A review on slip boundary conditions at the nanoscale: recent development and applications

• Ruifei Wang,
• Jin Chai,
• Bobo Luo,
• Xiong Liu,
• Jianting Zhang,
• Min Wu,
• Mingdan Wei and
• Zhuanyue Ma

Beilstein J. Nanotechnol. 2021, 12, 1237–1251, doi:10.3762/bjnano.12.91

• surface roughness on the flow boundary conditions, since a perfectly smooth surface is an idealized model even at molecular scales. Numerous investigations have demonstrated that the variations of topography on the surface can drastically influence the effective slip length [81][82]. However, the

• surfaces as shown in Figure 6. Such structured surfaces, with definite dimensions of the structures, are very crucial for the design and fabrication of nanofluidic devices [83][84][85]. Many previous works have shown that the topography variation of structured surfaces can induce the variation of the

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• strictly limited to the measurement of topography. When scanning in air, the interaction of the tip with the sample can be reduced, and the measurements themselves are performed more delicately when using resonance modes. In this class of AFM techniques, the probe is forced to oscillate close to its

• signal is saturated. If p = 50%, then the maximum value of δA does not exceed A0/2 and can be significantly less than h. This leads to inaccurate profile measurements. When descending from a step edge, so-called parachuting is observed and the actual topography profile is smoothed out. The climb to a

• steep topography. Likewise, when descending a steep edge, parachuting will not happen, as the probe will remain over each point as long as necessary to reach the reference level of the amplitude. Thus, the actual time taking to acquire a scan is determined both by the speed of movement between the

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• the measured electrical tip–sample interaction is directly affixed to the topography rendered by the mechanical PFT modulation at each tap. Furthermore, because the detailed response of the cantilever to the bias stimulation was recorded, it was possible to analyze and separate an average contribution

• the out-of-contact intervals of the PFT motion. Because this method consists of a single-pass scan, the CPD determined from the acquired data at a given location can be directly affixed to the topography provided by PFT at that location; in two-pass KPFM scans, the CPD trace determined in the second

• pass is distributed over the topography line recorded in the first pass. Also, because the response to the applied bias modulation was fully acquired in the proposed OL KPFM implementation, the CPD was determined by modeling the electrostatic interaction between the AFM probe and the sample. This was

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• was measured by TEM for different grains (see Supporting Information File 1). Both the TEM image and the FSD image, the latter is recorded with the EBSD detector and highlights the surface topography, show the different milling depths for different grains. Faster milling grains were milled to a 226 nm

• maps were recorded and evaluated. The measurements and evaluations are shown in Figure 7a–c. The figure insets show the experiments with the lowest ion dose. The 0° incidence angle milling creates a strong surface topography in both cases, as evidenced in the forward scatter diffraction image (Figure

•  7a). Figure 7a shows an overlay of the FSD image with the phase map. A strong surface topography was expected as different grain orientations mill at different rates. As a result of the induced strong topography, a lot of the regions cannot be indexed, returning twice the amount of zero solutions for

Self-assembly of Eucalyptus gunnii wax tubules and pure ß-diketone on HOPG and glass

• Miriam Anna Huth,
• Axel Huth and
• Kerstin Koch

Beilstein J. Nanotechnol. 2021, 12, 939–949, doi:10.3762/bjnano.12.70

• solvent and were done in tapping mode with tapping-mode cantilevers (Tap300-G, Budget Sensors, Sofia, Bulgaria). The scan rates ranged from 0.7 to 2.3 Hz and the scan sizes from 3 × 3 to 10 × 10 µm. The maximum possible set point was used (approx. 60–70% of drive amplitude). Obtained topography and

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• topography, for example, adhesion, phase shift, stiffness, work function, or friction. In the following section, the utility of CNN in SPM is illustrated through several examples taken from the literature. Enhancing speed of image acquisition As discussed above, SPM imaging is inherently slow. One of the

• acquired using an enhanced scanning technique termed “ringing mode”, which simultaneously gives mappings of other surface properties together with topography [133]. In this case, it was found that whereas topography was a poor criterion for separating the two populations, adhesion was much better

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• piezoelectricity has been patterned into multilayered MoTe2 [56]. In the case of helium ion irradiation of a bulk van der Waals layered ferroelectric semiconductor crystal (CuInP2S6), local volume expansion due to helium ion implantation was observed, forming a conical surface topography within which for

• silicon substrate supporting an amorphous nanoporous aluminum oxide structure was irradiated with helium ions causing dome-shaped swelling of the substrate and thereby 3D deformation of the supported material, accompanied by enlargement of the nanopores to accommodate the new topography [96]. 3

Impact of GaAs(100) surface preparation on EQE of AZO/Al₂O₃/p-GaAs photovoltaic structures

• Piotr Caban,
• Rafał Pietruszka,
• Jarosław Kaszewski,
• Monika Ożga,
• Bartłomiej S. Witkowski,
• Krzysztof Kopalko,
• Piotr Kuźmiuk,
• Katarzyna Gwóźdź,
• Ewa Płaczek-Popko,
• Krystyna Lawniczak-Jablonska and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 578–592, doi:10.3762/bjnano.12.48

• analyzed using a scanning electron microscope (Hitachi SU-70) with a secondary electron detector operating at 15 kV. The topography of the surface of the layers was analyzed using an atomic force microscope (Bruker Dimension Icon) working in peak-force tapping mode using a ScanAsyst algorithm. A ScanAsyst

• B series, respectively. From the AFM results shown in Figure 3 and Figure 4, one can see that A1, A2, A4, B1, and B4 samples exhibit uniform surfaces by the means of polycrystalline thin film topography. By taking into consideration the roughness of the surfaces (RMS was measured for an area of 4

• and SEM and the value obtained for the AZO layer thickness was approx. 50 nm in the cross-sections. The topography of the surface depends on the substrate preparation method. The lowest roughness (by means of RMS) was found in the samples etched with ammonium hydroxide solution. Also, these samples

Properties of graphene deposited on GaN nanowires: influence of nanowire roughness, self-induced nanogating and defects

• Jakub Kierdaszuk,
• Piotr Kaźmierczak,
• Justyna Grzonka,
• Aleksandra Krajewska,
• Aleksandra Przewłoka,
• Wawrzyniec Kaszub,
• Zbigniew R. Zytkiewicz,
• Marta Sobanska,
• Maria Kamińska,
• Andrzej Wysmołek and
• Aneta Drabińska

Beilstein J. Nanotechnol. 2021, 12, 566–577, doi:10.3762/bjnano.12.47

• graphene is observed in the N500 sample (Figure 1c, Figure 1f). Contrarily to the other samples, in this case graphene touches only the highest NWs and does not have any contact with the lowest ones. Furthermore, graphene in the N100 and N500 samples is pierced by some of the highest NWs. The topography of

Local stiffness and work function variations of hexagonal boron nitride on Cu(111)

• Abhishek Grewal,
• Yuqi Wang,
• Matthias Münks,
• Klaus Kern and
• Markus Ternes

Beilstein J. Nanotechnol. 2021, 12, 559–565, doi:10.3762/bjnano.12.46

• 6.1 eV [35], which can be modulated by the Moiré pattern [30]. We analyse the substrate using STM topography, dI/dV, and frequency shift, Δf, AFM maps under low (in-gap) and high (conduction band onset) bias conditions (see Figure 2). Due to h-BN being insulating, no spectroscopic contribution is

• expected at low bias voltages making it transparent to STM, as seen in Figure 2b,d. At this bias, only Friedel oscillations due to the scattering of the Cu(111) surface-state electrons on defects and adsorbates are observed. Contrarily, as Figure 2a reveals, at higher bias, the STM topography corresponds

• images and the STM topography. Also, the Δf variation between rim and valley areas in both images changes only marginally. The additionally imaged adsorbates (dots or ring-like features) allow, thereby, the precise alignment between the subsequently acquired data sets. Work function variation While the

Influence of electrospray deposition on C₆₀ molecular assemblies

• Antoine Hinaut,
• Sebastian Scherb,
• Sara Freund,
• Zhao Liu,
• Thilo Glatzel and
• Ernst Meyer

Beilstein J. Nanotechnol. 2021, 12, 552–558, doi:10.3762/bjnano.12.45

• nc-AFM topography image of a Au(111) surface covered with 0.35 monolayers of C60 molecules is shown in Figure 2a. Large clean terraces separated by monoatomic step edges are observed. On top, the adsorbed C60 molecules are seen in two possible locations. First, all step edges of the surface are

• molecules deposited on Au(111) surfaces with HV-ESD are known to form large assemblies [5]. A Au(111) surface with a coverage of 0.30 monolayers of C60 after HV-ESD, similar to that after TE in Figure 2a, is shown in the topography map in Figure 2b. Monoatomic step edges and terraces of a few hundreds of

• responsible for the nucleation of islands in the middle of the terraces. C60 on KBr(001) surface The deposition of C60 on bulk insulators is known to lead to the creation of large islands [22][31]. A typical KBr(001) surface after TE of C60 is shown in the nc-AFM topography image in Figure 3a. Large clean

Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene

• Zhao Liu,
• Antoine Hinaut,
• Stefan Peeters,
• Sebastian Scherb,
• Ernst Meyer,
• Maria Clelia Righi and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2021, 12, 432–439, doi:10.3762/bjnano.12.35

• temperature and density functional theory (DFT) calculations. The results suggest that this particular reconstruction of KBr occurs on Ir(111), due to a specific correlation of the lattice parameter. When deposited on a single layer of graphene on the same substrate, the topography of the KBr islands returns

• the iridium terraces. Figure 1a shows a large-scale topography image of a KBr island on Ir(111) measured by nc-AFM at room temperature. The monoatomic steps between the Ir terraces have a height of 235 pm as expected for Ir(111). The KBr islands are monolayers with an average height of 340 pm under

• Kelvin probe force microscopy (KPFM), as can be seen in Supporting Information File 1, Figure S3. To be able to tune this corrugated structure, a monolayer of graphene was prepared on Ir(111) before KBr deposition. Figure 4a shows a large-area topography of the Ir(111) surface, half of which is covered

Structural and optical characteristics determined by the sputtering deposition conditions of oxide thin films

• Petronela Prepelita,
• Florin Garoi and
• Valentin Craciun

Beilstein J. Nanotechnol. 2021, 12, 354–365, doi:10.3762/bjnano.12.29

• diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), while the surface topography of the samples was analyzed using scanning electron microscopy (SEM). The optical characteristics were measured for samples with the same composition but obtained with different deposition parameters, such as increasing

The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication

• Victor Deinhart,
• Lisa-Marie Kern,
• Jan N. Kirchhof,
• Sabrina Juergensen,
• Joris Sturm,
• Enno Krauss,
• Thorsten Feichtner,
• Sviatoslav Kovalchuk,
• Michael Schneider,
• Dieter Engel,
• Bastian Pfau,
• Bert Hecht,
• Kirill I. Bolotin,
• Stephanie Reich and
• Katja Höflich

Beilstein J. Nanotechnol. 2021, 12, 304–318, doi:10.3762/bjnano.12.25

• patterning without affecting the topography of the films [32]. The local modification of the magnetic properties, in particular anisotropy and exchange coupling (including the chiral Dzyaloshinskii–Moriya interaction), originates from structural modifications, such as interface structure, atomic ordering

• curvatures in the beam path, use the local dose optimization to achieve a uniform target depth. To demonstrate the capabilities of FIB-o-mat, three different 2D material systems were patterned. Multilayers of Co/Pt were modified regarding their local magnetic response without changing their topography

The nanomorphology of cell surfaces of adhered osteoblasts

• Christian Voelkner,
• Mirco Wendt,
• Regina Lange,
• Max Ulbrich,
• Martina Gruening,
• Susanne Staehlke,
• Barbara Nebe,
• Ingo Barke and
• Sylvia Speller

Beilstein J. Nanotechnol. 2021, 12, 242–256, doi:10.3762/bjnano.12.20

• flexible. Figure 2a shows an example of a typical SICM topography of the border region in the live state (see Figure 2b for the corresponding bright-field microscopy image). Features with lateral dimensions of approximately 1 µm × 0.8 µm protruding 100–300 nm from the surrounding (Figure 2c), at a density

• when the live-cell dynamics is suppressed upon fixation of the osteoblasts with 4% paraformaldehyde (PFA). Figure 3a shows an example of a respective SICM topography. Now, the ruffles exhibit a clearer shape and resemble similar features to those observed with electron microscopy [29][30]. Our data

• area (Aeff – Aproj). The effective surface is the undulated surface area of the three-dimensional function z(x,y) as determined from SICM topography images, and the projected area is the frame or base area Aproj = ∫∫dxdy (Figure 5b). The relative excess surface is then Figure 5a shows the relative

Extended iron phthalocyanine islands self-assembled on a Ge(001):H surface

• Rafal Zuzak,
• Marek Szymonski and
• Szymon Godlewski

Beilstein J. Nanotechnol. 2021, 12, 232–241, doi:10.3762/bjnano.12.19

• manipulation when the molecule marked by the dashed circle suddenly appeared on a perfectly hydrogenated Ge(001):H surface area. This could be inferred from that fact that the image shows the molecule only in the upper part of the scan, whereas the lower part of the topography presents the perfectly

Imaging of SARS-CoV-2 infected Vero E6 cells by helium ion microscopy

• Natalie Frese,
• Patrick Schmerer,
• Martin Wortmann,
• Matthias Schürmann,
• Matthias König,
• Michael Westphal,
• Friedemann Weber,
• Holger Sudhoff and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 172–179, doi:10.3762/bjnano.12.13

• topography or material contrast. The deposited carbon film is presumably thinner than typical conductive metal or carbon coatings for SEM imaging, and it does not show any surface masking and clustering as seen on the gold substrate in the upper left of Figure 2b2. The energy of the incident hydrocarbons is

• observed for human coronavirus229E and quantified in HeLa cells by Wang and co-workers [38]. However, the metal coating applied by Wang et al. is clearly visible at high resolution in the SEM images as a rough layer on the cell membrane that hides the true topography [25][39]. In contrast, the HIM images

Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• double-pass mode, which means that the probe executes two scans. The first scan measures the sample topography in tapping mode and the second scan mimics the profile at a defined lift height Zlift applying a voltage VDC between the tip and the conductive substrate [21]. The tip is mechanically forced to

• ). The α coefficient map and its average profile differ slightly from the topographic information, but some correspondences are identified. Thicker regions have a smaller α coefficient, as can be seen at the wing–resin interface (Figure 5b). There seems to be a correlation between topography (Figure 5a

• ) and the relative permittivity εr (Figure 5c): the lower the topography, the larger the εr. However, we observe a small εr value in the lower topography regions adjacent to the wing slab. Hence, topography crosstalk is small. Chalcopterix rutilans damselfly wings Using the protocol described above, we

Fusion of purple membranes triggered by immobilization on carbon nanomembranes

• René Riedel,
• Natalie Frese,
• Fang Yang,
• Martin Wortmann,
• Raphael Dalpke,
• Daniel Rhinow,
• Norbert Hampp and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 93–101, doi:10.3762/bjnano.12.8

• topography data from the first scan. The voltage applied to the tip to compensate for attracting/repelling electrostatic forces indicates the electrostatic potential of the sample. The samples were further analyzed by SEM in a Zeiss Auriga (Carl Zeiss, Jena, Germany) at an acceleration voltage of 5 kV using

• samples were subsequently washed with 200 µL distilled water and dried in a nitrogen flow. For each sample the topography of a 50 × 50 µm2 area was investigated by AFM to evaluate substrate coverage. It has been shown that the WT PM patches do not form a continuous monolayer, but rather separately

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• material phases based on AFM topography. Additional chemical characterization on the nanoscale is performed by an AFM/infrared-spectroscopy hybrid method. Mechanical properties (kr) and attractive forces (Fattr) are calculated and a structure–property correlation is obtained by a manual principle component

• and material interphases are usually deduced from AFM topography. This is problematic because subsurface structures are not taken into consideration even though they might be relevant for the physical properties [2][15]. Also, with increasing resolution and decreasing size of heterogeneous structures

• , AFM topography is often not conclusive. To overcome these disadvantages, complementary measurements are performed. Methods such as SEM and EDX are able to image structural contrasts with a lateral resolution on the order of magnitude of the AFM tip size or higher [16][17][18][19]. However, since those

Atomic layer deposited films of Al₂O₃ on fluorine-doped tin oxide electrodes: stability and barrier properties

• Hana Krýsová,
• Michael Neumann-Spallart,
• Hana Tarábková,
• Pavel Janda,
• Ladislav Kavan and
• Josef Krýsa

Beilstein J. Nanotechnol. 2021, 12, 24–34, doi:10.3762/bjnano.12.2

• deposited Al2O3. The height-density distribution (Figure S2, Supporting Information File 1), calculated from the AFM topography images (Figure 1), shows that the deposition of Al2O3 onto FTO substrates does not change its surface morphology. Calculated RMS (root mean square) values for AFM images of FTO and

• protection against the reduction of FTO. While bare FTO was reduced to Sn at −1.2 V vs Ag/AgCl in a neutral electrolyte, the Al2O3-coated FTO became reduction-resistant. AFM topography image (10 µm × 10 µm) of an FTO substrate (left) and of an FTO substrate coated with a 17 nm thick Al2O3 layer (right

Bio-imaging with the helium-ion microscope: A review

• Matthias Schmidt,
• James M. Byrne and
• Ilari J. Maasilta

Beilstein J. Nanotechnol. 2021, 12, 1–23, doi:10.3762/bjnano.12.1

• SEMs (FE-SEM) and transmission electron microscopes (TEM). On the other hand, HIM is less demanding in terms of sample preparation compared to both SEM and TEM. In particular, the advantage of HIM is that opaque and non-conductive specimens, which possess a relatively strong topography, can be imaged

• reach the detector. In HIM, the emitted secondary electrons already have low energy, which results in a strong edge and topography contrast. Furthermore, the low energies of the secondary electrons in a HIM produce excellent contrast due to changes in the work functions of the materials. An interesting

• EPS. The micrograph was recorded using secondary electron imaging. The high surface sensitivity and the strongly pronounced edges in this imaging mode render the thin EPS between the algal cells bright white. Furthermore, it is remarkable that despite the strong topography of more than 20 μm in the

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• 90 kHz and VDC = 0 V. The signals of ∂C/∂V phase, ∂C/∂V amplitude, sMIM-R, sMIM-C, and the topography were simultaneously acquired. In a second investigation, dynamic sMIM spectroscopy was performed by sweeping the VDC voltage from −2.0 V to 2.5 V at each location of the scan. The Integrated PIN

• , an electrical back contact is created between the microscope chuck and the sample. Results and Discussion The vertical PIN structure Figure 2 shows the surface topography of the cross section of the PIN diode. The different materials used (silicon substrate, epitaxial layers, oxides, and alloy metals

• ) have a slightly different polishing rate, which results in the observed topography. In the AFM topography image, one can localize the two deep trench isolation structures in the silicon wafer, as well as the anode and cathode contacts. It is important to note that a low roughness is required for a

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

• Tatsuya Yamamoto,
• Ryo Izumi,
• Kazushi Miki,
• Takahiro Yamasaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157

• cantilever was used, which was cleaned by Ar+ sputtering to remove the oxide and contamination on the tip. The deflection of the cantilever was measured by the optical beam deflection method. The topography of the surface was imaged while feedback electronics were used to adjust the tip–sample distance to

• images [37], these five bright spots can be explained by the dangling bonds of five atoms. Therefore, it was concluded that the five bright spots in pentagonal formation observed for a negative tip bias in STM images correspond to five atoms, that is, they were not due to crosstalk between the topography

Application of contact-resonance AFM methods to polymer samples

• Sebastian Friedrich and
• Brunero Cappella

Beilstein J. Nanotechnol. 2020, 11, 1714–1727, doi:10.3762/bjnano.11.154

• topography image of a 100 nm thick PnBMA film scanned with a PPP-FMAuD cantilever (kc = 2.74 N/m). The wave pattern was “engraved” into a smaller scan area of (15 µm)2 in DART mode previous to the scan in tapping mode. For the DART scan a static force of 308 nN, a frequency of ca. 320 kHz, and amplitudes of

• tip radius R was measured through recording tapping mode topography images on a grid with sharp tips (see Experimental section). The curves can be fitted quite exactly, most of all those on glass and PS. The three values of the reduced elastic moduli obtained for glass, PMMA, and PS are 62.3 GPa, 9.4

• topography image of a 100 nm thick PnBMA film after a smaller area (15 µm)2 was scanned in DART mode with a static force of 308 nN, a frequency of ca. 320 kHz, and amplitudes of 440 and 80 pm. CR frequency f(t) in the first mode as a function of the measuring time on three PnBMA films with thickness of 25