Electron beam-induced deposition of platinum from Pt(CO)₂Cl₂ and Pt(CO)₂Br₂

• Aya Mahgoub,
• Hang Lu,
• Rachel M. Thorman,
• Konstantin Preradovic,
• Titel Jurca,
• Lisa McElwee-White,
• Howard Fairbrother and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2020, 11, 1789–1800, doi:10.3762/bjnano.11.161

• deposits [21]. In that study, after exposing a Pt(CO)2Cl2 deposit to a 3 keV, 300 nA, e-beam in the AES system for 7 h, EDX and AES measurements were performed to evaluate the composition in the bulk and at the surface, respectively. The EDX measurement showed no change in the Pt content while the AES

• measurement showed an increase from 36 to 56 atom % Pt [21]. This proves that e-beam post deposition exposure removes the Cl from the surface only, and not from the bulk. Indeed, for much thinner deposits created in the AES system post-deposition e-beam irradiation purified deposits to a level of 87% Pt [21

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• -intrinsic/BN junction. Moreover, the amplitude of the local capacitance variation for the lightly doped n-type epitaxial silicon layer is close to zero (almost no signal). In the phase measurement, this layer has a value that is similar to the one obtained for the oxide, which explains the relatively poor

• architecture of the device including all FEOL and BEOL layers. In the previous sections, we described the testing methodology of the sMIM measurement for a highly integrated microelectronic device. Both FEOL and BEOL integrated layers were measured and analysed. In our study, sMIM was used to simultaneously

• regarding the local interaction between BEOL and FEOL layers (e.g., local diffusion). In addition, while the application of a DC voltage to the sample is not necessary for the measurement of the microwave impedance of the tip–sample system in sMIM, we evaluated the impact of the applied DC voltage using a

Absorption and photoconductivity spectra of amorphous multilayer structures

• Oxana Iaseniuc and
• Mihail Iovu

Beilstein J. Nanotechnol. 2020, 11, 1757–1763, doi:10.3762/bjnano.11.158

• using a spectrophotometer SPM-2 and an electrometrical amplifier U1-7, with a measurement error below ±1.0%. All experiments were performed at room temperature (T ≈ 20 °C). Results and Discussion Figure 1 shows the transmission spectra T = f(λ) of the separate amorphous thin films Ge0.30As0.04S0.66 (1

Application of contact-resonance AFM methods to polymer samples

• Sebastian Friedrich and
• Brunero Cappella

Beilstein J. Nanotechnol. 2020, 11, 1714–1727, doi:10.3762/bjnano.11.154

• Sebastian Friedrich Brunero Cappella Federal Institute for Material Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany 10.3762/bjnano.11.154 Abstract Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties of rather stiff

• of the contact stiffness. Several methods to obtain this parameter, such as direct measurement via scanning electron microscopy [14] or identification of the value for which two different modes of the same cantilever yield the same contact stiffness (“mode crossing” method), may lead to different

• values [16]. This is a major weakness of current analysis methods. Additionally, as in other techniques dealing with mechanical properties, the radius of the tip needs to be known. Alternatively, a calibration sample can be used [16]. Yet, this presupposes the exact measurement of the elastic modulus of

Seebeck coefficient of silicon nanowire forests doped by thermal diffusion

• Shaimaa Elyamny,
• Elisabetta Dimaggio and
• Giovanni Pennelli

Beilstein J. Nanotechnol. 2020, 11, 1707–1713, doi:10.3762/bjnano.11.153

• metal-assisted etching technique. After fabrication, a thermal diffusion process is used for doping the nanowire forest with phosphorous. A suitable experimental technique has been developed for the measurement of the Seebeck coefficient under static conditions, and results are reported for different

• not possible to fabricate an optimized generator module based on two legs with opposite heavy doping. A possible solution is to dope the silicon nanowires by thermal diffusion [21], after their fabrication by MACE. In this work, we present the measurement of the Seebeck coefficient of SiNWs doped

• . Therefore, it is mandatory to perform a single-step diffusion process, which results in a nonuniform doping concentration in the nanowire. Here, we report the measurement of the Seebeck coefficient after different doping processes, and compare the measurements with numerical simulations that take into

The influence of an interfacial hBN layer on the fluorescence of an organic molecule

• Christine Brülke,
• Oliver Bauer and
• Moritz M. Sokolowski

Beilstein J. Nanotechnol. 2020, 11, 1663–1684, doi:10.3762/bjnano.11.149

• . The sample was annealed in iterative steps of heating, holding at a constant temperature for 3 min, and cooling down again to 20 K for a measurement. The annealing temperatures were in the range of 100–400 K and are specified below. In the following, one monolayer (ML) of PTCDA refers to a single

Piezoelectric sensor based on graphene-doped PVDF nanofibers for sign language translation

• Shuai Yang,
• Xiaojing Cui,
• Rui Guo,
• Zhiyi Zhang,
• Shengbo Sang and
• Hulin Zhang

Beilstein J. Nanotechnol. 2020, 11, 1655–1662, doi:10.3762/bjnano.11.148

• . Nowadays, pressure and bending angle sensors are mainly based on signals caused by a changing force [17][18][19][20][21][22][23][24][25]. Plenty of measurement methods, using different materials and different principles, have been proposed in recent years [26]. Although these sensors can detect various

• , piezoelectric sensors show potential in wearable sensing applications [19][36][37][38][39][40][41]. However, traditional piezoelectric sensor devices such as piezoelectric ceramics have disadvantages in detecting bending, and their detection stability and measurement range need to be improved [18][42][43][44

• glove with double-sided tape. The thin copper wires were connected to the input terminals of the analogue measurement channels of a National Instruments BNC-2111 connector block. Voltage and current were measured with a Keithley 6514 electrometer (200 TΩ input impedance). The analogue signal of each

Amorphized length and variability in phase-change memory line cells

• Nafisa Noor,
• Sadid Muneer,
• Raihan Sayeed Khan,
• Anna Gorbenko and
• Helena Silva

Beilstein J. Nanotechnol. 2020, 11, 1644–1654, doi:10.3762/bjnano.11.147

• unpredictable programming feature in phase-change memory devices can be utilized in hardware security applications. Keywords: amorphous materials; drift; electrical breakdown; electrical resistivity; phase-change memory; pulse measurement; stochastic processes; threshold switching; Introduction Phase-change

• measurement results. Krebs et al. measured a threshold field of 56 V/µm for as-deposited GST amorphous bridge cells by measuring the threshold voltage values of various cells of known dimensions. They concluded that the threshold field is a material-dependent physical parameter, whereas the specific threshold

• applied. Low-voltage DC sweep read operations were performed before and after each applied pulse. Figure 3 shows the schematic of the measurement sequences. Results and Discussion Measurements of the re-amorphization of a single wire An example of the re-amorphization procedure on an initially amorphized

Selective detection of complex gas mixtures using point contacts: concept, method and tools

• Alexander P. Pospelov,
• Victor I. Belan,
• Dmytro O. Harbuz,
• Volodymyr L. Vakula,
• Lyudmila V. Kamarchuk,
• Yuliya V. Volkova and
• Gennadii V. Kamarchuk

Beilstein J. Nanotechnol. 2020, 11, 1631–1643, doi:10.3762/bjnano.11.146

• contacts display quantum properties that enable the direct measurement of the interaction between electrons and various quasiparticles, such as phonons or magnons [5][6], the observation of the spectral aspects of processes occurring in the superconducting state [7][8], and the extraction of spectral

• connector at the upper end of the holder, before the measurements are taken. Then, a disposable hood, in the form of a removable cone-shaped tube, used for the formation of a cell containing the sensor, is attached to the upper end of the holder. During the measurement, this cell is kept inside the mouth of

• usually is in the range of 1–3 min. Thus, the whole process of registering the breath profile occurs in real time. After the relaxation, the sensor is ready for the next measurement. To increase the reproducibility and reliability of the obtained results, we made three consecutive measurements for each

A self-powered, flexible ultra-thin Si/ZnO nanowire photodetector as full-spectrum optical sensor and pyroelectric nanogenerator

• Liang Chen,
• Jianqi Dong,
• Miao He and
• Xingfu Wang

Beilstein J. Nanotechnol. 2020, 11, 1623–1630, doi:10.3762/bjnano.11.145

• . Finally, by RF magnetron sputtering, a 200 nm thick layers of ITO and Cu were deposited on ZnO NWs and p-Si, respectively. Electrical measurements: the measurement setup includes a source meter, an optical platform, a chopper, sample, and a light source. Sample, chopper and light source must be in the

PTCDA adsorption on CaF₂ thin films

• Philipp Rahe

Beilstein J. Nanotechnol. 2020, 11, 1615–1622, doi:10.3762/bjnano.11.144

• distribution in Figure 3a, there is a strong tendency for PTCDA molecules to align under angles of about ±30° with respect to a CaF2 direction, especially after deposition on samples held at room temperature. The width of the peaks is attributed to uncertainties of the angle measurement and the asymmetry to a

High-responsivity hybrid α-Ag₂S/Si photodetector prepared by pulsed laser ablation in liquid

• Raid A. Ismail,
• Hanan A. Rawdhan and
• Duha S. Ahmed

Beilstein J. Nanotechnol. 2020, 11, 1596–1607, doi:10.3762/bjnano.11.142

• Ag2S nanoparticles, while the origin of carbon is CTAB. Hall measurement revealed that the Ag2S had a negative Hall coefficient, indicating that it is an n-type semiconductor. This finding agrees well with [39]. Figure 11 shows the dark I–V characteristics of an n-Ag2S/p-Si heterojunction prepared

Walking energy harvesting and self-powered tracking system based on triboelectric nanogenerators

• Mingliang Yao,
• Guangzhong Xie,
• Qichen Gong and
• Yuanjie Su

Beilstein J. Nanotechnol. 2020, 11, 1590–1595, doi:10.3762/bjnano.11.141

• the electrode as an output terminal. Characterization and electrical measurement of the u-TENG Field-emission scanning electron microscopy (FESEM, Hitachi SU-8020) was used to characterize the surface morphology of the modified PTFE film. A Stanford Research Systems equipment was used to measure the

• u-TENG reverts back to its unloaded position. (d) An external force compresses the u-TENG, driving the electrons move from the undulated electrode to the planar electrode. Electrical measurement results of the u-TENG. Open-circuit voltage (a) and short-circuit current (b) of the prepared u-TENG at

Fabrication of nano/microstructures for SERS substrates using an electrochemical method

• Jingran Zhang,
• Tianqi Jia,
• Xiaoping Li,
• Junjie Yang,
• Zhengkai Li,
• Guangfeng Shi,
• Xinming Zhang and
• Zuobin Wang

Beilstein J. Nanotechnol. 2020, 11, 1568–1576, doi:10.3762/bjnano.11.139

• SERS measurement. Different sizes of arrayed micro/nanostructures are fabricated by different treatment time using the electrochemical process. The topographies of these micro/nanostructures and the thickness of the Au film have an influence on the Raman intensity of the Mg substrate. Furthermore, when

• could be detected. Thus, the electrochemical method can be used to create flexible Au-coated substrates of highly reproducible structure with long-term stability. SERS measurement of lysozyme on the nanopore substrates The enzyme lysozyme can rupture the cell walls of certain pathogens following

Cu₂O nanoparticles for the degradation of methyl parathion

• Juan Rizo,
• David Díaz,
• Benito Reyes-Trejo and
• M. Josefina Arellano-Jiménez

Beilstein J. Nanotechnol. 2020, 11, 1546–1555, doi:10.3762/bjnano.11.137

• does not represent the concentration of NPs because they are made up of different amounts of Cu2O. When the reactions were over, the NPs were separated by centrifugation. This was done also before each UV–vis absorption and NMR measurement. Degradation of MP with bulk Cu2O was also tested, giving

• water is accomplished to about 87% after 44 h of reaction time using 16 nm Cu2O NPs, to about 84% with 29 nm Cu2O NPs, and to about 75% with 45 nm Cu2O NPs. The measurement at 144 h showed a complete degradation (100%), although this was an excess time and does not correspond to the actual time for a

Optically and electrically driven nanoantennas

• Monika Fleischer,
• Dai Zhang and
• Alfred J. Meixner

Beilstein J. Nanotechnol. 2020, 11, 1542–1545, doi:10.3762/bjnano.11.136

• of their optical phonon response. High local field enhancement is likewise required in TERS experiments, where a tip with a hotspot located at its apex is scanned across a sample surface. The performance of a TERS measurement is closely related to the quality of the tip [46]. Therefore, researchers

Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• -pass measurement [1]. In bimodal AFM, the first eigenmode is excited at or near the resonance frequency (reserved for topography measurements) while the second eigenmode is in open-loop capturing material composition via phase shift of the second eigenmode. Due to its unique capabilities

• , multifrequency AFM has gained the attention of different fields, such as, the measurement of nanoscale chemical and mechanical properties of human dentin [2], the mapping of viscoelastic materials [3], or the characterization of thin molecular films [4]. As different fields have implemented multifrequency AFM in

• -shaped cantilever involves considering different geometrical parameters that can directly influence the quality of bimodal AFM measurements. This nonlinear equation provides a single value to quantify how suitable the cantilever is for a given measurement. Schematic of V-shaped cantilevers with different

Helium ion microscope – secondary ion mass spectrometry for geological materials

• Matthew R. Ball,
• Richard J. M. Taylor,
• Joshua F. Einsle,
• Fouzia Khanom,
• Christelle Guillermier and
• Richard J. Harrison

Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133

• value of m/z for which no secondary ions were expected, for the measurement of a “background count rate”, with a fixed, low magnetic field of around 100 mT. The primary beam was rastered over the sample to simultaneously map ion counts on each detector with a typical dwell time per pixel of 4 ms

• standards, since small changes in the matrix can have a large effect on the constants involved in calculating the concentration of an element. The relative sensitivity factor approach relies on the measurement of both the target element, x, as well as a known matrix element, m. The concentration of the

• measurement conditions, which are accounted for in a “true” relative sensitivity factor approach by the secondary ion current of a matrix element, Im, as shown in Equation 2: Both of these methods rely on calibration to a known standard and using standards on the HIM–SIMS comes with many of the same

Controlling the electronic and physical coupling on dielectric thin films

• Philipp Hurdax,
• Michael Hollerer,
• Larissa Egger,
• Georg Koller,
• Xiaosheng Yang,
• Anja Haags,
• Serguei Soubatch,
• Frank Stefan Tautz,
• Mathias Richter,
• Alexander Gottwald,
• Peter Puschnig,
• Martin Sterrer and
• Michael G. Ramsey

Beilstein J. Nanotechnol. 2020, 11, 1492–1503, doi:10.3762/bjnano.11.132

• that systematic thickness-dependent studies of charge transfer to 6P could not be performed. On dielectric interlayers, a simple measurement of the work function before and after the adsorbate overlayer growth is perhaps the most telling result with regard to electronic and physical coupling. If there

A wideband cryogenic microwave low-noise amplifier

• Boris I. Ivanov,
• Dmitri I. Volkhin,
• Ilya L. Novikov,
• Dmitri K. Pitsun,
• Dmitri O. Moskalev,
• Ilya A. Rodionov,
• Evgeni Il’ichev and
• Aleksey G. Vostretsov

Beilstein J. Nanotechnol. 2020, 11, 1484–1491, doi:10.3762/bjnano.11.131

• gain (G). The superconducting qubit measurement setup requires particular low-noise amplifiers applicable for cryogenic temperatures. An important point is that cryogenic low-noise amplifiers (cLNAs) are wideband noise sources itself. In the superconducting qubit experimental setup the noise generated

• Ω input and output terminations and can be installed in a microwave measurement setup at the 4 K stage of modern dilution refrigerators. The implemented amplifier was tested by superconducting X-mon qubit measurements. In order to measure the X-mon qubit parameters the standard low signal power one

• frequency of 12 GHz. The design was optimized for the frequency range from 6 to 12 GHz, which fits to most of modern qubit measurement setups. We used the available S-parameters of the transistor for the matching circuit design. From a circuit simulation with ideal components a minimal gain value of more

Self-assembly and spectroscopic fingerprints of photoactive pyrenyl tectons on hBN/Cu(111)

• Domenik M. Zimmermann,
• Knud Seufert,
• Luka Ðorđević,
• Tobias Hoh,
• Sushobhan Joshi,
• Tomas Marangoni,
• Davide Bonifazi and
• Willi Auwärter

Beilstein J. Nanotechnol. 2020, 11, 1470–1483, doi:10.3762/bjnano.11.130

• between the values of the HOMO–LUMO gaps and the excitation energy obtained by STS and UV–vis absorption (see Figure 6) revealed that the optical gap seemed to be smaller than the electronic gap. This was expected due to the intrinsic differences in the measurement process of these gaps [85]. However

Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir

• Mathias Franz,
• Romy Junghans,
• Paul Schmitt,
• Adriana Szeghalmi and
• Stefan E. Schulz

Beilstein J. Nanotechnol. 2020, 11, 1439–1449, doi:10.3762/bjnano.11.128

• . The shown measurement was carried out on the sample shown in Figure 9c,d. It has been etched with an H2O2 concentration of 100 mmol/L. The graph shows the potential of an integration using Ir nanoparticles. The mean reflectance can be decreased down to 4%. However, a substantial improvement in

• %. The average value over the measured range is 5.4%. For comparison, the measurement of the Si wafer with the Au particles is added to the graph. This wafer has been etched under the same etching conditions but shows a significantly better performance than the other wafers. The reported reflectance

Protruding hydrogen atoms as markers for the molecular orientation of a metallocene

• Linda Laflör,
• Michael Reichling and
• Philipp Rahe

Beilstein J. Nanotechnol. 2020, 11, 1432–1438, doi:10.3762/bjnano.11.127

• between about 0.15 and 0.8 nm. Both instruments were equipped with an atom-tracking system for drift measurement and compensation [31]. All experimental data were analysed using Gwyddion [32]. The probe particle model (PPM) [23] was used for simulating NC-AFM imaging contrast. Neutral oxygen and xenon

• prepared by standard procedures to be mostly stable and sharp enough to locally enter the repulsive regime. Following the vision of [9], the measurement of the two hydrogen atom positions with respect to the orientation of the CaF2(111) lattice allows us to identify the ferrocene conformer and the

One-step synthesis of carbon-supported electrocatalysts

• Sebastian Tigges,
• Nicolas Wöhrl,
• Ivan Radev,
• Ulrich Hagemann,
• Markus Heidelmann,
• Thai Binh Nguyen,
• Stanislav Gorelkov,
• Stephan Schulz and
• Axel Lorke

Beilstein J. Nanotechnol. 2020, 11, 1419–1431, doi:10.3762/bjnano.11.126

• measurement errors. Due to these limitations, the absolute platinum loading (in µg/cm²) used for the ECSA calculation was determined by measuring the absolute mass of a catalyst layer with a highly sensitive mass comparator (Sartorius C50) and multiplying it with the relative platinum loading (in weight

On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 1409–1418, doi:10.3762/bjnano.11.125

• studies have explored different phenomena, such as energy dissipation and the proportion between elastic and viscous probe–sample interactions during the measurement [22][23][24][25][26][27]. A large number of publications have focused on the study of the phase signal (i.e., the lag of the oscillatory