Suspension feeding in Copepoda (Crustacea) – a numerical model of setae acting in concert

• Alexander E. Filippov,
• Wencke Krings and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2023, 14, 603–615, doi:10.3762/bjnano.14.50

• -resolution CLSM imaging or atomic force microscopy. As it was visualized by CLSM [55][56][57], the basal parts of some short and long setae appear to be relatively soft and seem to contain resilin or other proteins. This should influence the mobility of the rotating setae. To account for this in the

SERS performance of GaN/Ag substrates fabricated by Ag coating of GaN platforms

• Magdalena A. Zając,
• Bogusław Budner,
• Malwina Liszewska,
• Bartosz Bartosewicz,
• Łukasz Gutowski,
• Jan L. Weyher and
• Bartłomiej J. Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 552–564, doi:10.3762/bjnano.14.46

• substrates fabricated using both methods, we attempted to prepare substrates with a comparable amount of deposited Ag, which was examined and controlled using atomic force microscopy (AFM). For this purpose, additional Ag layers were deposited on flat Si substrates. Based on the measured thickness of the Ag

Carbon nanotube-cellulose ink for rapid solvent identification

• Tiago Amarante,
• Thiago H. R. Cunha,
• Claudio Laudares,
• Ana P. M. Barboza,
• Ana Carolina dos Santos,
• Cíntia L. Pereira,
• Vinicius Ornelas,
• Bernardo R. A. Neves,
• André S. Ferlauto and
• Rodrigo G. Lacerda

Beilstein J. Nanotechnol. 2023, 14, 535–543, doi:10.3762/bjnano.14.44

• length of 5 μm were produced at CTNano/UFMG [59][60][61]. Morphological analysis was carried out by scanning electron microscopy (SEM) in a Quanta 200 FEG, using secondary electrons between 2 and 10 kV. Atomic force microscopy (AFM) was carried out on a Bruker MultiMode8 SPM using the intermittent

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

• Keith R. Paton,
• Konstantinos Despotelis,
• Naresh Kumar,
• Piers Turner and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

• widely used characterization tool for GR2Ms [8]. A search of Web of Science showed that of 97,532 articles published in the last five years with “Graphene” in the abstract, 9.3% also mentioned “Raman”. This is compared with atomic force microscopy (AFM) (2.4%), scanning electron microscopy (SEM) (11.4

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• Ryo Izumi Masato Miyazaki Yan Jun Li Yasuhiro Sugawara Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan 10.3762/bjnano.14.18 Abstract The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation

• surfaces to confirm the dependence of the electrostatic force on the frequency of the AC bias voltage and obtain the interface state density. Keywords: high–low Kelvin probe force microscopy; high–low Kelvin probe force spectroscopy; interface state density; Kelvin probe force microscopy; Kelvin probe

• [1][2][3]. Therefore, direct observation of semiconductor surfaces with nanoscale spatial resolution will become even more important for understanding and controlling the effects of these properties on devices and for evaluating semiconductor device operation. Kelvin probe force microscopy (KPFM) is

Structural, optical, and bioimaging characterization of carbon quantum dots solvothermally synthesized from o-phenylenediamine

• Zoran M. Marković,
• Milica D. Budimir,
• Martin Danko,
• Dušan D. Milivojević,
• Pavel Kubat,
• Danica Z. Zmejkoski,
• Vladimir B. Pavlović,
• Marija M. Mojsin,
• Milena J. Stevanović and
• Biljana M. Todorović Marković

Beilstein J. Nanotechnol. 2023, 14, 165–174, doi:10.3762/bjnano.14.17

• 2.2 mg/mL. These specimens were designated as CQDs/PU. For bioimaging studies, toluene was evaporated, and a thin film of CQDs was redissolved in water and filtered. The prepared QCD samples were characterized by transmission electron microscopy (TEM), atomic force microscopy (AFM), Fourier

Intermodal coupling spectroscopy of mechanical modes in microcantilevers

• Ioan Ignat,
• Bernhard Schuster,
• Jonas Hafner,
• MinHee Kwon,
• Daniel Platz and
• Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

• Ioan Ignat Bernhard Schuster Jonas Hafner MinHee Kwon Daniel Platz Ulrich Schmid Institute of Sensor and Actuator Systems, TU Wien, Gußhaustraße 27–29, 1040 Vienna, Austria 10.3762/bjnano.14.13 Abstract Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries

• . Through such findings we aim to expand the field of multifrequency AFM with innumerable possibilities leading to improved signal-to-noise ratios, all accessible with no additional hardware. Keywords: atomic force microscopy; intermodal coupling; nonlinear mechanics; optomechanics; sideband cooling

• ; Introduction Atomic force microscopy has established itself as one of the most powerful tools in nanotechnology. With meticulous setups amassing techniques such as ultra high vacuum, cryogenic temperatures, and CO-terminated tips, it is able to create a wonderful vista of surfaces, not missing the atoms for

Liquid phase exfoliation of talc: effect of the medium on flake size and shape

• Samuel M. Sousa,
• Helane L. O. Morais,
• Joyce C. C. Santos,
• Ana Paula M. Barboza,
• Bernardo R. A. Neves,
• Elisângela S. Pinto and
• Mariana C. Prado

Beilstein J. Nanotechnol. 2023, 14, 68–78, doi:10.3762/bjnano.14.8

• based on atomic force microscopy images of thousands of flakes, the shape and size distribution of nanotalc obtained using the four different media are compared. This comparison highlights the strengths and weaknesses of the media tested and hopefully will facilitate the choice of the medium for

• applications that have specific requirements. Keywords: 2D materials; atomic force microscopy; liquid phase exfoliation; nanomaterials; talc; Introduction Two-dimensional (2D) materials have attracted a lot of interest due to their outstanding properties [1]. However, large-scale production is still a

• solution, and butanone. The mechanical energy necessary to delaminate the mineral was provided by an ultrasonic bath. We report a statistical analysis of the dimensions (measured by atomic force microscopy) of the nanoflakes obtained employing the four routes, evidencing that the exfoliation medium has an

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

• Chang-Ming Wang,
• Hong-Sheng Chan,
• Chia-Li Liao,
• Che-Wei Chang and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

• force microscopy (Dimension Fastscan, Bruker Nano Surfaces, Hsinchu, Taiwan). Results and Discussion The results of selective SAM removal are visualized by backfilling biotinylated alkanethiol (BAT) molecules into the post lift-off regions followed by conjugating streptavidin and FITC-labeled anti

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

• Alfred J. Weymouth,
• Emily Roche and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

• -precision STM and atomic force microscopy (AFM) scanning. Third, CuPc and PTCDA are known to form commensurate phases on flat metal surfaces. In particular, they have been well studied at different stoichiometries on Ag(111) [16]. Henneke and co-workers showed that more than 0.15 ML of PTCDA in addition to

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy

• Nobuyuki Ishida

Beilstein J. Nanotechnol. 2022, 13, 1558–1563, doi:10.3762/bjnano.13.129

• electrodes. In Kelvin probe force microscopy (KPFM) measurements on electrochemical cells, the surface potential is generally measured relative to electrical ground instead of a stable reference. Here, we show that the changes in the surface potential, measured using KPFM relative to the surface potential in

• . Keywords: electrochemistry; Kelvin probe force microscopy (KPFM); reference electrode; solid electrolyte; Introduction Kelvin probe force microscopy (KPFM) is a scanning probe technique for imaging surface potentials on the nanometer scale [1][2][3][4]. Its operating principle is based on detecting the

Induced electric conductivity in organic polymers

• Konstantin Y. Arutyunov,
• Anatoli S. Gurski,
• Vladimir V. Artemov,
• Alexander L. Vasiliev,
• Azat R. Yusupov,
• Danfis D. Karamov and
• Alexei N. Lachinov

Beilstein J. Nanotechnol. 2022, 13, 1551–1557, doi:10.3762/bjnano.13.128

• atomic force microscopy. In some cases, it was possible to observe regions with surface macromolecular (quasicrystalline) ordering [7]. The remarkable property of PDP is that, depending on the length of certain atomic bonds, its molecule can exist in several spatial configurations. Under normal

• , associates of macromolecules are formed in the solution, and the influence of adhesion processes decreases, but the cohesive forces increase. In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force

• microscopy (AFM) using an earlier described methodology [5]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes. The observation confirms the good film-forming properties

Frequency-dependent nanomechanical profiling for medical diagnosis

• Santiago D. Solares and
• Alexander X. Cartagena-Rivera

Beilstein J. Nanotechnol. 2022, 13, 1483–1489, doi:10.3762/bjnano.13.122

• Bioengineering, National Institutes of Health, Bethesda, Maryland, USA 10.3762/bjnano.13.122 Abstract Atomic force microscopy (AFM), developed in the early 1980s, has become a powerful characterization tool in micro- and nanoscale science. In the early 1990s, its relevance within biology and medicine research

• mechanical changes in the affected tissues. Keywords: atomic force microscopy; healthcare; mechanical properties; mechanobiology; medical diagnosis; Introduction Since its invention in the early 1980s, atomic force microscopy (AFM) has been extensively used for topographical, mechanical, electrical, and

Laser-processed antiadhesive bionic combs for handling nanofibers inspired by nanostructures on the legs of cribellate spiders

• Sebastian Lifka,
• Kristóf Harsányi,
• Erich Baumgartner,
• Lukas Pichler,
• Dariya Baiko,
• Karsten Wasmuth,
• Johannes Heitz,
• Marco Meyer,
• Anna-Christin Joel,
• Jörn Bonse and
• Werner Baumgartner

Beilstein J. Nanotechnol. 2022, 13, 1268–1283, doi:10.3762/bjnano.13.105

• Microsoft Excel. Details are presented in Table S2 in Supporting Information File 1. To investigate the effects of the surface texture on the measured peel-off force in more detail, the surfaces of the Al alloy and the Ti alloy samples were investigated by means of atomic force microscopy (AFM). The

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• a homemade cantilevered non-contact atomic force microscopy (NC-AFM) system. As the first step of tip sharpening, the focus is on the controlled extraction of individual clusters. The experimental results show that controlled extraction of individual clusters induces a change in tip sharpness, which

• future, such probes will enable previously unexplored conductivity measurements, such as measurements of semiconductor nanostructures or electrical conductivity on insulating substrates. Conductive atomic force microscopy (C-AFM) can be used to characterize the electrical properties of semi-conductive

Design of surface nanostructures for chirality sensing based on quartz crystal microbalance

• Yinglin Ma,
• Xiangyun Xiao and
• Qingmin Ji

Beilstein J. Nanotechnol. 2022, 13, 1201–1219, doi:10.3762/bjnano.13.100

• , Xu et al. studied real-time chiral recognition of CD films to isomers in the gas phase [69]. Based on atomic force microscopy (AFM) observations, functional β-CDs with a short sulfide group were inclined to form monolayers. In contrast, those with long sulfide groups produced a quasi-two-layer

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral resolution, and the characterization of various sample

• , but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging. Keywords: atomic force microscopy; atomic resolution; instrumentation design; multimodal operation; ultrahigh vacuum; Introduction Atomic force microscopy (AFM) operated under vacuum or

• for the coating of high-quality factor cantilevers for magnetic force microscopy [29]. In future work, much thinner coating thicknesses could be used, or the coating could be applied to the cantilever side to reduce energy dissipation processes arising from the grain boundaries of the polycrystalline

Effects of focused electron beam irradiation parameters on direct nanostructure formation on Ag surfaces

• Jānis Sniķeris,
• Vjačeslavs Gerbreders,
• Andrejs Bulanovs and
• Ēriks Sļedevskis

Beilstein J. Nanotechnol. 2022, 13, 1004–1010, doi:10.3762/bjnano.13.87

• surfaces undergoing irradiation by a focused electron beam. Keywords: atomic force microscopy; electron beam; lithography; nanostructure; silver; sputtering; surface; Introduction Metallic nanostructures have various uses, including in nano-electro-mechanical systems [1], plasmonic biosensors [2], and

• -contact atomic force microscopy (AFM) using the model Park NX10 AFM. The first experiment was conducted with beam current I as the variable parameter ranging from 7 to 500 pA. However, changing the value of I also changed the beam diameter d, which is a function of I and the working distance (WD). The

• kV, I = 42 pA, d = 14 nm, and t = 60 s. Atomic force microscopy images of the nanostructures on an Ag surface as a function of the angle of incidence of the electron beam. Constant EB parameters are: U = 30 kV, I = 42 pA, d = 14 nm, and t = 60 s. The volume and height of the nanostructures on an Ag

Design of a biomimetic, small-scale artificial leaf surface for the study of environmental interactions

• Miriam Anna Huth,
• Axel Huth,
• Lukas Schreiber and
• Kerstin Koch

Beilstein J. Nanotechnol. 2022, 13, 944–957, doi:10.3762/bjnano.13.83

• secondary electron detector. The working distance was 4–7 mm. Atomic force microscopy analysis of recrystallized structures The thickness of the wax coating on glass (1400 µg) was examined with an atomic force microscope (AFM, NanoWizard II, JPK instruments, Berlin, Germany). For this purpose, the

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• governing the performance of single and multifrequency Kelvin probe force microscopy (KPFM) techniques in both air and water. Metrics such as minimum detectable contact potential difference, minimum required AC bias, and signal-to-noise ratio are compared and contrasted both off resonance and utilizing the

• liquid environments whilst needing the smallest AC bias for operation. Keywords: AFM; atomic force microscopy; closed loop; Kelvin probe force microscope; KPFM; open loop; performance; signal-to-noise ratio; Introduction Atomic force microscopy (AFM) is an enabling technique for the nanoscale mapping

• of topography and surface properties of interfaces in a wide range of environments [1]. Kelvin probe force microscopy (KPFM) utilizes the application of a bias and a conductive probe to map the local electrical properties of an interface at the nanoscale [2], allowing for the determination of the

Temperature and chemical effects on the interfacial energy between a Ga–In–Sn eutectic liquid alloy and nanoscopic asperities

• Yujin Han,
• Pierre-Marie Thebault,
• Corentin Audes,
• Xuelin Wang,
• Haiwoong Park,
• Jian-Zhong Jiang and
• Arnaud Caron

Beilstein J. Nanotechnol. 2022, 13, 817–827, doi:10.3762/bjnano.13.72

• increase of the interfacial energy as a function of the temperature, which can be explained by the reactivity between SiOx and Ga and the occurrence of chemical segregation at the liquid alloy surface. Keywords: atomic force microscopy (AFM); interfacial energy; liquid alloy; Introduction Recently, room

• atomic force microscopy (AFM) tips of different chemistries as a function of the temperature (T = 21–90 °C) by AFM force spectroscopy using an XE100 AFM equipped with a heating stage (manufactured by Park Instruments, Republic of Korea). We recorded force–distance curves with PtSi-coated Si cantilevers

Optimizing PMMA solutions to suppress contamination in the transfer of CVD graphene for batch production

• Chun-Da Liao,
• Andrea Capasso,
• Tiago Queirós,
• Telma Domingues,
• Fatima Cerqueira,
• Nicoleta Nicoara,
• Jérôme Borme,
• Paulo Freitas and
• Pedro Alpuim

Beilstein J. Nanotechnol. 2022, 13, 796–806, doi:10.3762/bjnano.13.70

• analyzer had a pass energy of 20 eV. Atomic force microscopy The surface topographies of graphene were investigated by a Bruker Dimension Icon atomic force microscope (AFM), using PPP-NCH (NanosensorsTM) cantilevers with a tip radius smaller than 20 nm, a force constant of 42 N/m, and 250 kHz resonance

Efficient liquid exfoliation of KP₁₅ nanowires aided by Hansen's empirical theory

• Zhaoxuan Huang,
• Zhikang Jiang,
• Nan Tian,
• Disheng Yao,
• Fei Long,
• Yanhan Yang and
• Danmin Liu

Beilstein J. Nanotechnol. 2022, 13, 788–795, doi:10.3762/bjnano.13.69

• concentration, centrifugation was not used. Measurement equipment UV−visible spectrophotometry was performed by using a Shimadzu UV-3101PC system. Atomic force microscopy (AFM) tests were performed in a Multimode 8 system. The Raman tests were performed on a WITec alpha300 RA confocal Raman microscopy system

Gelatin nanoparticles with tunable mechanical properties: effect of crosslinking time and loading

• Agnes-Valencia Weiss,
• Daniel Schorr,
• Julia K. Metz,
• Metin Yildirim,
• Saeed Ahmad Khan and
• Marc Schneider

Beilstein J. Nanotechnol. 2022, 13, 778–787, doi:10.3762/bjnano.13.68

• . Keywords: atomic force microscopy; drug delivery; elasticity; gelatin nanoparticles; Young’s modulus; Introduction Developing nanoparticulate drug carriers for various diseases and application routes requires establishing controllable systems, matching the needs of the respective application to achieve

• experimental triplicate. Atomic force microscopy For AFM measurements, GNPs were electrostatically fixed on positively coated silica specimens. Samples for AFM measurements were prepared according to the following protocol: Silica wafers were cleaned in an ultrasonic bath (Elmasonic B, Elma Schmidbauer GmbH

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

• Masato Miyazaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2022, 13, 712–720, doi:10.3762/bjnano.13.63

• photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in which thermal drift degrades spatial and energy resolutions. In this study, we propose the method of AC bias Kelvin probe force microscopy (AC-KPFM

• modulated external disturbances. Keywords: atomic force microscopy; Kelvin probe force microscopy; photocatalyst; surface photovoltage; titanium dioxide; Introduction Surface photovoltage (SPV) is the change in surface potential caused by light illumination [1][2] and is measured to determine such

• features as band bending [3][4], the lifetimes of excited carriers [5][6][7], the minority carrier diffusion length [8][9], and the plasmonic effect [10][11][12]. The local SPV is usually measured by Kelvin probe force microscopy (KPFM) [13][14][15][16][17][18][19][20][21], which is based on atomic force