Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams

• Serguei Chiriaev,
• Luciana Tavares,
• Vadzim Adashkevich,
• Arkadiusz J. Goszczak and
• Horst-Günter Rubahn

Beilstein J. Nanotechnol. 2020, 11, 1693–1703, doi:10.3762/bjnano.11.151

• [4], in which 15 nm Pt60Pd40 films were patterned. Also, for the same reason of a more direct comparison, 200 nm thick PMMA substrates were used in this work to study possible effects of changing ion masses. Results and Discussion Irradiation of PMMA Figure 1 shows an example of an atomic force

• strain specifically at the compacted regions. Therefore, it results in the reduction of the strain energy accumulated in the system. The energy minimization provides a thermodynamic force for the strain relaxation. In addition to this, the ion irradiation is needed to break atomic bonds and to lower the

Piezoelectric sensor based on graphene-doped PVDF nanofibers for sign language translation

• Shuai Yang,
• Xiaojing Cui,
• Rui Guo,
• Zhiyi Zhang,
• Shengbo Sang and
• Hulin Zhang

Beilstein J. Nanotechnol. 2020, 11, 1655–1662, doi:10.3762/bjnano.11.148

• . Nowadays, pressure and bending angle sensors are mainly based on signals caused by a changing force [17][18][19][20][21][22][23][24][25]. Plenty of measurement methods, using different materials and different principles, have been proposed in recent years [26]. Although these sensors can detect various

Amorphized length and variability in phase-change memory line cells

• Nafisa Noor,
• Sadid Muneer,
• Raihan Sayeed Khan,
• Anna Gorbenko and
• Helena Silva

Beilstein J. Nanotechnol. 2020, 11, 1644–1654, doi:10.3762/bjnano.11.147

• . Yu Zhu for their support in device fabrication, and Professor Ali Gokirmak at the University of Connecticut for valuable discussions. Funding This research is funded by the multi-university research initiative (MURI) of Air Force Office of Scientific Research (AFOSR) under the grant FA9550-14-1-0351Z

High-responsivity hybrid α-Ag₂S/Si photodetector prepared by pulsed laser ablation in liquid

• Raid A. Ismail,
• Hanan A. Rawdhan and
• Duha S. Ahmed

Beilstein J. Nanotechnol. 2020, 11, 1596–1607, doi:10.3762/bjnano.11.142

• the Ag2S NP surfaces. The reason for the formation of monodisperse Ag2S NPs when CTAB was used as a surfactant can be ascribed to the deposition of CTAB on the Ag2S NP surface, which resulted in a certain repulsive force to other Ag2S NPs. This force may have prevented the agglomeration of the Ag2S

Walking energy harvesting and self-powered tracking system based on triboelectric nanogenerators

• Mingliang Yao,
• Guangzhong Xie,
• Qichen Gong and
• Yuanjie Su

Beilstein J. Nanotechnol. 2020, 11, 1590–1595, doi:10.3762/bjnano.11.141

• shown in Figure 2. The application and release of a stepping force during walking induces a periodical change between contact and separation the PTFE films and the undulated copper foils. This leads to the conversion of mechanical energy into electricity, as sketched in Figure 2. To quantitatively

• characterize the u-TENG output performance, a linear motor was used to apply a periodical and controllable impact with tunable amplitude, frequency, and force. Triggered by an impact of 500 N at a frequency of 1 Hz, the as-prepared u-TENG delivered an output voltage of 86.0 V and an output current of 6.2 μA

• proportional to the pedestrian weight. This is because a more intense impact force causes a larger deformation of the undulated electrode, which contributes to larger separation (d) and thus a stronger output voltage. To quantitatively study the dependence of the electric output on the force, the output

Detecting stable adsorbates of (1S)-camphor on Cu(111) with Bayesian optimization

• Jari Järvi,
• Patrick Rinke and
• Milica Todorović

Beilstein J. Nanotechnol. 2020, 11, 1577–1589, doi:10.3762/bjnano.11.140

• electronic properties of the material. Assemblies of organic molecules on surfaces have been studied experimentally, for example with X-ray diffraction [4][5], scanning tunneling microscopy [6][7][8] and atomic force microscopy (AFM) [9][10][11]. These methods have a considerable resolution in imaging planar

• its reliable identification, we must explore the PES thoroughly. Calculating the full PES for complex hybrid materials requires either (i) fast energy computations, or (ii) an advanced method of constructing the complete PES with a small number of energy points. Classical force-field potentials are

• structures are relaxed below a maximum force component of 10−2 eV/Å. We model the Cu substrate with a Cu(111) slab of four atomic layers and (6 × 4) orthogonal unit cells (192 atoms, lattice vectors [a, b, c] = [15.41, 17.79, 56.29] Å). The lattice constant of Cu is set to 3.632 Å, which we obtain from

Fabrication of nano/microstructures for SERS substrates using an electrochemical method

• Jingran Zhang,
• Tianqi Jia,
• Xiaoping Li,
• Junjie Yang,
• Zhengkai Li,
• Guangfeng Shi,
• Xinming Zhang and
• Zuobin Wang

Beilstein J. Nanotechnol. 2020, 11, 1568–1576, doi:10.3762/bjnano.11.139

• over a 20 × 20 μm2 area. Before the tests, the Raman spectra were rectified using a standard Si substrate. A Raman intensity peak of 1362 cm−1 for R6G was chosen in the experiment. An atomic force microscopy (AFM) system (Dimension Icon, Bruker, Germany) was employed to detect the two-dimensional and

• previous studies [49][50], a cavity depth of 1.7 µm was generated using a normal force of 10 mN with the force modulation indentation method. However, nanocavities were formed by the overlap of adjacent cavities. The depth of the nanocavities reached ca. 200 nm as the machining feeds were reduced. In

Electrokinetic characterization of synthetic protein nanoparticles

• Daniel F. Quevedo,
• Cody J. Lentz,
• Adriana Coll de Peña,
• Yazmin Hernandez,
• Nahal Habibi,
• Rikako Miki,
• Joerg Lahann and
• Blanca H. Lapizco-Encinas

Beilstein J. Nanotechnol. 2020, 11, 1556–1567, doi:10.3762/bjnano.11.138

• of the electric field, as particles move through an insulator-based microchannel the predominant forces will ultimately dictate the particle behavior. At lower magnitudes, the predominant force will be linear electrokinetics, EK, which is composed of electro-osmosis (EO) and linear electrophoresis

Design of V-shaped cantilevers for enhanced multifrequency AFM measurements

• Mehrnoosh Damircheli and
• Babak Eslami

Beilstein J. Nanotechnol. 2020, 11, 1525–1541, doi:10.3762/bjnano.11.135

• Mehrnoosh Damircheli Babak Eslami Department of Mechanical Engineering, Widener University, Chester, Pennsylvania, 19013, USA Department of Mechanical Engineering, Shahr-e-Qods Branch, Islamic Azad University, Tehran, Iran 10.3762/bjnano.11.135 Abstract As the application of atomic force

• ; Introduction Since the invention of atomic force microscopy (AFM), different techniques have been introduced into the field to enhance and improve this nanotechnology equipment. In 2004, multifrequency AFM was introduced as a technique that can capture both topographical and material composition in a single

• systems (MEMS), superparamagnetic particle embedded microprobe (SPEM) sensors, or lab-on chips devices [5][6][7][8]. Microcantilevers are also an important component of atomic force microscopes (AFM). Due to their importance in AFM, there have been many studies on modeling the cantilevers to represent the

Antimicrobial metal-based nanoparticles: a review on their synthesis, types and antimicrobial action

• Matías Guerrero Correa,
• Fernanda B. Martínez,
• Cristian Patiño Vidal,
• Camilo Streitt,
• Juan Escrig and
• Carol Lopez de Dicastillo

Beilstein J. Nanotechnol. 2020, 11, 1450–1469, doi:10.3762/bjnano.11.129

• , electricity is used as the driving or controlling force. The main advantages of using electrochemical techniques include using vacuum-free systems, simple operation procedures, high flexibility, low cost, low contamination (pure product), and the fact that it is an environmentally friendly process. In

Wafer-level integration of self-aligned high aspect ratio silicon 3D structures using the MACE method with Au, Pd, Pt, Cu, and Ir

• Mathias Franz,
• Romy Junghans,
• Paul Schmitt,
• Adriana Szeghalmi and
• Stefan E. Schulz

Beilstein J. Nanotechnol. 2020, 11, 1439–1449, doi:10.3762/bjnano.11.128

• main etching mechanism remains the same. However, these structures stick together at the topmost point. The nanostructure bundles form during the drying process. This occurs when the capillary forces during drying are high enough to cluster neighbouring single Si wires, and the adhesion force of the

• bundle is larger than the elastic force [26]. This bundling effect is the main limiting factor of this integration scheme. To overcome this issue, one can use liquids with low surface tension or supercritical CO2 [27]. However, this would increase complexity and cost of the process significantly

Protruding hydrogen atoms as markers for the molecular orientation of a metallocene

• Linda Laflör,
• Michael Reichling and
• Philipp Rahe

Beilstein J. Nanotechnol. 2020, 11, 1432–1438, doi:10.3762/bjnano.11.127

• acid (FDCA) molecules on bulk and thin film CaF2(111) surfaces with non-contact atomic force microscopy (NC-AFM). We use NC-AFM image calculations with the probe particle model to interpret this distinct shape by repulsive interactions between the NC-AFM tip and the top hydrogen atoms of the

• of the ferrocene moiety, herein on CaF2(111) surfaces, by using the protruding hydrogen atoms as markers. Keywords: calcium fluoride (CaF2); ferrocene; functionalised tips; high-resolution imaging; non-contact atomic force microscopy; Introduction It is still a challenge to determine the precise

• employed for the investigation of both ordered and unordered molecular systems as well as of individual and isolated species [4][5][6]. For example, two different non-planar isomers of dibenzo[a,h]thianthrene molecules could be identified by high-resolution non-contact atomic force microscopy (NC-AFM) [7

On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 1409–1418, doi:10.3762/bjnano.11.125

• Enrique A. Lopez-Guerra Santiago D. Solares The George Washington University, Department of Mechanical and Aerospace Engineering, Washington, DC 20052, USA Park Systems Inc., Santa Clara, CA, 95054, USA 10.3762/bjnano.11.125 Abstract Atomic force microscopy (AFM) is a widely use technique to

• inverting the frequency-dependent viscoelastic behavior of a material from dynamic AFM observables, we suggest that a partial solution is offered by recently developed quasi-static force–distance characterization techniques, which incorporate viscoelastic models with multiple characteristic times and can

• help inform dynamic AFM characterization. Keywords: dynamic atomic force microscopy; Generalized Maxwell model; loss modulus; storage modulus; viscoelasticity; Introduction There have been significant methodology developments since the introduction of atomic force microscopy (AFM) in the mid-1980s [1

Triboelectric nanogenerator based on Teflon/vitamin B1 powder for self-powered humidity sensing

• Liangyi Zhang,
• Huan Li,
• Yiyuan Xie,
• Jing Guo and
• Zhiyuan Zhu

Beilstein J. Nanotechnol. 2020, 11, 1394–1401, doi:10.3762/bjnano.11.123

• the Teflon membrane is separated in the absence of an external force. There is a positive charge transfer from the conductive copper foil tape at the bottom of the TVB-TENG, to the conductive copper foil tape at the top, leading to an electric field equilibrium due to electrostatic induction. As a

• TVB-TENG to the bottom one [46]. Therefore, it is expected that TVB-TENGs can produce a stable output power under the sustained effect of an external force. The potential distribution is illustrated to obtain a comprehensive understanding of this phenomenon. An oscilloscope (probe: 100 MΩ) was used to

• steady even after 500 external force testing cycles. The TENG output is affected by the humidity due to the triboelectric effect, and the preservation of the triboelectric charge at the surface is severely decreased by the humid environment [47]. It should be considered that the experiments with the TVB

Analysis of catalyst surface wetting: the early stage of epitaxial germanium nanowire growth

• Owen C. Ernst,
• Felix Lange,
• David Uebel,
• Thomas Teubner and
• Torsten Boeck

Beilstein J. Nanotechnol. 2020, 11, 1371–1380, doi:10.3762/bjnano.11.121

• calculations. Hamaker constants correspond to the susceptibility of particles to an electric field of very small length scales generated by the particles themselves [28]. For this reason, these constants are used to determine energy and force values in van der Waals interactions. A more detailed description of

• basic free energy, R is a contribution of the van der Waals energy, Γ is the so-called spreading factor and is the surface area [33]. Since R is a long-range force, it decreases with the square of the film thickness, d2, and increases proportionally to the difference between the Hamaker constants ASF

Impact of fluorination on interface energetics and growth of pentacene on Ag(111)

• Qi Wang,
• Meng-Ting Chen,
• Antoni Franco-Cañellas,
• Bin Shen,
• Thomas Geiger,
• Holger F. Bettinger,
• Frank Schreiber,
• Ingo Salzmann,
• Alexander Gerlach and
• Steffen Duhm

Beilstein J. Nanotechnol. 2020, 11, 1361–1370, doi:10.3762/bjnano.11.120

• the screening effect (also often called the mirror force effect), which is commonly observed in photoemission data of organic thin films on metal substrates [71][72][73]. The absence of nonrigid shifts of the core level peaks between the mono- and multilayer coverage, which usually occur in the case

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

• Jeremiah Croshaw,
• Thomas Dienel,
• Taleana Huff and
• Robert Wolkow

Beilstein J. Nanotechnol. 2020, 11, 1346–1360, doi:10.3762/bjnano.11.119

• Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta, T6G 2M9, Canada 10.3762/bjnano.11.119 Abstract The combination of scanning tunnelling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) allows enhanced extraction and correlation of properties not readily

• . With this, we take the first steps toward enabling the creation of superior H–Si surfaces through an improved understanding of surface defects, ultimately leading to more consistent and reliable fabrication of atom scale devices. Keywords: atomic force microscopy; hydrogen-terminated silicon; scanning

• same side of two neighbouring dimers. Subsequently, the latter had been reassigned as an H, OH pair originating from dissociative attachment of a residual water molecule in the vacuum system [15][16][17]. Further insights became available by non-contact atomic force microscopy (nc-AFM), separating the

Magnetohydrodynamic stagnation point on a Casson nanofluid flow over a radially stretching sheet

• Ganji Narender,
• Kamatam Govardhan and
• Gobburu Sreedhar Sarma

Beilstein J. Nanotechnol. 2020, 11, 1303–1315, doi:10.3762/bjnano.11.114

• distributions. For high values for Ha, the fluid velocity decreases while the temperature and concentration of the fluid increase. This stems from the fact that an opposing force generated by the magnetic field, generally referred to as the Lorentz force, reduces the fluid motion, resulting in a reduction in

Structure and electrochemical performance of electrospun-ordered porous carbon/graphene composite nanofibers

• Yi Wang,
• Yanhua Song,
• Chengwei Ye and
• Lan Xu

Beilstein J. Nanotechnol. 2020, 11, 1280–1290, doi:10.3762/bjnano.11.112

• increased. As a consequence, the resultant force generated by the copper ring also increased, leading to an increase in the jet kinetic energy and acceleration of the jet downward stretching speed [34]. Therefore, the results showed that MPEM improved both the stability and ordering of electrospun

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• -Zentrum Dresden-Rossendorf, Dresden 01328, Germany GETec Microscopy GmbH, Vienna 1220, Austria 10.3762/bjnano.11.111 Abstract In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and

• integration. Keywords: atomic force microscopy (AFM); combined setup; correlative microscopy; helium ion microscopy (HIM); self-sensing cantilevers; Introduction Shortly after the invention of the atomic force microscope (AFM) in 1986 [1], efforts were made towards combining this scanning probe microscopy

• used, in situ, in between exposures to assess the shrinkage, stiffness change or sputtering of the resist. More applications such as conductive AFM, piezo-force microscopy or magnetic force microscopy are within reach of the presented technology and would make AFM–HIM appealing to the microelectronics

Ultrasensitive detection of cadmium ions using a microcantilever-based piezoresistive sensor for groundwater

• Dinesh Rotake,
• Anand Darji and
• Nitin Kale

Beilstein J. Nanotechnol. 2020, 11, 1242–1253, doi:10.3762/bjnano.11.108

• . It was calibrated using atomic force microscopy (AFM) [40]. The process begins with thermal oxidation of Si at 1000 °C using an oxidation furnace to obtain a thermally grown SiO2 layer followed by masking and etching to get the desired pattern. The polysilicon is deposited in a low-pressure chemical

• . Comparison of different methods for cadmium detection. Funding The authors would like to thank Director of Indian Institute of Technology, Bombay for the support of atomic force microscopy under “Indian Nanoelectronics Users Program” and “Visvesvaraya Ph.D. Scheme for Electronics and IT” funded by the MeitY

Magnetic-field-assisted synthesis of anisotropic iron oxide particles: Effect of pH

• Andrey V. Shibaev,
• Petr V. Shvets,
• Darya E. Kessel,
• Roman A. Kamyshinsky,
• Anton S. Orekhov,
• Sergey S. Abramchuk,
• Alexei R. Khokhlov and
• Olga E. Philippova

Beilstein J. Nanotechnol. 2020, 11, 1230–1241, doi:10.3762/bjnano.11.107

• Figure 7C), which is only slightly larger than the minimum diameter of the magnetite particles (6.5 nm) [28], which is necessary for the magnetic force to overcome the Brownian motion of the particles. Therefore, the 8 nm primary nanocrysals are able to form chain-like structures upon the action of an

Influence of the magnetic nanoparticle coating on the magnetic relaxation time

• Mihaela Osaci and
• Matteo Cacciola

Beilstein J. Nanotechnol. 2020, 11, 1207–1216, doi:10.3762/bjnano.11.105

• , respectively, η is the dynamic viscosity coefficient, ri is the radius of the i-th nanoparticle, βi,tr(t) and βi,rot(t) are the random Brownian force and torque, respectively, Ii is the moment of inertia of the i-th nanoparticle, is the angular speed of the i-th nanoparticle, is the resultant of the

• conservative torques acting on the i-th nanoparticle. The forces acting on the nanoparticles of the system are the van der Waals forces, electrostatic repulsive forces, magnetic dipolar forces, steric repulsion forces and the random Brownian force [19][26][27][28][29]. The stabilisation of magnetic particles

• ., surface-to-surface separation between nanoparticles), and on the surface density of the polymer coating layer. Thus, the model uses the van der Waals interaction force equation, as follows [21]: where ri and rj are spherical particle radii of the i-th and j-th nanoparticles, is the versor of the

High permittivity, breakdown strength, and energy storage density of polythiophene-encapsulated BaTiO₃ nanoparticles

• Adnanullah Khan,
• Amir Habib and
• Adeel Afzal

Beilstein J. Nanotechnol. 2020, 11, 1190–1197, doi:10.3762/bjnano.11.103

• microscopy (JEOL JSM 6490LA SEM) and atomic force microscopy (JSPM-5200 scanning probe microscope). Electrical properties of the bulk materials are measured under ambient conditions with a Wayne Kerr 6505B precision impedance analyzer and a Hipotronics HD103 3kV DC Hipot Tester. Results and Discussion

• studied using atomic force microscopy, after depositing the samples on quartz wafers. Figure 5 shows the 2D- and 3D-AFM images of BTO, BTO-PTh, and PTh samples along with their surface profiles. The micrographs of BTO nanoparticles show the presence of clusters on the surface. This is in agreement with

Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

• Marius van den Berg,
• Ardeshir Moeinian,
• Arne Kobald,
• Yu-Ting Chen,
• Anke Horneber,
• Steffen Strehle,
• Alfred J. Meixner and
• Dai Zhang

Beilstein J. Nanotechnol. 2020, 11, 1147–1156, doi:10.3762/bjnano.11.99

• ) along the perimeter of a SiNW. The tip–sample distance is controlled by a shear-force feedback. For this purpose, the tip is mounted on an oscillating tuning fork, which experiences a phase shift of the oscillation upon approach. This phase shift is recorded with a lock-in amplifier and fed to a

• measured using the shear-force scanning function of our custom-built TERS setup. Eight TERS spectra were taken along the white arrow in Figure 5a over a length of 64 nm. The distance between the two sequential spectra is 8 nm. The spectra were acquired from bottom to top, with the black spectrum on the

• observed. a) A shear-force scanning probe microscopy topography image (250 × 250 nm2) of a silicon wire edge. The white arrow indicates the range and direction along which the Raman spectra in panels c and d were recorded. b) Location of the wire indicated on the 50 × 50 µm2 optical image by a white square