Facile synthesis of Fe-based metal–organic frameworks from Fe₂O₃ nanoparticles and their application for CO₂/N₂ separation

• Van Nhieu Le,
• Hoai Duc Tran,
• Minh Tien Nguyen,
• Hai Bang Truong,
• Toan Minh Pham and
• Jinsoo Kim

Beilstein J. Nanotechnol. 2024, 15, 897–908, doi:10.3762/bjnano.15.74

• (XPS). Subsequently, the gas separation performance of the as-prepared MIL-100(Fe) samples was assessed by studies regarding CO2 and N2 adsorption isotherms at various temperatures with pressures up to 1 bar. Experimental Materials Iron(III) oxide (Fe2O3, 96%) and benzene-1,3,5-tricarboxylic acid

• , MIL-100(Fe), and M-100Fe@Fe2O3 samples. XPS spectra of Fe2O3 and M-100Fe@Fe2O3#1.80 samples: (a) Fe 2p region and (b) O 1 s region. Adsorption isotherms of M-100Fe@Fe2O3 and reference MIL-100(Fe) samples at 298 K: (a) CO2 adsorption isotherms, (b) N2 adsorption isotherms. IAST-derived CO2/N2

Intermixing of MoS₂ and WS₂ photocatalysts toward methylene blue photodegradation

• Maryam Al Qaydi,
• Nitul S. Rajput,
• Michael Lejeune,
• Abdellatif Bouchalkha,
• Mimoun El Marssi,
• Steevy Cordette,
• Chaouki Kasmi and
• Mustapha Jouiad

Beilstein J. Nanotechnol. 2024, 15, 817–829, doi:10.3762/bjnano.15.68

• additional peaks observed in all XRD diagrams at ≈37° and ≈69° positions are due to the silicon substrate. The X-ray photoelectron spectroscopy (XPS) survey scans and high-resolution scans for all samples are presented in Figure 3a–j. All XPS analyses were first calibrated using the C 1s peak of carbon at

• the W 4f doublet (W 4f7/2 and W 4f5/2) [31]. An additional minor peak appearing at ≈38.7 eV is identified as W 5p3/2 [31]. The XPS analysis of the composite sample indicates the presence of the Mo 3d doublet peaks and S 2s peaks as well as the W 4f doublets, in addition to a peak appearing at ≈36.2 eV

• ascribed to W–O bonding [31]. This suggests the presence of minor oxidation of the flakes. Further quantitative analysis of XPS data indicates the following atomic compositions: Mo: 34.68%, S: 65.32%, W: 33.98%, S: 66.02%, and Mo: 14.06%, W: 23.70, S: 62.24%, respectively for MoS2, WS2, and MoS2/WS2

Electron-induced ligand loss from iron tetracarbonyl methyl acrylate

• Hlib Lyshchuk,
• Atul Chaudhary,
• Thomas F. M. Luxford,
• Miloš Ranković,
• Jaroslav Kočišek,
• Juraj Fedor,
• Lisa McElwee-White and
• Pamir Nag

Beilstein J. Nanotechnol. 2024, 15, 797–807, doi:10.3762/bjnano.15.66

• surface-based investigations, where the electron-induced ligand loss has been probed by XPS [13], ion desorption [14], IR spectroscopy [15], or cluster-beam studies [16][17][18]. The ligand loss has also been probed by ion impact, both in the gas phase [19] and on the surface [13], and, theoretically, by

Effect of repeating hydrothermal growth processes and rapid thermal annealing on CuO thin film properties

• Monika Ozga,
• Eunika Zielony,
• Aleksandra Wierzbicka,
• Anna Wolska,
• Marcin Klepka,
• Marek Godlewski,
• Bogdan J. Kowalski and
• Bartłomiej S. Witkowski

Beilstein J. Nanotechnol. 2024, 15, 743–754, doi:10.3762/bjnano.15.62

• underwent structural analysis using a high-resolution X-ray diffractometer X’Pert Pro MRD (Panalytical) equipped with a Cu anode (λ = 1.54060 Å). X-ray photoelectron spectroscopy (XPS) measurements were conducted utilizing a Scienta R4000 hemispherical analyzer with a pass energy of 200 eV and monochromatic

• Al Kα (1486.7 eV) excitation (Scienta MX-650) operating at 150 W. The energy scale was calibrated by setting the C–C bond at 285 eV. Analysis of the spectra was performed using the commercial CASA XPS software package (Casa Software Ltd., version 2.3.17) with Shirley background. The Gaussian

• content in the CuO films. The chemical composition of such thin films determined using EDX is only an approximation. However, the obtained results demonstrate a clear trend of decreasing carbon content in the material with successive HT+RTA cycles. To validate those findings, additional XPS analyses were

Laser synthesis of nanoparticles in organic solvents – products, reactions, and perspectives

• Theo Fromme,
• Sven Reichenberger,
• Katharine M. Tibbetts and
• Stephan Barcikowski

Beilstein J. Nanotechnol. 2024, 15, 638–663, doi:10.3762/bjnano.15.54

AFM-IR investigation of thin PECVD SiO_x films on a polypropylene substrate in the surface-sensitive mode

• Hendrik Müller,
• Hartmut Stadler,
• Teresa de los Arcos,
• Adrian Keller and
• Guido Grundmeier

Beilstein J. Nanotechnol. 2024, 15, 603–611, doi:10.3762/bjnano.15.51

• signal of the substrate material could be significantly reduced. Even layers that are so thin that they could hardly be measured in the contact mode can be analyzed with the surface-sensitive mode. Keywords: AFM-IR; polypropylene; surface-sensitive mode; silicon oxide; thin films; XPS; Introduction

• spectroscopy (NAP-XPS) using a NAP-XPS system with a Phoibos150 NAP analyzer from Specs Surface Nano Analysis GmbH. The setup has a µ-FOCUS 600 X-ray monochromator NAP source working with monochromatic Al Kα radiation at 1468.7 eV. The power was set to 50 W for all measurements. For the environmental charge

• level spectra, a Shirley type background was used. The Si 2p peak was fitted with doublet peaks with a Si 2p3/2-1/2 splitting of 0.6 eV [18]. Results and Discussion XPS analysis The XPS data in Figure 2 and Figure 3 show that the deposition of silicon oxide thin films was successful. In the survey

Controllable physicochemical properties of WO_x thin films grown under glancing angle

• Rupam Mandal,
• Aparajita Mandal,
• Alapan Dutta,
• Rengasamy Sivakumar,
• Sanjeev Kumar Srivastava and
• Tapobrata Som

Beilstein J. Nanotechnol. 2024, 15, 350–359, doi:10.3762/bjnano.15.31

• identified using X-ray photoelectron spectroscopy (XPS) measurements (PHI 5000 VersaProbeII, ULVAC – PHI, INC) with a monochromatic Al Kα source (hν = 1486.6 eV), and a microfocus (100 µm, 15 kV, 25 W) arrangement along with a multichannel detector and a hemispherical analyser. The microstructure of the WOx

• , chemical analysis on the NS-WOx films is conducted using XPS measurements. Figure 3a–d depicts the XPS core-level spectra of W 4f and O 1s for as-deposited and annealed films, each having a thickness of 6 nm. The W 4f spectra are deconvoluted into two major and two minor peaks using Gaussian–Lorentzian

• annealed WOx films [40]. The results suggest that the relative OV concentration in the WOx films increases from 19 to 25% after vacuum annealing; consequently, a rise in the W5+ component is also observed. In contrast, XPS analysis on a 30 nm as-deposited film (Figure S2a,b in Supporting Information File 1

CdSe/ZnS quantum dots as a booster in the active layer of distributed ternary organic photovoltaics

• Gabriela Lewińska,
• Piotr Jeleń,
• Zofia Kucia,
• Maciej Sitarz,
• Łukasz Walczak,
• Bartłomiej Szafraniak,
• Jerzy Sanetra and
• Konstanty W. Marszalek

Beilstein J. Nanotechnol. 2024, 15, 144–156, doi:10.3762/bjnano.15.14

• pressure of approximately 8 × 10−10 mbar, using the XPS/UPS/ARPES PREVAC setup. The analysis chamber was equipped with a PREVAC Ea15 hemispherical analyzer and a PREVAC EA15 40B source (UV power U = 0.56 kV, PUV = 55 W, He I). The beam energy scale was calibrated at the Fermi level of 16.87 eV. The samples

Study of the reusability and stability of nylon nanofibres as an antibody immobilisation surface

• Inés Peraile,
• Matilde Gil-García,
• Laura González-López,
• Nushin A. Dabbagh-Escalante,
• Juan C. Cabria-Ramos and
• Paloma Lorenzo-Lozano

Beilstein J. Nanotechnol. 2024, 15, 83–94, doi:10.3762/bjnano.15.8

• . The fluorescence signals were measured using a Gemini XPS Microplate Reader (Molecular Devices) in RFU. Anchored antibody was measured as FITC-fluorescence (λemission = 490 nm and λexcitation = 521 nm) after incubation and subsequent wash, divided by the FITC fluorescence obtained just before antibody

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

• and through reductive halogen removal using atomic hydrogen [58]. In an early study by Spencer et al. [57], 0.7 nm layers of Pt(CO)2Cl2 were exposed to 500 eV electrons and desorbing ligands were monitored by mass spectrometry, while the development of the deposit was monitored using XPS. It was found

Properties of tin oxide films grown by atomic layer deposition from tin tetraiodide and ozone

• Kristjan Kalam,
• Peeter Ritslaid,
• Tanel Käämbre,
• Aile Tamm and
• Kaupo Kukli

Beilstein J. Nanotechnol. 2023, 14, 1085–1092, doi:10.3762/bjnano.14.89

• grazing incidence X-ray diffractometry (GIXRD), using an X-ray diffractometer SmartLab Rigaku with Cu Kα radiation, which corresponds to an X-ray wavelength of 0.15406 nm. X-ray photoelectron emission and X-ray absorption spectroscopy (XPS and XAS, respectively) measurements were made at the FinEstBeAMS

• beamline [18] at a solids research endstation [19]. XPS was carried out using a SPECS Phoibos150 hemispherical photoelectron kinetic energy analyser at an overall spectral resolution of 0.3 eV. XAS was carried out at 0.1 eV spectral resolution in total electron yield (TEY) mode by measuring sample

• ]. The SnO2 films grown at 300 and 500 °C, that is, those with low residual iodine content, were analysed ex situ in terms of surface chemistry using soft X-ray spectroscopy methods. The Sn 3d XPS data (Figure 10a) show almost identical spectra for the samples deposited at 300 and 500 °C, and the narrow

Experimental investigation of usage of POE lubricants with Al₂O₃, graphene or CNT nanoparticles in a refrigeration compressor

• Kayhan Dağıdır and
• Kemal Bilen

Beilstein J. Nanotechnol. 2023, 14, 1041–1058, doi:10.3762/bjnano.14.86

• hybridisation in the chemical structure of the material. The chemical states of the elements for the graphene nanoplatelets were evaluated by XPS. Figure 16a shows a graphitic C 1s peak at 284.27 eV and a weak O 1s peak at 532.09 eV. Figure 16b shows that the graphene has a single intense peak at 284.19 eV

• corresponding to the sp2-hybridised C–C system. The XPS data obtained are also consistent with previous studies [41][42]. As a result, the high purity and low defect structures of graphene nanoplatelets used in this study are understood. This supports the fact that the best improvement occurs in the graphene

• compressor electrical power for the usage of nanolubricants with a) Al2O3, b) graphene, and c) CNTs. Required compressor electrical power for nanolubricants with optimum mass fraction of nanoparticles. Raman spectroscopy of the graphene nanoplatelets. XPS of the graphene nanoplatelets. Kinematic viscosity of

Low temperature atomic layer deposition of cobalt using dicobalt hexacarbonyl-1-heptyne as precursor

• Mathias Franz,
• Mahnaz Safian Jouzdani,
• Lysann Kaßner,
• Marcus Daniel,
• Frank Stahr and
• Stefan E. Schulz

Beilstein J. Nanotechnol. 2023, 14, 951–963, doi:10.3762/bjnano.14.78

• -temperature ALD; PEALD; plasma-enhanced ALD; XPS; Introduction The atomic layer deposition (ALD) of cobalt films is an ongoing topic of interest [1]. Cobalt thin and ultrathin films play an important role in current generations of integrated circuits [2]. Compared to copper, the metal offers a greater

• metallic cobalt according to Ward [24] combined with a Tauc–Lorentzian model for possible occurrences of oxidised cobalt [25][26]. The film compositions were measured ex situ by X-ray photoelectron spectroscopy (XPS) on a PRECAV sp. Z. o. o. XPS system using a MX-650 Al X-ray source and a R3000 analyser

• from VG Scienta using a fixed pass energy of 200 eV. The sample was pre-cleaned by argon sputtering for 2 min with 4.0 keV acceleration energy to remove surface adsorbents and contaminations. The data were analysed using MATPLOTLIB [27][28] and LMFIT [29]. The XPS spectra were corrected using the

Upscaling the urea method synthesis of CoAl layered double hydroxides

• Camilo Jaramillo-Hernández,
• Víctor Oestreicher,
• Martín Mizrahi and
• Gonzalo Abellán

Beilstein J. Nanotechnol. 2023, 14, 927–938, doi:10.3762/bjnano.14.76

• spectroscopic techniques (ATR-FTIR, UV–vis, XPS, ICP-MS, and XANES-EXAFS). In the case of the volumetric scale-up, a reduction of 45% in the lateral dimensions of the crystals (from 3.7 to 2.0 µm) is observed as the reaction volume increases. This fact is related to modified heating processes affecting the

• identity of the impurity observed in sample x25M, X-ray photoelectron spectroscopy (XPS) was conducted (Figure 1C). In the case of reference x1, the observed main peaks at 781.23 eV (Co 23/2) and 797.36 eV (Co 21/2), as well as their satellites at 783.13 and 798.83 eV, confirm the occurrence of CoII [15

• ][49]. The XPS spectra of the samples x20V and x25M are indistinguishable from that of reference x1, suggesting the lack of CoIII in the impurity of sample x25M. Supporting Information File 1, Table S2 compiles further information related to the XPS signals. Finally, UV–vis spectroscopy has

Titania nanoparticles for photocatalytic degradation of ethanol under simulated solar light

• Evghenii Goncearenco,
• Iuliana P. Morjan,
• Claudiu Teodor Fleaca,
• Florian Dumitrache,
• Elena Dutu,
• Monica Scarisoreanu,
• Valentin Serban Teodorescu,
• Alexandra Sandulescu,
• Crina Anastasescu and
• Ioan Balint

Beilstein J. Nanotechnol. 2023, 14, 616–630, doi:10.3762/bjnano.14.51

• correlation between specific surface area and particle/crystallite size is most obvious when comparing the TO-850-a sample with those synthesized at lower pressures. When the average particle size increases, the surface area diminishes. X-ray photoelectron spectroscopy (XPS) analysis was performed, and the

• spectral alignment of the binding energy (BE) scale was referenced to adventitious carbon at 284.8 eV [40][41]. Figure 4a shows the full survey scans of TO-250-a, TO-850-b, and commercial TiO2 (Degussa P25) samples, indicating the presence of the expected elements Ti, O, and C. The high-resolution XPS

• are shown in Figure 4d and were fitted with two peaks. The peaks at binding energies of 529.9 and 530.5 eV are attributed, respectively, to oxygen bound to Ti4+ and the adsorption of –OH on the surface [50][51]. The XPS results do not show differences between the two series of samples and do not

ZnO-decorated SiC@C hybrids with strong electromagnetic absorption

• Liqun Duan,
• Zhiqian Yang,
• Yilu Xia,
• Xiaoqing Dai,
• Jian’an Wu and
• Minqian Sun

Beilstein J. Nanotechnol. 2023, 14, 565–573, doi:10.3762/bjnano.14.47

• elements (C, Si, O, and Zn) have been determined by XPS in all SCZ samples, as shown in Figure 3. The survey scans of the SCZ samples exhibit major peaks assigned to C 1s (ca. 284 eV), O 1s (ca. 532 eV), Si 2p (ca. 100 eV), Zn 2p (ca. 1022 eV and ca. 1045 eV). The two Zn 2p peaks correspond to Zn 2p3/2 and

• results. In contrast, the relative intensities of the Si 2p and C 1s peaks gradually decrease at the same time. The peaks at 100 and 103.5 eV are related to Si 2p1/2 and Si 2p3/2, respectively. Table 1 provides the elemental compositions (atom %) on the SCZ sample surfaces as determined by XPS. The

• images derived from the red box area in image (b). XPS survey spectra of SCZ samples. 3D RL plots of the hybrids with different sample thicknesses in the range of 2–18 GHz with 30 wt % filler load. (a) SCZ0.5; (b) SCZ1; (c) SCZ2; (d) SCZ4. Dielectric tangent loss and impedance of SCZ/wax samples in the

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

• Keith R. Paton,
• Konstantinos Despotelis,
• Naresh Kumar,
• Piers Turner and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

• %), transmission electron microscopy (TEM) (7.2%) or X-ray photoelectron spectroscopy (XPS) (5.6%). It has the advantages of relatively low cost, simple sample preparation, quick measurements, and automated analysis, offering clear benefits for quality control applications. It has been demonstrated in several

Mixed oxides with corundum-type structure obtained from recycling can seals as paint pigments: color stability

• Dienifer F. L. Horsth,
• Julia de O. Primo,
• Nayara Balaba,
• Fauze J. Anaissi and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2023, 14, 467–477, doi:10.3762/bjnano.14.37

• ) coloration of the mixed oxides was confirmed by XPS and visible-light absorption measurements. The colorimetric stability of the oxides in acid and alkaline environments was evaluated. After 240 h of exposure to harsh environments, both pigments demonstrated stability and showed no strong color difference

• characteristic of α-Fe2O3 nanoparticles [21]. The same morphology was observed for concentrations of 5 and 20 wt % of coloring ions (Figure S2, Supporting Information File 1). X-ray photoelectron spectroscopy (XPS) The elemental composition of the samples evaluated by the analysis of XPS spectra is shown in

• Table 2. The relative amount of the coloring ions evaluated by XPS is approximately 12 wt % in both samples. The XPS spectra recorded in the Al 2p core level region (Figure 4a,b,d) show a peak fitted with one component centered at 73.6 eV. This component indicates the presence of Al2O3 in all samples

Evaluation of electrosynthesized reduced graphene oxide–Ni/Fe/Co-based (oxy)hydroxide catalysts towards the oxygen evolution reaction

• Karolina Cysewska,
• Marcin Łapiński,
• Marcin Zając,
• Jakub Karczewski,
• Piotr Jasiński and
• Sebastian Molin

Beilstein J. Nanotechnol. 2023, 14, 420–433, doi:10.3762/bjnano.14.34

• XRD signal due to the very thin NiFe layer (200 nm). The XPS analysis showed that the addition of cobalt to NiFe induced the formation of the new nickel species Ni3+ in the catalyst structure (Figure 4a). The effect of the addition of cobalt to the NiFe on its structure was studied in detail in our

• species, that is, Co2+ and Co3+, and virtually the same percentage ratio of Co2+/Co3+ remained in the catalyst after the addition of GO to CoNiFe (Figure 4c). Figure 4d presents the XPS spectra of the C 1s region of GO, NiFe-GO, and CoNiFe-GO. The C 1s spectrum of the catalysts indicates the degree of

• were conducted using Cu Kα radiation (λ = 1.5404 Å) with a Philips X’Pert Pro diffractometer in the 2θ range from 5° to 35°. The selected 2θ range was selected based on the previous measurements corresponding to similar types of materials [25]. X-ray photoemission spectra (XPS) of the catalysts were

A novel approach to pulsed laser deposition of platinum catalyst on carbon particles for use in polymer electrolyte membrane fuel cells

• Bogusław Budner,
• Wojciech Tokarz,
• Sławomir Dyjak,
• Andrzej Czerwiński,
• Bartosz Bartosewicz and
• Bartłomiej Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 190–204, doi:10.3762/bjnano.14.19

• ; ORR; PEMFCs; PLD deposition; Pt catalyst; rotating ring-disk electrode (RRDE); SEM; TEM; XPS; Introduction Fuel cells, which cleanly and efficiently convert the chemical energy of hydrogen or other fuels to electrical energy, are a good alternative to dirty and wasteful combustion engines for

• , morphology, and chemical composition of the fabricated catalysts were investigated using TEM, SEM, EDX, XPS, and Raman spectroscopy. Electrochemical measurements determined the performance of the fabricated catalysts. Results and Discussion Synthesis of a highly graphitized carbon material The synthesis of

• PtNPs on the carbon support surface. Additionally, the EDX studies show that in the area of the edge of the carbon particles, the Pt signal is more intense, likely due to PtNPs overlapping, which looks like an agglomeration. XPS spectra in a wide binding energy range (Supporting Information File 1

Structural, optical, and bioimaging characterization of carbon quantum dots solvothermally synthesized from o-phenylenediamine

• Zoran M. Marković,
• Milica D. Budimir,
• Martin Danko,
• Dušan D. Milivojević,
• Pavel Kubat,
• Danica Z. Zmejkoski,
• Vladimir B. Pavlović,
• Marija M. Mojsin,
• Milena J. Stevanović and
• Biljana M. Todorović Marković

Beilstein J. Nanotechnol. 2023, 14, 165–174, doi:10.3762/bjnano.14.17

• bending vibrations, respectively. The peaks at 1521 and 1061 cm−1 stem from N–O stretching and C–O stretching vibrations, respectively. The peaks at 961, 815, and 759 cm−1 could be assigned to C=C bending, C-H bending, and C=C bending vibrations, respectively [30]. An et al. reported that XPS analysis of

Combining physical vapor deposition structuration with dealloying for the creation of a highly efficient SERS platform

• Adrien Chauvin,
• Walter Puglisi,
• Damien Thiry,
• Cristina Satriano,
• Rony Snyders and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2023, 14, 83–94, doi:10.3762/bjnano.14.10

• SERS properties of the nanoporous structure. Using scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) the morphology and surface composition of each nanoporous structure were respectively evaluated and used to describe the SERS properties of the samples. Results and

• of the surface of the film was probed by XPS. The SERS properties of a structure are driven by the presence of ‘hot spots’. These are highly sensitive to the composition of the surface since the presence of impurities can hinder the SERS properties [30]. The XPS composition of the surface of the

• , surface composition drives SERS properties. Thus, the surface composition of the AlAg30 samples dealloyed for 60 min in NaOH and in H3PO4 was evaluated by XPS (Table 2). As for the sample dealloyed in HCl, the Ag 3d peak recorded on the sample dealloyed in H3PO4 reveals the presence of metallic silver at

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

• Chang-Ming Wang,
• Hong-Sheng Chan,
• Chia-Li Liao,
• Che-Wei Chang and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

• the rectangle function in ZEN 2012 Service Pack 2 software (Carl Zeiss Microscopy, Jena, Germany). XPS spectra after each surface modification step were collected with ULVAC-PHI X-ray photoelectron spectrometer (PHI QuanteraII, Kanagawa, Japan). Selective wet chemical etching processes and metal

• moieties are conjugated with streptavidin followed by FITC-labeled anti-streptavidin antibody recognition (Figure 1A). This process results in obvious contrast in fluorescence images, allowing the visualization of biorecognition processes at post lift-off regions. XPS spectroscopy is utilized to monitor

• surface patterns created by gap-directed CLL through biorecognition. (A) Schematic illustration of the biorecognition process including post lift-off region biotinylated thiol backfilling, streptavidin binding, and antibody recognition. (B) XPS characterization of the surface for (left) pure MCU SAM

LED-light-activated photocatalytic performance of metal-free carbon-modified hexagonal boron nitride towards degradation of methylene blue and phenol

• Nirmalendu S. Mishra and
• Pichiah Saravanan

Beilstein J. Nanotechnol. 2022, 13, 1380–1392, doi:10.3762/bjnano.13.114

• attachment using BaSO4 as the standard. The electronic arrangement of the studied materials was revealed through a PHI 5000 versa probe III high-resolution X-ray photoelectron spectroscope (HR-XPS). The mineralization efficiency was estimated through the variation in the total organic carbon content by using

• of various gases (NH3, CO2, H2O) generated during the synthesis process [3][23]. Elemental characteristics and surface area The XPS binding energy (BE) survey spectrum for MBN and its constituent elements have been depicted in Figure 2a. The existence of B 1s, N 1s, and C 1s in the BE spectra clearly

• four subpeaks at 283.66 (C–B), 284.96 (C–C), 287.4 (C–N), and 288.55 eV (C=O) respectively and has been depicted in Figure 3d. The XPS analysis also validates the equal stoichiometry of B/N in the as-synthesized MBN. Furthermore, the C content in MBN was found to be 37.4% which is noticeably higher

Near-infrared photoactive Ag-Zn-Ga-S-Se quantum dots for high-performance quantum dot-sensitized solar cells

• Roopakala Kottayi,
• Ilangovan Veerappan and
• Ramadasse Sittaramane

Beilstein J. Nanotechnol. 2022, 13, 1337–1344, doi:10.3762/bjnano.13.110

• JSM-7600F. The electronic states of the elements and their atomic ratio in the prepared samples was analyzed by using XPS (Kratos AXIS Ultra DLD) and EDX (Bruker Nano XFlash detector attached to the HRTEM). Optical properties were examined by using a UV–vis–NIR spectrophotometer (Perkin Elmer L-650 UV

• approximately a ratio of 1:1:1:1.5:1.5 , indicating the formation of AgZnGaS1.5Se1.5 QDs. XPS studies XPS spectra of AZGSSe QDs are depicted in Figure 3. To avoid the background noise, peak fits were included in all elemental spectra. Figure 3a shows Ag 3d, Zn 2p, S 2p, Se 3d, Ga 2p, C 1s, and O 1s peaks. Here

• to the enormous light-harvesting capacity of AZGSSe QDs and the enhanced electron transfer from AZGSSe QDs to TiO2 NFs. XRD pattern of AZGSSe QDs. (a) HRTEM image and (b) EXD spectrum of AZGSSe QDs. (a) Survey; (b) Ag 3d; (c) Zn 2p; (d) Ga 2p; (e) S 2p, and (f) Se 3d XPS spectra of AZGSSe QDs. (a) UV