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Search for "reliability" in Full Text gives 178 result(s) in Beilstein Journal of Nanotechnology.

Structural and tribometric characterization of biomimetically inspired synthetic "insect adhesives"

  • Matthias W. Speidel,
  • Malte Kleemeier,
  • Andreas Hartwig,
  • Klaus Rischka,
  • Angelika Ellermann,
  • Rolf Daniels and
  • Oliver Betz

Beilstein J. Nanotechnol. 2017, 8, 45–63, doi:10.3762/bjnano.8.6

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Published 06 Jan 2017

Grazing-incidence optical magnetic recording with super-resolution

  • Gunther Scheunert,
  • Sidney. R. Cohen,
  • René Kullock,
  • Ryan McCarron,
  • Katya Rechev,
  • Ifat Kaplan-Ashiri,
  • Ora Bitton,
  • Paul Dawson,
  • Bert Hecht and
  • Dan Oron

Beilstein J. Nanotechnol. 2017, 8, 28–37, doi:10.3762/bjnano.8.4

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  • the next major step in the storage industry: it is predicted to increase the storage capacity, the read/write speed and the data lifetime of future hard disk drives. However, despite more than a decade of development work, the reliability is still a prime concern. Featuring an inherently fragile
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Published 04 Jan 2017

Low temperature co-fired ceramic packaging of CMOS capacitive sensor chip towards cell viability monitoring

  • Niina Halonen,
  • Joni Kilpijärvi,
  • Maciej Sobocinski,
  • Timir Datta-Chaudhuri,
  • Antti Hassinen,
  • Someshekar B. Prakash,
  • Peter Möller,
  • Pamela Abshire,
  • Sakari Kellokumpu and
  • Anita Lloyd Spetz

Beilstein J. Nanotechnol. 2016, 7, 1871–1877, doi:10.3762/bjnano.7.179

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  • , to a printed circuit board (PCB). Figure 3a,b shows the manufactured package and Figure 3c the prototype package with microfluidic channel. Results and Discussion Reliability of the packaging method The new LTCC material was first tested using a dummy chip packaged in the LTCC and connected to a PCB
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Published 29 Nov 2016

A new approach to grain boundary engineering for nanocrystalline materials

  • Shigeaki Kobayashi,
  • Sadahiro Tsurekawa and
  • Tadao Watanabe

Beilstein J. Nanotechnol. 2016, 7, 1829–1849, doi:10.3762/bjnano.7.176

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  • nanocrystalline and submicrometer-grained Ni Segregation-induced intergranular embrittlement is a serious problem that degrades the performance reliability of various types of structural materials. In nanocrystalline and submicrometer-grained materials possessing a very high density of grain boundaries and triple
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Published 25 Nov 2016

Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment

  • Ann-Kathrin Kleinschmidt,
  • Lars Barzen,
  • Johannes Strassner,
  • Christoph Doering,
  • Henning Fouckhardt,
  • Wolfgang Bock,
  • Michael Wahl and
  • Michael Kopnarski

Beilstein J. Nanotechnol. 2016, 7, 1783–1793, doi:10.3762/bjnano.7.171

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  • – depending on the relevance of the trench depth for the device function. To examine the reliability of RAS in controlling the etch depth, the etched sample pieces I–IV (corresponding to specific etch times – see Figure 2) and, for reference, a not reactive-ion-etched piece of the same sample (type A) are
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Published 21 Nov 2016

Morphology of SiO2 films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

  • Volodymyr Tkachenko,
  • Antigone Marino,
  • Eva Otón,
  • Noureddine Bennis and
  • Josè Manuel Otón

Beilstein J. Nanotechnol. 2016, 7, 1743–1748, doi:10.3762/bjnano.7.167

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  • technique as a reference for such materials. The measure of the optical constants [21], tilt distribution and anchoring strength [22] in nematic LC cells is well reported. The integration of VASE with other techniques [23] has also been investigated to improve the reliability and accuracy of the optical
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Published 17 Nov 2016

Nanostructured germanium deposited on heated substrates with enhanced photoelectric properties

  • Ionel Stavarache,
  • Valentin Adrian Maraloiu,
  • Petronela Prepelita and
  • Gheorghe Iordache

Beilstein J. Nanotechnol. 2016, 7, 1492–1500, doi:10.3762/bjnano.7.142

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  • . This is closely related to the increase of high-speed operation, good reliability, low power consumption and the decrease of unit price that led to the rapid development of the semiconductor device market and to the continuous downscaling of devices. Regarding the downscaling process, high mobility
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Published 21 Oct 2016

Polystyrene-block-poly(ethylene oxide) copolymers as templates for stacked, spherical large-mesopore silica coatings: dependence of silica pore size on the PS/PEO ratio

  • Roberto Nisticò,
  • Giuliana Magnacca,
  • Sushilkumar A. Jadhav and
  • Dominique Scalarone

Beilstein J. Nanotechnol. 2016, 7, 1454–1460, doi:10.3762/bjnano.7.137

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  • refer, from top to bottom, to the 95/5 (dashed line) and 93/7 (dotted line) experimental fitting curves, respectively. Reliability of regressions: R2 > 0.98 and 0.83 (A), R2 > 0.96 and 0.88 (B). Black square in panel A is the zoomed area reported in panel C. Calculations of the pore size for the sample
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Published 14 Oct 2016

Functional diversity of resilin in Arthropoda

  • Jan Michels,
  • Esther Appel and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2016, 7, 1241–1259, doi:10.3762/bjnano.7.115

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  • are not absolutely specific. Therefore, it is strongly advisable to apply not only one single method but a combination of several different ones to increase the reliability of the identification and detection of resilin. In recent years, an antibody to a recombinant Drosophila melanogaster pro-resilin
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Published 01 Sep 2016

Influence of synthesis conditions on microstructure and phase transformations of annealed Sr2FeMoO6−x nanopowders formed by the citrate–gel method

  • Marta Yarmolich,
  • Nikolai Kalanda,
  • Sergey Demyanov,
  • Herman Terryn,
  • Jon Ustarroz,
  • Maksim Silibin and
  • Gennadii Gorokh

Beilstein J. Nanotechnol. 2016, 7, 1202–1207, doi:10.3762/bjnano.7.111

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  • capacity measurement has a higher sensitivity compared to the XRD investigations and makes it possible to determine the above-mentioned inclusions of the indirect phases with high reliability. In consideration of the highly λ-shaped transition at 330 K, we may presume that it is due to the transition of
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Published 22 Aug 2016

NO gas sensing at room temperature using single titanium oxide nanodot sensors created by atomic force microscopy nanolithography

  • Li-Yang Hong and
  • Heh-Nan Lin

Beilstein J. Nanotechnol. 2016, 7, 1044–1051, doi:10.3762/bjnano.7.97

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  • applications [5][11]. Semiconducting metal oxide gas sensors generally need to work at high temperatures due to the high energy required for surface reactions [5][12][13]. However, a high operating temperature results in issues with durability and reliability of the device [5]. To overcome this drawback, light
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Published 20 Jul 2016

In situ observation of deformation processes in nanocrystalline face-centered cubic metals

  • Aaron Kobler,
  • Christian Brandl,
  • Horst Hahn and
  • Christian Kübel

Beilstein J. Nanotechnol. 2016, 7, 572–580, doi:10.3762/bjnano.7.50

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  • figure, inset in Figure 1c) are superimposed with the reliability values in black, which constitute a measure for the unambiguousness of the orientation determination during the orientation assignment to the diffraction pattern. The evolution of the local orientation is tracked in a tensile experiment
  • ° disorientation Supporting Information File 1, Figure S11b). The high Schmid factor (≈0.5) of the orange crystallite (Supporting Information File 1, Figure S8) in conjunction with the decreasing reliability (amount of black pixels increases) from 0% to 4.7% strain is consistent with the creation and accumulation
  • concurrent deformation mechanisms. (b) ACOM-STEM orientation maps overlaid with the reliability and the cross-correlation index of a cross-section of ncPda at 0% strain. (c,d) ACOM-STEM orientation maps overlaid with the reliability of the fracture morphology of ncPda before (c) and after fracture (d). The
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Published 19 Apr 2016

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

  • Hannes Beyer,
  • Tino Wagner and
  • Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

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  • , demonstrating the reliability of the method. In Figure 3b the topography of the last scan is shown together with a height profile along the line indicated (Figure 3c). A typical KBr surface with terraces separated by steps of approximately 315 pm is observed. Force regime As mentioned earlier, the force
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Published 15 Mar 2016

Effects of electronic coupling and electrostatic potential on charge transport in carbon-based molecular electronic junctions

  • Richard L. McCreery

Beilstein J. Nanotechnol. 2016, 7, 32–46, doi:10.3762/bjnano.7.4

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  • they contain a covalent, conjugated “contact” between two aromatic π-systems. The reproducibility, reliability, and operating life of carbon-based MJs resulted in an application in audio processing of electronic music, available commercially in 2015 as an accessory for electric guitars. The fundamental
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Published 11 Jan 2016

Fabrication of hybrid nanocomposite scaffolds by incorporating ligand-free hydroxyapatite nanoparticles into biodegradable polymer scaffolds and release studies

  • Balazs Farkas,
  • Marina Rodio,
  • Ilaria Romano,
  • Alberto Diaspro,
  • Romuald Intartaglia and
  • Szabolcs Beke

Beilstein J. Nanotechnol. 2015, 6, 2217–2223, doi:10.3762/bjnano.6.227

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  • fabrication/laser parameters as well („physical tuning”) [23] with pristine resins as well as the Au NP ones. The obvious advantage of the chemical tuning over physical tuning is reliability, while physical tuning can be conducted in situ, leading to a highly versatile, albeit hard to evaluate, fabrication
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Published 25 Nov 2015

Enhanced model for determining the number of graphene layers and their distribution from X-ray diffraction data

  • Beti Andonovic,
  • Abdulakim Ademi,
  • Anita Grozdanov,
  • Perica Paunović and
  • Aleksandar T. Dimitrov

Beilstein J. Nanotechnol. 2015, 6, 2113–2122, doi:10.3762/bjnano.6.216

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  • calculation of the number of graphene layers for sample GAE2 and it is N = 3.46. The calculated value of La for the sample GAE2 was 3.93 nm. In the following section, the alterations to the simple model, which form the enhanced model and which improve the reliability of the provided insight, the precision of
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Published 06 Nov 2015

Framework for automatic information extraction from research papers on nanocrystal devices

  • Thaer M. Dieb,
  • Masaharu Yoshioka,
  • Shinjiro Hara and
  • Marcus C. Newton

Beilstein J. Nanotechnol. 2015, 6, 1872–1882, doi:10.3762/bjnano.6.190

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  • check the reliability of the guideline. We used kappa coefficient to test inter-annotator agreement (IAA) [32]. Two metrics were used for the analysis: tight agreement, which considers the term boundary and term category to decide the agreement; and loose agreement, which ignores the term boundary, i.e
  • evaluate this corpus and finalize it with a domain expert researcher to ensure reliability. We classified the annotations of graduate students into agreed and disagreed annotations. Careless mistakes, such as one annotator missed to add an annotation, or typical types of disagreement when annotators
  • ]. We have made a finalized version of the five papers of the corpus based on the revision of the domain expert. To evaluate the annotation reliability of the graduate students, we compared this finalized version with the original corpus constructed before the evaluation experiment. Evaluation showed
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Published 07 Sep 2015

Nanotechnology in the real world: Redeveloping the nanomaterial consumer products inventory

  • Marina E. Vance,
  • Todd Kuiken,
  • Eric P. Vejerano,
  • Sean P. McGinnis,
  • Michael F. Hochella Jr.,
  • David Rejeski and
  • Matthew S. Hull

Beilstein J. Nanotechnol. 2015, 6, 1769–1780, doi:10.3762/bjnano.6.181

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  • International Center for Scholars and the Project on Emerging Nanotechnologies created the Nanotechnology Consumer Products Inventory (CPI) in 2005. The objective of this present work is to redevelop the CPI by leading a research effort to increase the usefulness and reliability of this inventory. We created
  • , including a lower cost for industries and, ultimately, a registry would benefit consumers, companies, and governments [18]. The objective of this work was to modify the CPI to improve its functionality, reliability, and utility to the diverse group of stakeholders who have come to depend on it as a critical
  • identify nanomaterials in consumer products and to understand human exposure to those materials [36]. How much we know Through the “How much we know” descriptor, inventory entries are rated according to the reliability of the manufacturer’s claim that products contain nanomaterials. We evaluated 1259
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Published 21 Aug 2015

The eNanoMapper database for nanomaterial safety information

  • Nina Jeliazkova,
  • Charalampos Chomenidis,
  • Philip Doganis,
  • Bengt Fadeel,
  • Roland Grafström,
  • Barry Hardy,
  • Janna Hastings,
  • Markus Hegi,
  • Vedrin Jeliazkov,
  • Nikolay Kochev,
  • Pekka Kohonen,
  • Cristian R. Munteanu,
  • Haralambos Sarimveis,
  • Bart Smeets,
  • Pantelis Sopasakis,
  • Georgia Tsiliki,
  • David Vorgrimmler and
  • Egon Willighagen

Beilstein J. Nanotechnol. 2015, 6, 1609–1634, doi:10.3762/bjnano.6.165

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  • IUCLID database. They provide definitions and support for annotating the data records by relevance, reliability and adequacy. Some of the criteria necessarily overlap with rules defined elsewhere (availability of the raw data, adequate description of the study, protocols, parameters, purities/impurities
  • and the origin of the test substances; proof of ability of the lab to do the study). Klimisch codes (or scores) define four reliability categories (1 = reliable without restrictions, 2 = reliable with restrictions, 3 = not reliable, 4 = not assignable), where score 1 or 2 can only be assigned if the
  • data are generated through accepted standard methods (e.g., OECD guidelines or equivalent national or international standards) and according to Good Laboratory Practice (GLP). In practice, very few of the publicly available NM datasets can be assigned reliability code 1 or 2, due to the lack of
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Published 27 Jul 2015

Electron and heat transport in porphyrin-based single-molecule transistors with electro-burnt graphene electrodes

  • Hatef Sadeghi,
  • Sara Sangtarash and
  • Colin J. Lambert

Beilstein J. Nanotechnol. 2015, 6, 1413–1420, doi:10.3762/bjnano.6.146

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  • circuit should double approximately every two years. Since 1974, when the idea of a single-molecule rectifier was proposed by Ratner and Aviram [5], many attempts to realize FETs have failed to deliver the room-temperature reliability, reproducibility and stability required by the electronics industry [6
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Published 26 Jun 2015

Electrical characterization of single molecule and Langmuir–Blodgett monomolecular films of a pyridine-terminated oligo(phenylene-ethynylene) derivative

  • Henrry M. Osorio,
  • Santiago Martín,
  • María Carmen López,
  • Santiago Marqués-González,
  • Simon J. Higgins,
  • Richard J. Nichols,
  • Paul J. Low and
  • Pilar Cea

Beilstein J. Nanotechnol. 2015, 6, 1145–1157, doi:10.3762/bjnano.6.116

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  • reproducibility and reliability of the results. Figure 8 shows a representative I–V curve obtained for a single layer LB film transferred onto Au(111) at a surface pressure of 16 mN·m−1 and recorded under touch-to-contact conditions. The profile of the I–V curve is clearly symmetrical around zero bias and
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Published 11 May 2015

Statistics of work and orthogonality catastrophe in discrete level systems: an application to fullerene molecules and ultra-cold trapped Fermi gases

  • Antonello Sindona,
  • Michele Pisarra,
  • Mario Gravina,
  • Cristian Vacacela Gomez,
  • Pierfrancesco Riccardi,
  • Giovanni Falcone and
  • Francesco Plastina

Beilstein J. Nanotechnol. 2015, 6, 755–766, doi:10.3762/bjnano.6.78

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  • C60 indicates the reliability of the approach, putting emphasis on the present capability of DFT codes in predicting the excited state structure of molecules and solids [53]. On the other hand the comparison of the results from the trapped Fermi gas with the analytical model of [32][35] is suggestive
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Published 18 Mar 2015

Manipulation of magnetic vortex parameters in disk-on-disk nanostructures with various geometry

  • Maxim E. Stebliy,
  • Alexander G. Kolesnikov,
  • Alexey V. Ognev,
  • Alexander S. Samardak and
  • Ludmila A. Chebotkevich

Beilstein J. Nanotechnol. 2015, 6, 697–703, doi:10.3762/bjnano.6.70

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  • facilitate their practical implementation in real functional devices. For instance, magnetoresistive memory is used in aviation systems requiring the high reliability, nonvolatility and data write/read rate. Nanomagnets with stable and controllable spin configurations can be used to produce the magnetic
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Published 10 Mar 2015

Chains of carbon atoms: A vision or a new nanomaterial?

  • Florian Banhart

Beilstein J. Nanotechnol. 2015, 6, 559–569, doi:10.3762/bjnano.6.58

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  • perturbation theory (MBPT) in the GW approximation including electron–electron interactions resulted in more accurate calculations. Without discussing the applicability and reliability of different computational techniques, a short overview of some predicted properties of carbon chains will be given in this
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Published 25 Feb 2015

Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

  • Gemma Rius,
  • Matteo Lorenzoni,
  • Soichiro Matsui,
  • Masaki Tanemura and
  • Francesc Perez-Murano

Beilstein J. Nanotechnol. 2015, 6, 215–222, doi:10.3762/bjnano.6.20

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  • those parameters also affect the actual resolution of the LAO-AFM features and process reliability. The understanding of the conditions for LAO-AFM as well as of the resolution capabilities have been addressed from several viewpoints. Particularly, non-contact LAO-AFM has proven to yield a better
  • -probes can be ordinarily used for dynamic mode imaging. Reliability of CNF-LAO-AFM In Figure 5 we demonstrate another aspect concerning the reliability of CNF probes for LAO-AFM. The images depict two arrays of relatively dense lines defined at two different voltages and at a writing speed of 4 μm/s
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Published 19 Jan 2015
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