical or ellipsoidal with the irregular mitochondria are provided in Figure

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• acquiring data in the constant height mode, we invert Δf images so that a steeper force gradient appears as a brighter feature corresponding to an elevation in an image of the same feature taken in the constant frequency shift (topography) mode. Arrows in the upper right corner of Δf images represent the

Ar⁺ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

• Manu Bura,
• Divya Gupta,
• Arun Kumar and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 872–886, doi:10.3762/bjnano.16.66

• using a WITec alpha300 RA Raman spectrometer under excitation with a 532 nm solid-state diode laser operated at 10 mW. The topography of the films is examined using atomic force microscopy (AFM) with a Bruker Multimode 8 instrument. The surface morphology of pristine and implanted films is further

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

• Shafaq Kazim,
• Rahul Parmar,
• Maryam Azizinia,
• Matteo Amati,
• Muhammad Rauf,
• Andrea Di Cicco,
• Seyed Javid Rezvani,
• Dario Mastrippolito,
• Luca Ottaviano,
• Tomasz Klimczuk,
• Luca Gregoratti and
• Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

• ) AFM images of mechanically exfoliated CrCl3 flakes on the native Si (1 nm SiO2) substrate. (c) AFM thickness profile scans along the various flakes as denoted in Figure 1b. Optical contrast on ITO substrates (a) before and (b) after the SPEM measurements. (c, d) AFM topography images of CrCl3 on the

• SiO2/Si substrate. (a) Topography from non-contact mode AFM of two flakes with different thicknesses; (b) Kelvin surface potential of the samples on SiO2; (c) z-profiles of the two flakes; (d) Kelvin surface potential scans along the profiles of (a). A Pt-coated tip was used. (a)Topography from non

The impact of tris(pentafluorophenyl)borane hole transport layer doping on interfacial charge extraction and recombination

• Konstantinos Bidinakis and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 678–689, doi:10.3762/bjnano.16.52

• during the amplitude modulation topography scan. Supporting Information File 1, Figure S4 and Table S1, show the layered structure and layer thickness for each of the ion polished devices from the four batches. An important note that is highlighted by these measurements is that the optimal HTL thickness

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

• Pascal N. Rohrbeck,
• Lukas D. Cavar,
• Franjo Weber,
• Peter G. Reichel,
• Mara Niebling and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

• parts [93], leading to a strong nanoscale contrast in the dielectric signal. On the silicon substrate, F14H20 formed groups of spherical particles with a diameter of 40 ± 5 nm (Figure 7a) [94][95]. Simultaneously with the topography, we recorded the C″ amplitude and phase at electrical excitation

• the Pt/Ir-coated conductive cantilevers (NuNano SPARK-150Pt and MikroMasch HQ:NSC18/Pt) was ≈75 kHz; the levers had a spring constant of 2–3 N·m−1, a tip radius of 18 nm, and a tip height of 10–18 μm. The topography feedback measurements were performed with amplitude modulation on the first eigenmode

• part shows the excitation frequencies () and the detection frequencies () of the applied frequencies. The red arrow corresponds to topography, and the blue arrow corresponds to the electrical signal. The representation of Figure 1 was inspired by [18][26]. A comparison of heterodyne Kelvin probe force

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• topography and overall uniformity of the deposit (Figure 2a). The thickness profile extracted from the AFM data (Figure 2b) shows a dip at the center of the deposit. This shape is typical of the spiral scanning method when the rate of adsorbate dissociation exceeds the rate of adsorbate supply. The resulting

Performance optimization of a microwave-coupled plasma-based ultralow-energy ECR ion source for silicon nanostructuring

• Joy Mukherjee,
• Safiul Alam Mollick,
• Tanmoy Basu and
• Tapobrata Som

Beilstein J. Nanotechnol. 2025, 16, 484–494, doi:10.3762/bjnano.16.37

• the transformative impact of nanopatterning through low-energy inert ions. Keywords: optimization of ion current; surface topography; TEM; ultralow-energy ECR-based ion source; UV–vis spectroscopy; Introduction Ion sources serve as fundamental components in numerous scientific and industrial

• ions at different incidence angles and for various irradiation times is investigated using AFM in tapping mode. Si cantilevers with tip radii of 10 nm were employed, with scan rate of 1 µm/s and a fixed scan size of 5 µm × 5 µm. Quantitative analysis of the surface topography was conducted using WSxM

• formation of well-defined parallel ripples at off-normal incidence. Figure 7 illustrates the surface topography after 450 eV Ar-ion bombardment of the silicon surface at an angle of 72.5° as function of the bombardment time. 3D AFM images are presented along with 2D surface topography images. Generally, the

ReactorAFM/STM – dynamic reactions on surfaces at elevated temperature and atmospheric pressure

• Tycho Roorda,
• Hamed Achour,
• Matthijs A. van Spronsen,
• Marta E. Cañas-Ventura,
• Sander B. Roobol,
• Willem Onderwaater,
• Mirthe Bergman,
• Peter van der Tuijn,
• Gertjan van Baarle,
• Johan W. Bakker,
• Joost W. M. Frenken and
• Irene M. N. Groot

Beilstein J. Nanotechnol. 2025, 16, 397–406, doi:10.3762/bjnano.16.30

• the same color contrast as in Figure 5c). By observing the root-mean-squared (RMS) surface roughness (Rq) under UHV conditions of 0.17 nm in topography and 50 pA in the current signal, we determine that the surface is rather smooth and flat. In contrast, under oxidation conditions, the surface

• roughness in topography is increased to 0.63 nm because of the more challenging scanning conditions. However, the current signal surface roughness increases by an order of magnitude to 760 pA with respect to Figure 5c. This significant increase in surface roughness, which can be observed as the appearance

• images are topography images, and the bottom two images show the simultaneous current signal. (a) and (c) were taken under UHV conditions with dF = 7 Hz and bias voltage of −500 mV applied to the sample. (b) and (d) show the surface under 0.5 bar of O2 pressure and were taken with dF = 5 Hz and bias

Development of a mucoadhesive drug delivery system and its interaction with gastric cells

• Ahmet Baki Sahin,
• Serdar Karakurt and
• Deniz Sezlev Bilecen

Beilstein J. Nanotechnol. 2025, 16, 371–384, doi:10.3762/bjnano.16.28

• ) nanoparticles, topography, surface composition, size, and charge distribution of the delivery system were determined. The topography of the nanoparticles was studied with SEM (Figure 1). Both Alg and EudAlg nanoparticles are spherical with smooth surfaces (Figure 1A,B). It should be noted that during SEM

Tailoring of physical properties of RF-sputtered ZnTe films: role of substrate temperature

• Kafi Devi,
• Usha Rani,
• Arun Kumar,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 333–348, doi:10.3762/bjnano.16.25

• ) spectrophotometer under 320 nm excitation produced by a xenon arc lamp. For investigating the surface topography, atomic force microscopy (AFM) micrographs of ZnTe/Qz films were recorded (scan area 2 × 2 µm2) using a Bruker multimode-8 AFM in the ScanAsyst mode at the Ion Beam Centre, Kurukshetra University. The

Graphene oxide–chloroquine conjugate induces DNA damage in A549 lung cancer cells through autophagy modulation

• Braham Dutt Arya,
• Sandeep Mittal,
• Prachi Joshi,
• Alok Kumar Pandey,
• Jaime E. Ramirez-Vick,
• Govind Gupta and
• Surinder P. Singh

Beilstein J. Nanotechnol. 2025, 16, 316–332, doi:10.3762/bjnano.16.24

• ][51]. Further, the morphology and topography of GO nanosheets were analyzed employing atomic force microscopy. Supporting Information File 1, Figure S2 reveals the appearance of few layered interlocked GO nanosheets, and the topographical analysis reveals the thickness in the range of 0.6 to 1.06 nm

Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• monolayers (SAMs) and conducting AFM [10]. The authors find that rougher surfaces lead to stronger variations in conductivity, and it is suggested that a correlation of topography and conductivity maps is carried out to identify suitable areas for a representative averaging of conductivity values. Müller et

Ultrablack color in velvet ant cuticle

• Vinicius Marques Lopez,
• Wencke Krings,
• Juliana Reis Machado,
• Stanislav Gorb and
• Rhainer Guillermo-Ferreira

Beilstein J. Nanotechnol. 2024, 15, 1554–1565, doi:10.3762/bjnano.15.122

• underlying cuticle features a microstructured topography [26]. These concave structures scatter light and enhance absorption by melanin, serving as an antireflective feature and creating ultrablack colors [26]. In another beetle species, Euprotaetia inexpectata (Coleoptera: Scarabaeidae), a complex

A biomimetic approach towards a universal slippery liquid infused surface coating

• Ryan A. Faase,
• Madeleine H. Hummel,
• AnneMarie V. Hasbrook,
• Andrew P. Carpenter and
• Joe E. Baio

Beilstein J. Nanotechnol. 2024, 15, 1376–1389, doi:10.3762/bjnano.15.111

• with a fluid similar to blood [24]. AFM is a technique that provides topographical information through a nanoscale probe [25]. After each successive layer of the coating the topography of the surface will change and can be measured via AFM. SFG is a surface-sensitive non-linear spectroscopic technique

• substrates and were representative of a covalent carbon-sulfur bond [43]. AFM highlighted the level of roughness at each stage of the coating to show a rougher topography for the final layer. Results for each layer of the coating are shown in Supporting Information File 1, Figure S1 and reported as root mean

Hymenoptera and biomimetic surfaces: insights and innovations

• Vinicius Marques Lopez,
• Carlo Polidori and
• Rhainer Guillermo Ferreira

Beilstein J. Nanotechnol. 2024, 15, 1333–1352, doi:10.3762/bjnano.15.107

• , bioabsorbable surgical clamps modeled after the morphology and topography of the A. laevigata mandible, characterized by smooth internal regions and rougher external surfaces, could significantly improve grip and functionality [65]. Furthermore, the unique kinematic features of ant mandibles, such as the mobile

Interaction of graphene oxide with tannic acid: computational modeling and toxicity mitigation in C. elegans

• Romana Petry,
• James M. de Almeida,
• Francine Côa,
• Felipe Crasto de Lima,
• Diego Stéfani T. Martinez and
• Adalberto Fazzio

Beilstein J. Nanotechnol. 2024, 15, 1297–1311, doi:10.3762/bjnano.15.105

• possible to identify interactions between these groups and GO’s carbon structure and between carbon atoms of both structures. Furthermore, we analyzed the maximum heights of TA-plus-GO conformations among the snapshots. The values range from 1.5 to 3.0 nm, which corroborates with AFM topography results and