Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy

• Kerstin Neuhaus,
• Christina Schmidt,
• Liudmila Fischer,
• Wilhelm Albert Meulenberg,
• Ke Ran,
• Joachim Mayer and
• Stefan Baumann

Beilstein J. Nanotechnol. 2021, 12, 1380–1391, doi:10.3762/bjnano.12.102

• |ceria, ceria|electron conductor, and electron conductor|electron conductor). Kelvin probe force microscopy (KPFM) is an atomic force microscopy (AFM)-based measurement method that can measure the local surface potential (or Volta potential) of the sample [18][19]. The surface potential is a sensitive

Alteration of nanomechanical properties of pancreatic cancer cells through anticancer drug treatment revealed by atomic force microscopy

• Xiaoteng Liang,
• Shuai Liu,
• Xiuchao Wang,
• Dan Xia and
• Qiang Li

Beilstein J. Nanotechnol. 2021, 12, 1372–1379, doi:10.3762/bjnano.12.101

• regulation of cell activity, and hence to the health level of organisms. Here, the morphology and mechanical properties of normal pancreatic cells (HDPE6-C7) and pancreatic cancer cells (AsPC-1, MIA PaCa-2, BxPC-3) were studied by atomic force microscopy. In addition, the mechanical properties of MIA PaCa-2

• aggressive cancer cell BxPC-3. In addition, the Young's modulus of MIA PaCa-2 rises with the increasing of DOX concentration. This study may provide a new strategy of detecting cancer, and evaluate the possible interaction of drugs on cells. Keywords: anticancer drug; atomic force microscopy; nanomechanical

• from measuring the alteration of cellular mechanics, which provides a guide for the innovation and development of anticancer drugs [11]. Atomic force microscopy (AFM) has matured into a forceful nanoscale platform for imaging biological samples and quantifying biomechanical properties of living cells

Cantilever signature of tip detachment during contact resonance AFM

• Devin Kalafut,
• Ryan Wagner,
• Maria Jose Cadena,
• Anil Bajaj and
• Arvind Raman

Beilstein J. Nanotechnol. 2021, 12, 1286–1296, doi:10.3762/bjnano.12.96

• Devin Kalafut Ryan Wagner Maria Jose Cadena Anil Bajaj Arvind Raman School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907, USA 10.3762/bjnano.12.96 Abstract Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are

• atomic force microscopy modes in which the cantilever is held in contact with the sample at a constant average force while monitoring the cantilever motion under the influence of a small, superimposed vibrational signal. Though these modes depend on permanent contact, there is a lack of detailed analysis

• connect the qualitative and quantitative behavior to experimental features. Keywords: atomic force microscopy (AFM); contact resonance; nonlinear normal mode (NNM); tip–sample detachment; photothermal excitation; Introduction Contact resonance atomic force microscopy (CR-AFM) [1][2], piezoresponse force

A review on slip boundary conditions at the nanoscale: recent development and applications

• Ruifei Wang,
• Jin Chai,
• Bobo Luo,
• Xiong Liu,
• Jianting Zhang,
• Min Wu,
• Mingdan Wei and
• Zhuanyue Ma

Beilstein J. Nanotechnol. 2021, 12, 1237–1251, doi:10.3762/bjnano.12.91

• nanoscale systems [8][34][38][39]. For example, based on surface force apparatus (SFA) and atomic force microscopy (AFM) measurements, many researchers have investigated the slippage characteristics of nanoconfined liquid flows and derived the slip length according to its correlation with the hydrodynamic

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• 10.3762/bjnano.12.90 Abstract The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is

• formalized choice of the imaging parameters in these modes allows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging. Keywords: atomic force microscopy; dissipation mode; scanning probe microscopy; vertical mode

• ; Introduction More than 30 years have passed since the introduction of atomic force microscopy (AFM) [1]. This technique has established itself as an indispensable tool for characterization not only in physics and chemistry, but also in related fields of research including medicine, biology, and materials

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpreted to include

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

• Berkin Uluutku,
• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 1063–1077, doi:10.3762/bjnano.12.79

• at the micro- and the nanoscale is commonly performed with the aid of force–distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the observed material behavior to specific viscoelastic models, such as generalized viscoelastic models

• unbounded inputs traditionally used to acquire force–distance relationships in AFM, such as ramp functions, in which the cantilever position is displaced linearly with time for a finite period of time. Keywords: atomic force microscopy; force spectroscopy; material properties; viscoelasticity

• ; Introduction Atomic force microscopy (AFM) is a prominent technique for investigating material properties at the micro- and the nanoscale [1][2][3], within which a wide variety of instruments, probes, and analysis techniques have been developed to attempt meaningful material property extraction [4][5][6][7][8

Revealing the formation mechanism and band gap tuning of Sb₂S₃ nanoparticles

• Maximilian Joschko,
• Franck Yvan Fotue Wafo,
• Christina Malsi,
• Danilo Kisić,
• Ivana Validžić and
• Christina Graf

Beilstein J. Nanotechnol. 2021, 12, 1021–1033, doi:10.3762/bjnano.12.76

• . Atomic force microscopy (AFM) as an additional method of size determination was applied to confirm the TEM results of the sample obtained after 30 s reaction time. AFM enables imaging of the nanoparticles under milder conditions than TEM and at ambient conditions so that thermal damage of the

Molecular assemblies on surfaces: towards physical and electronic decoupling of organic molecules

• Sabine Maier and
• Meike Stöhr

Beilstein J. Nanotechnol. 2021, 12, 950–956, doi:10.3762/bjnano.12.71

• . To a lesser extent, metal oxides have also been used, for which defects and charging often pose additional challenges [44][45][46]. On electronically insulating surfaces, non-contact atomic force microscopy (AFM) is the method of choice to study molecular assemblies and individual molecules in real

Self-assembly of Eucalyptus gunnii wax tubules and pure ß-diketone on HOPG and glass

• Miriam Anna Huth,
• Axel Huth and
• Kerstin Koch

Beilstein J. Nanotechnol. 2021, 12, 939–949, doi:10.3762/bjnano.12.70

• is unknown. In this study, extracted wax of E. gunnii leaves and pure ß-diketone were recrystallized on two different artificial materials and analyzed by scanning electron microscopy (SEM) and atomic force microscopy (AFM) to study their formation process. Both the wax mixture and pure ß-diketone

• formation of the tubules [26]. Atomic force microscopy (AFM) investigations further showed that the elongation of secondary alcohol tubules is based on a helical growth mechanism [27]. Recrystallization experiments with nonacosan-10-ol on non-biological substrates showed that the chemical and physical

• morphologically different type of wax tubules is unknown. On Eucalyptus gunnii leaves mainly the characteristic ß-diketone tubules are present (Figure 1), but helically wound ribbons and a transitional form between both shapes are also present. Atomic force microscopy investigations of tubule formation on living

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• , convolutional neural networks, and how it is transforming the acquisition and analysis of scanning probe data. Keywords: atomic force microscopy (AFM); deep learning; machine learning; neural networks; scanning probe microscopy (SPM); Review Introduction: traditional machine learning vs deep learning Machine

Reducing molecular simulation time for AFM images based on super-resolution methods

• Zhipeng Dou,
• Jianqiang Qian,
• Yingzi Li,
• Rui Lin,
• Jianhai Wang,
• Peng Cheng and
• Zeyu Xu

Beilstein J. Nanotechnol. 2021, 12, 775–785, doi:10.3762/bjnano.12.61

• Zhipeng Dou Jianqiang Qian Yingzi Li Rui Lin Jianhai Wang Peng Cheng Zeyu Xu School of Physics, Beihang University, Beijing 100083, China 10.3762/bjnano.12.61 Abstract Atomic force microscopy (AFM) has been an important tool for nanoscale imaging and characterization with atomic and subatomic

• can be used to speed up the generation of training data and vary simulation resolution for AFM machine learning. Keywords: atomic force microscopy; Bayesian compressed sensing; convolutional neural network; molecular dynamics simulation; super resolution; Introduction Atomic force microscopy methods

9.1% efficient zinc oxide/silicon solar cells on a 50 μm thick Si absorber

• Rafal Pietruszka,
• Bartlomiej S. Witkowski,
• Monika Ozga,
• Katarzyna Gwozdz,
• Ewa Placzek-Popko and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 766–774, doi:10.3762/bjnano.12.60

• the tested PV cells, as measured with atomic force microscopy (AFM). The results for the photovoltaic cell modified with zinc oxide nanorods are shown in Figure 4a and Figure 4c. The results for the planar cell are shown in Figure 4b and Figure 4d. There are significant differences in the roughness

Physical constraints lead to parallel evolution of micro- and nanostructures of animal adhesive pads: a review

• Thies H. Büscher and
• Stanislav N. Gorb

Beilstein J. Nanotechnol. 2021, 12, 725–743, doi:10.3762/bjnano.12.57

• CC BY 4.0). (D–G) Atomic force microscopy (AFM) height images of the footprint droplets of the beetle Coccinella septempunctata (D,F) and the fly Calliphora vicina (E,G). (D) and (E) share the same colour scale. Brighter pixels correspond to higher z values. (F,G) Three-dimensional impressions of the

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

Impact of GaAs(100) surface preparation on EQE of AZO/Al₂O₃/p-GaAs photovoltaic structures

• Piotr Caban,
• Rafał Pietruszka,
• Jarosław Kaszewski,
• Monika Ożga,
• Bartłomiej S. Witkowski,
• Krzysztof Kopalko,
• Piotr Kuźmiuk,
• Katarzyna Gwóźdź,
• Ewa Płaczek-Popko,
• Krystyna Lawniczak-Jablonska and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 578–592, doi:10.3762/bjnano.12.48

• /interface needs to be properly prepared. In the experiments described here we examined eight different paths of GaAs surface treatment (cleaning, etching, passivation) which resulted in different external quantum efficiency (EQE) values of the tested photovoltaic (PV) cells. Atomic force microscopy (AFM

Local stiffness and work function variations of hexagonal boron nitride on Cu(111)

• Abhishek Grewal,
• Yuqi Wang,
• Matthias Münks,
• Klaus Kern and
• Markus Ternes

Beilstein J. Nanotechnol. 2021, 12, 559–565, doi:10.3762/bjnano.12.46

• , CH-1015 Lausanne, Switzerland II. Institute of Physics, RWTH Aachen University, D-52074 Aachen, Germany 10.3762/bjnano.12.46 Abstract Combined scanning tunnelling and atomic force microscopy using a qPlus sensor enables the measurement of electronic and mechanic properties of two-dimensional

• non-contact atomic force microscopy (nc-AFM) to study h-BN on Cu(111). This template has interesting properties because the dielectric layer is only very weakly bound to the metal and shows an electronically induced Moiré superstructure [25][26]. First STM studies on this system pointed to only a

Determining amplitude and tilt of a lateral force microscopy sensor

• Oliver Gretz,
• Alfred J. Weymouth,
• Thomas Holzmann,
• Korbinian Pürckhauer and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42

• frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on

• for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation. Keywords: frequency-modulation atomic force microscopy; lateral force microscopy; amplitude calibration; tilt estimation; Introduction Frequency-modulation

• atomic force microscopy (AFM) is a non-contact atomic force microscopy technique where the frequency shift (Δf) of an oscillating tip is detected [1]. The frequency shift is a measure of the total force gradient acting on the tip, which includes both long-range and short-range contributions. A typical

Boosting of photocatalytic hydrogen evolution via chlorine doping of polymeric carbon nitride

• Malgorzata Aleksandrzak,
• Michalina Kijaczko,
• Wojciech Kukulka,
• Daria Baranowska,
• Martyna Baca,
• Beata Zielinska and
• Ewa Mijowska

Beilstein J. Nanotechnol. 2021, 12, 473–484, doi:10.3762/bjnano.12.38

• , carbon, oxygen, and chlorine in Cl-PCN was performed and showed homogeneous distribution of all elements in the sample. As analyzed via atomic force microscopy (AFM, Figure 2a and Figure 2b) the as-prepared PCN aggregated as large sheets with thickness ranging from 1 to 4 nm (corresponding to 3–11 atomic

Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene

• Zhao Liu,
• Antoine Hinaut,
• Stefan Peeters,
• Sebastian Scherb,
• Ernst Meyer,
• Maria Clelia Righi and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2021, 12, 432–439, doi:10.3762/bjnano.12.35

• reconstruction of a two-dimensional layer of KBr on an Ir(111) surface is observed by high-resolution noncontact atomic force microscopy and verified by density functional theory (DFT). The observed KBr structure is oriented along the main directions of the Ir(111) surface, but forms a characteristic double-line

• with unconventional stoichiometries have been observed indirectly on graphene surfaces [37]. Here, we report on the formation of irregularly shaped KBr islands with corrugated stripe structures, observed on the (111) surface of Ir and analyzed by non-contact atomic force microscopy (nc-AFM) at room

• K). Atomic force microscopy Experiments were performed by using a custom-built UHV AFM microscope operating at room temperature and a base pressure of 5 × 10−11 mbar. All images were scanned with silicon cantilevers equipped with sharp tips (PPP-NCL, Nanosensors) running in noncontact AFM mode with

The nanomorphology of cell surfaces of adhered osteoblasts

• Christian Voelkner,
• Mirco Wendt,
• Regina Lange,
• Max Ulbrich,
• Martina Gruening,
• Susanne Staehlke,
• Barbara Nebe,
• Ingo Barke and
• Sylvia Speller

Beilstein J. Nanotechnol. 2021, 12, 242–256, doi:10.3762/bjnano.12.20

• signal is a force, pressure is applied to the sample. This is the case when using atomic force microscopy (AFM), giving rise to substantially depressed apparent heights on living and fixed cells [17]. Typically, mammalian cells exhibit Young's moduli in the range of 1 to 10 kPa while AFM probe pressures

Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 137–138, doi:10.3762/bjnano.12.10

• Cameron H. Parvini M. A. S. R. Saadi Santiago D. Solares Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, 800 22nd St. NW, Suite 3000, Washington, DC 20052, United States 10.3762/bjnano.12.10 Keywords: atomic force

• microscopy (AFM); creep; force mapping; indentation; Kelvin–Voigt; static force spectroscopy (SFS); viscoelasticity; In the “Useful Viscoelastic Quantities” section of the original publication, it is stated that the storage modulus (E′) and storage compliance (J′) are inverses of one another (Equation 10

Fusion of purple membranes triggered by immobilization on carbon nanomembranes

• René Riedel,
• Natalie Frese,
• Fang Yang,
• Martin Wortmann,
• Raphael Dalpke,
• Daniel Rhinow,
• Norbert Hampp and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 93–101, doi:10.3762/bjnano.12.8

• histidine-tag at the extracellular side of a PM mutant (c-His PM). The functionalization and the resulting hybrid membrane were examined by atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), confocal laser scanning microscopy (CLSM), and infrared

Numerical analysis of vibration modes of a qPlus sensor with a long tip

• Kebei Chen,
• Zhenghui Liu,
• Yuchen Xie,
• Chunyu Zhang,
• Gengzhao Xu,
• Wentao Song and
• Ke Xu

Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7

• the optimal diameter was found to be 0.1 mm. Keywords: finite element method; long tilted tip; noncontact atomic force microscopy; qPlus sensor; quartz tuning fork; simulations; Introduction Quartz tuning forks are widely used in the watch industry because of their low frequency offset over a wide

• and fq in the in-phase mode (Figure 3 and Figure 6). We found a 0.05 mm tip has the best performance when the tip length is 0.65 mm in the anti-phase mode. However, Ax/Az in the anti-phase mode is 2.36, that is, φ is 23°. In frequency modulation-atomic force microscopy (FM-AFM), the frequency shift Δf

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• of atomic force microscopy (AFM) is the measurement of physical properties at sub-micrometer resolution. Methods such as force–distance curves (FDCs) or dynamic variants (such as intermodulation AFM (ImAFM)) are able to measure mechanical properties (such as the local stiffness, kr) of nanoscopic

• determined. Keywords: AFM force spectroscopy; composites; principle component analysis; structure–property correlation; van der Waals forces; Introduction The mechanical properties of small volumes of materials can be measured using various atomic force microscopy (AFM) methods. The well-established force