One-step synthesis of carbon-supported electrocatalysts

• Sebastian Tigges,
• Nicolas Wöhrl,
• Ivan Radev,
• Ulrich Hagemann,
• Markus Heidelmann,
• Thai Binh Nguyen,
• Stanislav Gorelkov,
• Stephan Schulz and
• Axel Lorke

Beilstein J. Nanotechnol. 2020, 11, 1419–1431, doi:10.3762/bjnano.11.126

• shape of elemental Pt [40] and the double peak splitting of 3.33 eV [41] was taken from bulk samples in the literature. EDS (Oxford Instruments), in combination with an aberration-corrected transmission electron microscope (TEM; JEOL 2200FS), was used to analyze the chemical composition and to record

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

• Stefania Castelletto,
• Faraz A. Inam,
• Shin-ichiro Sato and
• Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

• -luminescence and optical spectroscopy in deep ultraviolet [91][93][94] were used for the characterization of stacking faults and point defects. More recently an aberration-corrected high-resolution transmission electron microscopy technique has been used to resolve atomic defects in a freestanding single layer

Fabrication of phase masks from amorphous carbon thin films for electron-beam shaping

• Lukas Grünewald,
• Dagmar Gerthsen and
• Simon Hettler

Beilstein J. Nanotechnol. 2019, 10, 1290–1302, doi:10.3762/bjnano.10.128

• modern (aberration-corrected) microscopes [11]. A range of different techniques has been developed to experimentally realize electron-beam shaping [12]. For example, special slit apertures [6][7] or nanoscale amplitude holograms [3] block specific parts of the incoming electron wave and generate the

Synthesis and characterization of quaternary La(Sr)S–TaS₂ misfit-layered nanotubes

• Marco Serra,
• Erumpukuthickal Ashokkumar Anumol,
• Dalit Stolovas,
• Iddo Pinkas,
• Ernesto Joselevich,
• Reshef Tenne,
• Andrey Enyashin and
• Francis Leonard Deepak

Beilstein J. Nanotechnol. 2019, 10, 1112–1124, doi:10.3762/bjnano.10.111

• spectroscopy. Density functional theory calculations were carried out to support the experimental observations. Keywords: aberration-corrected STEM; DFT; misfit-layered compounds; nanotubes; Raman spectroscopy; Introduction Since their discovery in 1992 [1], inorganic nanotubes (INTs) have attracted the

Comparative biological effects of spherical noble metal nanoparticles (Rh, Pd, Ag, Pt, Au) with 4–8 nm diameter

• Alexander Rostek,
• Marina Breisch,
• Kevin Pappert,
• Kateryna Loza,
• Marc Heggen,
• Manfred Köller,
• Christina Sengstock and
• Matthias Epple

Beilstein J. Nanotechnol. 2018, 9, 2763–2774, doi:10.3762/bjnano.9.258

• with a sample volume of 750 µL were used. High-resolution imaging was performed using an aberration-corrected FEI Titan transmission electron microscope (TEM) equipped with a Cs-probe corrector (CEOS Company) and operating at 300 kV [53]. Cell biology Human mesenchymal stem cells (hMSC, 5th to 10th

Accurate control of the covalent functionalization of single-walled carbon nanotubes for the electro-enzymatically controlled oxidation of biomolecules

• Naoual Allali,
• Veronika Urbanova,
• Mathieu Etienne,
• Xavier Devaux,
• Martine Mallet,
• Brigitte Vigolo,
• Jean-Joseph Adjizian,
• Chris P. Ewels,
• Sven Oberg,
• Alexander V. Soldatov,
• Edward McRae,
• Yves Fort,
• Manuel Dossot and
• Victor Mamane

Beilstein J. Nanotechnol. 2018, 9, 2750–2762, doi:10.3762/bjnano.9.257

• microscopy (HRSTEM) were performed using a probe aberration-corrected JEOL ARM200 microscope equipped with a cold field emission gun, a JEOL JED2300T energy dispersive X-ray spectrometer (EDS) and a Gatan GIF Quantum energy filter for electron energy loss spectroscopy (EELS). The microscope was operated at

Intrinsic ultrasmall nanoscale silicon turns n-/p-type with SiO₂/Si₃N₄-coating

• Dirk König,
• Daniel Hiller,
• Noël Wilck,
• Birger Berghoff,
• Merlin Müller,
• Sangeeta Thakur,
• Giovanni Di Santo,
• Luca Petaccia,
• Joachim Mayer,
• Sean Smith and
• Joachim Knoch

Beilstein J. Nanotechnol. 2018, 9, 2255–2264, doi:10.3762/bjnano.9.210

• Central Facility for Electron Microscopy, RWTH Aachen University, and on the spherical aberration corrected FEI Titan 80-300 TEM operated at 300 kV at Ernst Ruska-Centre, Forschungszentrum Jülich [26]. In addition, the Si-NWell thickness was measured by ellipsometry. The thickness of the Si-NWells in

A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si_1−xGe_x and Si layers

• Richard Daubriac,
• Emmanuel Scheid,
• Hiba Rizk,
• Richard Monflier,
• Sylvain Joblot,
• Rémi Beneyton,
• Pablo Acosta Alba,
• Sébastien Kerdilès and
• Filadelfo Cristiano

Beilstein J. Nanotechnol. 2018, 9, 1926–1939, doi:10.3762/bjnano.9.184

• measurements carried out using an aberration-corrected TEM instrument (see Figure S14, Supporting Information File 1, for the RTA-annealed wafer) and are reported as dashed lines in Figure 8. Conventional Hall effect measurements were performed on both annealed wafers and are reported in Table 1 (a scattering

Toward the use of CVD-grown MoS₂ nanosheets as field-emission source

• Geetanjali Deokar,
• Nitul S. Rajput,
• Junjie Li,
• Francis Leonard Deepak,
• Wei Ou-Yang,
• Nicolas Reckinger,
• Carla Bittencourt,
• Jean-Francois Colomer and
• Mustapha Jouiad

Beilstein J. Nanotechnol. 2018, 9, 1686–1694, doi:10.3762/bjnano.9.160

• performed using an image-corrected Titan G2 FEITM system. For selected samples, cross-section TEM analyses were carried out using an aberration-corrected FEITM Titan ChemiSTEM system (equipped with a Cs probe corrector, a high-angle annular dark-field imaging (HAADF) detector and a four quadrant Super X

Bombyx mori silk/titania/gold hybrid materials for photocatalytic water splitting: combining renewable raw materials with clean fuels

• Stefanie Krüger,
• Michael Schwarze,
• Otto Baumann,
• Christina Günter,
• Michael Bruns,
• Christian Kübel,
• Dorothée Vinga Szabó,
• Rafael Meinusch,
• Verónica de Zea Bermudez and
• Andreas Taubert

Beilstein J. Nanotechnol. 2018, 9, 187–204, doi:10.3762/bjnano.9.21

• TEM with a LaB6 cathode operated at 120 kV. High resolution transmission electron microscopy (HRTEM) was done using an aberration corrected Titan 80-300 (FEI, Eindhoven, The Netherlands) with field emission gun, operated at 300 kV. Scanning transmission electron microscopy (STEM) and chemical analysis

Magnetic properties of optimized cobalt nanospheres grown by focused electron beam induced deposition (FEBID) on cantilever tips

• Soraya Sangiao,
• César Magén,
• Darius Mofakhami,
• Grégoire de Loubens and
• José María De Teresa

Beilstein J. Nanotechnol. 2017, 8, 2106–2115, doi:10.3762/bjnano.8.210

• aberration-corrected Lorentz mode, with the objective lens switched off and the corrector aligned to compensate the spherical aberration of the Lorentz lens and achieve a spatial resolution of around 1 nm. Electron holograms of ≈20% contrast have been obtained with a biprism excitation of 160 V, an overlap

AgCl-doped CdSe quantum dots with near-IR photoluminescence

• Pavel A. Kotin,
• Sergey S. Bubenov,
• Natalia E. Mordvinova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2017, 8, 1156–1166, doi:10.3762/bjnano.8.117

• and 300 kV, respectively. The latter has 0.17 nm point resolution and is equipped with an EDAX EDX detector. High-angle annular dark field (HAADF) STEM studies and EDX mapping were performed using an JEM ARM200F cold FEG double aberration-corrected electron microscope operated at 80 kV and equipped

Structural properties and thermal stability of cobalt- and chromium-doped α-MnO₂ nanorods

• Romana Cerc Korošec,
• Polona Umek,
• Alexandre Gloter,
• Jana Padežnik Gomilšek and
• Peter Bukovec

Beilstein J. Nanotechnol. 2017, 8, 1032–1042, doi:10.3762/bjnano.8.104

• using a C3/C5 Nion USTEM spherical aberration-corrected microscope working at 100 keV. Electron energy loss spectra (EELS) were recorded with a modified GATAN EELS system with a back-illuminated charge coupled device camera. Thermogravimetric measurements were performed on a Mettler Toledo TGA/DSC1

Orientation of FePt nanoparticles on top of a-SiO₂/Si(001), MgO(001) and sapphire(0001): effect of thermal treatments and influence of substrate and particle size

• Martin Schilling,
• Paul Ziemann,
• Zaoli Zhang,
• Johannes Biskupek,
• Ute Kaiser and
• Ulf Wiedwald

Beilstein J. Nanotechnol. 2016, 7, 591–604, doi:10.3762/bjnano.7.52

• ]. HRTEM studies of cross-section samples are conducted in an aberration-corrected FEI Titan 80-300 microscope at 300 kV. The TEM samples are treated in situ in the same way as RHEED samples and finally a 10–15 nm SiO2 capping layer is deposited for oxidation protection prior to standard cross-section

Synthesis and applications of carbon nanomaterials for energy generation and storage

• Marco Notarianni,
• Jinzhang Liu,
• Kristy Vernon and
• Nunzio Motta

Beilstein J. Nanotechnol. 2016, 7, 149–196, doi:10.3762/bjnano.7.17

Ultrastructural changes in methicillin-resistant Staphylococcus aureus induced by positively charged silver nanoparticles

• Dulce G. Romero-Urbina,
• Humberto H. Lara,
• J. Jesús Velázquez-Salazar,
• M. Josefina Arellano-Jiménez,
• Eduardo Larios,
• Anand Srinivasan,
• Jose L. Lopez-Ribot and
• Miguel José Yacamán

Beilstein J. Nanotechnol. 2015, 6, 2396–2405, doi:10.3762/bjnano.6.246

• aureus and methicillin-resistant Staphylococcus aureus. We use aberration-corrected transmission electron microscopy to examine the bactericidal effects of silver nanoparticles and the ultrastructural changes in bacteria that are induced by silver nanoparticles. The study revealed that our 1 nm average

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

• Xiaoxing Ke,
• Carla Bittencourt and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

• , can now be carried out in unprecedented detail by aberration-corrected transmission electron microscopy (AC-TEM). This review discusses new possibilities and limits of AC-TEM at low voltage, including the structural imaging at atomic resolution, in three dimensions and spectroscopic investigation of

• chemistry and bonding. In situ TEM of carbon-based nanomaterials is discussed and illustrated through recent reports with particular emphasis on the underlying physics of interactions between electrons and carbon atoms. Keywords: TEM; aberration-corrected; carbon; nanostructures; low-kV imaging; Review 1

• . Fortunately this has changed over the last decade. The introduction of spherical-aberration-corrected lenses [6] has paved the way out of this dilemma by improving the spatial resolution and increasing the signal to noise ratio at the same time. This has a dramatic impact when imaging at low accelerating

Heterometal nanoparticles from Ru-based molecular clusters covalently anchored onto functionalized carbon nanotubes and nanofibers

• Deborah Vidick,
• Xiaoxing Ke,
• Michel Devillers,
• Claude Poleunis,
• Arnaud Delcorte,
• Pietro Moggi,
• Gustaaf Van Tendeloo and
• Sophie Hermans

Beilstein J. Nanotechnol. 2015, 6, 1287–1297, doi:10.3762/bjnano.6.133

• transmission electron microscopy (HRTEM) and high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) using aberration-corrected transmission electron microscopy (AC-TEM). HRTEM images of nanoparticles derived from cluster 4 reveal that they are not well crystallized (Figure 4a

• of the Ru/Pt bimetal nanoparticles, the sample was investigated using aberration-corrected HAADF-STEM and STEM energy dispersive X-ray (EDX) analysis. In HAADF-STEM, the intensity scales with the atomic number, Z. Therefore, the heavy elements in the nanoparticles, namely Pt and Ru, appear as bright

Addition of Zn during the phosphine-based synthesis of indium phospide quantum dots: doping and surface passivation

• Natalia E. Mordvinova,
• Alexander A. Vinokurov,
• Oleg I. Lebedev,
• Tatiana A. Kuznetsova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2015, 6, 1237–1246, doi:10.3762/bjnano.6.127

• ) microscope operated at 300 kV with 0.17 nm point resolution and equipped with an EDAX EDX detector. High angle annular dark field (HAADF)-scanning TEM (STEM) studies and EDX mapping were performed using an JEM ARM200F cold FEG double aberration corrected electron microscope operated at 80 kV and equipped

Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

• Sebastian Gutsch,
• Daniel Hiller,
• Jan Laube,
• Margit Zacharias and
• Christian Kübel

Beilstein J. Nanotechnol. 2015, 6, 964–970, doi:10.3762/bjnano.6.99

• ellipsometry. The EFTEM has been carried out using an image aberration corrected FEI Titan 80-300 microscope operated at 300 kV, equipped with a Gatan 863 Tridiem Imaging Filter and a US1000 slow-scan CCD camera. EFTEM images were acquired with a 5 eV energy slit centered at an energy loss of 17 eV (i.e., the

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

• Peter Guttmann and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2015, 6, 595–604, doi:10.3762/bjnano.6.61

• nanostructures/nanoparticles. By using monochromatic, aberration-corrected transmission electron microscopes (TEM) operating at low voltages spectromicroscopy of isolated nanostructures can be performed. Here, energy resolutions comparable to classical synchrotron based spectroscopy techniques can be achieved. A

Chains of carbon atoms: A vision or a new nanomaterial?

• Florian Banhart

Beilstein J. Nanotechnol. 2015, 6, 559–569, doi:10.3762/bjnano.6.58

• et al. [22]. Both groups studied graphene monolayers by aberration-corrected high-resolution electron microscopy (Figure 2). The procedure has been quite simple: graphene membranes were irradiated with the electron beam that is used for imaging in the microscope. Sputtering of carbon atoms from the

• all published images from carbon chains might be unambiguous. Despite some efforts, the atoms in chains have not been clearly resolved by TEM although aberration-corrected microscopes should have the necessary resolution power. Besides the contrast problem (single carbon atoms are rather weak electron

Liquid-phase exfoliated graphene: functionalization, characterization, and applications

• Mildred Quintana,
• Jesús Iván Tapia and
• Maurizio Prato

Beilstein J. Nanotechnol. 2014, 5, 2328–2338, doi:10.3762/bjnano.5.242

• described graphene–polyoxometalate nanohybrids can be exploited. For this, Ru4POM molecules were identified on functionalized graphene surfaces by low voltage aberration-corrected TEM (AC-TEM) [46]. Following this, a time sequence analysis of the dynamical rotation of individual Ru4POM anions on

Cathode lens spectromicroscopy: methodology and applications

• T. O. Menteş,
• G. Zamborlini,
• A. Sala and
• A. Locatelli

Beilstein J. Nanotechnol. 2014, 5, 1873–1886, doi:10.3762/bjnano.5.198

• the image quality as well as increasing the energy spread. As a result, even the aberration-corrected instruments are limited to a moderate lateral resolution in XPEEM [34]. Similar effects were not observed in LEEM with its monochromatic LaB6 cathode providing a much lower current density than the

• (111) are known to give a (2 × 2) reconstruction with an additional moiré superstructure. Nevertheless, the details of the Fe3O4 surface structure is still under study. The recent work by using an aberration-corrected XPEEM-LEEM setup, SMART (BESSY II, Helmholtz Zentrum, Berlin), showed distinct

Synthesis, characterization, and growth simulations of Cu–Pt bimetallic nanoclusters

• Subarna Khanal,
• Ana Spitale,
• Nabraj Bhattarai,
• Daniel Bahena,
• J. Jesus Velazquez-Salazar,
• Sergio Mejía-Rosales,
• Marcelo M. Mariscal and
• Miguel José-Yacaman

Beilstein J. Nanotechnol. 2014, 5, 1371–1379, doi:10.3762/bjnano.5.150

• aberration-corrected STEM, in combination with high resolution spectral and chemical analysis, has allowed us to study the atomic structure of the Cu–Pt bimetallic nanoclusters, and the chemical compositions of the particles were measured by STEM-EDX analysis. HAADF-STEM imaging allowed us to study the