Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• frequency-modulated atomic force microscopy (AFM). Furthermore, this technique can be extended to the experimental verification of potential forms for any given material pair. Specifically, interaction forces are determined between an AFM tip apex and a nominally flat substrate using dynamic force

• interactions necessitates characterization methods with angstrom-level precision. Therefore, techniques such as atomic force microscopy (AFM) are often used to evaluate the performance of these surface modification approaches. The interpretation of lubrication and surface modification behavior via AFM

• AFM; interaction potential; Lennard-Jones; surfaces; Introduction Knowledge of material interface interaction behavior is crucial to the design of nanometer-scale devices and processes, such as high-density hard disk storage [1], digital light processing (DLP) projectors [2][3], atomic force

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• –sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high

• [1][2]. However, each method has its limitations due to instrumentation capabilities and the geometry of the contact. Also, some of these methods can be destructive or provide only poor resolution because of the nanometric dimensions [1]. Atomic force microscopy (AFM) is a fundamental tool in

Structural optical and electrical properties of a transparent conductive ITO/Al–Ag/ITO multilayer contact

• Aliyu Kabiru Isiyaku,
• Ahmad Hadi Ali and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2020, 11, 695–702, doi:10.3762/bjnano.11.57

• fraction of Sn is low because it is the dopant element in ITO. The low content of Al is attributed to the very thin layer. The EDXS spectra of the films before and after annealing are shown in Figure 2. The surface morphology of the IAAI and ITO films was studied using atomic force microscopy (AFM) of an

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• , Institute of Building Energetics, Thermal Engineering and Energy Storage (IGTE), Pfaffenwaldring 31, 70569 Stuttgart, Germany 10.3762/bjnano.11.46 Abstract Electrochemical strain microscopy (ESM) is a powerful atomic force microscopy (AFM) mode for the investigation of ion dynamics and activities in energy

• (FIB) SEM and X-ray absorption near edge structure (XANES) [6][7][8][9][10][11][12][13]. Another technique for post-mortem analysis is atomic force microscopy (AFM). In its basic form, it provides information on the topography of the sample. More advanced AFM modes extract in addition to the topography

Examination of the relationship between viscoelastic properties and the invasion of ovarian cancer cells by atomic force microscopy

• Mengdan Chen,
• Jinshu Zeng,
• Weiwei Ruan,
• Zhenghong Zhang,
• Yuhua Wang,
• Shusen Xie,
• Zhengchao Wang and
• Hongqin Yang

Beilstein J. Nanotechnol. 2020, 11, 568–582, doi:10.3762/bjnano.11.45

• The mechanical properties of cells could serve as an indicator for disease progression and early cancer diagnosis. This study utilized atomic force microscopy (AFM) to measure the viscoelastic properties of ovarian cancer cells and then examined the association with the invasion of ovarian cancer at

• light on the biomechanical changes for early diagnosis of tumor transformation and progression at single-cell level. Keywords: atomic force microscopy (AFM); cancer invasion; cancer migration; ovarian cancer cells; viscoelasticity; Introduction Ovarian cancer is a lethal gynecological malignancy with

• cells could be detected biomechanically. At present, a variety of research technologies, such as optical tweezers, micropipette aspiration, magnetic twisting cytometry and atomic force microscopy (AFM), have been developed to characterize the mechanical properties of biological samples [7][8][9][10

Multilayer capsules made of weak polyelectrolytes: a review on the preparation, functionalization and applications in drug delivery

• Varsha Sharma and
• Anandhakumar Sundaramurthy

Beilstein J. Nanotechnol. 2020, 11, 508–532, doi:10.3762/bjnano.11.41

• force [13] using confocal laser scanning microscopy (CLSM), atomic force microscopy (AFM), and reflection interference contrast microscopy (RICM). Fabrication conditions such as the type of polymer (e.g., thicker layers are formed by PEs having lower charge density) [14], concentration of the polymer

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• Berkin Uluutku Santiago D. Solares The George Washington University, Department of Mechanical and Aerospace Engineering, 800 22nd St. NW, Suite 3000, Washington, DC 20052, USA 10.3762/bjnano.11.37 Abstract Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale

• significant instrumentation challenges are anticipated, the modelling results are promising and suggest that Fourier-based higher-harmonics current measurement may enable the development of a reliable intermittent-contact conductive AFM method. Keywords: atomic force microscopy (AFM); conductivity; current

Electrochemically derived functionalized graphene for bulk production of hydrogen peroxide

• Munaiah Yeddala,
• Pallavi Thakur,
• Anugraha A and
• Tharangattu N. Narayanan

Beilstein J. Nanotechnol. 2020, 11, 432–442, doi:10.3762/bjnano.11.34

• its layered nature (Supporting Information File 1, Figure S2). Here the thickness variation is confirmed using atomic force microscopy (AFM), and the results are given in Figure S3. This indicates that with an increase in the concentration of the electrolyte, the thickness is increased from 40 nm to

High dynamic resistance elements based on a Josephson junction array

• Konstantin Yu. Arutyunov and
• Janne S. Lehtinen

Beilstein J. Nanotechnol. 2020, 11, 417–420, doi:10.3762/bjnano.11.32

• situ to form tunnel barriers. Each sample consisted of 25 pairs of JJs connected in parallel where the area of each superconductor–insulator–superconductor (SIS) contact was about 100 × 100 nm (Figure 1). The samples were analyzed by scanning electron microscopy (SEM) (Figure 1) and atomic force

• microscopy (AFM). Transport measurements were made inside a 3He4He dilution refrigerator at temperatures below 400 mK, corresponding to the superconducting transition of Ti QPSJs [10][12]. All input/output lines were carefully filtered [13] to reduce the impact of the noisy electromagnetic environment. When

Nonclassical dynamic modeling of nano/microparticles during nanomanipulation processes

• Moharam Habibnejad Korayem,
• Ali Asghar Farid and
• Rouzbeh Nouhi Hefzabad

Beilstein J. Nanotechnol. 2020, 11, 147–166, doi:10.3762/bjnano.11.13

• ; nanoparticle modeling; size effects; Introduction It is not possible to simultaneously observe and manipulate a nanoparticle using atomic force microscopy (AFM) as the imaging and manipulation tools are combined. As a result, dynamic modeling and simulation are essential in this field of research. For the

A review of demodulation techniques for multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

• the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging. Keywords: atomic force microscopy (AFM); multifrequency; demodulation

• ; Kalman filter; Lyapunov filter; digital signal processing; field-programmable gate array (FPGA); Introduction Atomic force microscopy (AFM) [1] has enabled innovation in nanoscale engineering since it was invented in 1986 by Binnig and co-workers. Atomic-scale topographical resolution is achieved by

Simple synthesis of nanosheets of rGO and nitrogenated rGO

• Pallellappa Chithaiah,
• Madhan Mohan Raju,
• Giridhar U. Kulkarni and
• C. N. R. Rao

Beilstein J. Nanotechnol. 2020, 11, 68–75, doi:10.3762/bjnano.11.7

• force microscopy (AFM), X-ray diffraction (XRD) and thermogravimetric analysis (TGA). X-ray diffraction patterns of the samples were collected in the range of 10–70° (2θ) using a Bruker D8 diffractometer with a Cu Kα source (λ = 0.154178 nm). The morphology of the samples was examined using a Tescan

• temperature naturally. The resulting product was collected and used for the electrochemical supercapacitor measurements. The obtained results were compared with the as-synthesized rGO nanosheets. Materials characterization The samples were characterized using transmission electron microscopy (TEM), atomic

The effect of heat treatment on the morphology and mobility of Au nanoparticles

• Sven Oras,
• Sergei Vlassov,
• Simon Vigonski,
• Boris Polyakov,
• Mikk Antsov,
• Vahur Zadin,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2020, 11, 61–67, doi:10.3762/bjnano.11.6

• particles became immovable again. This effect was attributed to the diffusion of Au into the Si substrate and to the growth of the SiO2 layer. Keywords: annealing; atomic force microscopy (AFM); Au nanoparticles; manipulation; melting; nanotribology; Introduction Gold is one of the most prominent

The different ways to chitosan/hyaluronic acid nanoparticles: templated vs direct complexation. Influence of particle preparation on morphology, cell uptake and silencing efficiency

• Arianna Gennari,
• Julio M. Rios de la Rosa,
• Erwin Hohn,
• Maria Pelliccia,
• Enrique Lallana,
• Roberto Donno,
• Annalisa Tirella and
• Nicola Tirelli

Beilstein J. Nanotechnol. 2019, 10, 2594–2608, doi:10.3762/bjnano.10.250

• Synergy2 Biotek plate reader. Atomic force microscopy (AFM). Drops (ca. 35 µL) of the chitosan/HA nanoparticle suspensions were deposited on a clean mica surface and left to dry overnight in Petri dishes at room temperature. A molecular force probe 3D AFM (MFP-3D, Asylum Research, Oxford Instruments

Evaluation of click chemistry microarrays for immunosensing of alpha-fetoprotein (AFP)

• Seyed Mohammad Mahdi Dadfar,
• Sylwia Sekula-Neuner,
• Vanessa Trouillet,
• Hui-Yu Liu,
• Ravi Kumar,
• Annie K. Powell and
• Michael Hirtz

Beilstein J. Nanotechnol. 2019, 10, 2505–2515, doi:10.3762/bjnano.10.241

• occurring in the spectra at 400.0 eV also result from the successful reactions. To confirm the quality of the functionalized layers, after each step of the functionalization process, the roughness of the samples was monitored by atomic force microscopy (AFM). The results are shown in Supporting Information

• bare and functionalized glasses was characterized using surface-sensitive techniques, including atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). To map the surface roughness, AFM in tapping mode was conducted with a Dimension Icon (Bruker, Germany) device with HQ:NSC15/Al BS

Mobility of charge carriers in self-assembled monolayers

• Zhihua Fu,
• Tatjana Ladnorg,
• Hartmut Gliemann,
• Alexander Welle,
• Asif Bashir,
• Michael Rohwerder,
• Qiang Zhang,
• Björn Schüpbach,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2019, 10, 2449–2458, doi:10.3762/bjnano.10.235

• study charge transport within 2D layers of organic semi-conductors (OSCs) using atomic force microscopy (AFM)-based lithography applied to self-assembled monolayers (SAMs), fabricated from appropriate organothiols. The extent of lateral charge transport was investigated by insulating pre-defined patches

Self-assembly of a terbium(III) 1D coordination polymer on mica

• Quentin Evrard,
• Giuseppe Cucinotta,
• Felix Houard,
• Guillaume Calvez,
• Yan Suffren,
• Carole Daiguebonne,
• Olivier Guillou,
• Andrea Caneschi,
• Matteo Mannini and
• Kevin Bernot

Beilstein J. Nanotechnol. 2019, 10, 2440–2448, doi:10.3762/bjnano.10.234

• (375 µs) and the CHCl3 solution (13 µs) further reinforces the idea of water-induced growth. Keywords: atomic force microscopy (AFM); luminescence; nanostructuration; polymer; self-assembly; surface; terbium complexes; Introduction The study of materials for the realization of novel magnetic [1][2][3

• suitable for atomic force microscopy (AFM) imaging [24] as well as for its hydrophilic nature promoting the interaction with the deposited molecules. Indeed, muscovite mica has already been used for the deposition of magnetic materials such as FeCoN magnetic films [25] or tungsten oxide nanowires [21]. The

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• Abstract Employing polymer cantilevers has shown to outperform using their silicon or silicon nitride analogues concerning the imaging speed of atomic force microscopy (AFM) in tapping mode (intermittent contact mode with amplitude modulation) by up to one order of magnitude. However, tips of the

• any photo-processable polymer cantilever. Keywords: Atomic force microscopy (AFM); durability; imaging speed; polymer cantilever; silicon nitride tip; Introduction Atomic force microscopy (AFM) cantilevers have been developed for numerous applications since the invention of scanning probe microscopy

A novel method to remove impulse noise from atomic force microscopy images based on Bayesian compressed sensing

• Yingxu Zhang,
• Yingzi Li,
• Zihang Song,
• Zhenyu Wang,
• Jianqiang Qian and
• Junen Yao

Beilstein J. Nanotechnol. 2019, 10, 2346–2356, doi:10.3762/bjnano.10.225

• , China School of Physics, Beihang University, Beijing 100191, China 10.3762/bjnano.10.225 Abstract A novel method based on Bayesian compressed sensing is proposed to remove impulse noise from atomic force microscopy (AFM) images. The image denoising problem is transformed into a compressed sensing

• proposed method is robust and its performance is not influenced by the noise density in a certain range. Keywords: atomic force microscopy (AFM); Bayesian compressed sensing; denoising; image processing; impulse noise; Introduction Atomic force microscopy (AFM) is a powerful tool in the fields of

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• ], confocal microscopy, scanning electron microscopy (SEM) [12] and atomic force microscopy (AFM) [16][17] have been employed to investigate cell–substrate interactions. Fluorescence and confocal microscopy are traditional techniques to investigate the intra- and intercellular processes in biological studies

Microbubbles decorated with dendronized magnetic nanoparticles for biomedical imaging: effective stabilization via fluorous interactions

• Da Shi,
• Justine Wallyn,
• Dinh-Vu Nguyen,
• Francis Perton,
• Delphine Felder-Flesch,
• Sylvie Bégin-Colin,
• Mounir Maaloum and
• Marie Pierre Krafft

Beilstein J. Nanotechnol. 2019, 10, 2103–2115, doi:10.3762/bjnano.10.205

• stability characteristics of F-hexane-stabilized DPPC-shelled MBs incorporating IONP@CnX2n+1OEG8Den. Fourth, we report an atomic force microscopy (AFM) study that reveals that the location of the dendronized nanoparticles in the phospholipid film strongly depends on the nature of the terminal group. Results

The importance of design in nanoarchitectonics: multifractality in MACE silicon nanowires

• Stefania Carapezzi and
• Anna Cavallini

Beilstein J. Nanotechnol. 2019, 10, 2094–2102, doi:10.3762/bjnano.10.204

• conditions and the capacity dimension of the nanowires was obtained. Keywords: atomic force microscopy (AFM); capillary force; metal-assisted chemical etching (MACE); multifractal analysis; nanoarchitectonics; nanowires; self-assembly; Introduction In the last years, huge progress was made regarding the

• describe it by just one scaling law. In this latter case a shift to multifractal analysis is necessary. In the present work we show the results of multifractal analysis of nanoarchitectured surfaces of MACE Si NWs. The spontaneous arrangements of the NWs were investigated by using atomic force microscopy

• (AFM). Among the scanning probe techniques, AFM shows a peculiar capability to quantitatively characterize features with nanoscaled dimensions. To gain insight over the emergence of the organized nanoarchitectures we applied multifractal analysis to the AFM images. We have found that a single fractal

Synthesis and potent cytotoxic activity of a novel diosgenin derivative and its phytosomes against lung cancer cells

• Liang Xu,
• Dekang Xu,
• Ziying Li,
• Yu Gao and
• Haijun Chen

Beilstein J. Nanotechnol. 2019, 10, 1933–1942, doi:10.3762/bjnano.10.189

• below 100 nm and negative charges will be more suitable for lung cancer treatment. The morphology of the DiP and P2P was observed by transmission electron microscopy (TEM) and atomic force microscopy (AFM, Figure 3C,D). P2P and DiP demonstrated roughly homogeneous rod shapes in TEM but showed spherical

• Hydrodynamic diameter and zeta potential of the phytosomes were analyzed by DLS on a Malvern Instruments Zetasizer HS III (Malvern, UK) at room temperature. The morphology of the phytosomes was recorded by using atomic force microscopy (AFM, Multimode 8, Bruker, USA) and transmission electron microscopy (TEM

Oblique angle deposition of nickel thin films by high-power impulse magnetron sputtering

• Hamidreza Hajihoseini,
• Movaffaq Kateb,
• Snorri Þorgeir Ingvarsson and
• Jon Tomas Gudmundsson

Beilstein J. Nanotechnol. 2019, 10, 1914–1921, doi:10.3762/bjnano.10.186

• previously observed and discussed [52]. However, the reported mass density values are corresponding to the “bulk” part of the film. The film thickness gradient (Δd) was characterized by non-contact mode atomic force microscopy (AFM) analysis in an XE-100 multi-mode AFM system (PSIA Inc.) in air (ex situ

Growth dynamics and light scattering of gold nanoparticles in situ synthesized at high concentration in thin polymer films

• Corentin Guyot,
• Philippe Vandestrick,
• Ingrid Marenne,
• Olivier Deparis and
• Michel Voué

Beilstein J. Nanotechnol. 2019, 10, 1768–1777, doi:10.3762/bjnano.10.172

• the roughness of the films using atomic force microscopy (AFM). Results and Discussion Optical scattering measurements In preliminary experiments, Au-doped polymer films coated on glass were annealed in an oven at different temperatures (90–160 °C) over different periods of time (1–12 h). Different