Micro- and nanotechnology in biomedical engineering for cartilage tissue regeneration in osteoarthritis

• Zahra Nabizadeh,
• Mahmoud Nasrollahzadeh,
• Hamed Daemi,
• Mohamadreza Baghaban Eslaminejad,
• Ali Akbar Shabani,
• Mehdi Dadashpour,
• Majid Mirmohammadkhani and
• Davood Nasrabadi

Beilstein J. Nanotechnol. 2022, 13, 363–389, doi:10.3762/bjnano.13.31

Selected properties of Al_xZn_yO thin films prepared by reactive pulsed magnetron sputtering using a two-element Zn/Al target

• Witold Posadowski,
• Artur Wiatrowski,
• Jarosław Domaradzki and
• Michał Mazur

Beilstein J. Nanotechnol. 2022, 13, 344–354, doi:10.3762/bjnano.13.29

• a function of the distance from the target axis on both sides (front and back) of the substrate. The lowest measured resistivity was about 4 × 10−3 Ω·cm. Additionally, optical properties, surface topography, and elemental composition were determined in selected areas of the substrate. Keywords

The effect of metal surface nanomorphology on the output performance of a TENG

• Yiru Wang,
• Xin Zhao,
• Yang Liu and
• Wenjun Zhou

Beilstein J. Nanotechnol. 2022, 13, 298–312, doi:10.3762/bjnano.13.25

• full contact with PTFE, but the small nanoparticles have no or not full contact with PTFE, which leads to the difference in output efficiency. The effect of surface topography on the output performance was studied by classifying the nanocrystals according to different shapes. The reason for the

Topographic signatures and manipulations of Fe atoms, CO molecules and NaCl islands on superconducting Pb(111)

• Carl Drechsel,
• Philipp D’Astolfo,
• Jung-Ching Liu,
• Thilo Glatzel,
• Rémy Pawlak and
• Ernst Meyer

Beilstein J. Nanotechnol. 2022, 13, 1–9, doi:10.3762/bjnano.13.1

• metal surface, as observed on different noble metals [45][46]. Figure 1b and Figure 1c show STM topographic images after such process. While the surface topography remains unchanged in comparison to Figure 1a, numerous scan instabilities are now present, which we attribute to CO molecules diffusing

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• the approach curve; it is independent of surface topography and can be done prior to starting the actual scan. We used different types of cantilevers with a force constant in the range of 0.5–50 N/m and resonant frequencies of 40–400 kHz. Some of the probes had sharp custom-made spikes grown according

Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• was measured by TEM for different grains (see Supporting Information File 1). Both the TEM image and the FSD image, the latter is recorded with the EBSD detector and highlights the surface topography, show the different milling depths for different grains. Faster milling grains were milled to a 226 nm

• maps were recorded and evaluated. The measurements and evaluations are shown in Figure 7a–c. The figure insets show the experiments with the lowest ion dose. The 0° incidence angle milling creates a strong surface topography in both cases, as evidenced in the forward scatter diffraction image (Figure

•  7a). Figure 7a shows an overlay of the FSD image with the phase map. A strong surface topography was expected as different grain orientations mill at different rates. As a result of the induced strong topography, a lot of the regions cannot be indexed, returning twice the amount of zero solutions for

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• piezoelectricity has been patterned into multilayered MoTe2 [56]. In the case of helium ion irradiation of a bulk van der Waals layered ferroelectric semiconductor crystal (CuInP2S6), local volume expansion due to helium ion implantation was observed, forming a conical surface topography within which for

Structural and optical characteristics determined by the sputtering deposition conditions of oxide thin films

• Petronela Prepelita,
• Florin Garoi and
• Valentin Craciun

Beilstein J. Nanotechnol. 2021, 12, 354–365, doi:10.3762/bjnano.12.29

• diffraction (XRD) and X-ray photoelectron spectroscopy (XPS), while the surface topography of the samples was analyzed using scanning electron microscopy (SEM). The optical characteristics were measured for samples with the same composition but obtained with different deposition parameters, such as increasing

Imaging of SARS-CoV-2 infected Vero E6 cells by helium ion microscopy

• Natalie Frese,
• Patrick Schmerer,
• Martin Wortmann,
• Matthias Schürmann,
• Matthias König,
• Michael Westphal,
• Friedemann Weber,
• Holger Sudhoff and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 172–179, doi:10.3762/bjnano.12.13

• allowed imaging of Figure 2c3 without any external charge compensation. From the quality of this image, it can be inferred that the deposited carbon layer rendered the sample sufficiently conductive. However, small structures are still visible on the membrane surface, which may originate from surface

• topography or material contrast. The deposited carbon film is presumably thinner than typical conductive metal or carbon coatings for SEM imaging, and it does not show any surface masking and clustering as seen on the gold substrate in the upper left of Figure 2b2. The energy of the incident hydrocarbons is

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

• Rosine Coq Germanicus,
• Peter De Wolf,
• Florent Lallemand,
• Catherine Bunel,
• Serge Bardy,
• Hugues Murray and
• Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

• , an electrical back contact is created between the microscope chuck and the sample. Results and Discussion The vertical PIN structure Figure 2 shows the surface topography of the cross section of the PIN diode. The different materials used (silicon substrate, epitaxial layers, oxides, and alloy metals

Helium ion microscope – secondary ion mass spectrometry for geological materials

• Matthew R. Ball,
• Richard J. M. Taylor,
• Joshua F. Einsle,
• Fouzia Khanom,
• Christelle Guillermier and
• Richard J. Harrison

Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133

• substitute in the crystal lattice within a solid solution. The Li signal appears to be stronger along mica sheets perpendicular to the c-axis of the crystal structure. However, this may be the result of surface topography similar to that observed in the zircon samples, as a result of polishing picking out

High permittivity, breakdown strength, and energy storage density of polythiophene-encapsulated BaTiO₃ nanoparticles

• Adnanullah Khan,
• Amir Habib and
• Adeel Afzal

Beilstein J. Nanotechnol. 2020, 11, 1190–1197, doi:10.3762/bjnano.11.103

• the SEM image shown in Figure 4a. PTh, on the other hand, exhibits an inhomogeneous surface morphology with large flakes of polymer randomly distributed on the surface. In case of core–shell BTO-PTh nanoparticles (Figure 5b), the surface topography is very consistent with uniformly distributed sub

• images of the as-prepared BTO nanoparticles (a), BTO-PTh nanoparticles (b), and pristine PTh (c). 3D images showing the surface topography, and 2D images along with surface profiles showing the surface morphology of all samples. Dielectric properties of the as-prepared BTO nanoparticles, pristine PTh

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

• Christian Ritz,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2020, 11, 911–921, doi:10.3762/bjnano.11.76

• results in a continuous measurement of the local surface potential, the capacitance gradient, and the frequency shift induced by surface topography. In contrast to conventional techniques, the detection of the topography-induced frequency shift enables the compensation of all electrostatic influences

• FM-AFM can be separated into a component induced by surface topography, Δftopo, and a component induced electrically, Δfel, therefore The coefficient a is proportional to the capacitance gradient C′′ and has the unit of Hz V−2. It is one of the three sample properties that are continuously estimated

• surface topography is shown in Figure 3a, the obtained frequency shift is shown in Figure 3e. During postprocessing, the recorded Δf signal and bias voltage are fed to the TD-KFM controller. From the hidden contributions at fm and 2fm, the state observer reconstructed the sample properties, which are

Integrated photonics multi-waveguide devices for optical trapping and Raman spectroscopy: design, fabrication and performance demonstration

• Gyllion B. Loozen,
• Arnica Karuna,
• Mohammad M. R. Fanood,
• Erik Schreuder and
• Jacob Caro

Beilstein J. Nanotechnol. 2020, 11, 829–842, doi:10.3762/bjnano.11.68

• away from the edge. In the next step, a 3 µm thick layer of SiO2 is deposited using LPCVD (Figure 5e). This layer acts as an upper cladding of the excitation waveguides and separates these from the waveguiding layer that follows. For simplicity, we do not show the surface topography resulting after

• layers does not reflect the real situation. The surface topography resulting from the conformal deposition on the etched structures has been omitted in the cross sections. (a) Optical microscope image of a device with 16 excitation and 4 detection waveguides. (b) Magnification of the marked area in (a

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• (SPM) [1]. Quality and accuracy of an AFM image strongly depend on the tip geometry since the image topography is the convolution of the surface topography and the cantilever tip geometry [2]. More precisely, the resulting images suffer from the effect of dilation [3]. AFM images with tip artefacts are

Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

• Yan Liu,
• Li Li,
• Xing Chen,
• Ying Wang,
• Meng-Nan Liu,
• Jin Yan,
• Liang Cao,
• Lu Wang and
• Zuo-Bin Wang

Beilstein J. Nanotechnol. 2019, 10, 2329–2337, doi:10.3762/bjnano.10.223

• mechanical strength [25][26]. The patterned stiffness of the SU-8 films was induced by electron beam lithography (EBL). The approach to control the stiffness and the topography of the substrate is shown in Figure 1. The rigidity of the film was tuned by varying the electron beam dosage, while the surface

• topography is determined by both the exposure dose and the development of the SU-8 films. We cultured L929 cells on undeveloped and developed SU-8 surfaces as well as on a reference glass substrate. The structural responses of the L929 cells on the substrate topography were probed using AFAM. A fluorescence

Ion mobility and material transport on KBr in air as a function of the relative humidity

• Dominik J. Kirpal,
• Korbinian Pürckhauer,
• Alfred J. Weymouth and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

• from 25.0% to 35.1% within a time period of 46 h. Figure 2b and Figure 2c show the surface topography directly before and after this period. It can be observed that the accumulated material around the top right and the middle left structure has completely eroded. Also, for the other structures only a

• on the surface. This state is observed by the AFM technique as the surface topography. (2) In the second state the ions are dissolved in the hydration layer or in a physiosorbed or precursor state [30], which shows a high mobility and cannot be imaged. The material from the accumulation over time

Nanoarchitectonics meets cell surface engineering: shape recognition of human cells by halloysite-doped silica cell imprints

• Elvira Rozhina,
• Ilnur Ishmukhametov,
• Svetlana Batasheva,
• Farida Akhatova and
• Rawil Fakhrullin

Beilstein J. Nanotechnol. 2019, 10, 1818–1825, doi:10.3762/bjnano.10.176

• , fixed with formaldehyde, sputter-coated with a thin gold layer and then imaged using a Hitachi SU8000 microscope. As shown in Figure 2D–F, the typical smooth surface topography of HeLa cells was changed drastically by the deposition of either pure or halloysite-doped silica. Analysing the cell diameter

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He⁺: Projected images and intensity patterns

• Michael Mousley,
• Santhana Eswara,
• Olivier De Castro,
• Olivier Bouton,
• Nico Klingner,
• Christoph T. Koch,
• Gregor Hlawacek and
• Tom Wirtz

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

• suggests that the orientation of the particle surface is responsible for the direction of deflection. The local surface topography then defines the caustic pattern and the exact position of the bright points around the edge. Figure 4C shows that there is still a large amount of intensity at the center of

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

• Wenting Wang,
• Chengfu Ma,
• Yuhang Chen,
• Lei Zheng,
• Huarong Liu and
• Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

• ranging from 1000 to 6000 rpm. The resulting cover thicknesses were 52, 117, 185, 380, and 653 nm as measured by AFM. Furthermore, the top surface was smoothed to eliminate the cross-talk of surface topography in subsurface CR-AFM imaging. Our experiments were performed on an MFP-3D Origin AFM (Asylum

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• comparable to previous studies where the contact stiffness on an atomic terrace was found to be 0.12 N/m [25]. A reduction of contact stiffness over the uncovered step edges is evident in Figure 6c. The contact stiffness depends on the surface topography or local roughness, which can in turn change the

• a change in the contact area over the inclined steps [39]. However, examination of the covered step edges shows no variation in the response amplitude despite similar topographic variations as the uncovered steps. Therefore, we can conclude that the local variations in the surface topography do not

• be influenced by a number of factors, each factor will be examined individually to rule out their impact on the quantitative measurement of the elastic modulus on both the atomic terrace and the step edge. The factors that are specifically addressed in this section include: the impact of surface

Revisiting semicontinuous silver films as surface-enhanced Raman spectroscopy substrates

• Malwina Liszewska,
• Bogusław Budner,
• Małgorzata Norek,
• Bartłomiej J. Jankiewicz and
• Piotr Nyga

Beilstein J. Nanotechnol. 2019, 10, 1048–1055, doi:10.3762/bjnano.10.105

• and white and metal coverage was calculated. The AFM maps were collected using an NTEGRA atomic force microscope from NT-MDT company. The surface topography measurements were made in semi-contact mode. We used HA_NC ETALON (NT-MDT) probe with 140 kHz ± 10% resonant frequency, force constant of 3.5 N/m

In situ AFM visualization of Li–O₂ battery discharge products during redox cycling in an atmospherically controlled sample cell

• Kumar Virwani,
• Younes Ansari,
• Khanh Nguyen,
• Francisco José Alía Moreno-Ortiz,
• Jangwoo Kim,
• Maxwell J. Giammona,
• Ho-Cheol Kim and
• Young-Hye La

Beilstein J. Nanotechnol. 2019, 10, 930–940, doi:10.3762/bjnano.10.94

• the area scanned 344 times. The two rectangles in Figure 6 show an average Z-height difference in the two areas of about 1.5 nm after 344 scans, suggesting minimal impact on the surface topography of tapping mode scanning during electrochemistry! This also indicates that even relatively slow

• electrochemical impedance spectra collected from the AFM cell allowed for the study of cell impedance before and after cycling in the Li/O2 battery. Time-domain correlated images were collected showing changes in surface topography while cell discharge and recharge voltages/capacities were measured. The

Rapid, ultraviolet-induced, reversibly switchable wettability of superhydrophobic/superhydrophilic surfaces

• Yunlu Pan,
• Wenting Kong,
• Bharat Bhushan and
• Xuezeng Zhao

Beilstein J. Nanotechnol. 2019, 10, 866–873, doi:10.3762/bjnano.10.87

• solid surfaces governed by surface chemistry and surface topography [1][2] and has found significant applications in various fields [3][4][5][6][7][8]. Controllable wettability that can be enabled through external stimuli, such as illumination, electric fields or heating, can be applied in chemical

Ultraviolet patterns of flowers revealed in polymer replica – caused by surface architecture

• Anna J. Schulte,
• Matthias Mail,
• Lisa A. Hahn and
• Wilhelm Barthlott

Beilstein J. Nanotechnol. 2019, 10, 459–466, doi:10.3762/bjnano.10.45

• is described in Koch et al. [39] and is a suitable technique for the transfer of the surface topography of soft and fragile plant material to a rigid material in high precision down to the nanometer scale. Results and Discussion Images of flowers under environmental conditions were taken in the VIS

• also provide new data for the development of technical surfaces with well-defined optical specifications. For this purpose the UV-reflection of the flowers of approximately 8,000 angiosperms was systematically recorded and published [36][37][38]. To determine the possible influence of the surface

• topography on the appearance of UV-patterns, we investigated the interaction between UV-light and the surface structures of three different plant species in this study. To consider several diverse surface structures we chose three species with distinct UV-patterns and different surface structures, for