Self-assembly of amino acids toward functional biomaterials

• Huan Ren,
• Lifang Wu,
• Lina Tan,
• Yanni Bao,
• Yuchen Ma,
• Yong Jin and
• Qianli Zou

Beilstein J. Nanotechnol. 2021, 12, 1140–1150, doi:10.3762/bjnano.12.85

• that the nanofibers were assembled into sea-urchin-like microspheres. Fmoc-ʟ-Lys nanofibers act as templates to regulate the self-assembly of pigments. Sea-urchin-like structures facilitate light collection due to enhanced absorption cross sections and exciton energy transfer. In addition, Liu et al

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

Self-assembly of Eucalyptus gunnii wax tubules and pure ß-diketone on HOPG and glass

• Miriam Anna Huth,
• Axel Huth and
• Kerstin Koch

Beilstein J. Nanotechnol. 2021, 12, 939–949, doi:10.3762/bjnano.12.70

• substrate. AFM image of recrystallized wax tubules from a wax solution on glass. (a) Top view of vertically growing tubules 22 h and 39 min after application. (b) Cross section of tubule 1 and 2 and (c) cross sections of tubule 3 and 4 seen in (a). Scale bar: 500 nm. Diagram of height increase of vertically

9.1% efficient zinc oxide/silicon solar cells on a 50 μm thick Si absorber

• Rafal Pietruszka,
• Bartlomiej S. Witkowski,
• Monika Ozga,
• Katarzyna Gwozdz,
• Ewa Placzek-Popko and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 766–774, doi:10.3762/bjnano.12.60

• , allowing us to construct a 3D top electrode and to improve light collection/harvesting in cells with such electrodes. Figure 3 shows cross sections of the studied photovoltaic structures. The cell labeled as sample A contains ZnONR grown via the hydrothermal method. On the nanorods, an MZO film was

• of Zn, Mg, and O in the ZnMgO films. These concentrations were (52.0 ± 0.5)%, (46.6 ± 0.5)%, and (1.4 ± 0.5)% for zinc, oxygen, and magnesium, respectively. Aluminium-doped zinc oxide films were grown on top of the samples A and B as a transparent top electrode. Comparison of the cross sections

• ZnO films via ALD at higher growth temperatures or with a lattice-matched substrate [19]. The average thickness of the deposited films was calculated from the cross sections shown in Figure 3. It was hard to see the difference between MZO and ZnONR for sample A. Therefore, the average height was

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• interaction volume and resulting modification of the sample for helium ions impinging on bulk silicon and copper targets providing key insights into the beam–sample interaction [16]. Dose series were conducted and the interaction volumes directly visualized by preparing cross sections by gallium focused ion

Impact of GaAs(100) surface preparation on EQE of AZO/Al₂O₃/p-GaAs photovoltaic structures

• Piotr Caban,
• Rafał Pietruszka,
• Jarosław Kaszewski,
• Monika Ożga,
• Bartłomiej S. Witkowski,
• Krzysztof Kopalko,
• Piotr Kuźmiuk,
• Katarzyna Gwóźdź,
• Ewa Płaczek-Popko,
• Krystyna Lawniczak-Jablonska and
• Marek Godlewski

Beilstein J. Nanotechnol. 2021, 12, 578–592, doi:10.3762/bjnano.12.48

• of GaAs, which is seen on the SEM images of cross-sections and in the RMS values. Conversely, the samples treated with the ammonium hydroxide solution exhibit a high smoothness (i.e., low RMS values). This effect was observed before and is related to the presence of surface hydroxyls promoting a

• covered with a pattern of AZO crystallites. Worth mentioning are the samples bathed in NH4OH solution (A4, B4), as they exhibit a fine-grained uniform surface. In the cross-sections obtained by SEM (insets in Figure 3 and Figure 4), one can see the approx. 50 nm thick AZO layers for all the samples. The

• and SEM and the value obtained for the AZO layer thickness was approx. 50 nm in the cross-sections. The topography of the surface depends on the substrate preparation method. The lowest roughness (by means of RMS) was found in the samples etched with ammonium hydroxide solution. Also, these samples

Simulation of gas sensing with a triboelectric nanogenerator

• Kaiqin Zhao,
• Hua Gan,
• Huan Li,
• Ziyu Liu and
• Zhiyuan Zhu

Beilstein J. Nanotechnol. 2021, 12, 507–516, doi:10.3762/bjnano.12.41

• as a function of ds. (f) TENG potential difference of rectangular cross sections with different side lengths. (a) The potential of TENG with different injected gases at (a) ds = 0.1 mm, (b) ds = 0.5 mm, and (c) ds = 1 mm. (a) Schematic diagram of an isosceles triangle TENG with injected gases. (b

Interface interaction of transition metal phthalocyanines with strontium titanate (100)

• Reimer Karstens,
• Thomas Chassé and
• Heiko Peisert

Beilstein J. Nanotechnol. 2021, 12, 485–496, doi:10.3762/bjnano.12.39

• resublimed before usage. The materials were evaporated from temperature-controlled crucibles. The nominal layer thickness was estimated from substrate- and adsorbate-related XPS intensity ratios using photoemission cross sections from Yeh and Lindau [41]. A nominal monolayer of lying molecules corresponds to

The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication

• Victor Deinhart,
• Lisa-Marie Kern,
• Jan N. Kirchhof,
• Sabrina Juergensen,
• Joris Sturm,
• Enno Krauss,
• Thorsten Feichtner,
• Sviatoslav Kovalchuk,
• Michael Schneider,
• Dieter Engel,
• Bastian Pfau,
• Bert Hecht,
• Kirill I. Bolotin,
• Stephanie Reich and
• Katja Höflich

Beilstein J. Nanotechnol. 2021, 12, 304–318, doi:10.3762/bjnano.12.25

• ubiquitous in ion beam machining with well-established applications in material characterization, for example, TEM lamella fabrication, cross sections or tomographies [19][20], or in the fabrication of prototype nanostructures, such as plasmonic antennas [2]. In contrast, appropriate fields of application

• results in analytic shape geometries. For rasterization of the obtained geometries, different line-by-line raster styles are available, such as serpentines or cross sections. Further, shapes can be off-set along their normal direction. If provided by the manufacturer, such curves may be loaded into the

Mapping the local dielectric constant of a biological nanostructured system

• Wescley Walison Valeriano,
• Rodrigo Ribeiro Andrade,
• Juan Pablo Vasco,
• Angelo Malachias,
• Bernardo Ruegger Almeida Neves,
• Paulo Sergio Soares Guimarães and
• Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

• the cross sections of the wing between the dashed lines in Figure 6. These average profiles were obtained by averaging all the 128 profiles that constitute each map shown in Figure 6, that is, in (a) the red region, in (b) the blue region, and in (c) the yellow/green region. The peaks and valleys

Bio-imaging with the helium-ion microscope: A review

• Matthias Schmidt,
• James M. Byrne and
• Ilari J. Maasilta

Beilstein J. Nanotechnol. 2021, 12, 1–23, doi:10.3762/bjnano.12.1

Kondo effects in small-bandgap carbon nanotube quantum dots

• Patryk Florków,
• Damian Krychowski and
• Stanisław Lipiński

Beilstein J. Nanotechnol. 2020, 11, 1873–1890, doi:10.3762/bjnano.11.169

• diagram presented earlier (Figure 9a) with double-degeneracy lines and two threefold-degeneracy points, one can expect Kondo SU(2) lines and two different Kondo SU(3) resonances. The vertical dashed lines in Figure 9a indicate the cross sections for which we present the conduction curves. Figure 11a

• +⟩, and |e−1−⟩. Figure 11c, in turn, presents the conductance for cross sections through two SU(2) points, namely the hole Kondo state SU1(2) (|h−1+⟩, |h1+⟩) and the electron–hole Kondo state SU2(2) (|h1+⟩, |e−1−⟩). At the SU(3) Kondo points, partial conductances corresponding to the states taking part in

• ground states for B > 0 and brackets in red are the ground states for B < 0. Insets show the dependencies on the magnetic field of energies of the single-particle states |↑0⟩, |↓0⟩, |0↑⟩ and |0↓⟩ (red, blue, gray and black lines, respectively) plotted for the cross sections denoted by the dotted black

Nanomechanics of few-layer materials: do individual layers slide upon folding?

• Ronaldo J. C. Batista,
• Rafael F. Dias,
• Ana P. M. Barboza,
• Alan B. de Oliveira,
• Taise M. Manhabosco,
• Thiago R. Gomes-Silva,
• Matheus J. S. Matos,
• Andreij C. Gadelha,
• Cassiano Rabelo,
• Luiz G. L. Cançado,
• Ado Jorio,
• Hélio Chacham and
• Bernardo R. A. Neves

Beilstein J. Nanotechnol. 2020, 11, 1801–1808, doi:10.3762/bjnano.11.162

• )/2 and d0 = d − h, are parameters for the proposed continuum model. Carbon atom positions (gray circles) in cross sections of folded edges in (a) monolayer graphene and (b) three-layered graphene, as obtained through MD simulations. In both panels the red and black lines that superimpose the atomic

Detecting stable adsorbates of (1S)-camphor on Cu(111) with Bayesian optimization

• Jari Järvi,
• Patrick Rinke and
• Milica Todorović

Beilstein J. Nanotechnol. 2020, 11, 1577–1589, doi:10.3762/bjnano.11.140

• translational and rotational barriers. The translational energy barriers were computed using 2D x–y cross sections (grid of 100 × 100 points) of the predicted 6D PES, as described in the Computational Methods section. For the γ rotation barriers, we extracted 1D γ energy profiles from the 6D PES but found them

Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• mass distribution this ratio can be brought closer to an integer value causing self-excitation [34][35][36]. Additionally, there are studies in which cross sections of the cantilever were altered [36][37] or hole structures were cut into the cantilevers [38][39][40][41] to achieve the same goal. Some

Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir

• Mathias Franz,
• Romy Junghans,
• Paul Schmitt,
• Adriana Szeghalmi and
• Stefan E. Schulz

Beilstein J. Nanotechnol. 2020, 11, 1439–1449, doi:10.3762/bjnano.11.128

• analysed by Fazio et al. [1]. It is mainly based on multiple light scattering at the silicon nanowires. Figure 4 shows SEM images of an etched wafer using Au nanoparticles as etching catalyst. This wafer has been etched with 50 mmol/L H2O2 for 10 min. The SEM images show cross sections of the wafer centre

• (Figure 4a), of the wafer edge (Figure 4b), and top-view images of centre (Figure 4c) and edge (Figure 4d). The cross sections of the wafer centre and the wafer edge show straight vertical structures. The average etching depth is 1.2 μm. The top-view images show that the structure consists of randomly

Superconductor–insulator transition in capacitively coupled superconducting nanowires

• Alex Latyshev,
• Andrew G. Semenov and
• Andrei D. Zaikin

Beilstein J. Nanotechnol. 2020, 11, 1402–1408, doi:10.3762/bjnano.11.124

• . Provided the wire cross sections s1 and s2 differ strongly the plasmon velocities also differ considerably. Assume, for instance, that the first wire is much thinner than the second one. In this limit we have v1 ≪ v2 and, hence, the QPT condition (Equation 17) in the first wire remains almost unaffected

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

• Jeremiah Croshaw,
• Thomas Dienel,
• Taleana Huff and
• Robert Wolkow

Beilstein J. Nanotechnol. 2020, 11, 1346–1360, doi:10.3762/bjnano.11.119

• simulated line profiles is shown in Supporting Information File 1, Figure S11. We start by comparing dihydride-based defects. Figure 3a shows a Si tip AFM image of a 3 × 1 reconstructed region, with the locations of the two comparative line profiles marked. Figure 3b plots the extracted cross-sections

• damaging tip contact. As a result, the magnitude of the frequency shift of the unperturbed surface is small compared to the strong defect signal. Despite this, examination of the cross-sections for the SiH3 and SiH2 respectively, resolves the position of the defect with respect to the lattice; the SiH3

Hybridization vs decoupling: influence of an h-BN interlayer on the physical properties of a lander-type molecule on Ni(111)

• Maximilian Schaal,
• Takumi Aihara,
• Marco Gruenewald,
• Felix Otto,
• Jari Domke,
• Roman Forker,
• Hiroyuki Yoshida and
• Torsten Fritz

Beilstein J. Nanotechnol. 2020, 11, 1168–1177, doi:10.3762/bjnano.11.101

• corrected according to the photoionization cross sections of Yeh and Lindau [44]. For each spectrum the binding energy of the core level is marked by vertical black lines. The black arrow points to an unassigned second component of the N 1s level of the less ordered DBP layer on h-BN/Ni(111). Comparison of

Thermophoretic tweezers for single nanoparticle manipulation

• Jošt Stergar and
• Natan Osterman

Beilstein J. Nanotechnol. 2020, 11, 1126–1133, doi:10.3762/bjnano.11.97

• on the nanoparticle was always pointing towards the closest side of the rectangular region if the particle was outside the rectangle and that there was no force if the particle was inside the desired rectangle. The resulting 2D probability distribution and the potential cross sections are displayed

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

• Christian Ritz,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2020, 11, 911–921, doi:10.3762/bjnano.11.76

• difference between the TD-KFM and standard FM-KFM scan. The cross sections indicated by the white lines are shown below in Figure 5. Parameters FM-KFM: Δfset = −65 Hz, Uac = 2 V, fm = 1.5 kHz, PLL bandwidth: 500 Hz; TD-KFM: = −22 Hz, Uac = 2 V, fm = 253 Hz, fs = 3.6 kHz, PLL bandwidth: 1 kHz, Rth = 1.66

• × 10−3 Hz2 Hz−1, Qtopo = 5 Hz2 Hz, Qlcpd = 0.004 V2 Hz, Qa = 5 Hz2 V−4 Hz; Detection noise RD ≪ Rth is neglected here. Tip: Olympus AC240TM-R3, f0 = 52.0 kHz, k = 1.0 N m−1, Q = 77.2, A = 12 nm (active ACL), vscan = 1 μm s−1. (a) Cross sections of the topography along the sections indicated in Figure 4

Integrated photonics multi-waveguide devices for optical trapping and Raman spectroscopy: design, fabrication and performance demonstration

• Gyllion B. Loozen,
• Arnica Karuna,
• Mohammad M. R. Fanood,
• Erik Schreuder and
• Jacob Caro

Beilstein J. Nanotechnol. 2020, 11, 829–842, doi:10.3762/bjnano.11.68

• layers does not reflect the real situation. The surface topography resulting from the conformal deposition on the etched structures has been omitted in the cross sections. (a) Optical microscope image of a device with 16 excitation and 4 detection waveguides. (b) Magnification of the marked area in (a

A set of empirical equations describing the observed colours of metal–anodic aluminium oxide–Al nanostructures

• Cristina V. Manzano,
• Jakob J. Schwiedrzik,
• Gerhard Bürki,
• Laszlo Pethö,
• Johann Michler and
• Laetitia Philippe

Beilstein J. Nanotechnol. 2020, 11, 798–806, doi:10.3762/bjnano.11.64

• . After that, the Cr layer was deposited. Characterization of AAO films Morphological characterisation was performed using a field-emission scanning electron microscope (FESEM, Hitachi S-4800) with a 1.5 kV accelerating voltage. The thickness was obtained from sample cross sections fabricated using a

Electromigration-induced directional steps towards the formation of single atomic Ag contacts

• Atasi Chatterjee,
• Christoph Tegenkamp and
• Herbert Pfnür

Beilstein J. Nanotechnol. 2020, 11, 680–687, doi:10.3762/bjnano.11.55

• ] direction. The frequency at 0.6 has also been observed before by Mares et al. [10]. It was attributed to relatively stable cross sections due to the formation of diametric orbits. This frequency was found to be very prominent for Ag, less prominent in Cu and absent in Au as observed by the authors of [10

• 2.6G0 as compared to Figure 2. Moreover, in Figure 4 fine-structure peaks at 2.7G0, 2.8G0, 3.2G0, 3.7G0, 4G0 and 4.7G0 are observed. However, the peaks around 14.5G0 and 15G0 are absent in Figure 4, i.e., the range of unstable cross sections is even more extended in this case. This difference may be due

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• characterization The ESM analysis was conducted inside of particles of the cross-sections of the fresh and aged cathodes. Two examples of the cross-section structure of the cathodes are given in Figure 1. In Figure 1a the fresh and in 1b the aged cathode cross-section is shown. The electrode consists of particles

• that the measurements are conducted on cross-sections of particles, we neglect the carbon coating or binder material influence on the results. The ESM signals show some precise and fine structures and clear separations within the particles. Assuming a rather large probed volume of the cubic tip radius