Scanning probe microscopy for energy-related materials

• Rüdiger Berger,
• Benjamin Grévin,
• Philippe Leclère and
• Yi Zhang

Beilstein J. Nanotechnol. 2019, 10, 132–134, doi:10.3762/bjnano.10.12

• , Shanghai, PR of China 10.3762/bjnano.10.12 Keywords: energy conversion and storage, in-operando, Scanning Probe Microscopy, Scanning Force Microscopy; In order to stimulate, bundle and strengthen the activities in the field of scanning probe microscopy for energy applications, we have organized a

• perfectly reflect the current activities and advances in the field of scanning probe microscopy for energy applications. The term “energy applications” refers to materials that are used for energy conversion, energy transport and energy storage. In these fields, intensive basic and applied research is

• interfaces is therefore essential. Furthermore, these interface phenomena are strongly linked to material properties such as grain size, roughness, mechanical properties and work function. In an attempt to address the diversity of phenomena on the nanoscale, scanning probe microscopy (SPM) methods play an

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• . Indeed, the interphase is likely to be confined between the particles and the matrix below the probed region. Therefore, as the probing field is electrical in EFM, and this technology is expected to offer higher subsurface sensitivity compared with other scanning probe microscopy methods [22][23][24][25

• “real” nanocomposite systems, using mechanical scanning probe microscopy techniques [29][30][31], and EFM [26][27][32][33]. Moreover, discriminating the particles from the topography is important in the case of nanocomposites that include particles and matrix with low dielectric permittivity difference

• , comparing signals between various materials can provide information on the interphase. A correlation with other scanning probe microscopy methods would be also beneficial, such as the nanomechanical techniques that are adapted to similar types of materials with complex geometry and constituents. Conclusion

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

• Majid Fazeli Jadidi,
• Umut Kamber,
• Oğuzhan Gürlü and
• H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

• both STM and force. However, the line profiles show a different quantitative behavior in force scan. Now the two C atoms reveal the same force value as can be clearly seen in the line profile. It is well known in scanning probe microscopy that such contrast changes may occur due to a change in the

Charged particle single nanometre manufacturing

• Philip D. Prewett,
• Cornelis W. Hagen,
• Claudia Lenk,
• Steve Lenk,
• Marcus Kaestner,
• Tzvetan Ivanov,
• Ahmad Ahmad,
• Ivo W. Rangelow,
• Xiaoqing Shi,
• Stuart A. Boden,
• Alex P. G. Robinson,
• Dongxu Yang,
• Sangeetha Hari,
• Marijke Scotuzzi and
• Ejaz Huq

Beilstein J. Nanotechnol. 2018, 9, 2855–2882, doi:10.3762/bjnano.9.266

Low cost tips for tip-enhanced Raman spectroscopy fabricated by two-step electrochemical etching of 125 µm diameter gold wires

• Antonino Foti,
• Francesco Barreca,
• Enza Fazio,
• Cristiano D’Andrea,
• Paolo Matteini,
• Onofrio Maria Maragò and
• Pietro Giuseppe Gucciardi

Beilstein J. Nanotechnol. 2018, 9, 2718–2729, doi:10.3762/bjnano.9.254

• chemical and structural information of Raman spectroscopy with the large signal gain provided by plasmonic resonances in metal tips and the high spatial resolution mapping offered by scanning probe microscopy [1][2][3][4][5]. In TERS, sharp metallic (or metallized) tips act as optical nanoantennas [6][7

A scanning probe microscopy study of nanostructured TiO₂/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

• Laurie Letertre,
• Roland Roche,
• Olivier Douhéret,
• Hailu G. Kassa,
• Denis Mariolle,
• Nicolas Chevalier,
• Łukasz Borowik,
• Philippe Dumas,
• Benjamin Grévin,
• Roberto Lazzaroni and
• Philippe Leclère

Beilstein J. Nanotechnol. 2018, 9, 2087–2096, doi:10.3762/bjnano.9.197

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

• Amelie Axt,
• Ilka M. Hermes,
• Victor W. Bergmann,
• Niklas Tausendpfund and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172

• commercial scanning probe microscopy systems, mainly due to its easy implementation. Nevertheless, there are different ways to operate AM-KPFM. In the simplest form, an AC voltage is applied during normal tapping mode imaging (single scan) at a frequency far below the first resonance ωE << ω0. We refer to

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

• Yann Almadori,
• David Moerman,
• Jaume Llacer Martinez,
• Philippe Leclère and
• Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

• intrinsic material optoelectronic properties. Performing KPFM measurements on single crystals may therefore facilitate the interpretation of the SP and SPV data. Moreover, scanning probe microscopy measurements may help in distinguishing the properties of the bulk from the surface [13]. However, so far

Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS

• Jonathan Op de Beeck,
• Nouha Labyedh,
• Alfonso Sepúlveda,
• Valentina Spampinato,
• Alexis Franquet,
• Thierry Conard,
• Philippe M. Vereecken,
• Wilfried Vandervorst and
• Umberto Celano

Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154

• formed. For instance, Figure 1b shows the topography and current distribution map when performing such measurements in the case of the electrodeposited LMO. This basic concept was extended with the development of various scanning probe microscopy (SPM) techniques [8][9][10][11][12] dedicated to probe

Evaluation of replicas manufactured in a 3D-printed nanoimprint unit

• Manuel Caño-García,
• Morten A. Geday,
• Manuel Gil-Valverde,
• Xabier Quintana and
• José M. Otón

Beilstein J. Nanotechnol. 2018, 9, 1573–1581, doi:10.3762/bjnano.9.149

• or a transformation of the same that will be eventually processed by the second script. The first script was written in Python language, through a virtual Pygwy console of a Gwyddion package [10]. Gwyddion is a software environment specifically designed for data analysis of scanning probe microscopy

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• analysis with the high spatial resolution of scanning probe microscopy [3][4][5]. This method has been applied to various fields of research such as plasmonic analysis [6][7], Raman spectroscopy (tip-enhanced Raman spectroscopy, TERS) [8][9], or infrared analysis [10]. In this microscopy technique, a laser

Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• Background: Encased cantilevers are novel force sensors that overcome major limitations of liquid scanning probe microscopy. By trapping air inside an encasement around the cantilever, they provide low damping and maintain high resonance frequencies for exquisitely low tip–sample interaction forces even when

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• of rGO, scanning probe microscopy (SPM) has also been employed recently to study the reduction of GO sheets at the nanoscale. Conductive atomic force microscopy (CAFM) [15][16] can be used to verify the reduced nanostructures on GO sheets. However, because CAFM relies on contact with the sample, the

Electro-optical interfacial effects on a graphene/π-conjugated organic semiconductor hybrid system

• Karolline A. S. Araujo,
• Luiz A. Cury,
• Matheus J. S. Matos,
• Thales F. D. Fernandes,
• Luiz G. Cançado and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2018, 9, 963–974, doi:10.3762/bjnano.9.90

• interfacial effects. Scanning probe microscopy (SPM) and Raman scattering experiments, along with first-principles calculations, reveal the presence of a highly ordered RA self-assembled monolayer atop graphene and graphite. The electro-optical characterization of the hybrid system discloses interfacial

• probe microscopy, optical spectroscopy (photoluminescence and Raman) and ab initio calculations. The graphene/RA interaction induces the formation of a well-organized π-conjugated self-assembled monolayer (SAM) at the interface. Such structural organization leads to the high optical emission efficiency

• surface potential changes on the hybrid system. In summary, interface-induced organized structures atop 2D materials may have an important impact on both design and operation of π-conjugated nanomaterial-based hybrid systems. Keywords: DFT calculations; graphene; organic semiconductors; scanning probe

Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

• Daiki Katsube,
• Hayato Yamashita,
• Satoshi Abo and
• Masayuki Abe

Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63

• transmission electron microscopy [5][8][9][10][11][12][13]. As atomic resolution methods, scanning probe microscopy including scanning tunneling microscopy (STM) [13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28][29][30] and non-contact atomic force microscopy (NC-AFM) [19][23][29][31][32][33][34

Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy

• Sara Freund,
• Antoine Hinaut,
• Nathalie Marinakis,
• Edwin C. Constable,
• Ernst Meyer,
• Catherine E. Housecroft and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2018, 9, 242–249, doi:10.3762/bjnano.9.26

• were then annealed 1 h at 150 °C to facilitate the diffusion of the molecules on the substrate. Scanning probe microscopy The measurements were carried out with a custom-built atomic force microscope (AFM) in UHV and at room temperature. All AFM images were recorded in the non-contact mode (nc-AFM

• probe microscopy (SPM) [5]. Through the adsorption of a large variety of dye molecules, the ability of sensitized TiO2 to absorb light can be triggered and tuned. Thus, the possibility of designing photoactive devices with anodes consisting of nanostructured and functionalized TiO2 leads to numerous

• photovoltaics such as dye-sensitized solar cells (DSSCs) [1][2][3][4]. In the latter field, the wide band gap n-type semiconductor TiO2 has become one of the most common metal oxides for the design of classical n-type DSSCs, and is therefore a widely studied material, in particular in the field of scanning

Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire

• Tino Wagner,
• Fabian Menges,
• Heike Riel,
• Bernd Gotsmann and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2018, 9, 129–136, doi:10.3762/bjnano.9.15

• nanoscale tip with the surface. So far, electrical and thermal device characterization by scanning probe microscopy has often suffered from low lateral resolution [3][4][5][6], long-distance averaging effects [7][8][9], and topography-induced crosstalk [10][11][12], allowing for a mainly qualitative data

• the temperature to be detected with high sensitivity [12]. KFM is a non-contact scanning probe microscopy technique to measure local electrostatic potentials with high lateral resolution. The electrostatic force induced by an ac voltage bias between tip and surface is minimized by adjusting a dc

Patterning of supported gold monolayers via chemical lift-off lithography

• Liane S. Slaughter,
• Kevin M. Cheung,
• Sami Kaappa,
• Huan H. Cao,
• Qing Yang,
• Thomas D. Young,
• Andrew C. Serino,
• Sami Malola,
• Jana M. Olson,
• Stephan Link,
• Hannu Häkkinen,
• Anne M. Andrews and
• Paul S. Weiss

Beilstein J. Nanotechnol. 2017, 8, 2648–2661, doi:10.3762/bjnano.8.265

• the nanometer-scale heights of the supported Au monolayers through scanning probe microscopy, as well as the exploration of spatially encoded functionality using fluorescence microscopy. Otherwise, when topographically patterned PDMS stamps are used to pattern Au monolayers, the traits of the latter

Nanoprofilometry study of focal conic domain structures in a liquid crystalline free surface

• Anna N. Bagdinova,
• Evgeny I. Demikhov,
• Nataliya G. Borisenko and
• Sergei M. Tolokonnikov

Beilstein J. Nanotechnol. 2017, 8, 2544–2551, doi:10.3762/bjnano.8.254

• consistent with focal conic microscopy images, which will be explored in our publications to follow. It is interesting to compare ISSA images with scanning probe microscopy images (e.g. AFM and SNOM). We expect that the difference between these images will be significant because of the interaction of the tip

Nanotribological behavior of deep cryogenically treated martensitic stainless steel

• Germán Prieto,
• Konstantinos D. Bakoglidis,
• Walter R. Tuckart and
• Esteban Broitman

Beilstein J. Nanotechnol. 2017, 8, 1760–1768, doi:10.3762/bjnano.8.177

• implies a higher elastic shakedown limit of the material and a reduction of the friction coefficient. Figure 8 shows a scanning probe microscopy (SPM) image of a DCT specimen after a nanoscratch test, where the formation of the wear track can be clearly seen. Material pile-up is visible at both sides of

• load and b) cumulative wear coefficient. Evolution of the relative average roughness after each test cycle. Evolution of the friction coefficient during the nanowear test. Scanning probe microscopy (SPM) image after 30 cycles of nanoscratch testing in a DCT specimen. The depth profiles below in Figure

Micro- and nano-surface structures based on vapor-deposited polymers

• Hsien-Yeh Chen

Beilstein J. Nanotechnol. 2017, 8, 1366–1374, doi:10.3762/bjnano.8.138

• -/microstructures [35]. Similarly, direct writing using a scanning probe microscopy-based nanolithographic technique (dip-pen nanolithography, DPN) was used to deliver chemical substances with submicrometer features on a wide range of poly(p-xylylene) deposited substrates [36]. An array of micro-sized plasma was

Triptycene-terminated thiolate and selenolate monolayers on Au(111)

• Jinxuan Liu,
• Martin Kind,
• Björn Schüpbach,
• Daniel Käfer,
• Stefanie Winkler,
• Wenhua Zhang,
• Andreas Terfort and
• Christof Wöll

Beilstein J. Nanotechnol. 2017, 8, 892–905, doi:10.3762/bjnano.8.91

• ]. Other methods with sufficient height resolutions (0.1 nm) are ellipsometry and scanning probe microscopy (SPM). To our knowledge, SPM methods have so far not been successfully used to determine the absolute thickness of organic self-assmbled monolayers, most likely due to difficulties with preparing a

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

• Gheorghe Stan,
• Richard S. Gates,
• Qichi Hu,
• Kevin Kjoller,
• Craig Prater,
• Kanwal Jit Singh,
• Ebony Mays and
• Sean W. King

Beilstein J. Nanotechnol. 2017, 8, 863–871, doi:10.3762/bjnano.8.88

• scanning probe microscopy (SPM) [15][16][17][18][19][20][21]). It is due to the non-existence of techniques to identify chemical structures with nanometer lateral (in-plane) resolution. Scatterometry and near-field optical microscopy (NSOM) techniques have allowed sub-wavelength features to be resolved [22

Copper atomic-scale transistors

• Fangqing Xie,
• Maryna N. Kavalenka,
• Moritz Röger,
• Daniel Albrecht,
• Hendrik Hölscher,
• Jürgen Leuthold and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2017, 8, 530–538, doi:10.3762/bjnano.8.57

• copper atomic-scale point contacts have been fabricated as mechanically controllable break junctions (MCBJ) [42][43][44][45], by using scanning probe microscopy (SPM) with a conductive tip [46][47], or electrochemical techniques [24][25][26][48][49]. Copper is an interconnection material in ultra-large

Zigzag phosphorene nanoribbons: one-dimensional resonant channels in two-dimensional atomic crystals

• Carlos. J. Páez,
• Dario. A. Bahamon,
• Ana L. C. Pereira and
• Peter. A. Schulz

Beilstein J. Nanotechnol. 2016, 7, 1983–1990, doi:10.3762/bjnano.7.189

• would become rather involved with the presence of defect-induced barriers. However, scanning probe microscopy remains a way to reveal the edge quantum confinement. Conclusion So far, we have ignored the effect of Coulomb interactions. It is well known that the interplay of Coulomb blockade and quantum

• transport measurements as well as scanning probe microscopy [41]. The energy scale given by the resonance spacing is of the order of 10 meV for constriction lengths of L = 30 (not shown here), corresponding to about 5.05 nm and contacts about 13.3 nm wide. This figures can count as a benchmark for