Structural, optical, and bioimaging characterization of carbon quantum dots solvothermally synthesized from o-phenylenediamine

• Zoran M. Marković,
• Milica D. Budimir,
• Martin Danko,
• Dušan D. Milivojević,
• Pavel Kubat,
• Danica Z. Zmejkoski,
• Vladimir B. Pavlović,
• Marija M. Mojsin,
• Milena J. Stevanović and
• Biljana M. Todorović Marković

Beilstein J. Nanotechnol. 2023, 14, 165–174, doi:10.3762/bjnano.14.17

• 2.2 mg/mL. These specimens were designated as CQDs/PU. For bioimaging studies, toluene was evaporated, and a thin film of CQDs was redissolved in water and filtered. The prepared QCD samples were characterized by transmission electron microscopy (TEM), atomic force microscopy (AFM), Fourier

Intermodal coupling spectroscopy of mechanical modes in microcantilevers

• Ioan Ignat,
• Bernhard Schuster,
• Jonas Hafner,
• MinHee Kwon,
• Daniel Platz and
• Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

• Ioan Ignat Bernhard Schuster Jonas Hafner MinHee Kwon Daniel Platz Ulrich Schmid Institute of Sensor and Actuator Systems, TU Wien, Gußhaustraße 27–29, 1040 Vienna, Austria 10.3762/bjnano.14.13 Abstract Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries

• . Through such findings we aim to expand the field of multifrequency AFM with innumerable possibilities leading to improved signal-to-noise ratios, all accessible with no additional hardware. Keywords: atomic force microscopy; intermodal coupling; nonlinear mechanics; optomechanics; sideband cooling

• ; Introduction Atomic force microscopy has established itself as one of the most powerful tools in nanotechnology. With meticulous setups amassing techniques such as ultra high vacuum, cryogenic temperatures, and CO-terminated tips, it is able to create a wonderful vista of surfaces, not missing the atoms for

Liquid phase exfoliation of talc: effect of the medium on flake size and shape

• Samuel M. Sousa,
• Helane L. O. Morais,
• Joyce C. C. Santos,
• Ana Paula M. Barboza,
• Bernardo R. A. Neves,
• Elisângela S. Pinto and
• Mariana C. Prado

Beilstein J. Nanotechnol. 2023, 14, 68–78, doi:10.3762/bjnano.14.8

• based on atomic force microscopy images of thousands of flakes, the shape and size distribution of nanotalc obtained using the four different media are compared. This comparison highlights the strengths and weaknesses of the media tested and hopefully will facilitate the choice of the medium for

• applications that have specific requirements. Keywords: 2D materials; atomic force microscopy; liquid phase exfoliation; nanomaterials; talc; Introduction Two-dimensional (2D) materials have attracted a lot of interest due to their outstanding properties [1]. However, large-scale production is still a

• solution, and butanone. The mechanical energy necessary to delaminate the mineral was provided by an ultrasonic bath. We report a statistical analysis of the dimensions (measured by atomic force microscopy) of the nanoflakes obtained employing the four routes, evidencing that the exfoliation medium has an

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

• Chang-Ming Wang,
• Hong-Sheng Chan,
• Chia-Li Liao,
• Che-Wei Chang and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

• force microscopy (Dimension Fastscan, Bruker Nano Surfaces, Hsinchu, Taiwan). Results and Discussion The results of selective SAM removal are visualized by backfilling biotinylated alkanethiol (BAT) molecules into the post lift-off regions followed by conjugating streptavidin and FITC-labeled anti

• to etch the exposed underlying Au film. After 30 min of etching, the substrate was rinsed with deionized water and blown dry with nitrogen gas. The transferred metal structures were then characterized by optical microscopy, scanning election microscopy (SEM, JEOL JSM-7600F, Tokyo, Japan) and atomic

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

• Alfred J. Weymouth,
• Emily Roche and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

• -precision STM and atomic force microscopy (AFM) scanning. Third, CuPc and PTCDA are known to form commensurate phases on flat metal surfaces. In particular, they have been well studied at different stoichiometries on Ag(111) [16]. Henneke and co-workers showed that more than 0.15 ML of PTCDA in addition to

Induced electric conductivity in organic polymers

• Konstantin Y. Arutyunov,
• Anatoli S. Gurski,
• Vladimir V. Artemov,
• Alexander L. Vasiliev,
• Azat R. Yusupov,
• Danfis D. Karamov and
• Alexei N. Lachinov

Beilstein J. Nanotechnol. 2022, 13, 1551–1557, doi:10.3762/bjnano.13.128

• atomic force microscopy. In some cases, it was possible to observe regions with surface macromolecular (quasicrystalline) ordering [7]. The remarkable property of PDP is that, depending on the length of certain atomic bonds, its molecule can exist in several spatial configurations. Under normal

• , associates of macromolecules are formed in the solution, and the influence of adhesion processes decreases, but the cohesive forces increase. In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force

• microscopy (AFM) using an earlier described methodology [5]. The study of the film morphology showed that they are homogeneous, and within the entire thickness range from 3 nm to 1 µm the films are solid, without significant defects and/or pin holes. The observation confirms the good film-forming properties

Frequency-dependent nanomechanical profiling for medical diagnosis

• Santiago D. Solares and
• Alexander X. Cartagena-Rivera

Beilstein J. Nanotechnol. 2022, 13, 1483–1489, doi:10.3762/bjnano.13.122

• Bioengineering, National Institutes of Health, Bethesda, Maryland, USA 10.3762/bjnano.13.122 Abstract Atomic force microscopy (AFM), developed in the early 1980s, has become a powerful characterization tool in micro- and nanoscale science. In the early 1990s, its relevance within biology and medicine research

• mechanical changes in the affected tissues. Keywords: atomic force microscopy; healthcare; mechanical properties; mechanobiology; medical diagnosis; Introduction Since its invention in the early 1980s, atomic force microscopy (AFM) has been extensively used for topographical, mechanical, electrical, and

Laser-processed antiadhesive bionic combs for handling nanofibers inspired by nanostructures on the legs of cribellate spiders

• Sebastian Lifka,
• Kristóf Harsányi,
• Erich Baumgartner,
• Lukas Pichler,
• Dariya Baiko,
• Karsten Wasmuth,
• Johannes Heitz,
• Marco Meyer,
• Anna-Christin Joel,
• Jörn Bonse and
• Werner Baumgartner

Beilstein J. Nanotechnol. 2022, 13, 1268–1283, doi:10.3762/bjnano.13.105

• Microsoft Excel. Details are presented in Table S2 in Supporting Information File 1. To investigate the effects of the surface texture on the measured peel-off force in more detail, the surfaces of the Al alloy and the Ti alloy samples were investigated by means of atomic force microscopy (AFM). The

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• a homemade cantilevered non-contact atomic force microscopy (NC-AFM) system. As the first step of tip sharpening, the focus is on the controlled extraction of individual clusters. The experimental results show that controlled extraction of individual clusters induces a change in tip sharpness, which

• future, such probes will enable previously unexplored conductivity measurements, such as measurements of semiconductor nanostructures or electrical conductivity on insulating substrates. Conductive atomic force microscopy (C-AFM) can be used to characterize the electrical properties of semi-conductive

Design of surface nanostructures for chirality sensing based on quartz crystal microbalance

• Yinglin Ma,
• Xiangyun Xiao and
• Qingmin Ji

Beilstein J. Nanotechnol. 2022, 13, 1201–1219, doi:10.3762/bjnano.13.100

• , Xu et al. studied real-time chiral recognition of CD films to isomers in the gas phase [69]. Based on atomic force microscopy (AFM) observations, functional β-CDs with a short sulfide group were inclined to form monolayers. In contrast, those with long sulfide groups produced a quasi-two-layer

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices. Current instruments permit robust scanning over large areas, atomic-scale lateral resolution, and the characterization of various sample

• , but also perform rapid overview scans with the tip kept at larger tip–sample distances for robust imaging. Keywords: atomic force microscopy; atomic resolution; instrumentation design; multimodal operation; ultrahigh vacuum; Introduction Atomic force microscopy (AFM) operated under vacuum or

Effects of focused electron beam irradiation parameters on direct nanostructure formation on Ag surfaces

• Jānis Sniķeris,
• Vjačeslavs Gerbreders,
• Andrejs Bulanovs and
• Ēriks Sļedevskis

Beilstein J. Nanotechnol. 2022, 13, 1004–1010, doi:10.3762/bjnano.13.87

• surfaces undergoing irradiation by a focused electron beam. Keywords: atomic force microscopy; electron beam; lithography; nanostructure; silver; sputtering; surface; Introduction Metallic nanostructures have various uses, including in nano-electro-mechanical systems [1], plasmonic biosensors [2], and

• -contact atomic force microscopy (AFM) using the model Park NX10 AFM. The first experiment was conducted with beam current I as the variable parameter ranging from 7 to 500 pA. However, changing the value of I also changed the beam diameter d, which is a function of I and the working distance (WD). The

• kV, I = 42 pA, d = 14 nm, and t = 60 s. Atomic force microscopy images of the nanostructures on an Ag surface as a function of the angle of incidence of the electron beam. Constant EB parameters are: U = 30 kV, I = 42 pA, d = 14 nm, and t = 60 s. The volume and height of the nanostructures on an Ag

Design of a biomimetic, small-scale artificial leaf surface for the study of environmental interactions

• Miriam Anna Huth,
• Axel Huth,
• Lukas Schreiber and
• Kerstin Koch

Beilstein J. Nanotechnol. 2022, 13, 944–957, doi:10.3762/bjnano.13.83

• secondary electron detector. The working distance was 4–7 mm. Atomic force microscopy analysis of recrystallized structures The thickness of the wax coating on glass (1400 µg) was examined with an atomic force microscope (AFM, NanoWizard II, JPK instruments, Berlin, Germany). For this purpose, the

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• liquid environments whilst needing the smallest AC bias for operation. Keywords: AFM; atomic force microscopy; closed loop; Kelvin probe force microscope; KPFM; open loop; performance; signal-to-noise ratio; Introduction Atomic force microscopy (AFM) is an enabling technique for the nanoscale mapping

Temperature and chemical effects on the interfacial energy between a Ga–In–Sn eutectic liquid alloy and nanoscopic asperities

• Yujin Han,
• Pierre-Marie Thebault,
• Corentin Audes,
• Xuelin Wang,
• Haiwoong Park,
• Jian-Zhong Jiang and
• Arnaud Caron

Beilstein J. Nanotechnol. 2022, 13, 817–827, doi:10.3762/bjnano.13.72

• increase of the interfacial energy as a function of the temperature, which can be explained by the reactivity between SiOx and Ga and the occurrence of chemical segregation at the liquid alloy surface. Keywords: atomic force microscopy (AFM); interfacial energy; liquid alloy; Introduction Recently, room

• atomic force microscopy (AFM) tips of different chemistries as a function of the temperature (T = 21–90 °C) by AFM force spectroscopy using an XE100 AFM equipped with a heating stage (manufactured by Park Instruments, Republic of Korea). We recorded force–distance curves with PtSi-coated Si cantilevers

Optimizing PMMA solutions to suppress contamination in the transfer of CVD graphene for batch production

• Chun-Da Liao,
• Andrea Capasso,
• Tiago Queirós,
• Telma Domingues,
• Fatima Cerqueira,
• Nicoleta Nicoara,
• Jérôme Borme,
• Paulo Freitas and
• Pedro Alpuim

Beilstein J. Nanotechnol. 2022, 13, 796–806, doi:10.3762/bjnano.13.70

• analyzer had a pass energy of 20 eV. Atomic force microscopy The surface topographies of graphene were investigated by a Bruker Dimension Icon atomic force microscope (AFM), using PPP-NCH (NanosensorsTM) cantilevers with a tip radius smaller than 20 nm, a force constant of 42 N/m, and 250 kHz resonance

Efficient liquid exfoliation of KP₁₅ nanowires aided by Hansen's empirical theory

• Zhaoxuan Huang,
• Zhikang Jiang,
• Nan Tian,
• Disheng Yao,
• Fei Long,
• Yanhan Yang and
• Danmin Liu

Beilstein J. Nanotechnol. 2022, 13, 788–795, doi:10.3762/bjnano.13.69

• concentration, centrifugation was not used. Measurement equipment UV−visible spectrophotometry was performed by using a Shimadzu UV-3101PC system. Atomic force microscopy (AFM) tests were performed in a Multimode 8 system. The Raman tests were performed on a WITec alpha300 RA confocal Raman microscopy system

Gelatin nanoparticles with tunable mechanical properties: effect of crosslinking time and loading

• Agnes-Valencia Weiss,
• Daniel Schorr,
• Julia K. Metz,
• Metin Yildirim,
• Saeed Ahmad Khan and
• Marc Schneider

Beilstein J. Nanotechnol. 2022, 13, 778–787, doi:10.3762/bjnano.13.68

• . Keywords: atomic force microscopy; drug delivery; elasticity; gelatin nanoparticles; Young’s modulus; Introduction Developing nanoparticulate drug carriers for various diseases and application routes requires establishing controllable systems, matching the needs of the respective application to achieve

• experimental triplicate. Atomic force microscopy For AFM measurements, GNPs were electrostatically fixed on positively coated silica specimens. Samples for AFM measurements were prepared according to the following protocol: Silica wafers were cleaned in an ultrasonic bath (Elmasonic B, Elma Schmidbauer GmbH

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

• Masato Miyazaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2022, 13, 712–720, doi:10.3762/bjnano.13.63

• modulated external disturbances. Keywords: atomic force microscopy; Kelvin probe force microscopy; photocatalyst; surface photovoltage; titanium dioxide; Introduction Surface photovoltage (SPV) is the change in surface potential caused by light illumination [1][2] and is measured to determine such

• time [31]. To reach sufficient sensitivity, the value should typically be larger than 1 V. Experimental The experiments were performed by customized ultrahigh-vacuum (UHV) noncontact atomic force microscopy (NC-AFM, UNISOKU) at a temperature T of 78 K with a base pressure below 5 × 10−11 Torr. The NC

• features as band bending [3][4], the lifetimes of excited carriers [5][6][7], the minority carrier diffusion length [8][9], and the plasmonic effect [10][11][12]. The local SPV is usually measured by Kelvin probe force microscopy (KPFM) [13][14][15][16][17][18][19][20][21], which is based on atomic force

Reliable fabrication of transparent conducting films by cascade centrifugation and Langmuir–Blodgett deposition of electrochemically exfoliated graphene

• Teodora Vićentić,
• Stevan Andrić,
• Vladimir Rajić and
• Marko Spasenović

Beilstein J. Nanotechnol. 2022, 13, 666–674, doi:10.3762/bjnano.13.58

• wavelength of 660 nm and the number of graphene layers was calculated for each sample, taking into account an absorption of 2.3% for each layer of graphene, as in the work by Bonaccorso and co-workers [43]. Although atomic force microscopy (AFM) is often employed to characterize graphene films [2][12][14][44

Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• Philipp Rahe Daniel Heile Reinhard Olbrich Michael Reichling Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, 49076 Osnabrück, Germany 10.3762/bjnano.13.53 Abstract In the mathematical description of dynamic atomic force microscopy (AFM), the relation between the tip–surface normal

• measuring a heterogeneous atomic surface. We propose to measure the AFM observables along a path parallel to the oscillation direction in order to reliably recover the force along this direction. Keywords: atomic force microscopy; cantilever; quantitative force measurement; sampling path; Introduction

• Atomic force microscopy (AFM) is a quantitative technique that allows for probing the force field above a surface in one, two, or three dimensions. While imaging in a plane parallel to the surface provides nanoscale and atomic structural information [1], force curves, usually acquired along a recording

Revealing local structural properties of an atomically thin MoSe₂ surface using optical microscopy

• Lin Pan,
• Peng Miao,
• Anke Horneber,
• Alfred J. Meixner,
• Pierre-Michel Adam and
• Dai Zhang

Beilstein J. Nanotechnol. 2022, 13, 572–581, doi:10.3762/bjnano.13.49

• the optical contrast, one can estimate that the thickness of the more transparent areas of the MoSe2 flake is smaller than that of other regions. To visualize the CuPc molecule distribution on the MoSe2 flake, atomic force microscopy (AFM) was used, and the results are shown in Figure 1b. The insets

Effects of substrate stiffness on the viscoelasticity and migration of prostate cancer cells examined by atomic force microscopy

• Xiaoqiong Tang,
• Yan Zhang,
• Jiangbing Mao,
• Yuhua Wang,
• Zhenghong Zhang,
• Zhengchao Wang and
• Hongqin Yang

Beilstein J. Nanotechnol. 2022, 13, 560–569, doi:10.3762/bjnano.13.47

• unclear how mechanical properties regulate the cellular response to the environmental matrix. In this study, atomic force microscopy (AFM) and laser confocal imaging were used to qualitatively evaluate the relationship between substrate stiffness and migration of prostate cancer (PCa) cells. Cells

• substrate stiffness and the mechanical properties of cells in prostate tumour metastasis, providing a basis for understanding the changes in the biomechanical properties at a single-cell level. Keywords: actin cytoskeleton; atomic force microscopy; migration; prostate cancer cells; substrate stiffness

• functions have not been well appreciated [16]. In recent years, alterations in the physical properties of cells have been considered as a marker of malignant transformation of cancer cells [17][18][19]. Based on atomic force microscopy (AFM) measurements, our group found that the progression of prostate

Electrostatic pull-in application in flexible devices: A review

• Teng Cai,
• Yuming Fang,
• Yingli Fang,
• Ruozhou Li,
• Ying Yu and
• Mingyang Huang

Beilstein J. Nanotechnol. 2022, 13, 390–403, doi:10.3762/bjnano.13.32

• or bottom-up processes and, subsequently, their parameters are tested. In the latter, the pull-in effect of NWs is directly studied through atomic force microscopy or transmission electron microscopy using nanomanipulators. This allows one to explore different working states without having to

Relationship between corrosion and nanoscale friction on a metallic glass

• Haoran Ma and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2022, 13, 236–244, doi:10.3762/bjnano.13.18

• are promising materials for microdevices, although corrosion and friction limit their effectiveness and durability. We investigated nanoscale friction on a metallic glass in corrosive solutions after different periods of immersion time using atomic force microscopy to elucidate the influence of

• surface dissolution at the interface of the two layers. The findings contribute to the understanding of mechanical contacts with metallic glasses under corrosive conditions by exploring the interrelation of microscopic corrosion mechanisms and nanoscale friction. Keywords: atomic force microscopy (AFM