Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• Manufacturing of China, Changchun University of Science and Technology, Changchun 130022, China Computer Department, Changchun Medical College, Changchun 130031, China JR3CN & IRAC, University of Bedfordshire, Luton LU1 3JU, UK 10.3762/bjnano.10.223 Abstract The stiffness and the topography of the substrate at

• the cell–substrate interface are two key properties influencing cell behavior. In this paper, atomic force acoustic microscopy (AFAM) is used to investigate the influence of substrate stiffness and substrate topography on the responses of L929 fibroblasts. This combined nondestructive technique is

• able to characterize materials at high lateral resolution. To produce substrates of tunable stiffness and topography, we imprint nanostripe patterns on undeveloped and developed SU-8 photoresist films using electron-beam lithography (EBL). Elastic deformations of the substrate surfaces and the cells

Microbubbles decorated with dendronized magnetic nanoparticles for biomedical imaging: effective stabilization via fluorous interactions

• Da Shi,
• Justine Wallyn,
• Dinh-Vu Nguyen,
• Francis Perton,
• Delphine Felder-Flesch,
• Sylvie Bégin-Colin,
• Mounir Maaloum and
• Marie Pierre Krafft

Beilstein J. Nanotechnol. 2019, 10, 2103–2115, doi:10.3762/bjnano.10.205

• 5.0 ± 1.0 nm, respectively. These measurements are in agreement with earlier reports [43]. Figure 11A shows an AFM topography image of a mixed film composed of DPPC and IONP@C2F5OEG8Den. The IONPs are embedded within the DPPC monolayer domains in which they are well-dispersed, showing no tendency to

• the bubble characteristics and stability. For further experimental details see [48]. Each measurement was repeated three times for different bubble preparations. The volume of the microbubble dispersion injected in the acoustic cell was 2 mL. AFM topography analysis of mixed films of DPPC and

• @C4F9OEG8 (blue). Schematic representation of dendronized IONPs a) incorporated within the MB DPPC shell and b) located at the surface of this shell. AFM topography images (1 × 1 µm) and height profiles of a) IONP@C2F5OEG8Den and b) IONP@C2H5OEG8Den. Dispersions of IONPs in ethanol (0.002 mg mL−1) were spin

Ion mobility and material transport on KBr in air as a function of the relative humidity

• Dominik J. Kirpal,
• Korbinian Pürckhauer,
• Alfred J. Weymouth and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

• from 25.0% to 35.1% within a time period of 46 h. Figure 2b and Figure 2c show the surface topography directly before and after this period. It can be observed that the accumulated material around the top right and the middle left structure has completely eroded. Also, for the other structures only a

• on the surface. This state is observed by the AFM technique as the surface topography. (2) In the second state the ions are dissolved in the hydration layer or in a physiosorbed or precursor state [30], which shows a high mobility and cannot be imaged. The material from the accumulation over time

Nanostructured and oriented metal–organic framework films enabling extreme surface wetting properties

• Andre Mähringer,
• Julian M. Rotter and
• Dana D. Medina

Beilstein J. Nanotechnol. 2019, 10, 1994–2003, doi:10.3762/bjnano.10.196

• (OCA) of diiodomethane on these pellets reveals an inverse wetting phenomenon. Under these conditions, the M-CAT-1 materials reject oil and turn oleophobic with an OCA of 90° (Figure 1H). Constructing nanostructured M-CAT-1 surfaces According to Wenzel’s model, film topography has a strong impact on

Nanoarchitectonics meets cell surface engineering: shape recognition of human cells by halloysite-doped silica cell imprints

• Elvira Rozhina,
• Ilnur Ishmukhametov,
• Svetlana Batasheva,
• Farida Akhatova and
• Rawil Fakhrullin

Beilstein J. Nanotechnol. 2019, 10, 1818–1825, doi:10.3762/bjnano.10.176

• , fixed with formaldehyde, sputter-coated with a thin gold layer and then imaged using a Hitachi SU8000 microscope. As shown in Figure 2D–F, the typical smooth surface topography of HeLa cells was changed drastically by the deposition of either pure or halloysite-doped silica. Analysing the cell diameter

• cells and (G) HeLa cells coated with halloysite-doped silica shells. Atomic force microscopy (PeakForce Tapping mode) images of inorganic silica/halloysite imprints templated on HeLa cells: (A) topography image, (B) non-specific adhesion map; (C) scanning electron microscopy image of inorganic silica

Growth dynamics and light scattering of gold nanoparticles in situ synthesized at high concentration in thin polymer films

• Corentin Guyot,
• Philippe Vandestrick,
• Ingrid Marenne,
• Olivier Deparis and
• Michel Voué

Beilstein J. Nanotechnol. 2019, 10, 1768–1777, doi:10.3762/bjnano.10.172

• were imaged by AFM. A typical image of 5 μm × 5 μm size is presented in Figure 5a. It unambiguously shows the presence of the AuNPs. The topography of the samples was characterized by the average surface roughness parameter (Sa) and by the root-mean-square surface roughness parameter (Sq). For the

• angle of incidence (AOI) of θi = −20° (note that incidence angles are conventionally negative in BRDF measurements). A 12 mW HeNe Laser was also used in preliminary experiments in order to qualitatively evidence scattering after the annealing of the samples. Atomic force microscopy The topography of the

• °). Azimuth angles are varied along these circles (0–360°). Scattered intensity in the plane orthogonal to the incidence plane (azimuth 90° or 270°) as a function of the scattering angle. (A) Non-annealed sample; (B) sample annealed for 120 min at 135 °C. AFM topography images (Color scale bars in nanometers

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He⁺: Projected images and intensity patterns

• Michael Mousley,
• Santhana Eswara,
• Olivier De Castro,
• Olivier Bouton,
• Nico Klingner,
• Christoph T. Koch,
• Gregor Hlawacek and
• Tom Wirtz

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

• suggests that the orientation of the particle surface is responsible for the direction of deflection. The local surface topography then defines the caustic pattern and the exact position of the bright points around the edge. Figure 4C shows that there is still a large amount of intensity at the center of

• increased rate of charging. However, the motion of the spots could also be due to the most intense section of the beam (i.e., the focal plane of Lens 2) intersecting with different positions along the surfaces of the charged sample, having varying topography, which then deflect the beam to different

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• ranging from 1000 to 6000 rpm. The resulting cover thicknesses were 52, 117, 185, 380, and 653 nm as measured by AFM. Furthermore, the top surface was smoothed to eliminate the cross-talk of surface topography in subsurface CR-AFM imaging. Our experiments were performed on an MFP-3D Origin AFM (Asylum

• . The obtained topography and resonance frequency images are shown in Figure 2a and Figure 2b, respectively. We can clearly discern the circuit pattern from the resonance frequency image, which cannot be found in the topography. This verifies the CR-AFM’s capability in detecting subsurface circuit

• sample was scanned with the PPP-FM cantilever by using its first mode under an applied normal force of 1162 nN. The obtained topography and the resonance frequency image are shown in Figure 9b and Figure 9c, respectively. Even the smallest defects can be clearly observed from the CR-AFM frequency image

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• , providing the possibility of obtaining current maps as well as I–V characteristics at a given spot. Figure 2a and Figure 2b show the topography and current maps of the TiO nanowire network on SrTiO3(100). TiO has a higher conductivity than the surrounding SrTiO3 (STO) surface (the no current areas at

• topography and work function of the same area. Differences in the WF are as high as 900 meV between TiO and SrTiO3, in favor of TiO. However, there is also a certain variation within the TiO and SrTiO3 structures, which will be discussed later. The bias sweep measurements presented in Figure 2f show

• 3D topography overprinted image with color scale representing the WF is shown in Figure 3a. The WF of titanium monoxide varies to as high as 300 meV, even within one nanowire. This is not an imaging artifact but rather a morphological-related feature, which is proved by the two profiles obtained for

Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology

• Loïc Crouzier,
• Alexandra Delvallée,
• Sébastien Ducourtieux,
• Laurent Devoille,
• Guillaume Noircler,
• Christian Ulysse,
• Olivier Taché,
• Elodie Barruet,
• Christophe Tromas and
• Nicolas Feltin

Beilstein J. Nanotechnol. 2019, 10, 1523–1536, doi:10.3762/bjnano.10.150

• Figure 8. The profiles correspond to the intensity in grey level and the topography of the sample along the NP diameter for SEM and AFM measurements, respectively. For simplicity, the SEM diameter used here corresponds to DSEM, i.e., the projected area-equivalent diameter. Figure 7a and Figure 7b

Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere

• Petr Knotek,
• Tomáš Plecháček,
• Jan Smolík,
• Petr Kutálek,
• Filip Dvořák,
• Milan Vlček,
• Jiří Navrátil and
• Čestmír Drašar

Beilstein J. Nanotechnol. 2019, 10, 1401–1411, doi:10.3762/bjnano.10.138

• tunneling microscopy (STM) [27][28] or by using AFM in the semicontact mode. The latter enables a describtion not only of the topography (size and shape) but also a detection of the changes in density, stiffness and adhesion of NPs [20][21][24][29][30]. In the present study we demonstrate that the Schottky

• had to be used to decrease the plasma intensity. The topography, phase shift image, Kelvin probe force microscopy and I–V characteristics were measured by the AFM SolverPro M, Nt-MDT (Russia) with a resolution of 512 × 512 pixels. The HA_NC tips (resonant frequency 140 kHz, force constant 3.5 N/m

• potential difference) measurement was achieved by the modulation of the VAC at a frequency higher than the bandwidth of the topography feedback system. The topography was measured by the oscillation at the first resonance frequency of the AFM tip, and VCPD was measured by the amplitude of the oscillation at

Highly ordered mesoporous silica film nanocomposites containing gold nanoparticles for the catalytic reduction of 4-nitrophenol

• Mohamad Azani Jalani,
• Leny Yuliati,
• Siew Ling Lee and
• Hendrik O. Lintang

Beilstein J. Nanotechnol. 2019, 10, 1368–1379, doi:10.3762/bjnano.10.135

• TEM 3D tomography at low accelerating voltage with topography-based reconstruction to show the pore orientation at the various angles with the presence of AuNPs (see Supporting Information File 1 for the movie). Optical properties of AuNPs Surface plasmon resonance (SPR) peaks in the UV–vis spectrum

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• with the HOPG surface. The HOPG surface was scanned under a constant preload force, modulation frequency, and drive signal while the amplitude and phase response of the cantilever were recorded simultaneously with the topography and the lateral force signals using a digital lock-in amplifier supplied

• response of the cantilever were simultaneously recorded with the topography and the lateral force signals using a digital lock-in amplifier supplied with the RHK R9 controller. The calibration of the detected variations in amplitude and phase into elastic and loss modulus with high accuracy requires a good

• topography, environmental contamination, the Schwoebel–Ehrlich barrier, energy dissipation through viscoelastic energy losses, applied normal force, tip shape, and modulation frequency (both for CR and FMM modes). Each examination will show that the elastic modulus measured in the previous section is

Imaging the surface potential at the steps on the rutile TiO₂(110) surface by Kelvin probe force microscopy

• Masato Miyazaki,
• Huan Fei Wen,
• Quanzhen Zhang,
• Yuuki Adachi,
• Jan Brndiar,
• Ivan Štich,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2019, 10, 1228–1236, doi:10.3762/bjnano.10.122

• the fAC component of the electrostatic force, providing the CPD value (VCPD). The topography and CPD were measured sequentially using the lift-mode technique to minimize crosstalk [47]. In this scanning mode, the topography (z) is scanned in the first trace using AFM and immediately retraced with a

• about 70 mV, which is consistent with a previous study, in which surfaces with a high step density were found to have a lower work function than surfaces with a low step density [28]. The drop in CPD at the steps is not due to a feedback error since the forward and backward curves of the topography and

• , which is the opposite behavior to the decrease in CPD at the steps (Figure 2c and Figure 2e). Therefore, we can rule out the influence of an unintentional increase of the tip–sample distance. In addition, the influence of the electrostatic force on the topography measurements has been investigated. As a

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• structures with submicrometer resolution [1][2][3][4][5][6][7][8]. Although the MFM signals in the so-called interleave mode are taken at a certain distance (lift height) from the sample, following the topography of the sample measured in a first scan, a total force is measured with unknown contributions

• effect. During the imaging of nanoparticles a mirroring of the topography is often observed in MFM phase images [15][16][17][18]. Neves et al. [15] distinguished between magnetic and nonmagnetic nanoparticles by applying an external bias to the tip minimizing the topographical influence of the sample

• . Without an external tip bias a positive phase shift in the MFM image was reported for the nonmagnetic nanoparticles. Passeri et al. [19] also observed a positive phase shift for nonmagnetic niosomes in the MFM phase image. Angeloni et al. [16] discussed the topography-induced positive phase shift for

Revisiting semicontinuous silver films as surface-enhanced Raman spectroscopy substrates

• Malwina Liszewska,
• Bogusław Budner,
• Małgorzata Norek,
• Bartłomiej J. Jankiewicz and
• Piotr Nyga

Beilstein J. Nanotechnol. 2019, 10, 1048–1055, doi:10.3762/bjnano.10.105

• and white and metal coverage was calculated. The AFM maps were collected using an NTEGRA atomic force microscope from NT-MDT company. The surface topography measurements were made in semi-contact mode. We used HA_NC ETALON (NT-MDT) probe with 140 kHz ± 10% resonant frequency, force constant of 3.5 N/m

Tailoring the stability/aggregation of one-dimensional TiO₂(B)/titanate nanowires using surfactants

• Atiđa Selmani,
• Johannes Lützenkirchen,
• Kristina Kučanda,
• Dario Dabić,
• Engelbert Redel,
• Ida Delač Marion,
• Damir Kralj,
• Darija Domazet Jurašin and
• Maja Dutour Sikirić

Beilstein J. Nanotechnol. 2019, 10, 1024–1037, doi:10.3762/bjnano.10.103

• resolution of the Raman spectrometer was 4 cm−1. The morphology of the TNWs was visualized by using high-resolution scanning electron microscopy Zeiss HR-SEM (Gemini Class) at 3–5 kV. AFM imaging was performed with a Nanosurf Flex AFM in dynamic force mode (simultaneously acquiring topography, amplitude and

In situ AFM visualization of Li–O₂ battery discharge products during redox cycling in an atmospherically controlled sample cell

• Kumar Virwani,
• Younes Ansari,
• Khanh Nguyen,
• Francisco José Alía Moreno-Ortiz,
• Jangwoo Kim,
• Maxwell J. Giammona,
• Ho-Cheol Kim and
• Young-Hye La

Beilstein J. Nanotechnol. 2019, 10, 930–940, doi:10.3762/bjnano.10.94

• rather than for the highest capacity. The main aim was to obtain electrochemical impedance spectroscopy (EIS), discharge/recharge voltages and capacities time-domain-correlated with AFM images of topography, all in a completely atmospherically isolated and controlled setting. In our recent study [30

• charge transfer resistance, improves the kinetics of the reaction. Topographical observations using AFM AFM was used to monitor morphological changes on the glassy carbon cathode surface. The topography images in Figure 3 and Figure 4 each show one of the nine scanned regions at two different water

• water concentrations the discharge and recharge currents were 5 µA. Figure 3 shows AFM topography images scanned on the glassy carbon surface with electrolyte containing <20 ppm of H2O. Prior to the start of the discharge reaction in Figure 3a at an open-circuit potential of 2.921 V, the surface of the

Nanoscale optical and structural characterisation of silk

• Meguya Ryu,
• Reo Honda,
• Adrian Cernescu,
• Arturas Vailionis,
• Armandas Balčytis,
• Jitraporn Vongsvivut,
• Jing-Liang Li,
• Denver P. Linklater,
• Elena P. Ivanova,
• Vygantas Mizeikis,
• Mark J. Tobin,
• Junko Morikawa and
• Saulius Juodkazis

Beilstein J. Nanotechnol. 2019, 10, 922–929, doi:10.3762/bjnano.10.93

• diffractometer using a Cu Kα microfocus X-ray source with λ = 1.5418 Å (Figure 2a). IR spectral measurements The sub-diffraction scattering scanning near-field optical microscope (s-SNOM, neaspec GmbH) uses a metalized atomic force microscopy (AFM) tip. The tip maps the surface relief (topography) by its basic

Rapid, ultraviolet-induced, reversibly switchable wettability of superhydrophobic/superhydrophilic surfaces

• Yunlu Pan,
• Wenting Kong,
• Bharat Bhushan and
• Xuezeng Zhao

Beilstein J. Nanotechnol. 2019, 10, 866–873, doi:10.3762/bjnano.10.87

• solid surfaces governed by surface chemistry and surface topography [1][2] and has found significant applications in various fields [3][4][5][6][7][8]. Controllable wettability that can be enabled through external stimuli, such as illumination, electric fields or heating, can be applied in chemical

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

• Aaron Mascaro,
• Yoichi Miyahara,
• Tyler Enright,
• Omur E. Dagdeviren and
• Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

• time constants, τ, and stretching factors, β. “(a) Calibration curve for a range of characteristic times of exponential decay (τ) (inset shows a zoom-in for shorter times). (b) Topography

Ultraviolet patterns of flowers revealed in polymer replica – caused by surface architecture

• Anna J. Schulte,
• Matthias Mail,
• Lisa A. Hahn and
• Wilhelm Barthlott

Beilstein J. Nanotechnol. 2019, 10, 459–466, doi:10.3762/bjnano.10.45

• topography on the appearance of UV-patterns, we investigated the interaction between UV-light and the surface structures of three different plant species in this study. To consider several diverse surface structures we chose three species with distinct UV-patterns and different surface structures, for

• is described in Koch et al. [39] and is a suitable technique for the transfer of the surface topography of soft and fragile plant material to a rigid material in high precision down to the nanometer scale. Results and Discussion Images of flowers under environmental conditions were taken in the VIS

Advanced scanning probe lithography using anatase-to-rutile transition to create localized TiO₂ nanorods

• Julian Kalb,
• Vanessa Knittel and
• Lukas Schmidt-Mende

Beilstein J. Nanotechnol. 2019, 10, 412–418, doi:10.3762/bjnano.10.40

• probe lithography was performed with an Innova AFM (Bruker) in contact mode. The applied force was significantly higher than usually chosen for topography scanning. We used OTESPA-R3 (Bruker AFM probes) silicon tips with a spring constant of approximately 26 N/m. Based on the spring constant, we

Biocompatible organic–inorganic hybrid materials based on nucleobases and titanium developed by molecular layer deposition

• Leva Momtazi,
• Henrik H. Sønsteby and
• Ola Nilsen

Beilstein J. Nanotechnol. 2019, 10, 399–411, doi:10.3762/bjnano.10.39

• density of the systems were measured after 15 minutes of water treatment (Table 3), indicating some variations in index of refraction, but relatively small variations in film density between the different systems. The surface topography of films as-deposited on Si(100) and after being immersed in water

• increase during growth measured by QCM using TTIP and thymine (at 225 °C) (top graph), uracil (at 225 °C) (top graph), or adenine (250 °C) (bottom graph), and water. The shaded area represents the statistical variation during 16 cycles. Surface topography as measured by AFM for films deposited using TTIP

Intuitive human interface to a scanning tunnelling microscope: observation of parity oscillations for a single atomic chain

• Sumit Tewari,
• Jacob Bakermans,
• Christian Wagner,
• Federica Galli and
• Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2019, 10, 337–348, doi:10.3762/bjnano.10.33

• different stages of the experiment are shown. Here, similar to before, the topography colour scale is tuned to show a smaller apparent size of the adatoms ‘A’, ‘B’ or ‘C’. Next, using the geometric technique explained earlier, the background atoms are determined and three fixed positions on the surface ‘i

• show STM images with the topography colour scale tuned to reduce the apparent size of the two adatoms to match the superimposed surface lattice pattern. The full apparent size of Au adatoms on Au(111) is around 1 nm as shown in Figure 2b. (a) shows the two possible triangular hollow adsorption sites

• positioning (energetically favourable) of the adatoms with reference to the surface lattice. (a, c, e) show the STM images with the topography colour scale tuned to show a smaller apparent size of the adatoms ‘A’, ‘B’ or ‘C’. The scale bar in the bottom-right corner is 1 nm. The other three panels (b, d, f