Nonclassical dynamic modeling of nano/microparticles during nanomanipulation processes

• Moharam Habibnejad Korayem,
• Ali Asghar Farid and
• Rouzbeh Nouhi Hefzabad

Beilstein J. Nanotechnol. 2020, 11, 147–166, doi:10.3762/bjnano.11.13

• cantilever frequencies to contact stiffness and investigated the variation of sensitivity with cantilever slope [3][4]. Shi and Zhao examined the contact models at the nanoscale and compared Derjaguin–Muller–Toporov (DMT), Johnson–Kendall–Roberts–Sperling (JKRS) and Maugis–Dugdale (MD) models with the Hertz

• model. They studied the effect of dimensionless load and the transition parameter on the contact area. They emphasized the importance of the MD model that covers a large area of AFM surveys [5]. Owing to the importance of the AFM cantilever spring constant and its use in calculation of the rupture force

• of protein bonds and Young’s modulus of nanoparticles, Clifford and Seah determined the AFM cantilever normal spring constant [6]. Korayem and Zakeri studied the effects of different parameters on the times and forces in a 2D manipulation. Using their proposed algorithm, the location of the

A review of demodulation techniques for multifrequency atomic force microscopy

• David M. Harcombe,
• Michael G. Ruppert and
• Andrew J. Fleming

Beilstein J. Nanotechnol. 2020, 11, 76–91, doi:10.3762/bjnano.11.8

• sensing the interaction between a sharp microcantilever probe and the sample [2]. Initial operation was in constant-force contact-mode, where a static deflection is maintained through a constant contact force [3]. In dynamic imaging modes [4], the cantilever is driven at, or near, a resonance frequency

• , which establishes the requirement for demodulation in AFM. In intermittent-contact constant-amplitude AFM [5], a constant cantilever oscillation amplitude is maintained by feeding back the demodulated fundamental amplitude of the deflection signal. The imaging of delicate biological samples [6][7][8] is

• particularly suited to intermittent-contact AFM [9] when tip–sample contact is gentle. Environmental damping has a large effect on the quality factor (Q) of the cantilever. Values can range from as low as Q ≈ 1 in liquid [10], up to Q ≈ 10,000 in ultra-high vacuum [11]. This affects the mechanical bandwidth of

The effect of heat treatment on the morphology and mobility of Au nanoparticles

• Sven Oras,
• Sergei Vlassov,
• Simon Vigonski,
• Boris Polyakov,
• Mikk Antsov,
• Vahur Zadin,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2020, 11, 61–67, doi:10.3762/bjnano.11.6

• manipulation of the NPs was performed with a Bruker Multimode 8 AFM in the PeakForce quantitative nanoscale mechanical characteriztion (PeakForce QNM) mode using a rectangular AFM cantilever (Bruker, RTESPA-300, k = 40 N/m) with a resonance frequency of around 300 kHz. Prior to each manipulation, the samples

• calculated with the following equation [20]: where k is the cantilever spring constant, f0 is the resonance frequency of the cantilever, Aset is the setpoint amplitude, Apiezo is the drive amplitude, θ is the phase signal and Q is the quality factor of the AFM cantilever. The dissipated power was used as a

• measure of the mobility of the NPs. The calibration of the cantilevers was performed by the thermal tuning method. The oscillation amplitudes ranged from 0.05 to 0.6 V with a sensitivity of 25 to 31 nm/V. The sensitivity was measured individually for each cantilever by means of damping the AFM tip against

The different ways to chitosan/hyaluronic acid nanoparticles: templated vs direct complexation. Influence of particle preparation on morphology, cell uptake and silencing efficiency

• Arianna Gennari,
• Julio M. Rios de la Rosa,
• Erwin Hohn,
• Maria Pelliccia,
• Enrique Lallana,
• Roberto Donno,
• Annalisa Tirella and
• Nicola Tirelli

Beilstein J. Nanotechnol. 2019, 10, 2594–2608, doi:10.3762/bjnano.10.250

• , Abingdon, UK) equipped with an OTESPA-R3 cantilever (Bruker, Camarillo, CA, USA) was used to acquire AFM images in air at room temperature in tapping mode. Igor-Pro AFM software (Oxford Instrument, UK) was used to analyse the images. Nuclease protection assay. The protection effect against nuclease

Evaluation of click chemistry microarrays for immunosensing of alpha-fetoprotein (AFP)

• Seyed Mohammad Mahdi Dadfar,
• Sylwia Sekula-Neuner,
• Vanessa Trouillet,
• Hui-Yu Liu,
• Ravi Kumar,
• Annie K. Powell and
• Michael Hirtz

Beilstein J. Nanotechnol. 2019, 10, 2505–2515, doi:10.3762/bjnano.10.241

• was spotted onto them via microchannel cantilever spotting (µCS). Based on the fluorescence measurements, the optimal microarray design was found and its sensitivity was determined. Keywords: alpha-fetoprotein (AFP); cancer biomarker; click chemistry; fluorescent immunosensor; hepatocellular

• fabricated by microchannel cantilever spotting (μCS). Here, patterns are written with fluorescently labeled AFP (as antigen) on the surfaces modified with anti-AFP (as antibody). In different studies, many selective biosensors have been developed based on antigen–antibody interactions [22][30][31][33][34][35

Abrupt elastic-to-plastic transition in pentagonal nanowires under bending

• Sergei Vlassov,
• Magnus Mets,
• Boris Polyakov,
• Jianjun Bian,
• Leonid Dorogin and
• Vahur Zadin

Beilstein J. Nanotechnol. 2019, 10, 2468–2476, doi:10.3762/bjnano.10.237

• in cantilever beam configuration inside a scanning electron microscope. We demonstrated an unusual, abrupt elastic-to-plastic transition, observed as a sudden change of the NW profile from smooth arc-shaped to angled knee-like during the bending in the narrow range of bending angles. In contrast to

• NWs were studied both theoretically and experimentally in different configurations, including uniaxial loading (tensile and compression tests) [24][25], three-point bending [26][27], cantilever beam bending [28][29] and nanoindentation [30]. Several interesting phenomena were reported that can be

• curved pathways for electromagnetic radiation. Any crack or other discontinuities that are introduced by bending can prevent plasmon propagation in the NW [19]. Pure bending conditions are realized in the cantilever beam bending configuration where the NW is fixed at one end and the free end is pushed by

Mobility of charge carriers in self-assembled monolayers

• Zhihua Fu,
• Tatjana Ladnorg,
• Hartmut Gliemann,
• Alexander Welle,
• Asif Bashir,
• Michael Rohwerder,
• Qiang Zhang,
• Björn Schüpbach,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2019, 10, 2449–2458, doi:10.3762/bjnano.10.235

• . Then, the process of nanografting was performed in the contact mode (cantilever type: NSC-18/Cr-Au, spring const. 2.8 N/m, µmasch, NanoAndMore GmbH) with an increased force (setpoint: −0.66 V) of the tip on the surface. During the scanning process (scan rate: 5 Hz, number of lines: 512), the targeted

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• cantilever made out of a polymer material do not meet the requirements for tip sharpness and durability. Combining the high imaging bandwidth of polymer cantilevers with making sharp and wear-resistant tips is essential for a future adoption of polymer cantilevers in routine AFM use. In this work, we have

• any photo-processable polymer cantilever. Keywords: Atomic force microscopy (AFM); durability; imaging speed; polymer cantilever; silicon nitride tip; Introduction Atomic force microscopy (AFM) cantilevers have been developed for numerous applications since the invention of scanning probe microscopy

• (SPM) [1]. Quality and accuracy of an AFM image strongly depend on the tip geometry since the image topography is the convolution of the surface topography and the cantilever tip geometry [2]. More precisely, the resulting images suffer from the effect of dilation [3]. AFM images with tip artefacts are

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• biomechanical studies [21]. Atomic force acoustic microscopy (AFAM) is a technique based on AFM for nondestructive imaging. This technique operates on a dynamic mode in which the AFM cantilever vibrates upon ultrasound excitation. Accordingly, AFAM shows the ability to measure nanomechanical properties and is

• the sample holder was used to generate ultrasound waves propagating into the sample. An AFM tapping probe (Tap300Al-G, BudgetSensors) was used in all imaging experiments. A lock-in amplifier (SR830DSP, Stanford Research Systems, USA) was employed to analyze the cantilever oscillation signals. When the

• probe tip scanned across the specimen surface, acoustic and morphological images were acquired simultaneously. The deflections of the cantilever represent the morphological information, and the vibrations of the cantilever correspond to the acoustic signals. By employing a suitable mechanical model to

Nontoxic pyrite iron sulfide nanocrystals as second electron acceptor in PTB7:PC₇₁BM-based organic photovoltaic cells

• Olivia Amargós-Reyes,
• José-Luis Maldonado,
• Omar Martínez-Alvarez,
• María-Elena Nicho,
• José Santos-Cruz,
• Juan Nicasio-Collazo,
• Irving Caballero-Quintana and
• Concepción Arenas-Arrocena

Beilstein J. Nanotechnol. 2019, 10, 2238–2250, doi:10.3762/bjnano.10.216

• active layer thickness was measured by AFM (Easyscan2 from Nanosurf) in contact mode employing cantilever tips with the aluminum reflective coating (ContAl-G) from BudgetSensors. The AFM roughness images were acquired in dynamic force mode (using PPP-NCLAu from NanoSensors), because it shows better

Synthesis and potent cytotoxic activity of a novel diosgenin derivative and its phytosomes against lung cancer cells

• Liang Xu,
• Dekang Xu,
• Ziying Li,
• Yu Gao and
• Haijun Chen

Beilstein J. Nanotechnol. 2019, 10, 1933–1942, doi:10.3762/bjnano.10.189

• under ambient conditions with a silicon cantilever with L = 115 μm, W = 25 μm, and T = 605 nm. For TEM measurements, the DiP and P2P were diluted with ddH2O to a concentration of 10 μg/mL. 8.5 μL of the dispersion was dripped on the copper grid and dried in air overnight before imaging. Cell cultures

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical

• microscopy where the sample is ultrasonically excited at a specified frequency and the amplitude and phase of the cantilever are recorded [13][14]. After that, the theoretical analysis of the cantilever vibration with the tip contacting the sample surface was intensively investigated, including the influence

• of tip position on the cantilever, lateral forces and cantilever tilt [14][15][16]. Since the contact resonance is sensitive to the sample’s local mechanical properties, CR-AFM has been employed for characterization of elastic and viscoelastic properties [17][18][19][20]. In addition, mechanically

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• behavior, with the correct CPD values measured when TiO nanowires are separated by more than 40 nm. This stands in perfect agreement with the real tip radius of 15 nm, which was measured for the same cantilever in high-resolution SEM (see Figure 4d insets). Here, the use of uniformly PtIr-coated tips

• noncontact mode measurements (with a Kelvin loop) using the very same tip, maintaining oscillations at the higher harmonics of the fundamental frequency (≈75 kHz). Hence, in order to record current and CPD maps from the very same sample area, KPFM measurements were first performed with the soft cantilever

• actual PtSi cantilever used in the experiments with a tip radius of 15 nm. Characterization of the SrTiO3(100) surface by KPFM. a) Topography of a TiO/SrTiO3 structure (Δf = −20 Hz), b) corresponding work function map from KPFM, c) work function histogram from the selected area in b), d) and e

Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology

• Loïc Crouzier,
• Alexandra Delvallée,
• Sébastien Ducourtieux,
• Laurent Devoille,
• Guillaume Noircler,
• Christian Ulysse,
• Olivier Taché,
• Elodie Barruet,
• Christophe Tromas and
• Nicolas Feltin

Beilstein J. Nanotechnol. 2019, 10, 1523–1536, doi:10.3762/bjnano.10.150

• measurands defined for both techniques are distinct. AFM is a technique used for mapping physical properties at the nanoscale. The measuring principle is based on the detection of the interaction (attractive or repulsive forces) between a sharp tip attached to the end of a flexible cantilever and a sample

• (tapping) mode is more commonly used. It consists in oscillating the cantilever near its resonant frequency and maintaining a constant amplitude during the scan. However, regardless of the used mode, and due to tip convolution, the obtained image is a function of tip shape and tip radius (estimated to be

• %, respectively. The AFM measurements were carried out with a Veeco Nanoman V equipped with an accurate three-axis scanner operating under closed-loop control (hybrid XYZ-scanner with a range of 90 µm × 90 µm × 8 µm). All measurements were performed in air using tapping mode and OTESPA-R3 probes. The cantilever

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• cantilever are associated to the elastic modulus through a straight forward calculation [13]. In CR mode, the mechanical properties can be extracted by pressing the tip into the surface and oscillating the cantilever at a frequency corresponding to the contact resonance, which corresponds to the mechanical

• resonance of the cantilever and tip in contact with the sample surface. In this mode, the variation in the amplitude and shifts in the contact resonance frequency during scanning are recorded. While the obtained shift in the contact resonance frequency can be converted into a quantitative map of mechanical

• contaminants on the surface when measuring the mechanical properties of atomic-sized defects [15][16][17]. Furthermore, the high quality factor of the AFM cantilever that is achieved under UHV conditions can be very beneficial in dynamic AFM modes, as the Q-factor is inversely proportional to the force

Imaging the surface potential at the steps on the rutile TiO₂(110) surface by Kelvin probe force microscopy

• Masato Miyazaki,
• Huan Fei Wen,
• Quanzhen Zhang,
• Yuuki Adachi,
• Jan Brndiar,
• Ivan Štich,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2019, 10, 1228–1236, doi:10.3762/bjnano.10.122

• out with a custom-built ultrahigh-vacuum noncontact atomic force microscopy (NC-AFM) system operated at a temperature of 78 K with a base pressure below 4 × 10−11 mbar. The NC-AFM system was operated in the frequency-modulation mode [44] with a constant cantilever oscillation amplitude (5 Å). The

• cantilever deflection was measured using an optical beam deflection method [45]. The images were obtained using a commercial Ir-coated Si cantilever (NANOSENSORS) with a resonant frequency of 804 kHz and 808 kHz and a spring constant of 1500 N/m. Before the experiments, the tip was cleaned by Ar+ sputtering

• Waals force is dominant and the contribution of the force from the tip apex becomes weak and the force from the rest of the cantilever becomes significant. Therefore, the observed height of step was smaller than that of the real one. Before the experiments, we verified that the distance calibration of

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• nanoparticle diameter) resulting in a positive phase shift: with A being the effective capacitive area, z the lift height, d the nanoparticle diameter, VCPD the contact potential difference between tip and substrate, Q the quality factor, k the spring constant of the cantilever, and ε0 the dielectric constant

• magnetized sphere [20][22][23]: where Q is the quality factor of the cantilever, k is the spring constant, µ0 is the vacuum permeability, mp is the magnetic moment of the nanoparticle, mtip is the magnetic moment of the tip, and a is the distance between the two dipoles and is shown schematically in Figure 5

Outstanding chain-extension effect and high UV resistance of polybutylene succinate containing amino-acid-modified layered double hydroxides

• Adam A. Marek,
• Vincent Verney,
• Christine Taviot-Gueho,
• Grazia Totaro,
• Laura Sisti,
• Annamaria Celli and
• Fabrice Leroux

Beilstein J. Nanotechnol. 2019, 10, 684–695, doi:10.3762/bjnano.10.68

• monitored automatically against frequency. The dynamic mechanical thermal properties were measured using a Rheometric Scientific DMTA IV dynamic mechanic thermoanalysis (DMTA) instrument with a dual cantilever testing geometry. Test samples were prepared by injection moulding at 140 °C using a Minimix

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

• Aaron Mascaro,
• Yoichi Miyahara,
• Tyler Enright,
• Omur E. Dagdeviren and
• Peter Grütter

Beilstein J. Nanotechnol. 2019, 10, 617–633, doi:10.3762/bjnano.10.62

• period of the cantilever and compare and contrast it with those previously established. Keywords: atomic force microscopy; electrostatic force microscopy; ionic transport; lithium ion batteries; nanotechnology; Introduction Since the inception of the atomic force microscope (AFM) a variety of

• potential applied across the sample; the movement of mobile ions leads to a change in the tip–sample capacitance and, thus, to a change in the electrostatic force acting on the cantilever probe tip. The electrostatic tip–sample force is proportional to the capacitance gradient ∂C/∂z times the square of the

• used frequency-modulated AFM configuration, the resonance frequency of an oscillating cantilever is measured while the probe tip interacts with a surface [24]. The interactions are purely electrostatic – in other words, the tip and sample form a capacitor. The oscillation of the cantilever can

Direct observation of the CVD growth of monolayer MoS₂ using in situ optical spectroscopy

• Claudia Beatriz López-Posadas,
• Yaxu Wei,
• Wanfu Shen,
• Daniel Kahr,
• Michael Hohage and
• Lidong Sun

Beilstein J. Nanotechnol. 2019, 10, 557–564, doi:10.3762/bjnano.10.57

• situ using atomic force microscopy (Veeco Dimensions S3100) in tapping mode. A soft cantilever (TipsNano) was employed. The Raman and PL spectra spectra of the MoS2 thin films were collected using a JY Horiba LabRAM Aramis VIS microscope with an excitation wavelength of 532 nm. Measurements were

Mechanical and thermodynamic properties of Aβ₄₂, Aβ₄₀, and α-synuclein fibrils: a coarse-grained method to complement experimental studies

• Adolfo B. Poma,
• Horacio V. Guzman,
• Mai Suan Li and
• Panagiotis E. Theodorakis

Beilstein J. Nanotechnol. 2019, 10, 500–513, doi:10.3762/bjnano.10.51

• contact area, which will be the arc region that forms in contact with the sphere. In considering other shapes for the cantilever tip, such as conical or flat punch, the impact of the anisotropy is expected to be much higher [16]. Nonetheless, to our knowledge the exact shape of the cantilever tip cannot

• range of applications of AFM technique span from biomolecules to single cells [31][56][57]. The AFM nanoindentation force–distance curves typically depend on the correct determination of the cantilever stiffness and only measurements of biological fibrils located at the centre of the fibril are

• considered. The former refers to the way that the indentation load is measured by the deflection of the AFM cantilever. The latter is an assumption of the semi-infinite half-space approximation. Once the AFM data is obtained, it requires interpretation by using a contact mechanics theory. There is no

Advanced scanning probe lithography using anatase-to-rutile transition to create localized TiO₂ nanorods

• Julian Kalb,
• Vanessa Knittel and
• Lukas Schmidt-Mende

Beilstein J. Nanotechnol. 2019, 10, 412–418, doi:10.3762/bjnano.10.40

• cantilever arrays [47]. Besides these technically challenges, there are some clear advantages of this method. First, it works under ambient conditions, and the setup is inexpensive compared to electron-beam lithography. Nevertheless, the resolution is roughly of the same order of magnitude. Second, it is a

A comparison of tarsal morphology and traction force in the two burying beetles Nicrophorus nepalensis and Nicrophorus vespilloides (Coleoptera, Silphidae)

• Liesa Schnee,
• Benjamin Sampalla,
• Josef K. Müller and
• Oliver Betz

Beilstein J. Nanotechnol. 2019, 10, 47–61, doi:10.3762/bjnano.10.5

• (CSM Instruments, Peseux, Switzerland) equipped with a dual-beam cantilever STH-001 as previously described [19]. This cantilever features a highly sensitive dual-beam spring able to measure forces in the x-direction (Ft, stiffness = 4.8139 mN/µm) and z-direction (Fn, stiffness = 0.5122 mN/µm) with a

Bidirectional biomimetic flow sensing with antiparallel and curved artificial hair sensors

• Claudio Abels,
• Antonio Qualtieri,
• Toni Lober,
• Alessandro Mariotti,
• Lily D. Chambers,
• Massimo De Vittorio,
• William M. Megill and
• Francesco Rizzi

Beilstein J. Nanotechnol. 2019, 10, 32–46, doi:10.3762/bjnano.10.4

• stimuli. Inspired by the neuromasts found in the lateral line of fish, we present a novel flow sensor design based on two curved cantilevers with bending orientation antiparallel to each other. Antiparallel cantilever pairs were designed, fabricated and compared to a single cantilever based hair sensor in

• terms of sensitivity to temperature changes and their response to changes in relative air flow direction. Results: In bidirectional air flow, antiparallel cantilever pairs exhibit an axially symmetrical sensitivity between 40 μV/(m s−1) for the lower air flow velocity range (between ±10–20 m s−1) and 80

• μV/(m s−1) for a higher air flow velocity range (between ±20–32 m s−1). The antiparallel cantilever design improves directional sensitivity and provides a sinusoidal response to flow angle. In forward flow, the single sensor reaches its saturation limitation, flattening at 67% of the ideal sinusoidal

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• AFM (Bruker, previously Veeco, EnviroscopeTM). The probe consisted of a metal covered tip (µmasch: HQ:NSC18/Pt) supported by a cantilever electrically connected to a metallic sample holder and biased at an electrical potential. AC-biased EFM (ω = 100π rad) was employed in the double-pass configuration

• shifts Δf0 were extracted during the second scan by maintaining the phase shift constant throughout the modification of the cantilever exciting frequency. In the linear regime, Δf0 and G are related by the following equation [58]: Basically, the G2ω component was measured using an access module with a