The structural and chemical basis of temporary adhesion in the sea star Asterina gibbosa

• Birgit Lengerer,
• Marie Bonneel,
• Mathilde Lefevre,
• Elise Hennebert,
• Philippe Leclère,
• Emmanuel Gosselin,
• Peter Ladurner and
• Patrick Flammang

Beilstein J. Nanotechnol. 2018, 9, 2071–2086, doi:10.3762/bjnano.9.196

• homogenous granules. The footprints comprised a meshwork on top of a thin layer. This topography was consistently observed using various methods like scanning electron microscopy, 3D confocal interference microscopy, atomic force microscopy, and light microscopy with crystal violet staining. Additionally, we

• interference microscopy, and atomic force microscopy (AFM). A. gibbosa tube feet and footprints were labelled with antibodies raised against the adhesive protein Sfp1 from A. rubens, but no cross-reactivity was observed. To detect carbohydrate moieties, we performed lectin labelling with 24 commercially

• ). The mesh size varied from 1 to 5 µm in diameter (Figure 4C). At higher magnification, the fine structure of both layers appeared similar (Figure 4D). The footprint topography was confirmed with 3D confocal interference microscopy and atomic force microscopy (AFM) (Figure 5). 3D confocal interference

Recent highlights in nanoscale and mesoscale friction

• Andrea Vanossi,
• Dirk Dietzel,
• Andre Schirmeisen,
• Ernst Meyer,
• Rémy Pawlak,
• Thilo Glatzel,
• Marcin Kisiel,
• Shigeki Kawai and
• Nicola Manini

Beilstein J. Nanotechnol. 2018, 9, 1995–2014, doi:10.3762/bjnano.9.190

• ” research field is leading to new technological advances in the area of engineering and materials science. Keywords: atomic force microscopy; dissipation; friction; mesoscale; nanomanipulation; nanoscale; scale bridging; structural lubricity; superlubricity; Introduction Friction, the force that resists

Biomimetic and biodegradable cellulose acetate scaffolds loaded with dexamethasone for bone implants

• Aikaterini-Rafailia Tsiapla,
• Varvara Karagkiozaki,
• Veroniki Bakola,
• Foteini Pappa,
• Panagiota Gkertsiou,
• Eleni Pavlidou and
• Stergios Logothetidis

Beilstein J. Nanotechnol. 2018, 9, 1986–1994, doi:10.3762/bjnano.9.189

• work, a drug-delivery nanoplatform system consisting of polymeric celluloce acetate (CA) scaffolds loaded with dexamethasone was fabricated through electrospinning. Atomic force microscopy (AFM) and scanning electron microscopy (SEM) indicated the successful fabrication of these structures

Nonlinear effect of carrier drift on the performance of an n-type ZnO nanowire nanogenerator by coupling piezoelectric effect and semiconduction

• Yuxing Liang,
• Shuaiqi Fan,
• Xuedong Chen and
• Yuantai Hu

Beilstein J. Nanotechnol. 2018, 9, 1917–1925, doi:10.3762/bjnano.9.183

• nanowire bent when an atomic force microscopy tip scans over the top of the nanowire. The electromechanical coupling converts mechanical energy into electric energy [28][29]. A piezoelectric potential is built inside the nanowire with the stretched side being positively charged and the compressed side

Synthesis of hafnium nanoparticles and hafnium nanoparticle films by gas condensation and energetic deposition

• Irini Michelakaki,
• Nikos Boukos,
• Dimitrios A. Dragatogiannis,
• Spyros Stathopoulos,
• Costas A. Charitidis and
• Dimitris Tsoukalas

Beilstein J. Nanotechnol. 2018, 9, 1868–1880, doi:10.3762/bjnano.9.179

• of nanoparticles. Conclusion We have demonstrated the production and characterization of Hf nanoparticles and Hf nanoparticles thin films. A number of methods, including grazing X-ray diffraction, transmission electron microscopy, scanning electron microscopy, atomic force microscopy and

• of the NPs and NTFs were performed by field-emission scanning electron microscopy (FESEM FEI Nova Nano SEM 230) and atomic force microscopy (Veeco diInnova) in tapping mode. The nanomechanical properties of the NTFs were determined by nanoindentation. Nanoidentation testing was performed with a

Quantitative comparison of wideband low-latency phase-locked loop circuit designs for high-speed frequency modulation atomic force microscopy

• Kazuki Miyata and
• Takeshi Fukuma

Beilstein J. Nanotechnol. 2018, 9, 1844–1855, doi:10.3762/bjnano.9.176

• loop (PLL) circuit is the central component of frequency modulation atomic force microscopy (FM-AFM). However, its response speed is often insufficient, and limits the FM-AFM imaging speed. To overcome this issue, we propose a PLL design that enables high-speed FM-AFM. We discuss the main problems with

• dissolution process; frequency modulation atomic force microscopy; high-speed atomic-resolution imaging; phase-locked loop; Introduction Frequency modulation atomic force microscopy (FM-AFM) is a powerful tool for investigating atomic- and molecular-scale structures of sample surfaces in various environments

Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics

• Katherine Atamanuk,
• Justin Luria and
• Bryan D. Huey

Beilstein J. Nanotechnol. 2018, 9, 1802–1808, doi:10.3762/bjnano.9.171

• , microstructure, and performance is necessary as a function of device design, processing, and in-service conditions. Atomic force microscopy (AFM) has been a valuable tool for such characterization, especially of materials properties and device performance at the nanoscale. In the case of thin-film solar cells

Uniform cobalt nanoparticles embedded in hexagonal mesoporous nanoplates as a magnetically separable, recyclable adsorbent

• Can Zhao,
• Yuexiao Song,
• Tianyu Xiang,
• Wenxiu Qu,
• Shuo Lou,
• Xiaohong Yin and
• Feng Xin

Beilstein J. Nanotechnol. 2018, 9, 1770–1781, doi:10.3762/bjnano.9.168

• magnetometer (VSM) with an applied magnetic field between −20 kOe and 20 kOe at room temperature (SQUID-VSM, USA). Atomic force microscopy (AFM) was performed on an AFM instrument (NTEGRA Spectra, Russia) using tapping mode. The samples were deposited onto clean Si substrates and dried at 60 °C. UV–vis

Preparation of micro/nanopatterned gelatins crosslinked with genipin for biocompatible dental implants

• Reika Makita,
• Tsukasa Akasaka,
• Seiichi Tamagawa,
• Yasuhiro Yoshida,
• Saori Miyata,
• Hirofumi Miyaji and
• Tsutomu Sugaya

Beilstein J. Nanotechnol. 2018, 9, 1735–1754, doi:10.3762/bjnano.9.165

• patterns with immersion time in the cell culture medium by using atomic force microscopy or high-resolution confocal three-dimensional microscopy in liquid. Another limitation is that optimized reaction conditions have not been thoroughly investigated with conditions such as longer reaction time, higher or

Magnetic properties of Fe₃O₄ antidot arrays synthesized by AFIR: atomic layer deposition, focused ion beam and thermal reduction

• Juan L. Palma,
• Alejandro Pereira,
• Raquel Álvaro,
• José Miguel García-Martín and
• Juan Escrig

Beilstein J. Nanotechnol. 2018, 9, 1728–1734, doi:10.3762/bjnano.9.164

• has a controlled atmosphere of hydrogen (4%) balanced with argon (96%) at an overpressure of 400 mbar with a set temperature of 430 °C, for 4 h [32][33]. This process allows for the conversion of Fe2O3 to Fe3O4, which exhibits a strong magnetic signal. Atomic force microscopy (AFM) measurements have

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

• Yann Almadori,
• David Moerman,
• Jaume Llacer Martinez,
• Philippe Leclère and
• Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

• du Parc 20, B7000 Mons, Belgium 10.3762/bjnano.9.161 Abstract In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). We demonstrate that the surface photovoltage and crystal

• . Keywords: carrier lifetime; ion migration; Kelvin probe force microscopy (KPFM); noncontact atomic force microscopy (nc-AFM); organic–inorganic hybrid perovskites; photostriction; single crystals; surface photovoltage (SPV); time-resolved surface photovoltage; Introduction Organic–inorganic hybrid

Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS

• Jonathan Op de Beeck,
• Nouha Labyedh,
• Alfonso Sepúlveda,
• Valentina Spampinato,
• Alexis Franquet,
• Thierry Conard,
• Philippe M. Vereecken,
• Wilfried Vandervorst and
• Umberto Celano

Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154

• established nanoscale analysis techniques namely conductive atomic force microscopy (C-AFM) and secondary ion mass spectrometry (SIMS). We present a platform to study Li-ion composites with nanometer resolution that allows one to sense a multitude of key characteristics including structural, electrical and

• indicated. Keywords: all-solid-state microbatteries (ASB); conductive atomic force microscopy (C-AFM); Li-ion kinetics; secondary ion mass spectrometry (SIMS); 3D thin-film batteries; Findings Conventional Li-ion battery technology is undergoing continuous improvements in order to fulfil the increasing

• conductive atomic force microscopy (C-AFM) and secondary ion mass spectrometry (SIMS). As model systems, we focus on LiMn2O4 (LMO) as cathode material [7] deposited by wet electrodeposition (thickness 260 nm) and RF-sputtered (thickness 100 nm) and compare their properties on a local (sub-100 nm) scale. In

Light extraction efficiency enhancement of flip-chip blue light-emitting diodes by anodic aluminum oxide

• Yi-Ru Huang,
• Yao-Ching Chiu,
• Kuan-Chieh Huang,
• Shao-Ying Ting,
• Po-Jui Chiang,
• Chih-Ming Lai,
• Chun-Ping Jen,
• Snow H. Tseng and
• Hsiang-Chen Wang

Beilstein J. Nanotechnol. 2018, 9, 1602–1612, doi:10.3762/bjnano.9.152

• LEE [12][16][35][36]. Whether the nanostructure, which possesses special metallic features, is influenced by the surface plasmon wave and enhances LEE has also been studied [37][38][39][40]. Results and Discussion Scanning electron microscopy and atomic force microscopy measurements The scanning

• , and AAO80, respectively. The device structure is shown in Figure 12 after the AAO processes are completed. Scanning electron microscopy images of the anodic aluminum oxide (AAO) nanostructure on a sapphire substrate: sample (a) AAO60, (b) AAO70, and (c) AAO80. Atomic force microscopy measurements for

Closed polymer containers based on phenylboronic esters of resorcinarenes

• Tatiana Yu. Sergeeva,
• Rezeda K. Mukhitova,
• Irek R. Nizameev,
• Marsil K. Kadirov,
• Polina D. Klypina,
• Albina Y. Ziganshina and
• Alexander I. Konovalov

Beilstein J. Nanotechnol. 2018, 9, 1594–1601, doi:10.3762/bjnano.9.151

• diameter of p(SRA-B) is about 130 nm as evident from atomic force microscopy (AFM) images (Figure 1). The average molecular weight determined by static light scattering (SLS) measurements, is about 1600 ± 90 kDa (see Supporting Information File 1, Figure S2). In the IR spectrum of p(SRA-B), the band

Correlative electrochemical strain and scanning electron microscopy for local characterization of the solid state electrolyte Li_1.3Al_0.3Ti_1.7(PO₄)₃

• Nino Schön,
• Deniz Cihan Gunduz,
• Shicheng Yu,
• Hermann Tempel,
• Roland Schierholz and
• Florian Hausen

Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148

• relatively new technique based on atomic force microscopy (AFM): An AC voltage with the same frequency as the contact resonance frequency of the tip–sample contact is applied to a conductive tip. [22][23]. The induced electrical field in the material under investigation is extremely localized due to the

• , Hillsboro, Oregon, USA) equipped with a field emission gun (FEG) and EDX (Octane 60 mm2, EDAX Inc., Mahwah, NJ, USA) was employed to visualize the grain structure of LATP samples. Chemical information from the various regions of interest was obtained by means of EDX. Atomic force microscopy and

Preparation and morphology-dependent wettability of porous alumina membranes

• Dmitry L. Shimanovich,
• Alla I. Vorobjova,
• Daria I. Tishkevich,
• Alex V. Trukhanov,
• Maxim V. Zdorovets and
• Artem L. Kozlovskiy

Beilstein J. Nanotechnol. 2018, 9, 1423–1436, doi:10.3762/bjnano.9.135

• microscopy and atomic force microscopy characterization results are presented. The comparative analysis of PAM surfaces (outer and inner) and the effect of morphology of these surfaces on the wetting properties are discussed. Both alumina surfaces show significant morphology-dependent wettability

• examined by scanning electron microscopy (SEM, Philips, XL 30 S FEG and Hitachi, S-4800) and atomic force microscopy (AFM, Nanotop, NT-206 (Belarus) and Solver P47H, NT-MDT Co., Russia). Computer processing of the experimental data was carried out using the software package Surface Explorer Document (SED

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• , or vacuum environments. Keywords: amplitude calibration; atomic force microscopy; electrostatic excitation; encased cantilevers; liquid AFM; Introduction Dynamic atomic force microscopy requires excitation of the cantilever oscillation. Most commonly, this is achieved using a dither piezo built

Induced smectic phase in binary mixtures of twist-bend nematogens

• Anamarija Knežević,
• Irena Dokli,
• Marin Sapunar,
• Suzana Šegota,
• Ute Baumeister and
• Andreja Lesac

Beilstein J. Nanotechnol. 2018, 9, 1297–1307, doi:10.3762/bjnano.9.122

• , obtained by atomic force microscopy (AFM) imaging, is in the range of 6–7 nm. The induction of the smectic phase in the mixtures containing 55–80 mol % of BB was confirmed using polarising optical microscopy (POM), differential scanning calorimetry (DSC) and X-ray diffraction. The origin of the

• phase. Various spectroscopic techniques and molecular dynamic calculations were used in an attempt to determine the interactions responsible for the induction of the smectic phase. Atomic force microscopy (AFM) measurements performed on the mixtures enriched with CBI showed that the distance between

Artifacts in time-resolved Kelvin probe force microscopy

• Sascha Sadewasser,
• Nicoleta Nicoara and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2018, 9, 1272–1281, doi:10.3762/bjnano.9.119

• electrostatic force microscopy (EFM) on organic photovoltaic blends [14][15][16]. By applying a bias pulse to the atomic force microscopy (AFM) tip, Schirmeisen et al. studied the ion transport in solid electrolytes [17]. By applying bias pulses across organic field-effect transistors (OFETs) electronic

Atomistic modeling of tribological properties of Pd and Al nanoparticles on a graphene surface

• Alexei Khomenko,
• Miroslav Zakharov,
• Denis Boyko and
• Bo N. J. Persson

Beilstein J. Nanotechnol. 2018, 9, 1239–1246, doi:10.3762/bjnano.9.115

• where the surface atoms interact strongly with the substrate. In the opposite limit (Figure 6a), where the interaction potential with the substrate atoms is very weak (), the particle takes a nearly spherical shape and in this case the projected area, as would be obtained using, e.g., atomic force

• microscopy, would be much larger than the surface area where strong interaction with the substrate occurs. In our study we are in an intermediate interaction potential region where the contact appears as in Figure 6b. In this case using the projected contact area will not give the area where the interaction

A novel copper precursor for electron beam induced deposition

• Caspar Haverkamp,
• George Sarau,
• Mikhail N. Polyakov,
• Ivo Utke,
• Marcos V. Puydinger dos Santos,
• Silke Christiansen and
• Katja Höflich

Beilstein J. Nanotechnol. 2018, 9, 1220–1227, doi:10.3762/bjnano.9.113

• spectrum of FEBID nanocones. Results and Discussion Pads with different deposition times were fabricated and their heights were measured by atomic force microscopy, cf. Figure 1a and Figure 1b. The deposition current was measured to be 7 nA. Other deposition parameters are 15 keV primary beam energy, 10 μs

Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• matrix of OTS showed minimal areas of nonspecific adsorption. The AFM studies provide insight into the mechanism of the self-polymerization of CMPS as a platform for constructing porphyrin heterostructures. Keywords: atomic force microscopy (AFM); nanostructures; particle lithography; porphyrin; self

• with a surface orientation defined by the substituents [20]. The self-assembly of manganese meso-tetra(4-pyridyl)porphyrin on Cu(111) was studied using low temperature scanning tunneling microscopy (STM) and atomic force microscopy (AFM) to resolve molecular structures by Chen et al. [21]. A

• porphyrins and organosilanes. With ex situ steps of particle lithography, the successive addition of molecules through chemical reactions in solution can be evaluated by measuring changes in the heights and morphology of nanostructures. Using high-resolution atomic force microscopy (AFM), surface changes can

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• of rGO, scanning probe microscopy (SPM) has also been employed recently to study the reduction of GO sheets at the nanoscale. Conductive atomic force microscopy (CAFM) [15][16] can be used to verify the reduced nanostructures on GO sheets. However, because CAFM relies on contact with the sample, the

Imaging of viscoelastic soft matter with small indentation using higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy

• Miead Nikfarjam,
• Enrique A. López-Guerra,
• Santiago D. Solares and
• Babak Eslami

Beilstein J. Nanotechnol. 2018, 9, 1116–1122, doi:10.3762/bjnano.9.103

• Abstract In this short paper we explore the use of higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy (AFM) for the small-indentation imaging of soft viscoelastic materials. In viscoelastic materials, whose response depends on the deformation rate, the tip–sample forces

• the invention of atomic force microscopy (AFM), researchers have sought to increase the number of observables that are recorded during a single-pass measurement, as well as improve the sensitivity with which those observables are recorded [1][2][3][4][5]. In an effort to control the sensitivity and

A simple extension of the commonly used fitting equation for oscillatory structural forces in case of silica nanoparticle suspensions

• Sebastian Schön and
• Regine von Klitzing

Beilstein J. Nanotechnol. 2018, 9, 1095–1107, doi:10.3762/bjnano.9.101

• before use. Methods Experiments have been conducted using the colloidal probe atomic force microscopy technique (CP-AFM) as introduced by Ducker and Butt [60][61]. For this method, a large silica sphere, 6.7 μm in diameter, is glued (UHU endfest 300) onto the tip of a cantilever (CSC38 tipless micromash