Disorder in H⁺-irradiated HOPG: effect of impinging energy and dose on Raman D-band splitting and surface topography

• Lisandro Venosta,
• Noelia Bajales,
• Sergio Suárez and
• Paula G. Bercoff

Beilstein J. Nanotechnol. 2018, 9, 2708–2717, doi:10.3762/bjnano.9.253

• tapping mode. Standard Si cantilevers with sharp tips were used for high-resolution topography imaging and the software Gwyddion 2.36 was used for image analyses. Results and Discussion Raman characterization Figure 1 compares the Raman spectra after excitation with a laser wavelength of 514 nm

Optimization of Mo/Cr bilayer back contacts for thin-film solar cells

• Nima Khoshsirat,
• Fawad Ali,
• Vincent Tiing Tiong,
• Mojtaba Amjadipour,
• Hongxia Wang,
• Mahnaz Shafiei and
• Nunzio Motta

Beilstein J. Nanotechnol. 2018, 9, 2700–2707, doi:10.3762/bjnano.9.252

• tapping mode NT-MDT Solver-Pro atomic force microscope (AFM). A KeithLink four-point probe system was used to measure the sheet resistivity of the films. A Cary 5000 UV–vis–NIR spectrophotometer was also used for the optical properties measurements. The adhesion of the Mo layer was tested through ultra

Characterization of the microscopic tribological properties of sandfish (Scincus scincus) scales by atomic force microscopy

• Weibin Wu,
• Christian Lutz,
• Simon Mersch,
• Richard Thelen,
• Christian Greiner,
• Guillaume Gomard and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2018, 9, 2618–2627, doi:10.3762/bjnano.9.243

• controlled temperature (21–23 °C) and humidity (50–70%). All AFM experiments were conducted with a Dimension Icon AFM (Veeco Inc., USA). The topography of the samples was measured in tapping mode while adhesion force, friction, and wear analysis were conducted in contact mode. No extra treatment was applied

Non-agglomerated silicon–organic nanoparticles and their nanocomplexes with oligonucleotides: synthesis and properties

• Asya S. Levina,
• Marina N. Repkova,
• Nadezhda V. Shikina,
• Zinfer R. Ismagilov,
• Svetlana A. Yashnik,
• Dmitrii V. Semenov,
• Yulia I. Savinovskaya,
• Natalia A. Mazurkova,
• Inna A. Pyshnaya and
• Valentina F. Zarytova

Beilstein J. Nanotechnol. 2018, 9, 2516–2525, doi:10.3762/bjnano.9.234

• microscope. The results are presented in Figure 3. Atomic force microscopy (AFM) was performed on a Solver P47 Bio atomic force microscope (NT-МDT, Russia) in a tapping mode. The aqueous solution of the Si–NH2·ODN(1) sample (10 µL, 0.16 µM, NH2/p = 10) was applied to a freshly cleaved mica area of 25–30 mm2

Phosphorus monolayer doping (MLD) of silicon on insulator (SOI) substrates

• Noel Kennedy,
• Ray Duffy,
• Luke Eaton,
• Dan O’Connell,
• Scott Monaghan,
• Shane Garvey,
• James Connolly,
• Chris Hatem,
• Justin D. Holmes and
• Brenda Long

Beilstein J. Nanotechnol. 2018, 9, 2106–2113, doi:10.3762/bjnano.9.199

• Figure S2 (Supporting Information File 1), which lead to the use of a 1050 °C annealing for a time period of 5 s for all applications to SOI. Characterisation Atomic force microscopy was carried out in tapping mode at room temperature to analyse the surface quality throughout the MLD process. ECV

A scanning probe microscopy study of nanostructured TiO₂/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

• Laurie Letertre,
• Roland Roche,
• Olivier Douhéret,
• Hailu G. Kassa,
• Denis Mariolle,
• Nicolas Chevalier,
• Łukasz Borowik,
• Philippe Dumas,
• Benjamin Grévin,
• Roberto Lazzaroni and
• Philippe Leclère

Beilstein J. Nanotechnol. 2018, 9, 2087–2096, doi:10.3762/bjnano.9.197

• average spacing between the columns is (10 ± 3) nm, with an average width of the columns of (19 ± 4) nm, as determined by SEM measurements [24]. The topography of the deposit is shown in the tapping-mode atomic force microscopy (TM-AFM) image of Figure 1d, where the apex of the columns appears as

The structural and chemical basis of temporary adhesion in the sea star Asterina gibbosa

• Birgit Lengerer,
• Marie Bonneel,
• Mathilde Lefevre,
• Elise Hennebert,
• Philippe Leclère,
• Emmanuel Gosselin,
• Peter Ladurner and
• Patrick Flammang

Beilstein J. Nanotechnol. 2018, 9, 2071–2086, doi:10.3762/bjnano.9.196

• (Bruker Nano Inc., Santa Barbara, CA) using AFM in tapping mode. Tapping mode AFM was performed in amplitude modulation mode. The height of the cantilever position is constantly adjusted (via a feedback loop) to keep constant the ratio of the tip vibrational amplitude in contact with the sample surface to

A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si_1−xGe_x and Si layers

• Richard Daubriac,
• Emmanuel Scheid,
• Hiba Rizk,
• Richard Monflier,
• Sylvain Joblot,
• Rémi Beneyton,
• Pablo Acosta Alba,
• Sébastien Kerdilès and
• Filadelfo Cristiano

Beilstein J. Nanotechnol. 2018, 9, 1926–1939, doi:10.3762/bjnano.9.184

• good agreement with previous results obtained by our research group [26]. Concerning the surface roughness, tapping mode AFM analysis provided arithmetic averages Ra of about 1.2 Å (Figure S2, Supporting Information File 1). However, in view of its application for DHE experiments, it is necessary to

Synthesis of hafnium nanoparticles and hafnium nanoparticle films by gas condensation and energetic deposition

• Irini Michelakaki,
• Nikos Boukos,
• Dimitrios A. Dragatogiannis,
• Spyros Stathopoulos,
• Costas A. Charitidis and
• Dimitris Tsoukalas

Beilstein J. Nanotechnol. 2018, 9, 1868–1880, doi:10.3762/bjnano.9.179

• of the NPs and NTFs were performed by field-emission scanning electron microscopy (FESEM FEI Nova Nano SEM 230) and atomic force microscopy (Veeco diInnova) in tapping mode. The nanomechanical properties of the NTFs were determined by nanoindentation. Nanoidentation testing was performed with a

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

• Amelie Axt,
• Ilka M. Hermes,
• Victor W. Bergmann,
• Niklas Tausendpfund and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172

• commercial scanning probe microscopy systems, mainly due to its easy implementation. Nevertheless, there are different ways to operate AM-KPFM. In the simplest form, an AC voltage is applied during normal tapping mode imaging (single scan) at a frequency far below the first resonance ωE << ω0. We refer to

• and CPD measurements are decoupled: In a first step, a topographic contour line is recorded in tapping mode. In a second step, the mechanical excitation is switched off and the tip follows the same contour line shifted in z-direction by a defined lift height, typically 10–100 nm above the sample. AM

Uniform cobalt nanoparticles embedded in hexagonal mesoporous nanoplates as a magnetically separable, recyclable adsorbent

• Can Zhao,
• Yuexiao Song,
• Tianyu Xiang,
• Wenxiu Qu,
• Shuo Lou,
• Xiaohong Yin and
• Feng Xin

Beilstein J. Nanotechnol. 2018, 9, 1770–1781, doi:10.3762/bjnano.9.168

• magnetometer (VSM) with an applied magnetic field between −20 kOe and 20 kOe at room temperature (SQUID-VSM, USA). Atomic force microscopy (AFM) was performed on an AFM instrument (NTEGRA Spectra, Russia) using tapping mode. The samples were deposited onto clean Si substrates and dried at 60 °C. UV–vis

Correlative electrochemical strain and scanning electron microscopy for local characterization of the solid state electrolyte Li_1.3Al_0.3Ti_1.7(PO₄)₃

• Nino Schön,
• Deniz Cihan Gunduz,
• Shicheng Yu,
• Hermann Tempel,
• Roland Schierholz and
• Florian Hausen

Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148

• , respectively, the assignment of the individual phases to their chemical composition is further supported. Additionally, the occurrence of a secondary phase of AlPO4 has been previously observed [1][4]. No changes based on the different composition in phase images of tapping-mode AFM, nor in peak-force tapping

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• an annealed ultra-flat gold surface. The surface is imaged in tapping mode using harmonic excitation with amplitude modulation feedback, a free amplitude of 1 nm and a set-point of 0.8 nm. In harmonic excitation, we observe that intentional switching of the applied Udc by a few volts would result in

Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• OTS on Si(111) Particle lithography with an immersion step was used to prepare nanoholes within a film of OTS. A topographic view of the nanoholes is shown in Figure 2a, with the simultaneously acquired phase image (Figure 2b).The ex situ images were acquired with tapping-mode AFM in air. The

• sonication step was repeated 4 times and then the samples were dried under nitrogen. Atomic force microscopy Samples were characterized using a model 5500 atomic force microscope (Keysight Technologies, Santa Rosa, CA). Images of samples were acquired using tapping-mode in ambient air. Silicon nitride tips

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• ., Manchester, UK), UV–vis absorption spectra (Lambda 750 UV/VIS/NIR spectrometer, PerkinElmer, Inc., Waltham, MA, USA) and SPFM. In the SPFM, a DC or AC bias is applied to a tapping mode AFM tip, generating an electrostatic attractive force (polarization force) between the biased tip and the polarized charge

Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition

• Federico Venturi,
• Gian Carlo Gazzadi,
• Amir H. Tavabi,
• Alberto Rota,
• Rafal E. Dunin-Borkowski and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2018, 9, 1040–1049, doi:10.3762/bjnano.9.97

• a two-dimensional magnetization map can be recorded. MFM analysis was performed with a VEECO EnviroScope system, working in tapping mode with amplitude detection feedback. The MFM maps were acquired in two-pass lift-mode, with the magnetic signal collected about 30 nm above the surface. The probe

Automated image segmentation-assisted flattening of atomic force microscopy images

• Yuliang Wang,
• Tongda Lu,
• Xiaolai Li and
• Huimin Wang

Beilstein J. Nanotechnol. 2018, 9, 975–985, doi:10.3762/bjnano.9.91

• AFM (Resolve, Bruker) in tapping mode with 96% setpoint value. A silicon cantilever (NSC36/ALBS, MikroMasch) with quoted stiffness of 0.6 N/m and tip radius of 8 nm was used for scanning. The scanning frequency and scanning angle were 2 Hz and 0°, respectively. Methods The step-by-step procedure of

Electro-optical interfacial effects on a graphene/π-conjugated organic semiconductor hybrid system

• Karolline A. S. Araujo,
• Luiz A. Cury,
• Matheus J. S. Matos,
• Thales F. D. Fernandes,
• Luiz G. Cançado and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2018, 9, 963–974, doi:10.3762/bjnano.9.90

• peak force or tapping mode. Besides conventional topographic images, peak force mode yields several concomitant images which map mechanical properties of the sample, like adhesion, elastic modulus, dissipation and others [64]. The adhesion channel monitors tip–sample attractive forces along the imaging

Scanning speed phenomenon in contact-resonance atomic force microscopy

• Christopher C. Glover,
• Jason P. Killgore and
• Ryan C. Tung

Beilstein J. Nanotechnol. 2018, 9, 945–952, doi:10.3762/bjnano.9.87

• ] and Tyrell et al. [40] were able to image nanobubbles in tapping mode and found that the bubbles could be easily moved by the probe tip and could not be imaged in contact mode. The presence of nanobubbles on the hydrophobic HOPG sample may prevent a continuous film from forming. The scan speed

Comparative study of antibacterial properties of polystyrene films with TiO_x and Cu nanoparticles fabricated using cluster beam technique

• Vladimir N. Popok,
• Cesarino M. Jeppesen,
• Peter Fojan,
• Anna Kuzminova,
• Jan Hanuš and
• Ondřej Kylián

Beilstein J. Nanotechnol. 2018, 9, 861–869, doi:10.3762/bjnano.9.80

• studied by AFM in tapping mode using Ntegra Aura nanolaboratory (from NT-MDT). Commercial cantilevers with sharp silicon tips (radius of curvature <10 nm, force constant of 3.5–6.0 N/m) are used. SEM analysis is carried out by means of Mira3 (Tescan) microscope operated with accelerating voltage of 30 kV

Graphene composites with dental and biomedical applicability

• Sharali Malik,
• Felicite M. Ruddock,
• Adam H. Dowling,
• Kevin Byrne,
• Wolfgang Schmitt,
• Ivan Khalakhan,
• Yoshihiro Nemoto,
• Hongxuan Guo,
• Lok Kumar Shrestha,
• Katsuhiko Ariga and
• Jonathan P. Hill

Beilstein J. Nanotechnol. 2018, 9, 801–808, doi:10.3762/bjnano.9.73

• ). Characterization The MLG and FLG material was characterized by Raman spectroscopy (Renishaw at 514 nm) and the AFM measurements were performed on a MultiMode V AFM (Veeco) in tapping mode under ambient conditions. RTESP silicon probes (Veeco) were used with a nominal tip radius of 10 nm and nominal spring constant

Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

• Daiki Katsube,
• Hayato Yamashita,
• Satoshi Abo and
• Masayuki Abe

Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63

• deposition, a deposited sample was taken out into the ambient atmosphere and its topography was measured with a tapping AFM in air. Although it is difficult to obtain atomic resolution images in tapping mode, the larger scanning area of tapping AFM enabled us to check whether a step-and-terrace surface was

• rate fp = 2.0 Hz on a LaAlO3(100) substrate. The sample was then taken out of vacuum, and its surface was measured with tapping mode AFM in air as shown in Figure 3a. It was found that an atomically flat area did not exist on the surface, instead grain structures appeared on the surface. A peak for

• view of the combined PLD/AFM system. STM measurements can also be performed. LEED and RHEED apparatuses are also installed. The AFM (and also STM) is operated at room temperature in UHV. (a) Sample holder and (b) holder stocker used in the PLD camber. (a–d) Tapping mode AFM images of anatase-TiO2(001

Tuning adhesion forces between functionalized gold colloidal nanoparticles and silicon AFM tips: role of ligands and capillary forces

• Sven Oras,
• Sergei Vlassov,
• Marta Berholts,
• Rünno Lõhmus and
• Karine Mougin

Beilstein J. Nanotechnol. 2018, 9, 660–670, doi:10.3762/bjnano.9.61

• , but also by the interactions of the NPs and silicon substrate during nanomanipulation in AFM in tapping mode [23]. Despite its inertness [24], Au NPs can be relatively easily functionalized with organic ligands resulting in the formation of stable colloids [23][25]. The possibility of changing the

Kinetics of solvent supported tubule formation of Lotus (Nelumbo nucifera) wax on highly oriented pyrolytic graphite (HOPG) investigated by atomic force microscopy

• Sujit Kumar Dora,
• Kerstin Koch,
• Wilhelm Barthlott and
• Klaus Wandelt

Beilstein J. Nanotechnol. 2018, 9, 468–481, doi:10.3762/bjnano.9.45

• taken in account to understand how different factors affecting self-assembly of these tubules on HOPG. Koch et al. [21] demonstrated that self-assembly of nonacosan-10-ol tubules resulted in an upright orientation of tubules on HOPG. By employing tapping mode atomic force microscopy (AFM), they observed

Wafer-scale bioactive substrate patterning by chemical lift-off lithography

• Chong-You Chen,
• Chang-Ming Wang,
• Hsiang-Hua Li,
• Hong-Hseng Chan and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2018, 9, 311–320, doi:10.3762/bjnano.9.31

• tapping mode atomic force microscopy (AFM, Dimension Fastscan, Bruker Nano Surfaces, Hsinchu, Taiwan). Topographic AFM images were collected using a silicon cantilever with a spring constant of 48 N/m and a resonance frequency of 190 kHz (Nanosensors, Neuchatel, Switzerland). The substrates were gently