Structural and optical characteristics determined by the sputtering deposition conditions of oxide thin films

• Petronela Prepelita,
• Florin Garoi and
• Valentin Craciun

Beilstein J. Nanotechnol. 2021, 12, 354–365, doi:10.3762/bjnano.12.29

• ). The system is equipped with an X-ray source and an EDX unit with elementary energy dispersion spectroscopy (EDS). These analyses employ different magnifications depending on the quality of the thin films and the structure of their surface. Using cross-section imaging and a magnification of 20000×, it

• was possible to gain information related to the thickness of our samples. The high-resolution elementary microanalysis of the cross section perpendicular to the surface of the thin films was performed in manual mode, where the adjustment device allowed the manual setting of the tilt angle from −90° to

• +90°. Therefore, the dynamic focusing with tilt angle was successfully used. The thickness was measured by the cross-section technique of the SEM analysis, with a margin of error of ±5% (2–5 nm) compared to a standard 100 nm thick sample. Optical transmission spectra were acquired using a UV–vis–NIR

Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• work is to determine the varying dielectric constant of a biological nanostructured system via electrostatic force microscopy (EFM) and to show how this method is useful to study natural photonic crystals. We mapped the dielectric constant of the cross section of the posterior wing of the damselfly

• wings appear as the external discontinuous regions of the multilayered structure. The number of nanolayers and their thickness values change from one color region to another. The ventral and dorsal sides shown in Figure 1 can be seen in cross section in the images of Figure 6, where the ventral side is

• about (210 ± 10) nm wide, matching the reddish color of the whole ventral side of the wing, as seen in Figure 1b. Figure 7 shows the average value of the relativity permittivity, for each region, along the cross section of the wing (the area between the vertical white dashed lines in the figure). The

A review on the green and sustainable synthesis of silver nanoparticles and one-dimensional silver nanostructures

• Sina Kaabipour and
• Shohreh Hemmati

Beilstein J. Nanotechnol. 2021, 12, 102–136, doi:10.3762/bjnano.12.9

• –gel technique at 100 °C and produced particles with an average diameter of 25 nm with hexagonal cross section. In the sol–gel process, besides temperature and gel composition, the solvent plays an important role in determining the size, morphology, and surface characteristics of the synthesized AgNPs

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• analysis (mPCA) from a kr/Fattr diagram. A third sample comprised of (3) epoxy/polycarbonate/boehmite is measured by ImAFM. The measurement of a 2 × 2 µm cross section yields 128 × 128 force curves which are successfully evaluated by a kr/Fattr diagram and the nanoscopic heterogeneity of the sample is

• , therefore, a mixed behavior. This is supported by the corresponding mixed mechanical behavior, as seen in the kr/Fattr diagram (Figure 4d, top right). It has to be taken into account that the topography only shows a cross section of a three-dimensional structured composite and PC spherulites might extend

• and an inorganic phase and is described in detail by Khorasani and coworkers [16]. A layer of boehmite is sandwiched between epoxy layers, as seen in Figure 5a–c which shows the cross section of the three layers. The layers were built from left to right, which means that the left-side epoxy was cured

Bio-imaging with the helium-ion microscope: A review

• Matthias Schmidt,
• James M. Byrne and
• Ilari J. Maasilta

Beilstein J. Nanotechnol. 2021, 12, 1–23, doi:10.3762/bjnano.12.1

Kondo effects in small-bandgap carbon nanotube quantum dots

• Patryk Florków,
• Damian Krychowski and
• Stanisław Lipiński

Beilstein J. Nanotechnol. 2020, 11, 1873–1890, doi:10.3762/bjnano.11.169

• presents the field dependence of the partial conductance along the cross section through the SU(3) Kondo state (SU1(3)) with fluctuating states |h−1+⟩, |e1−⟩, and |e−1−⟩. Figure 11b shows the field dependencies of the conductance through the SU(3) Kondo state (SU2(3)) involving the states |h1+⟩, |h−1

• vertical lines. (c) Partial-conductance values of the dot CNTQD(24,21) strongly coupled to the leads for B|| = 0. (d) Conductance values for fixed values of the gate voltage (cross section through the SU(3) point specified by the dotted black line, Γ = 0.03 meV). Maps of the total conductance values with

Towards 3D self-assembled rolled multiwall carbon nanotube structures by spontaneous peel off

• Jonathan Quinson

Beilstein J. Nanotechnol. 2020, 11, 1865–1872, doi:10.3762/bjnano.11.168

• same cross section, unambiguously assign a given morphology to a given structure in a confirmed root-growth mechanism, since the sample can be kept on a substrate [16]. TEM characterization is more challenging since the information regarding the relative position of the different sections is lost

• clarity, cross section images of MWCNT forests were obtained by simply cleaving the silicon wafer after MWCNT growth, in order to expose the inside of the MWCNT forests for both Raman and SEM. This was simply achieved by applying mechanical pressure on the edge of the silicon wafer. EDS mapping and

Nanomechanics of few-layer materials: do individual layers slide upon folding?

• Ronaldo J. C. Batista,
• Rafael F. Dias,
• Ana P. M. Barboza,
• Alan B. de Oliveira,
• Taise M. Manhabosco,
• Thiago R. Gomes-Silva,
• Matheus J. S. Matos,
• Andreij C. Gadelha,
• Cassiano Rabelo,
• Luiz G. L. Cançado,
• Ado Jorio,
• Hélio Chacham and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2020, 11, 1801–1808, doi:10.3762/bjnano.11.162

• deposited on a substrate exhibits a cross-section geometry similar to that indicated in Figure 1 (see, for instance, Wang et al. [12] for electron microscopy images). Figure 1a shows an AFM image of a talc flake (green shades) with a thickness of approximately 2.4 nm (corresponding to two layers), which was

• curve R0 = ahb, where b = 1.75 and a = 0.38 (m−3/4). To obtain κ and α from the AFM data, we propose a variational continuum model (see Supporting Information File 1, section “Deposited folded edges”) for the folded edges with the geometry depicted in Figure 2. This figure shows both cross-section

Electron beam-induced deposition of platinum from Pt(CO)₂Cl₂ and Pt(CO)₂Br₂

• Aya Mahgoub,
• Hang Lu,
• Rachel M. Thorman,
• Konstantin Preradovic,
• Titel Jurca,
• Lisa McElwee-White,
• Howard Fairbrother and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2020, 11, 1789–1800, doi:10.3762/bjnano.11.161

• ][29]. The larger height of the MeCpPtMe3 pillars compared to the Pt(CO)2Cl2 pillars is presumably caused by the higher partial pressure of MeCpPtMe3, but may also be caused by many other factors governing FEBID such as the surface residence time, the dissociation cross section, and surface diffusion

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• BEOL steps were accomplished. The SPM electrical measurements were performed in the cross section of the chip at the wafer level. In order to enable a stable and constant nanoscale contact between the sensor tip and the sample, a surface with a low roughness is required. For this purpose, the sample

• was hand-polished down to a roughness of a few nanometres with diamond-based lapping films with decreasing granularity. In the following section, the local electrical properties of all layers in the cross section of the PIN diode are analysed. In order to evaluate the impact of the applied VDC bias

• , an electrical back contact is created between the microscope chuck and the sample. Results and Discussion The vertical PIN structure Figure 2 shows the surface topography of the cross section of the PIN diode. The different materials used (silicon substrate, epitaxial layers, oxides, and alloy metals

Application of contact-resonance AFM methods to polymer samples

• Sebastian Friedrich and
• Brunero Cappella

Beilstein J. Nanotechnol. 2020, 11, 1714–1727, doi:10.3762/bjnano.11.154

• (CR-AFM) is to get information on the stiffness of a sample via its vibrations and, in particular, through its contact-resonance frequency (CR frequency). In the following, the cantilever is modeled as a rectangular, elastically isotropic beam of uniform cross section with length L, width w, thickness

• measurements and calculated through mode crossing are not the same [10][26]. Differences are ascribed to deviations of the cantilever shape from the idealized model shape (uniform rectangular cross section). The measurements analyzed in the present work show varying γ values for the same cantilever. For

• determined on compliant polymer samples are often very different from those on stiff samples, such as glass or silicon. This is probably due to the use of very simple models: (1) The cantilever is modelled as an elastically isotropic beam of uniform cross section and the tip mass is neglected [8][26]. (2

Seebeck coefficient of silicon nanowire forests doped by thermal diffusion

• Shaimaa Elyamny,
• Elisabetta Dimaggio and
• Giovanni Pennelli

Beilstein J. Nanotechnol. 2020, 11, 1707–1713, doi:10.3762/bjnano.11.153

• ) ν, where ν is the ratio between the total cross-section surface of the nanowires and the surface of the sample. From the plot, a value of kt = 4.2 ± 0.4 results for the samples doped at 800 °C. For the estimation of the filling factor, several SEM images have been taken of different locations of

• diffusion in nanowires with a diameter of 80 nm and length of several micrometers. The simulations were carried out solving the 2D diffusion equation = −DP∇ND(x,y,t) in the circular cross section of a typical nanowire, where ND(x,y,t) is the doping concentration as a function of the position and of the

• the result of the simulation of the doping process. Hence, the Seebeck coefficient depends on the position in the nanowire. That is, S = S(n(x,y)), where (x,y) is a generic point in the cross section. Also the electrical conductivity depends on doping, that is, σ(x,y) = σ(n(x,y)) It has been estimated

Piezoelectric sensor based on graphene-doped PVDF nanofibers for sign language translation

• Shuai Yang,
• Xiaojing Cui,
• Rui Guo,
• Zhiyi Zhang,
• Shengbo Sang and
• Hulin Zhang

Beilstein J. Nanotechnol. 2020, 11, 1655–1662, doi:10.3762/bjnano.11.148

• sensing. Results and Discussion The structural design of the self-powered PES based on GR-doped PVDF nanofibers is shown in Figure 1a. The cross section of the self-powered PES shows three parts, namely the GR-doped PVDF piezoelectric layer in the center, the electrode layer of Ti3C2 MXene and Ag NWs on

Amorphized length and variability in phase-change memory line cells

• Nafisa Noor,
• Sadid Muneer,
• Raihan Sayeed Khan,
• Anna Gorbenko and
• Helena Silva

Beilstein J. Nanotechnol. 2020, 11, 1644–1654, doi:10.3762/bjnano.11.147

• properties of these sources of variability in Lamorphized can contribute to the design of stronger hardware security primitives. Assuming an ideal uniform cross section of the amorphous regions covering the entire cross-section area Aamorphous = WGST × tGST (WGST ≈ 130 nm, tGST ≈ 50 nm), the amorphous

Oxidation of Au/Ag films by oxygen plasma: phase separation and generation of nanoporosity

• Abdel-Aziz El Mel,
• Said A. Mansour,
• Mujaheed Pasha,
• Atef Zekri,
• Janarthanan Ponraj,
• Akshath Shetty and
• Yousef Haik

Beilstein J. Nanotechnol. 2020, 11, 1608–1614, doi:10.3762/bjnano.11.143

• nanospheres (Figure 2d). By further increasing the oxidation time to 30 min, an increase in microsphere size and number is seen at the surface (Figure 2e,f). The evolution of film thickness was examined by SEM cross-section imaging (Figure 3). The results show that the as-grown films exhibit a columnar

• increased in size (Figure 3e,f). To investigate whether the formed nanoporous microspheres have a hollow interior or not, a cross-section SEM specimen from the sample oxidized for 30 min was prepared using focused ion beam (FIB) (Figure 3e). According to the results, the microspheres were not hollow and the

• equipped with an FEI EDS detector and a high-angle annular dark-field (HAADF) detector operating at 200 kV. For qualitative elemental chemical analysis, ESPRIT software from Bruker was used. The cross-section film (thickness <100 nm) was prepared using a SEM/FIB Versa 3D dual beam instrument from FEI

Detecting stable adsorbates of (1S)-camphor on Cu(111) with Bayesian optimization

• Jari Järvi,
• Patrick Rinke and
• Milica Todorović

Beilstein J. Nanotechnol. 2020, 11, 1577–1589, doi:10.3762/bjnano.11.140

• between the two carbon atoms, highlighted in red. (c) Orthogonal unit cell of Cu(111), which is the search range in x and y directions. Energy landscapes from preparatory BOSS simulations. (a) θ–ω 2D cross section of the 3D PES in the camphor conformer search, featuring a single minimum and an energy

• barrier of 0.1 eV for methyl group rotation. (b) α–β 2D cross section of the 3D PES in the search for adsorption orientation of camphor on Cu(111). The landscape features multiple local minima and a higher-energy region at β ≈ 90°. (c) PES of the 2D translational x–y search of the adsorption site of

Optically and electrically driven nanoantennas

• Monika Fleischer,
• Dai Zhang and
• Alfred J. Meixner

Beilstein J. Nanotechnol. 2020, 11, 1542–1545, doi:10.3762/bjnano.11.136

• . Prominent examples are SERS and TERS, where the intrinsically small Raman scattering cross-section is enhanced by several orders of magnitude, making single-molecule spectroscopy feasible. These spectroscopic techniques have shown tremendous progress in the last two decades [29][30][31][32]. Under high

Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• selecting an appropriate cantilever. Theory Unlike the uniform cross section of rectangular cantilevers throughout their length, the cross section of V-shaped cantilevers varies over the length. Therefore, in order to model them as Timoshenko’s beam, the equation of motion needs to be divided into two

• portions as shown in Figure 1. The first portion, shown in Equation 1, is the equation of motion related to the length of the cantilever base to the point where the two legs merge. For this range, the cross section is a rectangle on both sides: where 0 ≤ x ≤ (L – L′). In Equation 1 and Equation 2, K, G, A1

• , y(x,t), ϕ(x,t), ρ, I, E and c are shear coefficient, shear modulus, area of cross section, transverse deflection of the beam, bending angle of the beam, mass density of the beam, moment of inertia of cross section, Young’s modulus, and internal damping of the cantilevers, respectively. The cross

Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir

• Mathias Franz,
• Romy Junghans,
• Paul Schmitt,
• Adriana Szeghalmi and
• Stefan E. Schulz

Beilstein J. Nanotechnol. 2020, 11, 1439–1449, doi:10.3762/bjnano.11.128

• between the connected Ir clusters. The SEM cross-section measurements show that the film has an average thickness of approx. 12 nm (see inset of Figure 2). The fabricated nanoparticles show a good compromise between process complexity and surface coverage with nanoparticles. With this bottom-up approach

• images after 90 cycles of Ir ALD. The inset shows the corresponding cross section. Microscope image of etched structures. SEM images of etched structures (with 50 mmol/L H2O2 and 1.73 mol/L HF for 10 min) using Au particles. (a, b): Cross section; (c, d): top view; (e): top view from back-scattering

• detector with highlighted Au particles. The scale applies to all images. SEM images of etched structures (with 145 mmol/L H2O2 and 1.73 mol/L HF for 10 min) using Au particles showing sticking structures. (a): Top view; (b): cross section. Measured reflectance of Au wafers after 10 min of etching in HF

Superconductor–insulator transition in capacitively coupled superconducting nanowires

• Alex Latyshev,
• Andrew G. Semenov and
• Andrei D. Zaikin

Beilstein J. Nanotechnol. 2020, 11, 1402–1408, doi:10.3762/bjnano.11.124

• –Schön plasmons produces a logarithmic interaction in space–time between different QPSs where the magnitude is controlled by the wire diameter (cross section) [5]. For sufficiently thick wires this interaction is strong and the QPSs are bound in close pairs. Accordingly, the (linear) resistance of such

• quasi-one-dimensional superconducting wires [5] with geometric capacitance C and kinetic inductance is controlled by the parameter [5] which is proportional to the square root of the wire cross section, s. It follows immediately from the analysis of [5] that, provided the two superconducting wires

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

• Jeremiah Croshaw,
• Thomas Dienel,
• Taleana Huff and
• Robert Wolkow

Beilstein J. Nanotechnol. 2020, 11, 1346–1360, doi:10.3762/bjnano.11.119

• probe the vacancy’s depth. Both of these dihydride variants can be compared to the final example of a dihydride pair in Figure 3e,f. It interestingly appears remarkably similar to the normal dimer cross-section, with only slight variation at the position of the outermost H atoms. The lack of a hydrogen

• originates above one side of a dimer, while the SiH2 is centred between the two atoms of a dimer. The neutral point defect in Figure 3q,r displays as a slight decrease in the minima above the defect. The almost normal appearance of the defect cross section compared to the regular surface suggests a similarly

• is actually measuring a signal from the back-bonded and bulk silicon atoms. This is verified by comparing the magnitude of this smaller frequency shift to an equivalent measurement of other back-bonded Si atoms, as would be measured in a cross section taken between dimers (burgundy line in Figure 4n

Structure and electrochemical performance of electrospun-ordered porous carbon/graphene composite nanofibers

• Yi Wang,
• Yanhua Song,
• Chengwei Ye and
• Lan Xu

Beilstein J. Nanotechnol. 2020, 11, 1280–1290, doi:10.3762/bjnano.11.112

• the electrode alternating current (AC) were performed at frequencies ranging from 0.01 Hz to 100 kHz. Results and Discussion The surface and cross-section morphologies of the CNFs before and after carbonization were examined via SEM and TEM, respectively, as shown in Figure 2. According to Figure 2a

Thermophoretic tweezers for single nanoparticle manipulation

• Jošt Stergar and
• Natan Osterman

Beilstein J. Nanotechnol. 2020, 11, 1126–1133, doi:10.3762/bjnano.11.97

• nowadays widely used, add an optical trap repositioning feedback loop to its control software, and use a thin absorptive layer on a substrate of an experimental chamber as a heat source. Experimental chamber and laser-induced heating. (a) Chamber cross section. A 5 μm thick liquid layer is sandwiched

• for a single 200 nm particle. (a) 2D histogram of particle positions. (b) Cross section of the effective potential in x- and y-directions. Manipulation of a 200 nm nanoparticle in water. (a) The trajectory of the particle. (b) Time dependence of x- and y-position of the particle during the

Vibration analysis and pull-in instability behavior in a multiwalled piezoelectric nanosensor with fluid flow conveyance

• Sayyid H. Hashemi Kachapi

Beilstein J. Nanotechnol. 2020, 11, 1072–1081, doi:10.3762/bjnano.11.92

• /interface effects, the pull-in voltage and critical fluid velocity reach zero later than the rest of the parameters. Fluid-conveying multiwalled piezoelectric nanosensor. (a) Illustration of van der Walls forces between two adjacent tubes of a multiple shell cross section of a multiwalled carbon nanotube

Highly sensitive detection of estradiol by a SERS sensor based on TiO₂ covered with gold nanoparticles

• Andrea Brognara,
• Ili F. Mohamad Ali Nasri,
• Beatrice R. Bricchi,
• Andrea Li Bassi,
• Caroline Gauchotte-Lindsay,
• Matteo Ghidelli and
• Nathalie Lidgi-Guigui

Beilstein J. Nanotechnol. 2020, 11, 1026–1035, doi:10.3762/bjnano.11.87

• affinity to Au but none to TiO2. Moreover, the Raman spectrum of MBA is well known and the molecule demonstrates a large scattering cross section [30]. For the functionalization of TiO2/Au surfaces, MBA was diluted in ethanol at a concentration of 2.9 mM. The TiO2/Au samples were then soaked in the

• signal of the empty sensor is designated as “Apt+MCH”. It mostly reflects the signal of the aptamer as MCH is known to have a very low Raman cross section and is thus not expected to yield a significant signal. From the comparison between the spectra of the empty sensor (Apt+MCH) and of the hormone (E2