Tuning the electronic properties of defect-rich MoS₂

• Eric Juriatti,
• Martina Binninger,
• Carolin Schüle,
• Maren Zirwick,
• Katarina Margetic,
• Erika Giangrisostomi,
• Marcus Scheele and
• Heiko Peisert

Beilstein J. Nanotechnol. 2026, 17, 796–805, doi:10.3762/bjnano.17.56

• structural defects significantly affect the electronic properties of the material. The present study utilizes angle-resolved photoelectron spectroscopy (ARPES) and surface-sensitive core-level spectroscopy (SXPS, XAS) with synchrotron radiation to investigate the interfaces between defect-rich MoS2 and

• . Keywords: angle-resolved photoelectron spectroscopy (ARPES); MoS2; phthalocyanine; X-ray absorption spectroscopy (XAS); X-ray photoelectron spectroscopy (XPS); Introduction In the pursuit for novel semiconducting materials, the group of transition metal dichalcogenides (TMDCs), including molybdenum

• fabrication of ultrafast photodetectors [4][5]. To tune their electronic structure for such applications, the adsorption of organic molecules is a versatile strategy [6][7], resulting, for example, in dipole-induced doping or (complex) charge transfer [8]. Photoelectron spectroscopy (PES), X-ray absorption

Tailoring Ag–Pt nanoalloys through solid-state dewetting: structural and optical insights

• Marcin Łapiński,
• Piotr Okoczuk,
• Blaž Grobiša,
• Ewa Pawlikowska,
• Amelia Rozwadowska,
• Wojciech Sadowski and
• Barbara Kościelska

Beilstein J. Nanotechnol. 2026, 17, 748–759, doi:10.3762/bjnano.17.52

• homogeneous elemental distribution, as measured by energy dispersive spectroscopy. Additionally, X-ray photoelectron spectroscopy measurements confirmed the coexistence of both metals in metallic states, with a slight Ag deficiency attributed to its higher instability and desorption during the annealing

• selection of a series with a total bilayer thickness of 8 nm, fabricated at 650 °C, for further investigations. A detailed chemical composition analysis of pure Ag and Pt nanostructures, as well as those synthesized with various Ag–Pt ratios, was performed using X-ray photoelectron spectroscopy (XPS) and is

Oxidative atmosphere-driven formation of single-phase spinel CuRh₂O₄ nanofibers for alkaline water oxidation

• Namhee Kim,
• Sumin Ko,
• Sohyeon Choi,
• Seoyoon Jang,
• Myung Hwa Kim and
• Dasol Jin

Beilstein J. Nanotechnol. 2026, 17, 737–743, doi:10.3762/bjnano.17.50

• oxygen-atmosphere engineering during annealing is critical for suppressing undesired phase segregation and achieving phase-pure CuRh2O4 nanofibers. Angle-resolved X-ray photoelectron spectroscopy (AR-XPS) was performed to clarify the surface chemical states of Cu and Rh in Cu–Rh bimetallic oxides

• analyzed by X-ray diffraction (MP-XRD; Malvern Panalytical X-ray diffractometer using Cu Kα radiation), Raman spectroscopy (HORIBA, LabRAM HR Evo 800), and angle-resolved X-ray photoelectron spectroscopy (AR-XPS; Thermo Fisher Scientific K-ALPHA XPS, Al Kα radiation at 12 kV). Electrochemical measurements

Environmental applications of silver nanoparticles: state-of-the-art review and emerging trends

• Soni Prajapati,
• Akash Kumar and
• Ranjana Singh

Beilstein J. Nanotechnol. 2026, 17, 697–736, doi:10.3762/bjnano.17.49

• spectroscopy (SERS) using AgNP nanocomposites could selectively detect polystyrene nanoparticles with a detection limit of 14 μg/mL [55]. X-ray photoelectron spectroscopy (XPS) provides information on the elemental composition, surface oxidation states, and electronic configuration of AgNPs [56]. This

Decontamination from water pollutants and pathogens by electrospun nanofibers doped with heavy-atom-free borafluorene-BODIPY photosensitizers

• Angelika Zaszczyńska,
• Paulina H. Marek-Urban,
• Karolina Wrochna,
• Agnieszka E. Kuklewska,
• Kacper Kręgielewski,
• Marta Grodzik,
• Dawid R. Natkowski,
• Jolanta Mierzejewska,
• Ewa Iwanek,
• Agata Blacha-Grzechnik,
• Paweł Sajkiewicz and
• Krzysztof Durka

Beilstein J. Nanotechnol. 2026, 17, 668–682, doi:10.3762/bjnano.17.46

• measurements, the samples were sputtered with 10 nm of gold using a CCU-010 Compact Coating Unit (Safematic). The ToF SIMS maps were acquired in the positive ion mode spectrum using 8 kV accelerating voltage and 10 nA beam current. X-ray photoelectron spectroscopy X-ray photoelectron spectroscopy (XPS

• resulting from hydrogen and dipole–dipole interactions, as well as the dispersive component associated with London and van der Waals forces [56]. The study was complemented with X-ray photoelectron spectroscopy (XPS) for the sample with the highest BODIPY concentration, 1(1.00 wt %)@PCL. The analysis of SEM

Recent progress in enhancing built-in electric fields of perovskite solar cells via junction engineering

• Tong Xiao and
• Ke Xu

Beilstein J. Nanotechnol. 2026, 17, 602–621, doi:10.3762/bjnano.17.42

• to p-type, and thus induced a vertical p–n homojunction in the lower bulk region of the film. This band restructuring significantly amplified and extended the BEF, thereby facilitating directional charge separation and transport. Ultraviolet photoelectron spectroscopy (UPS) revealed an increase in

Electrochemical determination of ciprofloxacin using a MIL-101/reduced graphene oxide-modified electrode

• Nguyen Quang Man,
• Nguyen Ngoc Nghia,
• Nguyen Vinh Phu,
• Vo Thi Khanh Ly,
• Le Lam Son,
• Pham Khac Lieu,
• Le Thi Hong Phong,
• Nguyen Dinh Luyen and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2026, 17, 541–554, doi:10.3762/bjnano.17.35

• by X-ray photoelectron spectroscopy (XPS). The survey spectrum (Figure 3a) confirms the presence of Cr, C, and O, which is consistent with the expected composition of MIL-101(Cr) integrated with reduced graphene oxide (rGO). No obvious extraneous elemental signals were observed in the survey spectrum

Probing internal continua and atomic ultrafast charge transfer within size-controlled nanoparticles by post-collision interaction in core-hole clock spectroscopy

• Johannes Lütgert,
• Erika Giangrisostomi,
• Nomi L. A. N. Sorgenfrei and
• Alexander Föhlisch

Beilstein J. Nanotechnol. 2026, 17, 505–514, doi:10.3762/bjnano.17.33

• characterization of the QDs with UV–vis absorption spectroscopy, hard X-ray photoelectron spectroscopy (HAXPES), and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy has been performed by us to verify the size-dependence of quantum confinement (see further details in Supporting Information File 1

Upcycling agroindustrial waste into graphene oxide supports for gold nanoparticles: toward sustainable nanomaterials

• Juan Marcos Castro-Tapia,
• Selene Acosta,
• Hiram Joazet Ojeda-Galván,
• Elsie Evelyn Araujo-Palomo,
• Edgar Giovanni Villabona-Leal and
• Mildred Quintana

Beilstein J. Nanotechnol. 2026, 17, 489–504, doi:10.3762/bjnano.17.32

• room temperature in the 4000–540 cm−1 range with a spectral resolution of 4 cm−1, averaging 80 scans per sample. The surface chemical composition was assessed by X-ray photoelectron spectroscopy (XPS) using a SPECS spectrometer equipped with a PHOIBOS 100 energy analyzer and an Al Kα X-ray source (hν

Defects and defect-mediated engineering of two-dimensional materials: challenges and open questions

• Arkady V. Krasheninnikov,
• Matthias Batzill,
• Anouar-Akacha Delenda,
• Marija Drndić,
• Chris Ewels,
• Katharina J. Franke,
• Mahdi Ghorbani-Asl,
• Alexander Holleitner,
• Ado Jorio,
• Ute Kaiser,
• Daria Kieczka,
• Hannu-Pekka Komsa,
• Jani Kotakoski,
• Manuel Längle,
• David Lamprecht,
• Yun Liu,
• Steven G. Louie,
• Janina Maultzsch,
• Thomas Michely,
• Katherine Milton,
• Anna Niggas,
• Hanako Okuno,
• Joshua A. Robinson,
• Marika Schleberger,
• Bruno Schuler,
• Alexander Shluger,
• Kazu Suenaga,
• Kristian S. Thygesen,
• Richard A. Wilhelm,
• E. Harriet Åhlgren and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2026, 17, 454–488, doi:10.3762/bjnano.17.31

• control over defect positioning, uniformity (only one and the same defect present), and scalability, which ultimately will lead to useful technological applications. What are the limitations of X-ray photoelectron spectroscopy in identifying and quantifying defect concentrations in 2D materials, and how

• can these limitations be addressed? X-ray photoelectron spectroscopy (XPS) is a powerful tool for identifying and quantifying defects in 2D materials, offering unique advantages in surface sensitivity, chemical state analysis, and real-time monitoring of defect evolution. While challenges such as

Interconnection morphology effects on the radio frequency response of carbon nanotube sponges

• Manuela Scarselli,
• Javad Rezvani,
• Zeno Zuccari,
• Mattia Scagliotti and
• Simone Tocci

Beilstein J. Nanotechnol. 2026, 17, 343–351, doi:10.3762/bjnano.17.23

• treatment. We also investigated the chemical state of the carbon atoms by acquiring X-ray photoelectron spectroscopy (XPS) spectra from the as-grown and ethanol-treated CNS samples. The survey spectra are reported in Supporting Information File 1 (Figure S2). Figure 5 shows that the C1 s spectra are

Gold nanoparticle-decorated reduced graphene oxide as a highly effective catalyst for the selective α,β-dehydrogenation of N-alkyl-4-piperidones

• Brenda Flore Kenyim,
• Mihir Tzalis,
• Marilyn Kaul,
• Robert Oestreich,
• Aysenur Limon,
• Chancellin Pecheu Nkepdep and
• Christoph Janiak

Beilstein J. Nanotechnol. 2026, 17, 218–238, doi:10.3762/bjnano.17.15

• functionalities of rGO were investigated by X-ray photoelectron spectroscopy (XPS) in the composite Au-SiW9/rGO. The Au 4f region (Figure 11a) shows two dominant peaks at 84.1 eV (Au 4f7/2) and 87.8 eV (Au 4f5/2), which correspond to metallic Au0, which is the initial catalytically active form in oxidative

Time of flight secondary ion mass spectrometry imaging of contaminant species in chemical vapour deposited graphene on copper

• Barry Brennan,
• Vlad-Petru Veigang-Radulescu,
• Philipp Braeuninger-Weimer,
• Stephan Hofmann and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2026, 17, 200–213, doi:10.3762/bjnano.17.13

• single crystals [3][20][21][22][23], utilising Raman spectroscopy to confirm the physical structure of the graphene [24][25][26] and X-ray photoelectron spectroscopy (XPS) to confirm the sp2 bonding configuration [27][28]. However, there is typically little consideration given to possible chemical

Reduced graphene oxide paper electrode for lithium-ion cells – towards optimized thermal reduction

• Agata Pawłowska,
• Magdalena Baran,
• Stefan Marynowicz,
• Aleksandra Izabela Banasiak,
• Adrian Racki,
• Adrian Chlanda,
• Tymoteusz Ciuk,
• Marta Wolczko and
• Andrzej Budziak

Beilstein J. Nanotechnol. 2026, 17, 24–37, doi:10.3762/bjnano.17.3

• 100). XPS X-ray photoelectron spectroscopy was applied to determine the surface concentrations of chemical bonds. The equipment applied was a PHI VersaProbeII Scanning XPS system with monochromatic Al Kα (1486.6 eV) X-rays (100 μm spot focused). High-energy-resolution spectra were obtained with 46.95

Current status of using adsorbent nanomaterials for removing microplastics from water supply systems: a mini review

• Nguyen Thi Nhan and
• Tran Le Luu

Beilstein J. Nanotechnol. 2025, 16, 1837–1850, doi:10.3762/bjnano.16.127

• . also confirmed that the reaction mechanisms of MPs and graphene oxide–chitosan sponges were electrostatic interactions, hydrogen bonding, and π–π interactions through Fourier-transform infrared spectroscopy and X-ray photoelectron spectroscopy measurements [69]. Integrating different types of

Electrical, photocatalytic, and sensory properties of graphene oxide and polyimide implanted with low- and medium-energy silver ions

• Josef Novák,
• Eva Štěpanovská,
• Petr Malinský,
• Vlastimil Mazánek,
• Jan Luxa,
• Ulrich Kentsch and
• Zdeněk Sofer

Beilstein J. Nanotechnol. 2025, 16, 1794–1811, doi:10.3762/bjnano.16.123

• of GO and PI. Elemental and structural changes induced by implantation were analyzed using Rutherford backscattering spectroscopy, elastic recoil detection analysis, Raman spectroscopy, Fourier-transform infrared spectroscopy, and X-ray photoelectron spectroscopy. Surface morphology was assessed via

• detected profile. Surface chemical analysis by XPS Chemical groups and the concentration of chemical elements on the surfaces of GO and PI before and after 20 keV and 1.5 MeV Ag ion implantation were analyzed by X-ray photoelectron spectroscopy (XPS). The XPS method specifically provides information from a

• implantation energy. The deconvolution of the C 1s region in high-resolution X-ray photoelectron spectroscopy (XPS) spectra of pristine PI is depicted in Figure 6a, illustrating four distinct carbon components. These components include C–C carbons originating from the aromatic rings of the oxydianiline portion

Ambient pressure XPS at MAX IV

• Mattia Scardamaglia,
• Ulrike Küst,
• Alexander Klyushin,
• Rosemary Jones,
• Jan Knudsen,
• Robert Temperton,
• Andrey Shavorskiy and
• Esko Kokkonen

Beilstein J. Nanotechnol. 2025, 16, 1677–1694, doi:10.3762/bjnano.16.118

• , Lund University, Box 118, SE-221 00, Lund, Sweden 10.3762/bjnano.16.118 Abstract Ambient pressure X-ray photoelectron spectroscopy (APXPS) has emerged as an important technique for investigating surface and interface chemistry under realistic conditions, overcoming the limitations of conventional XPS

• operando. With IRRAS, vibrational information is available, which greatly complements the electronic information obtained by photoelectron spectroscopy. This combination enables a more complete picture of surface reaction mechanisms. The examples discussed here focus on “model catalysts”, that is, systems

• have been performed on sputtered LiCoO2 cathodes, demonstrating the broader applicability of this technique to conventional battery materials [10]. Conclusion and Perspectives Ambient pressure X-ray photoelectron spectroscopy has emerged as a powerful and versatile technique for probing surface and

Photocatalytic degradation of ofloxacin in water assisted by TiO₂ nanowires on carbon cloth: contributions of H₂O₂ addition and substrate absorbability

• Iram Hussain,
• Lisha Zhang,
• Zhizhen Ye and
• Jin-Ming Wu

Beilstein J. Nanotechnol. 2025, 16, 1567–1579, doi:10.3762/bjnano.16.111

• diffractometer (Rigaku Corporation) with Cu Kα radiation, operating at 40 kV and 35 mA. Raman spectra were obtained using an Alpha300R UV system (WITec, Germany) equipped with a TEM00 laser at a wavelength of 532 nm. X-ray photoelectron spectroscopy (XPS) characterizations were conducted using a Kratos AXIS

Laser processing in liquids: insights into nanocolloid generation and thin film integration for energy, photonic, and sensing applications

• Akshana Parameswaran Sreekala,
• Pooja Raveendran Nair,
• Jithin Kundalam Kadavath,
• Bindu Krishnan,
• David Avellaneda Avellaneda,
• M. R. Anantharaman and
• Sadasivan Shaji

Beilstein J. Nanotechnol. 2025, 16, 1428–1498, doi:10.3762/bjnano.16.104

Synthesis and antibacterial properties of nanosilver-modified cellulose triacetate membranes for seawater desalination

• Lei Wang,
• Shizhe Li,
• Kexin Xu,
• Wenjun Li,
• Ying Li and
• Gang Liu

Beilstein J. Nanotechnol. 2025, 16, 1380–1391, doi:10.3762/bjnano.16.100

• result cannot exclude the possibility of instrumental error. X-ray photoelectron spectroscopy (XPS) is utilized to analyze the surface chemical compositions of Ag@PCTA, PCTA, and CTA. Figure 3a shows the XPS wide scan spectrum of CTA, PCTA, and Ag@PCTA. The C 1s peak at a binding energy (BE) of 284.94 eV

Enhancing the photoelectrochemical performance of BiOI-derived BiVO₄ films by controlled-intensity current electrodeposition

• Huu Phuc Dang,
• Khanh Quang Nguyen,
• Nguyen Thi Mai Tho and
• Tran Le

Beilstein J. Nanotechnol. 2025, 16, 1289–1301, doi:10.3762/bjnano.16.94

• . Characteristics of materials X-ray diffraction (XRD, Bruker D8 Advance) and Raman spectroscopy (LabRAM Odyssey Semiconductor) were used to analyze the crystal structures of photoanodes. UV–vis absorption spectra were obtained using a Cary 60 spectrophotometer. X-ray photoelectron spectroscopy (XPS, VG ESCALAB250

• , controlled crystallinity, and superior film uniformity achieved via the controlled-intensity current electrodeposition of BiOI. Surface chemical composition (XPS) X-ray photoelectron spectroscopy (XPS) was employed to investigate the surface chemical states and composition of the BiVO4 photoanodes, focusing

• 600 min. X-ray photoelectron spectroscopy (XPS) analysis of the BiVO4(326) photoanode before and after PEC stability testing in 30 min (0.5 M Na2SO4). (a) XPS view scans of survey spectrum and high-resolution spectra of (b) Bi 4f, (c) O 1s, and (d) V 2p. Estimated crystallite sizes of BiVO4

Single-layer graphene oxide film grown on α-Al₂O₃(0001) for use as an adsorbent

• Shiro Entani,
• Mitsunori Honda,
• Masaru Takizawa and
• Makoto Kohda

Beilstein J. Nanotechnol. 2025, 16, 1082–1087, doi:10.3762/bjnano.16.79

• Figure 1 shows an atomic force microscopy (AFM) image of SLG and SLGO on α-Al2O3(0001) substrates. The as-grown SLG film has an atomically flat surface and wrinkles with its height less than 0.4 nm [18]. The single layer of graphene was confirmed through X-ray photoelectron spectroscopy (XPS) peak

Structural and magnetic properties of microwave-synthesized reduced graphene oxide/VO₂/Fe₂O₃ nanocomposite

• Sumanta Sahoo,
• Ankur Sood and
• Sung Soo Han

Beilstein J. Nanotechnol. 2025, 16, 921–932, doi:10.3762/bjnano.16.70

• graphite oxide to form rGO, the reduction of V2O5 to form VO2, and the formation of Fe2O3 from ferrocene. X-ray diffraction and X-ray photoelectron spectroscopy analyses confirm the formation of distinct metal oxides in the presence of rGO. Furthermore, the morphological analysis reveals the deposition of

• the NCs. The Raman spectra of rGO and the related NCs were recorded through the “XploRA plus HORIBA” instrument with a laser excitation of 532 nm. Additionally, the surface analysis was performed using X-ray photoelectron spectroscopy measurements (XPS, Thermofisher Scientific) functioning at 12 kV

Heat-induced transformation of nickel-coated polycrystalline diamond film studied in situ by XPS and NEXAFS

• Olga V. Sedelnikova,
• Yuliya V. Fedoseeva,
• Dmitriy V. Gorodetskiy,
• Yuri N. Palyanov,
• Elena V. Shlyakhova,
• Eugene A. Maksimovskiy,
• Anna A. Makarova,
• Lyubov G. Bulusheva and
• Aleksandr V. Okotrub

Beilstein J. Nanotechnol. 2025, 16, 887–898, doi:10.3762/bjnano.16.67

• thin nickel film deposited by thermal evaporation. The graphitization of diamond with and without a nickel coating as a result of high-vacuum annealing at a temperature of about 1100 °C was studied in situ using synchrotron-based X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption

• . Keywords: graphitization; near-edge X-ray absorption fine structure spectroscopy; nickel coating; polycrystalline diamond film; single-crystal diamond; X-ray photoelectron spectroscopy; Introduction Diamond and graphite, both composed entirely of carbon atoms, exhibit vastly different properties due to

• requires a detailed study. HRTEM has proven very useful for investigating the graphite–diamond interface [19][24]. However, it provides information about local morphology and ordering of diamond surface and graphite layers. X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine

Insights into the electronic and atomic structures of cerium oxide-based ultrathin films and nanostructures using high-brilliance light sources

• Paola Luches and
• Federico Boscherini

Beilstein J. Nanotechnol. 2025, 16, 860–871, doi:10.3762/bjnano.16.65

• light sources, such as synchrotrons and free-electron lasers, allow researchers to probe the structural, electronic, and dynamic properties of functional materials at an unprecedented level of detail. Techniques like X-ray photoelectron spectroscopy and X-ray absorption spectroscopy, can reveal atomic

• applications, examining the application of high-brilliance light sources on model systems such as supported thin films and epitaxial nanostructures. We review selected studies exploiting the high energy resolution and sensitivity of synchrotron radiation-based X-ray photoelectron spectroscopy and X-ray

• perspectives offered by the ultrahigh brilliance and ultrashort free-electron laser pulses for dynamic studies of the processes that take place upon photoexcitation are discussed. Keywords: cerium oxide; free-electron lasers; thin films; X-ray absorption spectroscopy; X-ray photoelectron spectroscopy