Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function

• Perawat Boonpuek and
• Jonathan R. Felts

Beilstein J. Nanotechnol. 2023, 14, 1200–1207, doi:10.3762/bjnano.14.99

• angle yield the scanline profile of the tip with its slope angle for tip radius calculation. However, this geometry-based method relies on the tip slope angle, which varies for different types of tips [11]. In noncontact scanning mode, Maragliano et al. showed that a sharper tip (small tip radius

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

• three experiments. The FEBID structures were investigated by SEM and noncontact atomic force microscopy (AFM). Figure 3a shows the SEM images of the deposits along with the respective deposition parameters. Magnified sections from these SEM images are shown in Figure 3b. Auger electron spectroscopy was

• (SiO2 (500 nm)/Si(111)) at different beam currents In order to obtain complementary information on the structures deposited with different beam currents, noncontact AFM was used to investigate the height of the deposits and their particle size. Figure 4a and Figure 4b depict the 2D AFM images and

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

• Zeinab Eftekhari,
• Nasim Rezaei,
• Hidde Stokkel,
• Jian-Yao Zheng,
• Andrea Cerreta,
• Ilka Hermes,
• Minh Nguyen,
• Guus Rijnders and
• Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

• ] is a powerful and versatile technique to study fundamental and functional characteristics of materials and devices at the nanoscale, with application in physics, materials science, engineering, and biology. It can operate in either static (contact mode) or dynamic (tapping and noncontact mode) modes

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

• Masato Miyazaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2022, 13, 712–720, doi:10.3762/bjnano.13.63

• time [31]. To reach sufficient sensitivity, the value should typically be larger than 1 V. Experimental The experiments were performed by customized ultrahigh-vacuum (UHV) noncontact atomic force microscopy (NC-AFM, UNISOKU) at a temperature T of 78 K with a base pressure below 5 × 10−11 Torr. The NC

Comprehensive review on ultrasound-responsive theranostic nanomaterials: mechanisms, structures and medical applications

• Sepand Tehrani Fateh,
• Lida Moradi,
• Elmira Kohan,
• Michael R. Hamblin and
• Amin Shiralizadeh Dezfuli

Beilstein J. Nanotechnol. 2021, 12, 808–862, doi:10.3762/bjnano.12.64

• ]. Many studies have demonstrated further applications of ARF in biomedical fields [109][110]. It is possible to deliver force in a noncontact manner using ARF [90], and ARF has been considered as one possible mechanism in nanostructure-based theranostics [111]. The biomedical applications of ARF have

Reducing molecular simulation time for AFM images based on super-resolution methods

• Zhipeng Dou,
• Jianqiang Qian,
• Yingzi Li,
• Rui Lin,
• Jianhai Wang,
• Peng Cheng and
• Zeyu Xu

Beilstein J. Nanotechnol. 2021, 12, 775–785, doi:10.3762/bjnano.12.61

• are key tools for nanoscale imaging and characterization with unparalleled resolution [1]. The first atomic-resolution image by AFM of the (001) surface of NaCl was reported in ultrahigh vacuum [2]. Later, in noncontact mode, the reconstructed silicon (111)-(7×7) surface was imaged with 6 Å lateral

Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene

• Zhao Liu,
• Antoine Hinaut,
• Stefan Peeters,
• Sebastian Scherb,
• Ernst Meyer,
• Maria Clelia Righi and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2021, 12, 432–439, doi:10.3762/bjnano.12.35

• reconstruction of a two-dimensional layer of KBr on an Ir(111) surface is observed by high-resolution noncontact atomic force microscopy and verified by density functional theory (DFT). The observed KBr structure is oriented along the main directions of the Ir(111) surface, but forms a characteristic double-line

• K). Atomic force microscopy Experiments were performed by using a custom-built UHV AFM microscope operating at room temperature and a base pressure of 5 × 10−11 mbar. All images were scanned with silicon cantilevers equipped with sharp tips (PPP-NCL, Nanosensors) running in noncontact AFM mode with

Paper-based triboelectric nanogenerators and their applications: a review

• Jing Han,
• Nuo Xu,
• Yuchen Liang,
• Mei Ding,
• Junyi Zhai,
• Qijun Sun and
• Zhong Lin Wang

Beilstein J. Nanotechnol. 2021, 12, 151–171, doi:10.3762/bjnano.12.12

• induced potential variation. The application scenarios of TENGs with an SE mode are broad, including direct finger/hand/skin touch or body motions. The FT mode uses two unconnected symmetrical electrodes as the reference electrodes. When the top free-standing (i.e., noncontact) dielectric layer moves from

Numerical analysis of vibration modes of a qPlus sensor with a long tip

• Kebei Chen,
• Zhenghui Liu,
• Yuchen Xie,
• Chunyu Zhang,
• Gengzhao Xu,
• Wentao Song and
• Ke Xu

Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7

• the optimal diameter was found to be 0.1 mm. Keywords: finite element method; long tilted tip; noncontact atomic force microscopy; qPlus sensor; quartz tuning fork; simulations; Introduction Quartz tuning forks are widely used in the watch industry because of their low frequency offset over a wide

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• measurements are easier to implement, since no additional sample preparation is necessary [20]. There is a number of AFM-based methods, such as tip-enhanced Raman spectroscopy (TERS) [21], AFM-based infrared spectroscopy (AFM-IR) [16][22], noncontact AFM (ncAFM ) [23][24], chemical AFM (cAFM) [25][26], and

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

• Tatsuya Yamamoto,
• Ryo Izumi,
• Kazushi Miki,
• Takahiro Yamasaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157

• , Himeji, Hyogo 671-2280, Japan Institute for Nanoscience Design, Osaka University, 1-2 Machikaneyama, Toyonaka, Osaka 560-0043, Japan 10.3762/bjnano.11.157 Abstract The atomic arrangement of the Si(110)-(16×2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K

• between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure. Keywords: atomic force microscopy (AFM); noncontact atomic force microscopy (NC-AFM); Si

• were performed using noncontact atomic force microscopy (NC-AFM) under ultrahigh vacuum (UHV) conditions, where the frequency modulation AFM (FM-AFM) method was used. The pressure was maintained below 3 × 10−11 Torr and the temperature was held at 78 K. As a probe, a commercially available Si

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different

• contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although

• the surface, although in the noncontact regime. Specifically, STM measurements are modulated based on the observed tunnelling current, which has an exponential dependence on the tip–sample distance [21]. Therefore, any unexpected contact with the surface may lead to a current spike and severely

Implementation of data-cube pump–probe KPFM on organic solar cells

• Benjamin Grévin,
• Olivier Bardagot and
• Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

• the chosen approach for pp-KPFM are finally discussed. pp-KPFM Implementation The experiments were performed on the basis of noncontact AFM (nc-AFM) under ultrahigh vacuum (UHV) with a beam deflection setup operated in frequency-modulation (FM) mode at room temperature. In the following, we only

• -based devices, hybrid perovskite thin films and single crystals as well as type-II van der Waals heterojunctions based on transition metal dichalcogenides. Experimental Nc-AFM and pp-KPFM Noncontact-AFM (nc-AFM) experiments were performed with a ScientaOmicron VT-AFM setup in UHV at room temperature (RT

Nonclassical dynamic modeling of nano/microparticles during nanomanipulation processes

• Moharam Habibnejad Korayem,
• Ali Asghar Farid and
• Rouzbeh Nouhi Hefzabad

Beilstein J. Nanotechnol. 2020, 11, 147–166, doi:10.3762/bjnano.11.13

• network was able to model the behavior of a probe in the noncontact model [20]. Yuan et al. focused on the problem of tip location uncertainty caused by the nonlinearity of piezoelectric and temperature changes. They proposed a method in which local scanning was used for observing the distance. The

Recent progress in perovskite solar cells: the perovskite layer

• Xianfeng Dai,
• Ke Xu and
• Fanan Wei

Beilstein J. Nanotechnol. 2020, 11, 51–60, doi:10.3762/bjnano.11.5

• and spray coating PSC fabrication processes. Jiang et al. [34] solved this problem by successfully applying inkjet printing to deposit a flat and uniform CH3NH3PbI3 (MAPbI3) perovskite layer on a TiO2 film. Inkjet printing is a noncontact printing technique with direct control of material deposition

Nontoxic pyrite iron sulfide nanocrystals as second electron acceptor in PTB7:PC₇₁BM-based organic photovoltaic cells

• Olivia Amargós-Reyes,
• José-Luis Maldonado,
• Omar Martínez-Alvarez,
• María-Elena Nicho,
• José Santos-Cruz,
• Juan Nicasio-Collazo,
• Irving Caballero-Quintana and
• Concepción Arenas-Arrocena

Beilstein J. Nanotechnol. 2019, 10, 2238–2250, doi:10.3762/bjnano.10.216

• ) AFM images of the OPVs with different concentrations of FeS2 recorded in the noncontact mode. The roughness of the OPV surface is increased gradually as the FeS2 concentration increases (Table 1 and Figure 7), such that traps for the charge carriers could occur and the leakage current could increase

• noncontact mode. Impedance spectroscopy measurements (filled color squares) and simulations (black lines) of a) PTB7:PC71BM and b) PTB7:PC71BM:FeS2 with 0.5 wt % of FeS2; c) equivalent circuit used for the IS simulations; d) Rrec values vs bias voltage of PTB7:PC71BM (blue) and PTB7:PC71BM:FeS2 (with 0.5 wt

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• obtaining work function and conductivity maps on the same area by combining noncontact and contact modes of atomic force microscopy (AFM). As most of the real applications require ambient operating conditions, we have additionally checked the impact of air venting on the work function of the TiO/SrTiO3(100

• noncontact mode measurements (with a Kelvin loop) using the very same tip, maintaining oscillations at the higher harmonics of the fundamental frequency (≈75 kHz). Hence, in order to record current and CPD maps from the very same sample area, KPFM measurements were first performed with the soft cantilever

Imaging the surface potential at the steps on the rutile TiO₂(110) surface by Kelvin probe force microscopy

• Masato Miyazaki,
• Huan Fei Wen,
• Quanzhen Zhang,
• Yuuki Adachi,
• Jan Brndiar,
• Ivan Štich,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2019, 10, 1228–1236, doi:10.3762/bjnano.10.122

• out with a custom-built ultrahigh-vacuum noncontact atomic force microscopy (NC-AFM) system operated at a temperature of 78 K with a base pressure below 4 × 10−11 mbar. The NC-AFM system was operated in the frequency-modulation mode [44] with a constant cantilever oscillation amplitude (5 Å). The

Contactless photomagnetoelectric investigations of 2D semiconductors

• Marian Nowak,
• Marcin Jesionek,
• Barbara Solecka,
• Piotr Szperlich,
• Piotr Duka and
• Anna Starczewska

Beilstein J. Nanotechnol. 2018, 9, 2741–2749, doi:10.3762/bjnano.9.256

• effect is generally accepted for infrared photon detectors [18][19][20] which are based upon the proportionality of this effect on the intensity of radiation that enters the semiconductor. Mette [21] proposed a noncontact measurement involving the PME effect in Corbino configuration, i.e., in point

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

• Yann Almadori,
• David Moerman,
• Jaume Llacer Martinez,
• Philippe Leclère and
• Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

• du Parc 20, B7000 Mons, Belgium 10.3762/bjnano.9.161 Abstract In this work, methylammonium lead tribromide (MAPbBr3) single crystals are studied by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). We demonstrate that the surface photovoltage and crystal

• . Keywords: carrier lifetime; ion migration; Kelvin probe force microscopy (KPFM); noncontact atomic force microscopy (nc-AFM); organic–inorganic hybrid perovskites; photostriction; single crystals; surface photovoltage (SPV); time-resolved surface photovoltage; Introduction Organic–inorganic hybrid

• desirable to nullify (or a least minimize) the electrostatic forces by using an active KPFM compensation potential loop. In this work, the photovoltaic and optomechanical properties of a methylammonium lead tribromide (CH3NH3PbBr3, also referred to as MAPbBr3) single crystal are investigated by noncontact

Heterostuctures of 4-(chloromethyl)phenyltrichlorosilane and 5,10,15,20-tetra(4-pyridyl)-21H,23H-porphine prepared on Si(111) using particle lithography: Nanoscale characterization of the main steps of nanopatterning

• Phillip C. Chambers and
• Jayne C. Garno

Beilstein J. Nanotechnol. 2018, 9, 1211–1219, doi:10.3762/bjnano.9.112

• studied with scanning tunneling microscopy (STM) to evaluate the surface conformation and molecular geometry [14]. Individual molecules of nonplanar freebase and copper-metallated tetraphenyl porphyrins adsorbed on Cu(111) were investigated using frequency modulated noncontact AFM to resolve subtle

Dopant-stimulated growth of GaN nanotube-like nanostructures on Si(111) by molecular beam epitaxy

• Alexey D. Bolshakov,
• Alexey M. Mozharov,
• Georgiy A. Sapunov,
• Igor V. Shtrom,
• Nickolay V. Sibirev,
• Vladimir V. Fedorov,
• Evgeniy V. Ubyivovk,
• Maria Tchernycheva,
• George E. Cirlin and
• Ivan S. Mukhin

Beilstein J. Nanotechnol. 2018, 9, 146–154, doi:10.3762/bjnano.9.17

• approximate doping level for planar layers (see Table 1) is in close proximity with the doping level estimated via PL data analysis. So we conclude that the low-temperature PL is an effective noncontact method of assessing the doping level in GaN NWs. Theoretical model According to modern theoretical

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

• Weijie Zhang,
• Yuhang Chen,
• Xicheng Xia and
• Jiaru Chu

Beilstein J. Nanotechnol. 2017, 8, 2771–2780, doi:10.3762/bjnano.8.276

• thermal calibration method [39]. For amplitude calibration the inverse optical lever sensitivity in units of nm/V was determined via a noncontact method proposed by M. J. Higgins et al. [36]. The noise level of the AFM optical detector was less than 60 μV, which corresponds to an amplitude noise of

Patterning of supported gold monolayers via chemical lift-off lithography

• Liane S. Slaughter,
• Kevin M. Cheung,
• Sami Kaappa,
• Huan H. Cao,
• Qing Yang,
• Thomas D. Young,
• Andrew C. Serino,
• Sami Malola,
• Jana M. Olson,
• Stephan Link,
• Hannu Häkkinen,
• Anne M. Andrews and
• Paul S. Weiss

Beilstein J. Nanotechnol. 2017, 8, 2648–2661, doi:10.3762/bjnano.8.265

• noncontact regions. Next, hydroxyl-terminated alkanethiols were self-assembled on the patterned Au masters (Figure 1, left). Topographically flat, activated PDMS was brought into contact with the patterned Au masters to carry out a second round of CLL that resulted in otherwise featureless PDMS that was

• containing mercaptoundecanol (noncontact regions associated with the first CLL step), but also in the contact regions dominated by inserted octadecanethiol. Residual mercaptoundecanol in the contact regions is due to the incomplete removal of molecules during the first CLL step. This partial removal has been

• Au in the noncontact regions. We note that the contrast in the topographic AFM map of the Au–alkanethiolate monolayers produced via two-component SAMs (Figure 3B) appears lower than that of the monolayers produced via Au-on-Si masters (Figure 1E–H). We attribute the low topographic contrast in the

Nanoprofilometry study of focal conic domain structures in a liquid crystalline free surface

• Anna N. Bagdinova,
• Evgeny I. Demikhov,
• Nataliya G. Borisenko and
• Sergei M. Tolokonnikov

Beilstein J. Nanotechnol. 2017, 8, 2544–2551, doi:10.3762/bjnano.8.254

• substrate without electrodes. On the glass substrate the same surface structures were observed. It is important to note that the FCDs are not observed on the smectic-free surface. The conditions for FCD formation are given in [4]. The nanoprofilometer presented in this work is a noncontact method which can